Evaluation of Design Tools for Rapid Prototyping of Parallel Signal Processing Algorithms

Digital signal processing (DSP) has become a popular method for handling not only signal processing, but communications, and control system applications. A DSP application of interest to the Air Force is high speed avionics processing. The real time computing requirements of avionics processing exceed the capabilities of current single chip DSP processors, and parallelization of multiple DSP processors is a solution to handle such requirements. Designing and implementing a parallel DSP algorithm has been a lengthy process often requiring different design tools and extensive programming experience. Through the use of integrated software development tools, rapid prototyping becomes possible by simulating algorithms, generating code for workstations or DSP microprocessors, and generating hardware description language code for hardware synthesis. This research examines the use of one such tool, the Signal Processing WorkSystem (SPW) by the Alta Group of Cadence Design Systems, Inc., and how SPW supports the rapid prototyping process from an avionics algorithm design through simulation and hardware implementation. Throughout this process, SPW is evaluated as an aid to the avionics designer to meet design objectives and evaluate tradeoffs to find the best blend of efficiency and effectiveness. By designing a two dimensional fast Fourier transform algorithm as a specific avionics algorithm and exploring implementation options, SPW is shown to be a viable rapid prototyping solution allowing an avionics designer to focus on design trade-offs instead of implementation details while using parallelization to meet real-time application requirements

A software-based self test of CUDA Fermi GPUs

Nowadays, Graphical Processing Units (GPUs) have become increasingly popular due to their high computational power and low prices. This makes them particularly suitable for high-performance computing applications, like data elaboration and financial computation. In these fields, high efficient test methodologies are mandatory. One of the most effective ways to detect and localize hardware faults in GPUs is a Software-Based-Self-Test methodology (SBST). In this paper a fully comprehensive SBST and fault localization methodology for GPUs is presented. This novel approach exploits different custom test strategies for each component inside the GPU architecture. Such strategies guarantee both permanent fault detection and accurate fault localization

Digital System Design - Use of Microcontroller

Embedded systems are today, widely deployed in just about every piece of machinery from toasters to spacecraft. Embedded system designers face many challenges. They are asked to produce increasingly complex systems using the latest technologies, but these technologies are changing faster than ever. They are asked to produce better quality designs with a shorter time-to-market. They are asked to implement increasingly complex functionality but more importantly to satisfy numerous other constraints. To achieve the current goals of design, the designer must be aware with such design constraints and more importantly, the factors that have a direct effect on them.One of the challenges facing embedded system designers is the selection of the optimum processor for the application in hand; single-purpose, general-purpose or application specific. Microcontrollers are one member of the family of the application specific processors.The book concentrates on the use of microcontroller as the embedded system?s processor, and how to use it in many embedded system applications. The book covers both the hardware and software aspects needed to design using microcontroller.The book is ideal for undergraduate students and also the engineers that are working in the field of digital system design.Contents• Preface;• Process design metrics;• A systems approach to digital system design;• Introduction to microcontrollers and microprocessors;• Instructions and Instruction sets;• Machine language and assembly language;• System memory; Timers, counters and watchdog timer;• Interfacing to local devices / peripherals;• Analogue data and the analogue I/O subsystem;• Multiprocessor communications;• Serial Communications and Network-based interfaces

Aerospace Applications of Microprocessors

An assessment of the state of microprocessor applications is presented. Current and future requirements and associated technological advances which allow effective exploitation in aerospace applications are discussed

Architectures for dependable modern microprocessors

Η εξέλιξη των ολοκληρωμένων κυκλωμάτων σε συνδυασμό με τους αυστηρούς χρονικούς περιορισμούς καθιστούν την επαλήθευση της ορθής λειτουργίας των επεξεργαστών μία εξαιρετικά απαιτητική διαδικασία. Με κριτήριο το στάδιο του κύκλου ζωής ενός επεξεργαστή, από την στιγμή κατασκευής των πρωτοτύπων και έπειτα, οι τεχνικές ελέγχου ορθής λειτουργίας διακρίνονται στις ακόλουθες κατηγορίες: (1) Silicon Debug: Τα πρωτότυπα ολοκληρωμένα κυκλώματα ελέγχονται εξονυχιστικά, (2) Manufacturing Testing: ο τελικό ποιοτικός έλεγχος και (3) In-field verification: Περιλαμβάνει τεχνικές, οι οποίες διασφαλίζουν την λειτουργία του επεξεργαστή σύμφωνα με τις προδιαγραφές του. Η διδακτορική διατριβή προτείνει τα ακόλουθα: (1) Silicon Debug: Η εργασία αποσκοπεί στην επιτάχυνση της διαδικασίας ανίχνευσης σφαλμάτων και στον αυτόματο εντοπισμό τυχαίων προγραμμάτων που δεν περιέχουν νέα -χρήσιμη- πληροφορία σχετικά με την αίτια ενός σφάλματος. Η κεντρική ιδέα αυτής της μεθόδου έγκειται στην αξιοποίηση της έμφυτης ποικιλομορφίας των αρχιτεκτονικών συνόλου εντολών και στην δυνατότητα από-διαμόρφωσης τμημάτων του κυκλώματος, (2) Manufacturing Testing: προτείνεται μία μέθοδο για την βελτιστοποίηση του έλεγχου ορθής λειτουργίας των πολυνηματικών και πολυπύρηνων επεξεργαστών μέσω της χρήση λογισμικού αυτοδοκιμής, (3) Ιn-field verification: Αναλύθηκε σε βάθος η επίδραση που έχουν τα μόνιμα σφάλματα σε μηχανισμούς αύξησης της απόδοσης. Επιπρόσθετα, προτάθηκαν τεχνικές για την ανίχνευση και ανοχή μόνιμων σφαλμάτων υλικού σε μηχανισμούς πρόβλεψης διακλάδωσης.Technology scaling, extreme chip integration and the compelling requirement to diminish the time-to-market window, has rendered microprocessors more prone to design bugs and hardware faults. Microprocessor validation is grouped into the following categories, based on where they intervene in a microprocessor’s lifecycle: (a) Silicon debug: the first hardware prototypes are exhaustively validated, (b) Μanufacturing testing: the final quality control during massive production, and (c) In-field verification: runtime error detection techniques to guarantee correct operation. The contributions of this thesis are the following: (1) Silicon debug: We propose the employment of deconfigurable microprocessor architectures along with a technique to generate self-checking random test programs to avoid the simulation step and triage the redundant debug sessions, (2) Manufacturing testing: We propose a self-test optimization strategy for multithreaded, multicore microprocessors to speedup test program execution time and enhance the fault coverage of hard errors; and (3) In-field verification: We measure the effect of permanent faults performance components. Then, we propose a set of low-cost mechanisms for the detection, diagnosis and performance recovery in the front-end speculative structures. This thesis introduces various novel methodologies to address the validation challenges posed throughout the life-cycle of a chip

Advanced sensors technology survey

This project assesses the state-of-the-art in advanced or 'smart' sensors technology for NASA Life Sciences research applications with an emphasis on those sensors with potential applications on the space station freedom (SSF). The objectives are: (1) to conduct literature reviews on relevant advanced sensor technology; (2) to interview various scientists and engineers in industry, academia, and government who are knowledgeable on this topic; (3) to provide viewpoints and opinions regarding the potential applications of this technology on the SSF; and (4) to provide summary charts of relevant technologies and centers where these technologies are being developed

Application of advanced technology to space automation

Automated operations in space provide the key to optimized mission design and data acquisition at minimum cost for the future. The results of this study strongly accentuate this statement and should provide further incentive for immediate development of specific automtion technology as defined herein. Essential automation technology requirements were identified for future programs. The study was undertaken to address the future role of automation in the space program, the potential benefits to be derived, and the technology efforts that should be directed toward obtaining these benefits

Innovative Techniques for Testing and Diagnosing SoCs

We rely upon the continued functioning of many electronic devices for our everyday welfare, usually embedding integrated circuits that are becoming even cheaper and smaller with improved features. Nowadays, microelectronics can integrate a working computer with CPU, memories, and even GPUs on a single die, namely System-On-Chip (SoC). SoCs are also employed on automotive safety-critical applications, but need to be tested thoroughly to comply with reliability standards, in particular the ISO26262 functional safety for road vehicles. The goal of this PhD. thesis is to improve SoC reliability by proposing innovative techniques for testing and diagnosing its internal modules: CPUs, memories, peripherals, and GPUs. The proposed approaches in the sequence appearing in this thesis are described as follows: 1. Embedded Memory Diagnosis: Memories are dense and complex circuits which are susceptible to design and manufacturing errors. Hence, it is important to understand the fault occurrence in the memory array. In practice, the logical and physical array representation differs due to an optimized design which adds enhancements to the device, namely scrambling. This part proposes an accurate memory diagnosis by showing the efforts of a software tool able to analyze test results, unscramble the memory array, map failing syndromes to cell locations, elaborate cumulative analysis, and elaborate a final fault model hypothesis. Several SRAM memory failing syndromes were analyzed as case studies gathered on an industrial automotive 32-bit SoC developed by STMicroelectronics. The tool displayed defects virtually, and results were confirmed by real photos taken from a microscope. 2. Functional Test Pattern Generation: The key for a successful test is the pattern applied to the device. They can be structural or functional; the former usually benefits from embedded test modules targeting manufacturing errors and is only effective before shipping the component to the client. The latter, on the other hand, can be applied during mission minimally impacting on performance but is penalized due to high generation time. However, functional test patterns may benefit for having different goals in functional mission mode. Part III of this PhD thesis proposes three different functional test pattern generation methods for CPU cores embedded in SoCs, targeting different test purposes, described as follows: a. Functional Stress Patterns: Are suitable for optimizing functional stress during I Operational-life Tests and Burn-in Screening for an optimal device reliability characterization b. Functional Power Hungry Patterns: Are suitable for determining functional peak power for strictly limiting the power of structural patterns during manufacturing tests, thus reducing premature device over-kill while delivering high test coverage c. Software-Based Self-Test Patterns: Combines the potentiality of structural patterns with functional ones, allowing its execution periodically during mission. In addition, an external hardware communicating with a devised SBST was proposed. It helps increasing in 3% the fault coverage by testing critical Hardly Functionally Testable Faults not covered by conventional SBST patterns. An automatic functional test pattern generation exploiting an evolutionary algorithm maximizing metrics related to stress, power, and fault coverage was employed in the above-mentioned approaches to quickly generate the desired patterns. The approaches were evaluated on two industrial cases developed by STMicroelectronics; 8051-based and a 32-bit Power Architecture SoCs. Results show that generation time was reduced upto 75% in comparison to older methodologies while increasing significantly the desired metrics. 3. Fault Injection in GPGPU: Fault injection mechanisms in semiconductor devices are suitable for generating structural patterns, testing and activating mitigation techniques, and validating robust hardware and software applications. GPGPUs are known for fast parallel computation used in high performance computing and advanced driver assistance where reliability is the key point. Moreover, GPGPU manufacturers do not provide design description code due to content secrecy. Therefore, commercial fault injectors using the GPGPU model is unfeasible, making radiation tests the only resource available, but are costly. In the last part of this thesis, we propose a software implemented fault injector able to inject bit-flip in memory elements of a real GPGPU. It exploits a software debugger tool and combines the C-CUDA grammar to wisely determine fault spots and apply bit-flip operations in program variables. The goal is to validate robust parallel algorithms by studying fault propagation or activating redundancy mechanisms they possibly embed. The effectiveness of the tool was evaluated on two robust applications: redundant parallel matrix multiplication and floating point Fast Fourier Transform

Digital System Design - Use of Microcontroller

Embedded systems are today, widely deployed in just about every piece of machinery from toasters to spacecraft. Embedded system designers face many challenges. They are asked to produce increasingly complex systems using the latest technologies, but these technologies are changing faster than ever. They are asked to produce better quality designs with a shorter time-to-market. They are asked to implement increasingly complex functionality but more importantly to satisfy numerous other constraints. To achieve the current goals of design, the designer must be aware with such design constraints and more importantly, the factors that have a direct effect on them.One of the challenges facing embedded system designers is the selection of the optimum processor for the application in hand; single-purpose, general-purpose or application specific. Microcontrollers are one member of the family of the application specific processors.The book concentrates on the use of microcontroller as the embedded system?s processor, and how to use it in many embedded system applications. The book covers both the hardware and software aspects needed to design using microcontroller.The book is ideal for undergraduate students and also the engineers that are working in the field of digital system design.Contents• Preface;• Process design metrics;• A systems approach to digital system design;• Introduction to microcontrollers and microprocessors;• Instructions and Instruction sets;• Machine language and assembly language;• System memory; Timers, counters and watchdog timer;• Interfacing to local devices / peripherals;• Analogue data and the analogue I/O subsystem;• Multiprocessor communications;• Serial Communications and Network-based interfaces

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks