A novel scan segmentation design method for avoiding shift timing failure in scan testing

ITC : 2011 IEEE International Test Conference , 20-22 Sep. 2011 , Anaheim, CA, USAHigh power consumption in scan testing can cause undue yield loss which has increasingly become a serious problem for deep-submicron VLSI circuits. Growing evidence attributes this problem to shift timing failures, which are primarily caused by excessive switching activity in the proximities of clock paths that tends to introduce severe clock skew due to IR-drop-induced delay increase. This paper is the first of its kind to address this critical issue with a novel layout-aware scheme based on scan segmentation design, called LCTI-SS (Low-Clock-Tree-Impact Scan Segmentation). An optimal combination of scan segments is identified for simultaneous clocking so that the switching activity in the proximities of clock trees is reduced while maintaining the average power reduction effect on conventional scan segmentation. Experimental results on benchmark and industrial circuits have demonstrated the advantage of the LCTI-SS scheme

A PCI Express board designed to interface with the electronic phase-2 upgrades of the ATLAS detectors at CERN

Nei prossimi 10 anni è in previsione un aggiornamento radicale dell'acceleratore LHC al CERN finalizzato al raggiungimento di più alti valori di luminosità istantanea (oltre \begin{math}5 \times 10^{34}cm^{-2}s^{-1}\end{math}) ed integrata (oltre un fattore 10 rispetto a quella attuale). Conseguentemente, anche i rilevatori degli esperimenti che lavorano al CERN, così come i loro sistemi di acquisizione dati, dovranno essere aggiornati per poter gestire un flusso notevolmente maggiore rispetto a quello utilizzato finora. Questa tesi tratta in particolare di una nuova scheda elettronica di lettura, progettata e testata nel laboratorio di elettronica del Dipartimento di Fisica ed Astronomia dell'Università di Bologna e nel laboratorio di elettronica della Sezione INFN (Istituto Nazionale di Fisica Nucleare) di Bologna. Le motivazioni che hanno indotto lo sviluppo della scheda prototipale sono molteplici. Un primo obiettivo da perseguire è stato quello di aggiornare la versione attuale delle schede elettroniche di acquisizione dati usate oggi nel Pixel Detector dell'esperimento ATLAS, visto che sono anch'esse sotto la responsabilità della sezione INFN di Bologna. Secondariamente, la scheda (nominata Pixel-ROD) è orientata a gestire le esigenze elettroniche che seguiranno l'upgrade di LHC durante la fase 2. La complessità del progetto e l'inerzia intrinseca di una vasta collaborazione come quella di ATLAS, hanno poi indotto lo sviluppo di questo progetto elettronico in largo anticipo rispetto al vero upgrade di fase 2 di LHC, previsto per il 2024. In questo modo saranno anche più facilmente eseguibili eventuali aggiornamenti tecnologici in corso d'opera, senza dover riprogettare da zero un sistema di acquisizione dati completo

REDUCING POWER DURING MANUFACTURING TEST USING DIFFERENT ARCHITECTURES

Power during manufacturing test can be several times higher than power consumption in functional mode. Excessive power during test can cause IR drop, over-heating, and early aging of the chips. In this dissertation, three different architectures have been introduced to reduce test power in general cases as well as in certain scenarios, including field test. In the first architecture, scan chains are divided into several segments. Every segment needs a control bit to enable capture in a segment when new faults are detectable on that segment for that pattern. Otherwise, the segment should be disabled to reduce capture power. We group the control bits together into one or more control chains. To address the extra pin(s) required to shift data into the control chain(s) and significant post processing in the first architecture, we explored a second architecture. The second architecture stitches the control bits into the chains they control as EECBs (embedded enable capture bits) in between the segments. This allows an ATPG software tool to automatically generate the appropriate EECB values for each pattern to maintain the fault coverage. This also works in the presence of an on-chip decompressor. The last architecture focuses primarily on the self-test of a device in a 3D stacked IC when an existing FPGA in the stack can be programmed as a tester. We show that the energy expended during test is significantly less than would be required using low power patterns fed by an on-chip decompressor for the same very short scan chains

High-Speed Wide-Field Time-Correlated Single-Photon Counting Fluorescence Lifetime Imaging Microscopy

Fluorescence microscopy is a powerful imaging technique used in the biological sciences to identify labeled components of a sample with specificity. This is usually accomplished through labeling with fluorescent dyes, isolating these dyes by their spectral signatures with optical filters, and recording the intensity of the fluorescent response. Although these techniques are widely used, fluorescence intensity images can be negatively affected by a variety of factors that impact the fluorescence intensity. Fluorescence lifetime imaging microscopy (FLIM) is an imaging technique that is relatively immune to intensity fluctuations and also provides the unique ability to directly monitor the microenvironment surrounding a fluorophore. Despite the benefits associated with FLIM, the applications to which it is applied are fairly limited due to long image acquisition times and high cost of traditional hardware. Recent advances in complementary metal-oxide-semiconductor (CMOS) single-photon avalanche diodes (SPADs) have enabled the design of low-cost imaging arrays that are capable of recording lifetime images with acquisition times greater than one order of magnitude faster than existing systems. However, these SPAD arrays have yet to realize the full potential of the technology due to limitations in their ability to handle the vast amount of data generated during the commonly used time-correlated single-photon counting (TCSPC) lifetime imaging technique. This thesis presents the design, implementation, characterization, and demonstration of a high speed FLIM imaging system. The components of this design include a CMOS imager chip in a standard 0.13 μm technology containing a custom CMOS SPAD, a 64-by-64 array of these SPADs, pixel control circuitry, independent time-to-digital converters (TDCs), a FLIM specific datapath, and high bandwidth output buffers. In addition to the CMOS imaging array, a complete system was designed and implemented using a printed circuit board (PCB) for capturing data from the imager, creating histograms for the photon arrival data using field-programmable gate arrays, and transferring the data to a computer using a cabled PCIe interface. Finally, software is used to communicate between the imaging system and a computer.The dark count rate of the SPAD was measured to be only 231 Hz at room temperature while maintaining a photon detection probability of up to 30\%. TDCs included on the array have a 62.5 ps resolution and a 64 ns range, which is suitable for measuring the lifetime of most biological fluorophores. Additionally, the on-chip datapath was designed to handle continuous data transfers at rates capable of supporting TCSPC-based lifetime imaging at 100 frames per second. The system level implementation also provides sufficient data throughput for transferring up to 750 frames per second from the imaging system to a computer. The lifetime imaging system was characterized using standard techniques for evaluating SPAD performance and an electrical delay signal for measuring the TDC performance. This thesis concludes with a demonstration of TCSPC-FLIM imaging at 100 frames per second -- the fastest 64-by-64 TCSPC FLIM that has been demonstrated. This system overcomes some of the limitations of existing FLIM systems and has the potential to enable new application domains in dynamic FLIM imaging

A Novel Scan Segmentation Design Method for Avoiding Shift Timing Failure in Scan Testing

High power consumption in scan testing can cause undue yield loss which has increasingly become a serious problem for deep-submicron VLSI circuits. Growing evidence attributes this problem to shift timing failures, which are primarily caused by excessive switching activity in the proximities of clock paths that tends to introduce severe clock skew due to IR-drop-induced delay increase. This paper is the first of its kind to address this critical issue with a novel layout-aware scheme based on scan segmentation design, called LCTI-SS (Low-Clock-Tree-Impact Scan Segmentation). An optimal combination of scan segments is identified for simultaneous clocking so that the switching activity in the proximities of clock trees is reduced while maintaining the average power reduction effect on conventional scan segmentation. Experimental results on benchmark and industrial circuits have demonstrated the advantage of the LCTI-SS scheme.2011 IEEE International Test Conference, 20-22 September 2011, Anaheim, CA, US

Novel Front-end Electronics for Time Projection Chamber Detectors

Este trabajo ha sido realizado en la Organización Europea para la Investigación Nuclear (CERN) y forma parte del proyecto de investigación Europeo para futuros aceleradores lineales (EUDET). En física de partículas existen diferentes categorías de detectores de partículas. El diseño presentado esta centrado en un tipo particular de detector de trayectoria de partículas denominado TPC (Time Projection Chamber) que proporciona una imagen en tres dimensiones de las partículas eléctricamente cargadas que atraviesan su volumen gaseoso. La tesis incluye un estudio de los objetivos para futuros detectores, resumiendo los parámetros que un sistema de adquisición de datos debe cumplir en esos casos. Además, estos requisitos son comparados con los actuales sistemas de lectura utilizados en diferentes detectores TPC. Se concluye que ninguno de los sistemas cumple las restrictivas condiciones. Algunos de los principales objetivos para futuros detectores TPC son un altísimo nivel de integración, incremento del número de canales, electrónica más rápida y muy baja potencia. El principal inconveniente del estado del arte de los sistemas anteriores es la utilización de varios circuitos integrados en la cadena de adquisición. Este hecho hace imposible alcanzar el altísimo nivel de integración requerido para futuros detectores. Además, un aumento del número de canales y frecuencia de muestreo haría incrementar hasta valores no permitidos la potencia utilizada. Y en consecuencia, incrementar la refrigeración necesaria (en caso de ser posible). Una de las novedades presentadas es la integración de toda la cadena de adquisición (filtros analógicos de entrada, conversor analógico-digital (ADC) y procesado de señal digital) en un único circuito integrado en tecnología de 130nm. Este chip es el primero que realiza esta altísima integración para detectores TPC. Por otro lado, se presenta un análisis detallado de los filtros de procesado de señal. Los objetivos más importantes es la reduccióGarcía García, EJ. (2012). Novel Front-end Electronics for Time Projection Chamber Detectors [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/16980Palanci

NASA airborne satellite instrumentation calibrator (NASIC) technical reference

The NASA Satellite Instrumentation Calibrator (NASIC) is a visible and near-infrared spectrometer used to calibrate various satellite instruments by underflying those instruments in a NASA ER-2 aircraft. The calibration instrument's hardware and software are documented. The design, operation, and function of an Ebert-Fastie monochronomator, which by means of a moveable diffraction grating, becomes a visible and near-infrared spectrometer used to calibrate satellite-borne instruments by high altitude underflights in the NASA ER-2

A mixed-signal ASIC for time and charge measurements with GEM detectors

L'abstract è presente nell'allegato / the abstract is in the attachmen

Accelerating Missile Threat Engagement Simulations Using Personal Computer Graphics Cards

The 453rd Electronic Warfare Squadron supports on-going military operations by providing battlefield commanders with aircraft ingress and egress routes that minimize the risk of shoulder or ground-fired missile attacks on our aircraft. To determine these routes, the 453rd simulates engagements between ground-to-air missiles and allied aircraft to determine the probability of a successful attack. The simulations are computationally expensive, often requiring two-hours for a single 10-second missile engagement. Hundreds of simulations are needed to perform a complete risk assessment which includes evaluating the effectiveness of countermeasures such as flares, chaff, jammers, and missile warning systems. Thus, the need for faster simulations is acute. This research speeds up these mission critical simulations by using inexpensive commodity PC graphics cards to perform intensive image processing computations used to simulate a heat seeking missile\u27s tracking system. The innovative techniques developed in this research reduce execution time by 33% and incorporate a user-selectable fidelity feature to perform high-fidelity simulations when required. Furthermore, these image processing computations use only 5% of the available computational capacity of the graphics cards, providing a ready source of additional computational power for future simulation enhancements. Analysts can now meet shorter suspenses with more accurate products, ultimately enhancing the safety of Air Force pilots and their weapon systems. With ongoing operations in Iraq and Afghanistan, and a growing threat at home and abroad posed by the proliferation of man-portable missiles, the speed of these simulations play an important role in protecting forces and saving lives

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results