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2 research outputs found

Speeding up test pattern generation from behavioral VHDL descriptions containing several processes

Author: Santucci Jean-François
Vandevanter Loic
Publication venue: 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date: 01/01/1994
Field of study

ISBN:0-89791-685-9 website : http://portal.acm.org/citation.cfm?id=198343&coll=PORTAL&dl=ACM&CFID=2473679&CFTOKEN=38034650International audienc

Speeding up Test Pattern Generation from Behavioral VHDL descriptions containing several processes

Author: Jean-François Santucci
Loïc Vandeventer
Publication venue
Publication date: 10/04/2020
Field of study

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