20 research outputs found

    Design of Asynchronous Circuits for High Soft Error Tolerance in Deep Submicron CMOS Circuits

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    As the devices are scaling down, the combinational logic will become susceptible to soft errors. The conventional soft error tolerant methods for soft errors on combinational logic do not provide enough high soft error tolerant capability with reasonably small performance penalty. This paper investigates the feasibility of designing quasi-delay insensitive (QDI) asynchronous circuits for high soft error tolerance. We analyze the behavior of null convention logic (NCL) circuits in the presence of particle strikes, and propose an asynchronous pipeline for soft-error correction and a novel technique to improve the robustness of threshold gates, which are basic components in NCL, against particle strikes by using Schmitt trigger circuit and resizing the feedback transistor. Experimental results show that the proposed threshold gates do not generate soft errors under the strike of a particle within a certain energy range if a proper transistor size is applied. The penalties, such as delay and power consumption, are also presented

    Ultra-Low Power and Radiation Hardened Asynchronous Circuit Design

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    This dissertation proposes an ultra-low power design methodology called bit-wise MTNCL for bit-wise pipelined asynchronous circuits, which combines multi-threshold CMOS (MTCMOS) with bit-wise pipelined NULL Convention Logic (NCL) systems. It provides the leakage power advantages of an all high-Vt implementation with a reasonable speed penalty compared to the all low-Vt implementation, and has negligible area overhead. It was enhanced to handle indeterminate standby states. The original MTNCL concept was enhanced significantly by sleeping Registers and Completion Logic as well as Combinational circuits to reduce area, leakage power, and energy per operation. This dissertation also develops an architecture that allows NCL circuits to recover from a Single Event Upset (SEU) or Single Event Latchup (SEL) fault without any data loss. Finally, an accurate throughput derivation formula for pipelined NCL circuits was developed, which can be used for static timing analysis

    Error Containment in the Presence of Metastability

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    Error containment is an important concept in fault tolerant system design, and techniques like voting are applied to mask erroneous outputs, thus preventing their propagation. In this presentation we will use the example of DARTS, a fault-tolerant distributed clock generation scheme in hardware, to demonstrate that metastability is a substantial threat to error containment. We will illustrate how metastability can originate and propagate such that a single fault may upset the system. The main conclusion is that modeling efforts on all design levels are definitely required in order to mitigate and quantify the deteriorating effect of metastability on system dependability

    Asynchronous designs on FPGA with soft error tolerance for security algorithms

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    Asynchronous methodologies, such as Null Convention Logic (NCL), have tremendous potential in implementing digital logic. It is essential to design complex asynchronous circuits using commercial Electronic Design Automation (EDA) tools. The main focus of this thesis is to design NCL circuits using VHDL and implementing them on FPGAs. The major contributions of this thesis include: 1) Developing a methodology of designing NCL circuits with VHDL and applying it successfully to all practical designs in this thesis. 2) As an example, the NCL circuit for DES (Data Encryption Standard) algorithm has been designed and simulated using VHDL and the implementation issues on various FPGAs (Xilinx and Altera) have been investigated. Modification of the design has been done to minimize the amount of logic used. 3) An effective soft error tolerant scheme for asynchronous circuits on FPGAs is proposed, and successfully verified through software simulation and hardware implementation by introducing it into a DES round. This thesis provides a starting point for further investigation of NCL circuits, in terms of VHDL modeling, FPGA implementations, and soft error tolerance

    High-performance hardware accelerators for image processing in space applications

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    Mars is a hard place to reach. While there have been many notable success stories in getting probes to the Red Planet, the historical record is full of bad news. The success rate for actually landing on the Martian surface is even worse, roughly 30%. This low success rate must be mainly credited to the Mars environment characteristics. In the Mars atmosphere strong winds frequently breath. This phenomena usually modifies the lander descending trajectory diverging it from the target one. Moreover, the Mars surface is not the best place where performing a safe land. It is pitched by many and close craters and huge stones, and characterized by huge mountains and hills (e.g., Olympus Mons is 648 km in diameter and 27 km tall). For these reasons a mission failure due to a landing in huge craters, on big stones or on part of the surface characterized by a high slope is highly probable. In the last years, all space agencies have increased their research efforts in order to enhance the success rate of Mars missions. In particular, the two hottest research topics are: the active debris removal and the guided landing on Mars. The former aims at finding new methods to remove space debris exploiting unmanned spacecrafts. These must be able to autonomously: detect a debris, analyses it, in order to extract its characteristics in terms of weight, speed and dimension, and, eventually, rendezvous with it. In order to perform these tasks, the spacecraft must have high vision capabilities. In other words, it must be able to take pictures and process them with very complex image processing algorithms in order to detect, track and analyse the debris. The latter aims at increasing the landing point precision (i.e., landing ellipse) on Mars. Future space-missions will increasingly adopt Video Based Navigation systems to assist the entry, descent and landing (EDL) phase of space modules (e.g., spacecrafts), enhancing the precision of automatic EDL navigation systems. For instance, recent space exploration missions, e.g., Spirity, Oppurtunity, and Curiosity, made use of an EDL procedure aiming at following a fixed and precomputed descending trajectory to reach a precise landing point. This approach guarantees a maximum landing point precision of 20 km. By comparing this data with the Mars environment characteristics, it is possible to understand how the mission failure probability still remains really high. A very challenging problem is to design an autonomous-guided EDL system able to even more reduce the landing ellipse, guaranteeing to avoid the landing in dangerous area of Mars surface (e.g., huge craters or big stones) that could lead to the mission failure. The autonomous behaviour of the system is mandatory since a manual driven approach is not feasible due to the distance between Earth and Mars. Since this distance varies from 56 to 100 million of km approximately due to the orbit eccentricity, even if a signal transmission at the light speed could be possible, in the best case the transmission time would be around 31 minutes, exceeding so the overall duration of the EDL phase. In both applications, algorithms must guarantee self-adaptability to the environmental conditions. Since the Mars (and in general the space) harsh conditions are difficult to be predicted at design time, these algorithms must be able to automatically tune the internal parameters depending on the current conditions. Moreover, real-time performances are another key factor. Since a software implementation of these computational intensive tasks cannot reach the required performances, these algorithms must be accelerated via hardware. For this reasons, this thesis presents my research work done on advanced image processing algorithms for space applications and the associated hardware accelerators. My research activity has been focused on both the algorithm and their hardware implementations. Concerning the first aspect, I mainly focused my research effort to integrate self-adaptability features in the existing algorithms. While concerning the second, I studied and validated a methodology to efficiently develop, verify and validate hardware components aimed at accelerating video-based applications. This approach allowed me to develop and test high performance hardware accelerators that strongly overcome the performances of the actual state-of-the-art implementations. The thesis is organized in four main chapters. Chapter 2 starts with a brief introduction about the story of digital image processing. The main content of this chapter is the description of space missions in which digital image processing has a key role. A major effort has been spent on the missions in which my research activity has a substantial impact. In particular, for these missions, this chapter deeply analizes and evaluates the state-of-the-art approaches and algorithms. Chapter 3 analyzes and compares the two technologies used to implement high performances hardware accelerators, i.e., Application Specific Integrated Circuits (ASICs) and Field Programmable Gate Arrays (FPGAs). Thanks to this information the reader may understand the main reasons behind the decision of space agencies to exploit FPGAs instead of ASICs for high-performance hardware accelerators in space missions, even if FPGAs are more sensible to Single Event Upsets (i.e., transient error induced on hardware component by alpha particles and solar radiation in space). Moreover, this chapter deeply describes the three available space-grade FPGA technologies (i.e., One-time Programmable, Flash-based, and SRAM-based), and the main fault-mitigation techniques against SEUs that are mandatory for employing space-grade FPGAs in actual missions. Chapter 4 describes one of the main contribution of my research work: a library of high-performance hardware accelerators for image processing in space applications. The basic idea behind this library is to offer to designers a set of validated hardware components able to strongly speed up the basic image processing operations commonly used in an image processing chain. In other words, these components can be directly used as elementary building blocks to easily create a complex image processing system, without wasting time in the debug and validation phase. This library groups the proposed hardware accelerators in IP-core families. The components contained in a same family share the same provided functionality and input/output interface. This harmonization in the I/O interface enables to substitute, inside a complex image processing system, components of the same family without requiring modifications to the system communication infrastructure. In addition to the analysis of the internal architecture of the proposed components, another important aspect of this chapter is the methodology used to develop, verify and validate the proposed high performance image processing hardware accelerators. This methodology involves the usage of different programming and hardware description languages in order to support the designer from the algorithm modelling up to the hardware implementation and validation. Chapter 5 presents the proposed complex image processing systems. In particular, it exploits a set of actual case studies, associated with the most recent space agency needs, to show how the hardware accelerator components can be assembled to build a complex image processing system. In addition to the hardware accelerators contained in the library, the described complex system embeds innovative ad-hoc hardware components and software routines able to provide high performance and self-adaptable image processing functionalities. To prove the benefits of the proposed methodology, each case study is concluded with a comparison with the current state-of-the-art implementations, highlighting the benefits in terms of performances and self-adaptability to the environmental conditions

    Soft error analysis and mitigation in circuits involving C-elements

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    PhD ThesisA SEU or soft error is defined as a temporary error on digital electronics due to the effect of radiation. Such an error can cause system failure, e.g. a deadlock in an asynchronous system or production of incorrect outputs due to data corruption. The first part of this thesis studies the impact of process variation, temperature, voltage and size scaling within the same process on the vulnerability of the nodes of C-element circuits. The objectives are to identify vulnerable to SEU nodes inside a C-element and to find the critical charge needed to flip the output from low to high (0-1) and high to low (1-0) on different implementations of C-elements. In the second part, a framework to compute the SEU error rates is developed. The error rates of circuits are a trade-off between the size of the transistors and the total area of vulnerability. Comparisons of the vulnerability of different configurations of a C-element are made, and error rates are calculated. The third part focuses on soft error mitigation for single and dual rail latches. The latches are able to detect and correct errors due to SEU. The functionalities of the solutions have been validated by simulation. A comprehensive analysis of the performance of the latches under variations of the process and temperature are presented. The fourth part focuses on testing of the new latches. The objective is to design complex systems and incorporate both single rail and dual rail latches in the systems. Errors are injected in the latches and the functionality of the error correcting latches towards the SEU errors are observed at their outputs. The framework to compute error rates and soft error mitigation developed in this thesis can be used by designers in predicting the occurrence of soft error and mitigating soft error in systems

    Methodologies and Toolflows for the Predictable Design of Reliable and Low-Power NoCs

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    There is today the unmistakable need to evolve design methodologies and tool ows for Network-on-Chip based embedded systems. In particular, the quest for low-power requirements is nowadays a more-than-ever urgent dilemma. Modern circuits feature billion of transistors, and neither power management techniques nor batteries capacity are able to endure the increasingly higher integration capability of digital devices. Besides, power concerns come together with modern nanoscale silicon technology design issues. On one hand, system failure rates are expected to increase exponentially at every technology node when integrated circuit wear-out failure mechanisms are not compensated for. However, error detection and/or correction mechanisms have a non-negligible impact on the network power. On the other hand, to meet the stringent time-to-market deadlines, the design cycle of such a distributed and heterogeneous architecture must not be prolonged by unnecessary design iterations. Overall, there is a clear need to better discriminate reliability strategies and interconnect topology solutions upfront, by ranking designs based on power metric. In this thesis, we tackle this challenge by proposing power-aware design technologies. Finally, we take into account the most aggressive and disruptive methodology for embedded systems with ultra-low power constraints, by migrating NoC basic building blocks to asynchronous (or clockless) design style. We deal with this challenge delivering a standard cell design methodology and mainstream CAD tool ows, in this way partially relaxing the requirement of using asynchronous blocks only as hard macros

    Calcul sur architecture non fiable

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    Although materials could be fabricated as error-free theoretically with a huge cost for worst-case design methodologies, the circuit is still susceptible to transient faults by the effects of radiation, temperature sensitivity, and etc. On the contrary, an error-resilient design enables the manufacturing process to be relieved from the variability issue so as to save material cost. Since variability and transient upsets are worsening as emerging fabrication process and size shrink are tending intense, the requirement of robust design is imminent. This thesis addresses the issue of designing on unreliable circuit. The main contributions are fourfold. Firstly a fast error-correction and low cost redundancy fault-tolerant method is presented. Moreover, we introduce judicious two-dimensional criteria to estimate the reliability and the hardware efïŹciency of a circuit. A general-purpose model offers low-redundancy error-resilience for contemporary logic systems as well as future nanoeletronic architectures. At last, a decoder against internal transient faults is designed in this work.En thĂ©orie, les circuits Ă©lectroniques conçus selon la mĂ©thode du pire-cas sont supposĂ©s garantir un fonctionnement sans erreur pourun coĂ»t d’implĂ©mentation Ă©levĂ©. Dans la pratique les circuits restent sujets aux erreurs transitoires du fait de leur sensibilitĂ© aux alĂ©astels que la radiation et la tempĂ©rature. En revanche, une conception prenant en compte la tolĂ©rance aux fautes permet de faire face Ă  detels alĂ©as comme la variabilitĂ© du processus de fabrication. De plus, les erreurs transitoires et la variabilitĂ© de fabrication s’intensiïŹentavec l’émergence de nouveaux processus de fabrication et des circuits de dimension de plus en plus rĂ©duite. La demande d’une conceptionintĂ©grant la tolĂ©rance aux fautes devient dĂ©sormais primordiale. La prĂ©sente thĂšse a pour objectif de cerner la problĂ©matique de laconception de circuits sur des puces peu ïŹables et apporte des contributions suivant quatre aspects. Dans un premier temps, nous proposonsune mĂ©thode de tolĂ©rance aux fautes, basĂ©e sur la correction d’erreurs et la redondance Ă  faible coĂ»t. Puis, nous prĂ©sentonsun critĂšre bidimensionnel judicieux permettant d’évaluer la ïŹabilitĂ© et l’efïŹcacitĂ© matĂ©rielle de circuits. Nous proposons ensuite un modĂšleuniversel qui apporte une tolĂ©rance avec fautes Ă  redondance faible pour les systĂšmes logiques d’aujourd’hui et les architecturesnanoĂ©lectroniques de demain. EnïŹn, nous dĂ©couvrons un dĂ©codeur tolĂ©rant aux fautes transitoires internes
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