Testing high resolution SD ADC’s by using the noise transfer function

A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques

Accurate spectral testing without accurate instrumentation

Analog-to-digital converters (ADCs) are becoming increasingly common in many systems in integrated circuits. Spectral testing is widely used to test the dynamic linearity performance of ADCs and waveform generators. With improvements in the performance of ADCs, it is becoming an expensive and challenging task to perform spectral testing using standard methods because of the requirement that the test instrumentation environment must satisfy several stringent conditions. In order to address these challenges and to decrease the test cost, in this dissertation, four new algorithms are proposed to perform accurate spectral testing of ADCs by relaxing three conditions required for standard spectral testing methods. The first method developed is relaxing the requirements on precise control of coherent sampling and input signal amplitude. The efficiency and accuracy of this method is similar to the straightforward FFT, but it can simultaneously handle amplitude clipping and noncoherent sampling. By replacing a noncoherent and clipped fundamental with a coherent and unclipped one, correct spectral specifications can be obtained. Both simulation and measurement results validated the proposed method. The second algorithm can simultaneously perform the linearity test and the spectral test with only one-time data acquisition. Targeted for realizing the cotest of linearity and spectral performance under noncoherent sampling and amplitude clipping, a new accurate method for identifying the noncoherent and clipped fundamental is introduced. The residue after removing the identified fundamental from raw data is used to obtain the linearity and spectral characterizations. Simulation and measurement results against the standard test methods collaborate to validate the accuracy and robustness of the new solution. The third method proposes an efficient and accurate jitter estimation method based on one frequency measurement. Applying a simple mathematical processing to the ADC output in time domain, the RMS of jitter and noise power are obtained. Furthermore, prior information of harmonics need not be known before the processing. The algorithm is robust enough that nonharmonic spurs do not affect the estimation result. Using the proposed algorithm, specifications of the ADC under test can be obtained without the jitter effect. Simulation results of ADCs with different resolutions show the functionality and accuracy of the method. The last method is developed to accurately estimate the SNR with sampling clock jitter. This method does not require a precise sampling clock and thus reduces the test cost. The ADC output sequence is separated into two segments. By analyzing the difference of the two segments, the RMS of jitter and the noise power are estimated, and then the SNR is obtained. Simulation and measurement results against the standard test methods collaborate to validate the accuracy and robustness of the new solution

Accurate and robust spectral testing with relaxed instrumentation requirements

Spectral testing has been widely used to characterize the dynamic performances of the electrical signals and devices, such as Analog-to-Digital Converters (ADCs) for many decades. One of the difficulties faced is to accurately and cost-effectively test the continually higher performance devices. Standard test methods can be difficult to implement accurately and cost effectively, due to stringent requirements. To relax these necessary conditions and to reduce test costs, while achieving accurate spectral test results, several new algorithms are developed to perform accurate spectral and linearity test without requiring precise, expensive instruments. In this dissertation, three classes of methods for overcoming the above difficulties are presented. The first class of methods targeted the accurate, single-tone spectral testing. The first method targets the non-coherent sampling issue on spectral testing, especially when the non-coherently sampled signal has large distortions. The second method resolves simultaneous amplitude and frequency drift with non-coherent sampling. The third method achieves accurate linearity results for DAC-ADC co-testing, and generates high-purity sine wave using the nonlinear DAC in the system via pre-distortion. The fourth method targets ultra-pure sine wave generation with two nonlinear DACs, two simple filters, and a nonlinear ADC. These proposed methods are validated by both simulation and measurement results, and have demonstrated their high accuracy and robustness against various test conditions. The second class of methods deals with the accurate multi-tone spectral testing. The first method in this class resolves the non-coherent sampling issue in multi-tone spectral testing. The second method in this class introduces another proposed method to deal with multi-tone impure sources in spectral testing. The third method generates the multi-tone sine wave with minimum peak-to-average power ratio, which can be implemented in many applications, such as spectral testing and signal analysis. Similarly, simulation and measurement results validate the functionality and robustness of these proposed methods. Finally, the third class introduces two proposed methods to accurately test linearity characteristics of high-performance ADCs using low purity sinusoidal or ramp stimulus in the presence of flicker noise. Extensive simulation results have verified their effectiveness to reduce flicker noise influence and achieve accurate linearity results

A built-in self-test technique for high speed analog-to-digital converters

Fundação para a Ciência e a Tecnologia (FCT) - PhD grant (SFRH/BD/62568/2009

Dynamic Pressure Sensing for the Flight Test Data System

This thesis describes the design, assembly, and test of the FTDS-K, a new device in the Boundary Layer Data System (BLDS) family of flight data acquisition systems. The FTDS-K provides high-frequency, high-gain data acquisition capability for up to two pressure sensors and an additional three low-frequency pressure sensors. Development of the FTDS-K was separated into a core module, specialized analog subsystem, and practical testing of the FTDS-K in a flow measurement mission. The core module combines an nRF52840-based microcontroller module, switching regulator, microSD card, real-time clock, temperature sensor, and trio of pressure sensors to provide the same capabilities as previous-generation BLDS-P devices. An expansion header is included in the core module to allow additional functionality to be added via daughter boards. An analog signal chain comprised of two-stage amplification and fourth-order active antialiasing filters was implemented as a daughter board to provide an AC-coupled end-to-end gain of 7,500 and a DC-coupled end-to-end gain of 50. This arrangement was tested in a wind tunnel to demonstrate that sensors with a full-scale range of 103 kPa can be used to reliably discriminate between laminar and turbulent flows based on pressure fluctuation differences on the order of tens of Pa. A combination of wind-off correction and band-filtering was used to reduce the effect of inherent and induced electrical noise, while two-sensor correlation was tested and shown to be effective at removing certain types of noise. Total power consumption for the FTDS-K in a representative mission is 208 mW, which translates to an operational endurance of 9 hours with 2 AAA LiFeS2 cells at -40°C

A Robust High Precision Algorithm for Sinewave Parameter Estimation

The estimation of sinewave parameters has many practical applications in test and data processing systems. Measuring the effective bits of an analog-to-digital converter and linear circuit identification are some typical examples. If a sinew ave\u27s frequency is known, there is an established linear method to estimate the other parameters. But when none of the parameters are known (which is usually the case in practical situations), the estimation problem becomes more difficult. Traditional approaches to this task applied an iterative, sinewave curve-fit algorithm. Two problems with this technique are that convergence is often slow and not always guaranteed and the results of different trials may be inconsistent due to trapping at a local minimum. Recently, a non-iterative algorithm has been developed which computes all four sine wave parameters directly. The algorithm combines a nonlinear technique and windowing to compute the estimates. Although this method is faster and more consistent than the curve-fit approach, one disadvantage is that the accuracy of some estimates tends to deteriorate rapidly if the sinusoid is corrupted by a high level of noise distortion. This study presents an improved algorithm to extract the four parameters of an unknown sinusoid from a sampled data record even though the samples may be distorted by a high level of noise. Given this record, the proposed method first computes the FFT (Fast Fourier Transform) of the data. Analysis of the resulting frequency spectrum provides a rough estimate of the sinewave\u27s fundamental frequency. Next, a bandpass filter designed around this frequency is used to eliminate much of the noise from the samples. Applying the existing four-parameter estimation algorithm to the filtered data, yields a more accurate frequency estimate. Finally, this new value, together with the original (noisy) data record is input to the three-parameter estimation algorithm to determine the remaining sinewave parameters. Simulation results indicate this proposed (new) algorithm not only shows substantial improvement in the accuracy of parameter estimates, but also produces consistent results for higher levels of noise distortion than previous methods have achieved

CMOS Data Converters for Closed-Loop mmWave Transmitters

With the increased amount of data consumed in mobile communication systems, new solutions for the infrastructure are needed. Massive multiple input multiple output (MIMO) is seen as a key enabler for providing this increased capacity. With the use of a large number of transmitters, the cost of each transmitter must be low. Closed-loop transmitters, featuring high-speed data converters is a promising option for achieving this reduced unit cost.In this thesis, both digital-to-analog (D/A) and analog-to-digital (A/D) converters suitable for wideband operation in millimeter wave (mmWave) massive MIMO transmitters are demonstrated. A 2 76 bit radio frequency digital-to-analog converter (RF-DAC)-based in-phase quadrature (IQ) modulator is demonstrated as a compact building block, that to a large extent realizes the transmit path in a closed-loop mmWave transmitter. The evaluation of an successive-approximation register (SAR) analog-to-digital converter (ADC) is also presented in this thesis. Methods for connecting simulated and measured performance has been studied in order to achieve a better understanding about the alternating comparator topology.These contributions show great potential for enabling closed-loop mmWave transmitters for massive MIMO transmitter realizations