Hybrid monolithic integration of high-power DC-DC converters in a high-voltage technology

The supply of electrical energy to home, commercial, and industrial users has become ubiquitous, and it is hard to imagine a world without the facilities provided by electrical energy. Despite the ever increasing efficiency of nearly every electrical application, the worldwide demand for electrical power continues to increase, since the number of users and applications more than compensates for these technological improvements. In order to maintain the affordability and feasibility of the total production, it is essential for the distribution of the produced electrical energy to be as efficient as possible. In other words the loss in the power distribution is to be minimized. By transporting electrical energy at the maximum safe voltage, the current in the conductors, and the associated conduction loss can remain as low as possible. In order to optimize the total efficiency, the high transportation voltage needs to be converted to the appropriate lower voltage as close as possible to the end user. Obviously, this conversion also needs to be as efficient, affordable, and compact as possible. Because of the ever increasing integration of electronic systems, where more and more functionality is combined in monolithically integrated circuits, the cost, the power consumption, and the size of these electronic systems can be greatly reduced. This thorough integration is not limited to the electronic systems that are the end users of the electrical energy, but can also be applied to the power conversion itself. In most modern applications, the voltage conversion is implemented as a switching DC-DC converter, in which electrical energy is temporarily stored in reactive elements, i.e. inductors or capacitors. High switching speeds are used to allow for a compact and efficient implementation. For low power levels, typically below 1 Watt, it is possible to monolithically implement the voltage conversion on an integrated circuit. In some cases, this is even done on the same integrated circuit that is the end user of the electrical energy to minimize the system dimensions. For higher power levels, it is no longer feasible to achieve the desired efficiency with monolithically integrated components, and some external components prove indispensable. Usually, the reactive components are the main limiting factor, and are the first components to be moved away from the integrated circuit for increasing power levels. The semiconductor components, including the power transistors, remain part of the integrated circuit. Using this hybrid approach, it is possible in modern converterapplications to process around 60 Watt, albeit limited to voltages of a few Volt. For hybrid integrated converters with an output voltage of tens of Volt, the power is limited to approximately 10 Watt. For even higher power levels, the integrated power transistors also become a limiting factor, and are replaced with discrete power devices. In these discrete converters, greatly increased power levels become possible, although the system size rapidly increases. In this work, the limits of the hybrid approach are explored when using so-called smart-power technologies. Smart-power technologies are standard lowcost submicron CMOS technologies that are complemented with a number of integrated high-voltage devices. By using an appropriate combination of smart-power technologies and circuit topologies, it is possible to improve on the current state-of-the-art converters, by optimizing the size, the cost, and the efficiency. To determine the limits of smart-power DC-DC converters, we first discuss the major contributing factors for an efficient energy distribution, and take a look at the role of voltage conversion in the energy distribution. Considering the limitations of the technologies and the potential application areas, we define two test-cases in the telecommunications sector for which we want to optimize the hybrid monolithic integration in a smart-power technology. Subsequently, we explore the specifications of an ideal converter, and the relevant properties of the affordable smart-power technologies for the implementation of DC-DC converters. Taking into account the limitations of these technologies, we define a cost function that allows to systematically evaluate the different potential converter topologies, without having to perform a full design cycle for each topology. From this cost function, we notice that the de facto default topology selection in discrete converters, which is typically based on output power, is not optimal for converters with integrated power transistors. Based on the cost function and the boundary conditions of our test-cases, we determine the optimal topology for a smart-power implementation of these applications. Then, we take another step towards the real world and evaluate the influence of parasitic elements in a smart-power implementation of switching converters. It is noticed that the voltage overshoot caused by the transformer secondary side leakage inductance is a major roadblock for an efficient implementation. Since the usual approach to this voltage overshoot in discrete converters is not applicable in smart-power converters due to technological limitations, an alternative approach is shown and implemented. The energy from the voltage overshoot is absorbed and transferred to the output of the converter. This allows for a significant reduction in the voltage overshoot, while maintaining a high efficiency, leading to an efficient, compact, and low-cost implementation. The effectiveness of this approach was tested and demonstrated in both a version using a commercially available integrated circuit, and our own implementation in a smart-power integrated circuit. Finally, we also take a look at the optimization of switching converters over the load range by exploiting the capabilities of highly integrated converters. Although the maximum output power remains one of the defining characteristics of converters, it has been shown that most converters spend a majority of their lifetime delivering significantly lower output power. Therefore, it is also desirable to optimize the efficiency of the converter at reduced output current and output power. By splitting the power transistors in multiple independent segments, which are turned on or off in function of the current, the efficiency at low currents can be significantly improved, without introducing undesirable frequency components in the output voltage, and without harming the efficiency at higher currents. These properties allow a near universal application of the optimization technique in hybrid monolithic DC-DC converter applications, without significant impact on the complexity and the cost of the system. This approach for the optimization of switching converters over the load range was demonstrated using a boost converter with discrete power transistors. The demonstration of our smart-power implementation was limited to simulations due to an issue with a digital control block. On a finishing note, we formulate the general conclusions and provide an outlook on potential future work based on this research

Solid State Circuits Technologies

The evolution of solid-state circuit technology has a long history within a relatively short period of time. This technology has lead to the modern information society that connects us and tools, a large market, and many types of products and applications. The solid-state circuit technology continuously evolves via breakthroughs and improvements every year. This book is devoted to review and present novel approaches for some of the main issues involved in this exciting and vigorous technology. The book is composed of 22 chapters, written by authors coming from 30 different institutions located in 12 different countries throughout the Americas, Asia and Europe. Thus, reflecting the wide international contribution to the book. The broad range of subjects presented in the book offers a general overview of the main issues in modern solid-state circuit technology. Furthermore, the book offers an in depth analysis on specific subjects for specialists. We believe the book is of great scientific and educational value for many readers. I am profoundly indebted to the support provided by all of those involved in the work. First and foremost I would like to acknowledge and thank the authors who worked hard and generously agreed to share their results and knowledge. Second I would like to express my gratitude to the Intech team that invited me to edit the book and give me their full support and a fruitful experience while working together to combine this book

Monolithic Integration of CMOS Charge Pumps for High Voltage Generation beyond 100 V

Monolithic integration of step-up DC-DC converters used to be one of the largest challenges in high voltage CMOS SoCs. Charge pumps are considered as the most promising solution regarding in- tegration levels compared to boost converter with bulky inductors. However, conventional charge pump architectures usually show significant drawbacks and reliability problems, when used as on- chip high voltage generators. Hence, innovative charge pump architectures are required to realize the monolithic integration of charge pumps in high voltage applications. In this dissertation, three 4-phase charge pump architectures with the dynamic body biasing tech- nique and clock schemes with dead time techniques were proposed to overcome drawbacks such as body effect and reverse current problem of traditional Pelliconi charge pump. The influences of high voltage CMOS sandwich capacitors on the voltage gain and power efficiency of charge pumps were extensively investigated. The most reasonable 4-phase charge pump architecture with a suitable configuration of high voltage sandwich capacitors regarding the voltage gain and power efficiency was chosen to implement two high voltage ASICs in an advanced 120 V 0.35 μm high voltage CMOS technology. The first test chip operates successfully and is able to generate up to 120 V from a 3.7 V low voltage DC supply, which shows the highest output voltage among all the reported fully integrated CMOS charge pumps. The measurement results confirmed the benefits of the proposed charge pump architectures and clock schemes. The second chip providing a similar output voltage has a reduced chip size mainly due to decreased capacitor areas by increased clock frequencies. Fur- thermore, the second chip with an on-chip clock generator works independently of external clock signals which shows the feasibility of integrated charge pumps as part of high voltage SoCs. Based on the successful implementation of those high voltage CMOS ASICs, further discussions on the stability of the output voltage, levels of integration and limitations in the negative high voltage generation of high voltage CMOS charge pumps are held with the aid of simulation or measurement results. Feed- back regulation by adjusting the clock frequency or DC power supply is able to stabilize the voltage performance effectively while being easily integrated on-chip. Increasing the clock frequency can significantly reduce the required capacitor values which results in reduced chip sizes. An application example demonstrates the importance of fully integrated high voltage charge pumps. Besides, a new design methodology for the on-chip high voltage generation using CMOS technolo- gies was proposed. It contains a general design flow focusing mainly on the feasibility and reliability of high voltage CMOS ASICs and design techniques for on-chip high voltage generators. In this dissertation, it is proven that CMOS charge pumps using suitable architectures regarding the required chip size and circuit reliability are able to be used as on-chip high voltage generators for voltages beyond 100 V . Several methods to improve the circuit performance and to extend the functionalities of high voltage charge pumps are suggested for future works

Highly Integrated Dc-dc Converters

A monolithically integrated smart rectifier has been presented first in this work. The smart rectifier, which integrates a power MOSFET, gate driver and control circuitry, operates in a self-synchronized fashion based on its drain-source voltage, and does not need external control input. The analysis, simulation, and design considerations are described in detail. A 5V, 5-µm CMOS process was used to fabricate the prototype. Experimental results show that the proposed rectifier functions as expected in the design. Since no dead-time control needs to be used to switch the sync-FET and ctrl-FET, it is expected that the body diode losses can be reduced substantially, compared to the conventional synchronous rectifier. The proposed self-synchronized rectifier (SSR) can be operated at high frequencies and maintains high efficiency over a wide load range. As an example of the smart rectifier\u27s application in isolated DC-DC converter, a synchronous flyback converter with SSR is analyzed, designed and tested. Experimental results show that the operating frequency could be as high as 4MHz and the efficiency could be improved by more than 10% compared to that when a hyper fast diode rectifier is used. Based on a new current-source gate driver scheme, an integrated gate driver for buck converter is also developed in this work by using a 0.35µm CMOS process with optional high voltage (50V) power MOSFET. The integrated gate driver consists both the current-source driver for high-side power MOSFET and low-power driver for low-side power iv MOSFET. Compared with the conventional gate driver circuit, the current-source gate driver can recovery some gate charging energy and reduce switching loss. So the current-source driver (CSD) can be used to improve the efficiency performance in high frequency power converters. This work also presents a new implementation of a power supply in package (PSiP) 5MHz buck converter, which is different from all the prior-of-art PSiP solutions by using a high-Q bondwire inductor. The high-Q bondwire inductor can be manufactured by applying ferrite epoxy to the common bondwire during standard IC packaging process, so the new implementation of PSiP is expected to be a cost-effective way of power supply integration

A novel deep submicron bulk planar sizing strategy for low energy subthreshold standard cell libraries

Engineering andPhysical Science ResearchCouncil (EPSRC) and Arm Ltd for providing funding in the form of grants and studentshipsThis work investigates bulk planar deep submicron semiconductor physics in an attempt to improve standard cell libraries aimed at operation in the subthreshold regime and in Ultra Wide Dynamic Voltage Scaling schemes. The current state of research in the field is examined, with particular emphasis on how subthreshold physical effects degrade robustness, variability and performance. How prevalent these physical effects are in a commercial 65nm library is then investigated by extensive modeling of a BSIM4.5 compact model. Three distinct sizing strategies emerge, cells of each strategy are laid out and post-layout parasitically extracted models simulated to determine the advantages/disadvantages of each. Full custom ring oscillators are designed and manufactured. Measured results reveal a close correlation with the simulated results, with frequency improvements of up to 2.75X/2.43X obs erved for RVT/LVT devices respectively. The experiment provides the first silicon evidence of the improvement capability of the Inverse Narrow Width Effect over a wide supply voltage range, as well as a mechanism of additional temperature stability in the subthreshold regime. A novel sizing strategy is proposed and pursued to determine whether it is able to produce a superior complex circuit design using a commercial digital synthesis flow. Two 128 bit AES cores are synthesized from the novel sizing strategy and compared against a third AES core synthesized from a state-of-the-art subthreshold standard cell library used by ARM. Results show improvements in energy-per-cycle of up to 27.3% and frequency improvements of up to 10.25X. The novel subthreshold sizing strategy proves superior over a temperature range of 0 °C to 85 °C with a nominal (20 °C) improvement in energy-per-cycle of 24% and frequency improvement of 8.65X. A comparison to prior art is then performed. Valid cases are presented where the proposed sizing strategy would be a candidate to produce superior subthreshold circuits

High efficiency wide-band line drivers in low voltage CMOS using Class-D techniques

In this thesis, the applicability of Class-D amplifiers to integrated wide-band communication line driver applications is studied. While Class-D techniques can address some of the efficiency limitations of linear amplifier structures and have shown promising results in low frequency applications, the low frequency techniques and knowledge need further development in order to improve their practicality for wide band systems. New structures and techniques to extend the application of Class-D to wide-band communication systems, in particular the HomePlug AV wire- line communication standard, will be proposed. Additionally, the digital processing requirements of these wide-band systems drives rapid movement towards nanometer technology nodes and presents new challenges which will be addressed, and new opportunities which will be exploited, for wide-band integrated Class-D line drivers. There are three main contributions of this research. First, a model of Class-D efficiency degradation mechanisms is created, which allows the impact of high-level design choices such as supply voltage, process technology and operating frequency to be assessed. The outcome of this section is a strategy for pushing the high efficiency of Class-D to wide band communication applications, with switching frequencies up to many hundreds of Megahertz. A second part of this research considers the design of efficient, fast and high power Class-D output stages, as these are the major efficiency and bandwidth bottleneck in wide-band applications. A novel NMOS-only totem pole output stage with a fast, integrated drive structure will be proposed. In a third section, a complete wide-band Class-D line driver is designed in a 0.13μm digital CMOS process. The line driver is systematically designed using a rigorous development methodology and the aims are to maximise the achievable signal bandwidth while minimising power dissipation. Novel circuits and circuit structures are proposed as part of this section and the resulting fabricated Class-D line driver test chip shows an efficiency of 15% while driving a 30MHz wide signal with an MTPR of 22dB, at 33mW injected power

Physical Design Methodologies for Low Power and Reliable 3D ICs

As the semiconductor industry struggles to maintain its momentum down the path following the Moore's Law, three dimensional integrated circuit (3D IC) technology has emerged as a promising solution to achieve higher integration density, better performance, and lower power consumption. However, despite its significant improvement in electrical performance, 3D IC presents several serious physical design challenges. In this dissertation, we investigate physical design methodologies for 3D ICs with primary focus on two areas: low power 3D clock tree design, and reliability degradation modeling and management. Clock trees are essential parts for digital system which dissipate a large amount of power due to high capacitive loads. The majority of existing 3D clock tree designs focus on minimizing the total wire length, which produces sub-optimal results for power optimization. In this dissertation, we formulate a 3D clock tree design flow which directly optimizes for clock power. Besides, we also investigate the design methodology for clock gating a 3D clock tree, which uses shutdown gates to selectively turn off unnecessary clock activities. Different from the common assumption in 2D ICs that shutdown gates are cheap thus can be applied at every clock node, shutdown gates in 3D ICs introduce additional control TSVs, which compete with clock TSVs for placement resources. We explore the design methodologies to produce the optimal allocation and placement for clock and control TSVs so that the clock power is minimized. We show that the proposed synthesis flow saves significant clock power while accounting for available TSV placement area. Vertical integration also brings new reliability challenges including TSV's electromigration (EM) and several other reliability loss mechanisms caused by TSV-induced stress. These reliability loss models involve complex inter-dependencies between electrical and thermal conditions, which have not been investigated in the past. In this dissertation we set up an electrical/thermal/reliability co-simulation framework to capture the transient of reliability loss in 3D ICs. We further derive and validate an analytical reliability objective function that can be integrated into the 3D placement design flow. The reliability aware placement scheme enables co-design and co-optimization of both the electrical and reliability property, thus improves both the circuit's performance and its lifetime. Our electrical/reliability co-design scheme avoids unnecessary design cycles or application of ad-hoc fixes that lead to sub-optimal performance. Vertical integration also enables stacking DRAM on top of CPU, providing high bandwidth and short latency. However, non-uniform voltage fluctuation and local thermal hotspot in CPU layers are coupled into DRAM layers, causing a non-uniform bit-cell leakage (thereby bit flip) distribution. We propose a performance-power-resilience simulation framework to capture DRAM soft error in 3D multi-core CPU systems. In addition, a dynamic resilience management (DRM) scheme is investigated, which adaptively tunes CPU's operating points to adjust DRAM's voltage noise and thermal condition during runtime. The DRM uses dynamic frequency scaling to achieve a resilience borrow-in strategy, which effectively enhances DRAM's resilience without sacrificing performance. The proposed physical design methodologies should act as important building blocks for 3D ICs and push 3D ICs toward mainstream acceptance in the near future

Skybridge: 3-D Integrated Circuit Technology Alternative to CMOS

Continuous scaling of CMOS has been the major catalyst in miniaturization of integrated circuits (ICs) and crucial for global socio-economic progress. However, scaling to sub-20nm technologies is proving to be challenging as MOSFETs are reaching their fundamental limits and interconnection bottleneck is dominating IC operational power and performance. Migrating to 3-D, as a way to advance scaling, has eluded us due to inherent customization and manufacturing requirements in CMOS that are incompatible with 3-D organization. Partial attempts with die-die and layer-layer stacking have their own limitations. We propose a 3-D IC fabric technology, Skybridge[TM], which offers paradigm shift in technology scaling as well as design. We co-architect Skybridge's core aspects, from device to circuit style, connectivity, thermal management, and manufacturing pathway in a 3-D fabric-centric manner, building on a uniform 3-D template. Our extensive bottom-up simulations, accounting for detailed material system structures, manufacturing process, device, and circuit parasitics, carried through for several designs including a designed microprocessor, reveal a 30-60x density, 3.5x performance per watt benefits, and 10X reduction in interconnect lengths vs. scaled 16-nm CMOS. Fabric-level heat extraction features are shown to successfully manage IC thermal profiles in 3-D. Skybridge can provide continuous scaling of integrated circuits beyond CMOS in the 21st century.Comment: 53 Page

Compact and Efficient Millimetre-Wave Circuits for Wideband Applications

Radio systems, along with the ever increasing processing power provided by computer technology, have altered many aspects of our society over the last century. Various gadgets and integrated electronics are found everywhere nowadays; many of these were science-fiction only a few decades ago. Most apparent is perhaps your ``smart phone'', possibly kept within arm's reach wherever you go, that provides various services, news updates, and social networking via wireless communications systems. The frameworks of the fifth generation wireless system is currently being developed worldwide. Inclusion of millimetre-wave technology promise high-speed piconets, wireless back-haul on pencil-beam links, and further functionality such as high-resolution radar imaging. This thesis addresses the challenge to provide signals at carrier frequencies in the millimetre-wave spectrum, and compact integrated transmitter front-ends of sub-wavelength dimensions. A radio frequency pulse generator, i.e. a ``wavelet genarator'', circuit is implemented using diodes and transistors in III--V compound semiconductor technology. This simple but energy-efficient front-end circuit can be controlled on the time-scale of picoseconds. Transmission of wireless data is thereby achieved at high symbol-rates and low power consumption per bit. A compact antenna is integrated with the transmitter circuit, without any intermediate transmission line. The result is a physically small, single-chip, transmitter front-end that can output high equivalent isotropically radiated power. This element radiation characteristic is wide-beam and suitable for array implementations