Fault-tolerance techniques for hybrid CMOS/nanoarchitecture

The authors propose two fault-tolerance techniques for hybrid CMOS/nanoarchitecture implementing logic functions as look-up tables. The authors compare the efficiency of the proposed techniques with recently reported methods that use single coding schemes in tolerating high fault rates in nanoscale fabrics. Both proposed techniques are based on error correcting codes to tackle different fault rates. In the first technique, the authors implement a combined two-dimensional coding scheme using Hamming and Bose-Chaudhuri-Hocquenghem (BCH) codes to address fault rates greater than 5. In the second technique, Hamming coding is complemented with bad line exclusion technique to tolerate fault rates higher than the first proposed technique (up to 20). The authors have also estimated the improvement that can be achieved in the circuit reliability in the presence of Don-t Care Conditions. The area, latency and energy costs of the proposed techniques were also estimated in the CMOS domain

Application of redundancy in the Saturn 5 guidance and control system

The Saturn launch vehicle's guidance and control system is so complex that the reliability of a simplex system is not adequate to fulfill mission requirements. Thus, to achieve the desired reliability, redundancy encompassing a wide range of types and levels was employed. At one extreme, the lowest level, basic components (resistors, capacitors, relays, etc.) are employed in series, parallel, or quadruplex arrangements to insure continued system operation in the presence of possible failure conditions. At the other extreme, the highest level, complete subsystem duplication is provided so that a backup subsystem can be employed in case the primary system malfunctions. In between these two extremes, many other redundancy schemes and techniques are employed at various levels. Basic redundancy concepts are covered to gain insight into the advantages obtained with various techniques. Points and methods of application of these techniques are included. The theoretical gain in reliability resulting from redundancy is assessed and compared to a simplex system. Problems and limitations encountered in the practical application of redundancy are discussed as well as techniques verifying proper operation of the redundant channels. As background for the redundancy application discussion, a basic description of the guidance and control system is included

Fault-tolerant sub-lithographic design with rollback recovery

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pf = 10^-7) in systems with 10^12 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme

Why Catastrophic Organizational Failures Happen

Excerpt from the introduction: The purpose of this chapter is to examine the major streams of research about catastrophic failures, describing what we have learned about why these failures occur as well as how they can be prevented. The chapter begins by describing the most prominent sociological school of thought with regard to catastrophic failures, namely normal accident theory. That body of thought examines the structure of organizational systems that are most susceptible to catastrophic failures. Then, we turn to several behavioral perspectives on catastrophic failures, assessing a stream of research that has attempted to understand the cognitive, group and organizational processes that develop and unfold over time, leading ultimately to a catastrophic failure. For an understanding of how to prevent such failures, we then assess the literature on high reliability organizations (HRO). These scholars have examined why some complex organizations operating in extremely hazardous conditions manage to remain nearly error free. The chapter closes by assessing how scholars are trying to extend the HRO literature to develop more extensive prescriptions for managers trying to avoid catastrophic failures

Mariner IV Mission to Mars. Part I

This technical report is a series of individual papers documenting the Mariner-Mars project from its beginning in 1962 following the successful Mariner-Venus mission. Part I is pre-encounter data. It includes papers on the design, development, and testing of Mariner IV, as well as papers detailing methods of maintaining communication with and obtaining data from the spacecraft during flight, and expected results during encounter with Mars. Part 11, post-encounter data, to be published later, will consist of documentation of the events taking place during Mariner IV's encounter with Mars and thereafter. The Mariner-Mars mission, the culmination of an era of spacecraft development, has contributed much new technology to be used in future projects