DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

Verification of integer multipliers on the arithmetic bit level

One of the most severe short-comings of currently available equivalence checkers is their inability to verify integer multipliers. In this paper, we present a bit level reverse-engineering technique that can be integrated into standard equivalence checking flows. We propose a Boolean mapping algorithm that extracts a network of half adders from the gate netlist of an addition circuit. Once the arithmetic bit level representation of the circuit is obtained, equivalence checking can be performed using simple arithmetic operations. Experimental results show the promise of our approach

Precomputation-based sequential logic optimization for low power

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1994.Includes bibliographical references (leaves 69-71).by Mazhar Murtaza Alidina.M.S

Immunotronics - novel finite-state-machine architectures with built-in self-test using self-nonself differentiation

A novel approach to hardware fault tolerance is demonstrated that takes inspiration from the human immune system as a method of fault detection. The human immune system is a remarkable system of interacting cells and organs that protect the body from invasion and maintains reliable operation even in the presence of invading bacteria or viruses. This paper seeks to address the field of electronic hardware fault tolerance from an immunological perspective with the aim of showing how novel methods based upon the operation of the immune system can both complement and create new approaches to the development of fault detection mechanisms for reliable hardware systems. In particular, it is shown that by use of partial matching, as prevalent in biological systems, high fault coverage can be achieved with the added advantage of reducing memory requirements. The development of a generic finite-state-machine immunization procedure is discussed that allows any system that can be represented in such a manner to be "immunized" against the occurrence of faulty operation. This is demonstrated by the creation of an immunized decade counter that can detect the presence of faults in real tim

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

A unified approach for the synthesis of self-testable finite state machines

Conventionally self-test hardware is added after synthesis is completed. For highly sequential circuits like controllers this design method either leads to high hardware overheads or compromises fault coverage. In this paper we outline a unified approach for considering self-test hardware like pattern generators and signature registers during synthesis. Three novel target structures are presented, and a method for designing parallel self-testable circuits is discussed in more detail. For a collection of benchmark circuits we show that hardware overheads for self-testable circuits can be significantly reduced this way without sacrificing testability

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches

Technology scaling poses an increasing challenge to the reliability of digital circuits. Hardware redundancy solutions, such as triple modular redundancy (TMR), produce very high area overhead, so partial redundancy is often used to reduce the overheads. Approximate logic circuits provide a general framework for optimized mitigation of errors arising from a broad class of failure mechanisms, including transient, intermittent, and permanent failures. However, generating an optimal redundant logic circuit that is able to mask the faults with the highest probability while minimizing the area overheads is a challenging problem. In this study, we propose and compare two new approaches to generate approximate logic circuits to be used in a TMR schema. The probabilistic approach approximates a circuit in a greedy manner based on a probabilistic estimation of the error. The evolutionary approach can provide radically different solutions that are hard to reach by other methods. By combining these two approaches, the solution space can be explored in depth. Experimental results demonstrate that the evolutionary approach can produce better solutions, but the probabilistic approach is close. On the other hand, these approaches provide much better scalability than other existing partial redundancy techniques.This work was supported by the Ministry of Economy and Competitiveness of Spain under project ESP2015-68245-C4-1-P, and by the Czech science foundation project GA16-17538S and the Ministry of Education, Youth and Sports of the Czech Republic from the National Programme of Sustainability (NPU II); project IT4Innovations excellence in science - LQ1602

Transition Faults and Transition Path Delay Faults: Test Generation, Path Selection, and Built-In Generation of Functional Broadside Tests

As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing is indispensable to guarantee the correct timing behavior of the circuits. In this dissertation, we describe methods developed for three aspects of delay testing in scan-based circuits: test generation, path selection and built-in test generation. We first describe a deterministic broadside test generation procedure for a path delay fault model named the transition path delay fault model, which captures both large and small delay defects. Under this fault model, a path delay fault is detected only if all the individual transition faults along the path are detected by the same test. To reduce the complexity of test generation, sub-procedures with low complexity are applied before a complete branch-and-bound procedure. Next, we describe a method based on static timing analysis to select critical paths for test generation. Logic conditions that are necessary for detecting a path delay fault are considered to refine the accuracy of static timing analysis, using input necessary assignments. Input necessary assignments are input values that must be assigned to detect a fault. The method calculates more accurate path delays, selects paths that are critical during test application, and identifies undetectable path delay faults. These two methods are applicable to off-line test generation. For large circuits with high complexity and frequency, built-in test generation is a cost-effective method for delay testing. For a circuit that is embedded in a larger design, we developed a method for built-in generation of functional broadside tests to avoid excessive power dissipation during test application and the overtesting of delay faults, taking the functional constraints on the primary input sequences of the circuit into consideration. Functional broadside tests are scan-based two-pattern tests for delay faults that create functional operation conditions during test application. To avoid the potential fault coverage loss due to the exclusive use of functional broadside tests, we also developed an optional DFT method based on state holding to improve fault coverage. High delay fault coverage can be achieved by the developed method for benchmark circuits using simple hardware