11,168 research outputs found

    Plug & Test at System Level via Testable TLM Primitives

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    With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos

    Studies on Core-Based Testing of System-on-Chips Using Functional Bus and Network-on-Chip Interconnects

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    The tests of a complex system such as a microprocessor-based system-onchip (SoC) or a network-on-chip (NoC) are difficult and expensive. In this thesis, we propose three core-based test methods that reuse the existing functional interconnects-a flat bus, hierarchical buses of multiprocessor SoC's (MPSoC), and a N oC-in order to avoid the silicon area cost of a dedicated test access mechanism (TAM). However, the use of functional interconnects as functional TAM's introduces several new problems. During tests, the interconnects-including the bus arbitrator, the bus bridges, and the NoC routers-operate in the functional mode to transport the test stimuli and responses, while the core under tests (CUT) operate in the test mode. Second, the test data is transported to the CUT through the functional bus, and not directly to the test port. Therefore, special core test wrappers that can provide the necessary control signals required by the different functional interconnect are proposed. We developed two types of wrappers, one buffer-based wrapper for the bus-based systems and another pair of complementary wrappers for the NoCbased systems. Using the core test wrappers, we propose test scheduling schemes for the three functionally different types of interconnects. The test scheduling scheme for a flat bus is developed based on an efficient packet scheduling scheme that minimizes both the buffer sizes and the test time under a power constraint. The schedulingscheme is then extended to take advantage of the hierarchical bus architecture of the MPSoC systems. The third test scheduling scheme based on the bandwidth sharing is developed specifically for the NoC-based systems. The test scheduling is performed under the objective of co-optimizing the wrapper area cost and the resulting test application time using the two complementary NoC wrappers. For each of the proposed methodology for the three types of SoC architec .. ture, we conducted a thorough experimental evaluation in order to verify their effectiveness compared to other methods

    IEEE Standard 1500 Compliance Verification for Embedded Cores

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    Core-based design and reuse are the two key elements for an efficient system-on-chip (SoC) development. Unfortunately, they also introduce new challenges in SoC testing, such as core test reuse and the need of a common test infrastructure working with cores originating from different vendors. The IEEE 1500 Standard for Embedded Core Testing addresses these issues by proposing a flexible hardware test wrapper architecture for embedded cores, together with a core test language (CTL) used to describe the implemented wrapper functionalities. Several intellectual property providers have already announced IEEE Standard 1500 compliance in both existing and future design blocks. In this paper, we address the problem of guaranteeing the compliance of a wrapper architecture and its CTL description to the IEEE Standard 1500. This step is mandatory to fully trust the wrapper functionalities in applying the test sequences to the core. We present a systematic methodology to build a verification framework for IEEE Standard 1500 compliant cores, allowing core providers and/or integrators to verify the compliance of their products (sold or purchased) to the standar

    Content addressable memory project

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    A parameterized version of the tree processor was designed and tested (by simulation). The leaf processor design is 90 percent complete. We expect to complete and test a combination of tree and leaf cell designs in the next period. Work is proceeding on algorithms for the computer aided manufacturing (CAM), and once the design is complete we will begin simulating algorithms for large problems. The following topics are covered: (1) the practical implementation of content addressable memory; (2) design of a LEAF cell for the Rutgers CAM architecture; (3) a circuit design tool user's manual; and (4) design and analysis of efficient hierarchical interconnection networks

    Testability Analysis and Improvements of Register-Transfer Level Digital Circuits

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    The paper presents novel testability analysis method applicable to register-transfer level digital circuits. It is shown if each module stored in a design library is equipped both with information related to design and information related to testing, then more accurate testability results can be achieved. A mathematical model based on virtual port conception is utilized to describe the information and proposed testability analysis method. In order to be effective, the method is based on the idea of searching two special digraphs developed for the purpose. Experimental results gained by the method are presented and compared with results of existing methods

    Using Physical Compilation to Implement a System on Chip Platform

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    The goal of this thesis was to setup a complete design flow involving physical synthesis. The design chosen for this purpose was a system-on-chip (SoC) platform developed at the University of Tennessee. It involves a Leon Processor with a minimal cache configuration, an AMBA on-chip bus and an Advanced Encryption Standard module which performs decryption. As transistor size has entered the deep submicron level, iterations involved in the design cycle have increased due to the domination of interconnect delays over cell delays. Traditionally, interconnect delay has been estimated through the use of wire-load models. However, since there is no physical placement information, the delay estimation may be ineffective and result in increased iterations. Hence, placement-based synthesis has recently been introduced to provide better interconnect delay estimation. The tool used in this thesis to implement the system-on-chip design using physical synthesis is Synopsys Physical Compiler. The flow has been setup through the use of the Galaxy Reference Flow scripts obtained from Synopsys. As part of the thesis, an analysis of the differences between a physically synthesized design and a logically synthesized one in terms of area and delay is presented
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