Recent Advances in Transfer Learning for Cross-Dataset Visual Recognition: A Problem-Oriented Perspective

This paper takes a problem-oriented perspective and presents a comprehensive review of transfer learning methods, both shallow and deep, for cross-dataset visual recognition. Specifically, it categorises the cross-dataset recognition into seventeen problems based on a set of carefully chosen data and label attributes. Such a problem-oriented taxonomy has allowed us to examine how different transfer learning approaches tackle each problem and how well each problem has been researched to date. The comprehensive problem-oriented review of the advances in transfer learning with respect to the problem has not only revealed the challenges in transfer learning for visual recognition, but also the problems (e.g. eight of the seventeen problems) that have been scarcely studied. This survey not only presents an up-to-date technical review for researchers, but also a systematic approach and a reference for a machine learning practitioner to categorise a real problem and to look up for a possible solution accordingly

Adaptive Online Sequential ELM for Concept Drift Tackling

A machine learning method needs to adapt to over time changes in the environment. Such changes are known as concept drift. In this paper, we propose concept drift tackling method as an enhancement of Online Sequential Extreme Learning Machine (OS-ELM) and Constructive Enhancement OS-ELM (CEOS-ELM) by adding adaptive capability for classification and regression problem. The scheme is named as adaptive OS-ELM (AOS-ELM). It is a single classifier scheme that works well to handle real drift, virtual drift, and hybrid drift. The AOS-ELM also works well for sudden drift and recurrent context change type. The scheme is a simple unified method implemented in simple lines of code. We evaluated AOS-ELM on regression and classification problem by using concept drift public data set (SEA and STAGGER) and other public data sets such as MNIST, USPS, and IDS. Experiments show that our method gives higher kappa value compared to the multiclassifier ELM ensemble. Even though AOS-ELM in practice does not need hidden nodes increase, we address some issues related to the increasing of the hidden nodes such as error condition and rank values. We propose taking the rank of the pseudoinverse matrix as an indicator parameter to detect underfitting condition.Comment: Hindawi Publishing. Computational Intelligence and Neuroscience Volume 2016 (2016), Article ID 8091267, 17 pages Received 29 January 2016, Accepted 17 May 2016. Special Issue on "Advances in Neural Networks and Hybrid-Metaheuristics: Theory, Algorithms, and Novel Engineering Applications". Academic Editor: Stefan Hauf

Supervised Classification: Quite a Brief Overview

The original problem of supervised classification considers the task of automatically assigning objects to their respective classes on the basis of numerical measurements derived from these objects. Classifiers are the tools that implement the actual functional mapping from these measurements---also called features or inputs---to the so-called class label---or output. The fields of pattern recognition and machine learning study ways of constructing such classifiers. The main idea behind supervised methods is that of learning from examples: given a number of example input-output relations, to what extent can the general mapping be learned that takes any new and unseen feature vector to its correct class? This chapter provides a basic introduction to the underlying ideas of how to come to a supervised classification problem. In addition, it provides an overview of some specific classification techniques, delves into the issues of object representation and classifier evaluation, and (very) briefly covers some variations on the basic supervised classification task that may also be of interest to the practitioner