Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Voltage-to-Time Converter for High-Speed Time-Based Analog-to-Digital Converters

In modern complementary metal oxide semiconductor (CMOS) technologies, the supply voltage scales faster than the threshold voltage (Vth) of the transistors in successive smaller nodes. Moreover, the intrinsic gain of the transistors diminishes as well. Consequently, these issues increase the difficulty of designing higher speed and larger resolution analog-to-digital converters (ADCs) employing voltage-domain ADC architectures. Nevertheless, smaller transistor dimensions in state-of-the-art CMOS technologies leads to reduced capacitance, resulting in lower gate delays. Therefore, it becomes beneficial to first convert an input voltage to a 'time signal' using a voltage-to-time converter (VTC), instead of directly converting it into a digital output. This 'time-signal' could then be converted to a digital output through a time-to-digital converter (TDC) for complete analog-to-digital conversion. However, the overall performance of such an ADC will still be limited to the performance level of the voltage-to-time conversion process. Hence, this thesis presents the design of a linear VTC for a high-speed time-based ADC in 28 nm CMOS process. The proposed VTC consists of a sample-and-hold (S/H) circuit, a ramp generator and a comparator to perform the conversion of the input signal from the voltage to the time domain. Larger linearity is attained by integrating a constant current (with high output impedance) over a capacitor, generating a linear ramp. The VTC operates at 256 MSPS consuming 1.3 mW from 1 V supply with a full-scale 1 V pk-pk differential input signal, while achieving a time-domain output signal with a spurious-free-dynamic-range (SFDR) of 77 dB and a signal-to-noise-and-distortion ratio (SNDR) of 56 dB at close to Nyquist frequency (f = 126.5 MHz). The proposed VTC attains an output range of 2.7 ns, which is the highest linear output range for a VTC at this speed, published to date

Oversampled ADC based on pulse frequency modulator and TDC

Oversaw led converters based on voltage controlled ring oscillators are an attractive solution because of their digital implementation and simplicity. However, the voltage-to-frequency conversion of ring oscillators displays a poor linearity. Replacing the ring oscillator by a pulse frequency modulator (PFM) that provides improved linearity at the expense of feedback and analogue amplification is proposed. Compared to the equivalent continuous time sigma delta modulators, the PFM may be more tolerant to circuit impairments. In addition, the output data of the proposed architecture is a multibit sequence through the use of a time-to-digital converter TDC instead of a Flash quantiser or a multibit digital-to-analogue converter. A high dynamic range can be achieved without severe constraints on analogue mismatch or clock jitter

Analog-to-digital converter circuit and system design to improve with CMOS scaling

textThere is a need to rethink the design of analog/mixed-signal circuits to be viable in state-of-the-art nanometer-scale CMOS processes due to the hostile environment they create for analog circuits. Reduced supply voltages and smaller capacitances are beneficial to circuit speed and digital circuit power efficiency; however, these changes along with smaller dimensions and close coupling of fast-switching digital circuits have made high-accuracy voltage domain analog processing increasingly difficult. In this work, techniques to improve analog-to-digital converters (ADC) for nanometer-scale processes are explored. First, I propose a mostly-digital time-based oversampling delta-sigma (∆Σ) ADC architecture. This system uses time, rather than voltage, as the analog variable for its quantizer, where the noise shaping process is realized by modulating the width of a variable-width digital "pulse." The merits of this architecture render it not only viable to scaling, but also enable improved circuit performance with ever-increasing time resolution of scaled CMOS processes. This is in contrast to traditional voltage-based analog circuit design, whose performance generally decreases with scaling due to increasingly higher voltage uncertainty due to supply voltage reduction and short-channel effects. In conjunction with Dr. Woo Young Jung while he was a Ph.D. student at The University of Texas at Austin, two prototype implementations of the proposed architecture were designed and fabricated in TSMC 180 nm CMOS and IBM 45 nm Silicon-On-Insulator (SOI) processes. The prototype ADCs demonstrate that the architecture can achieve bandwidths of 5-20 MHz and ∼50 dB SNR with very small area. The first generation ADC core occupies an area of only 0.0275 mm² , while the second generation ADC core occupies 0.0192 mm² . The two prototypes can be categorized as some of the smallestarea modulators in the literature. Second, I analyze the measured results of the prototype ADC chips, and determine the source for the harmonic distortion. I then demonstrate a digital calibration algorithm that sufficiently mitigates the distortion. This calibration approach falls in the general philosophy of digitally-assisted analog systems. In this philosophy, digital calibration and post-correction are favored over traditional analog solutions, in which there is a high cost to the analog solution either in complexity, power, or area.Electrical and Computer Engineerin

Front-ends para LiDAR baseados em ADC e TDC

Autonomous vehicles are a promising technology to save over a million lives each year that are lost in road accidents. However, bringing safe autonomous vehicles to market requires massive development, starting with vision sensors. LiDAR is a fundamental vision sensor for autonomous vehicles, as it enables high resolution 3D vision. However, automotive LiDAR is not yet a mature technology, and, also requires massive development in many aspects. This thesis aims to contribute to the maturity of LiDAR, focusing on sampling architectures for LiDAR front-ends. Two architectures were developed. The first is based on a pipelined ADC, available from an AD-FMCDAQ2-EBZ board. The ADC is synchronized with the emitted pulse and able to sample at 1 Gsample/s. The second architecture is based on a TDC that is directly implemented in an FPGA. It relies on a tapped delay line topology comprising 45 delay elements and on a mux-based decoder, resulting in a resolution of 50 ps. Preliminary test results show that both implementations operate correctly, and are both suitable for sampling short pulses typically used by LiDARs. When comparing both architectures, we conclude that an ADC consumes a significant amount of power, and uses many FPGA resources. However, it samples the LiDAR waveform without any loss of information, therefore enabling maximum range and precision. The TDC is just the opposite: it consumes little power, and uses less FPGA resources. However, it only captures one sample per pulse.Os veículos autónomos são uma tecnologia promissora para salvar mais de um milhão de vidas por ano, colhidas por acidentes rodoviários. Contudo, colocar veículos autónomos seguros no mercado requer inúmeros desenvolvimentos, a começar por sensores de visão. O LiDAR é um sensor de visão fundamental para veículos autónomos, pois permite uma visão 3D de alta resolução. Contudo, o LiDAR automotivo não é uma tecnologia madura, e portanto requer também desenvolvimento em vários aspectos. Esta dissertação visa contribuir para a maturidade do LiDAR, com foco em arquiteturas de amostragem para front-ends de LiDAR. Foram desenvolvidas duas arquiteturas. A primeira assenta numa ADC pipelined, por sua vez implementada numa placa de teste AD-FMCDAQ2-EBZ. A ADC opera em sincronismo com o pulso emitido, e permite capturar amostras a 1 Gsample/s. A segunda arquitetura assenta num TDC implementado diretamente numa FPGA. O TDC baseia-se numa topologia tapped delay line com 45 linhas de atraso, e num descodificador à base de multiplexers, permitindo uma resolução temporal de 50 ps. Resultados preliminares mostram que ambas as implementações operam corretamente, e são adequadas para amostrar pulsos curtos tipicamente associados a LiDAR. Em termos comparativos, a arquitectura com base numa ADC tem um consumo de potência considerável e requer uma quantidade significativa de recursos da FPGA. Contudo, esta permite amostrar a forma de onda de LiDAR sem nenhuma perda de informação, permitindo assim alcance e precisão máximos. A arquitectura com base num TDC é exatamente o oposto: tem um baixo consumo de potência e requer poucos recursos da FPGA. Contudo, permite capturar apenas uma amostra por pulso.Mestrado em Engenharia Eletrónica e Telecomunicaçõe

Power efficient analog-to-digital converters using both voltage and time domain information

As advanced wired and wireless communication systems attempt to achieve higher performance, the demand for high resolution and wide signal bandwidth in their associated ADCs is strongly increased. Recently, time-domain quantization has drawn attention from its scalability in deep submicron CMOS processes. Furthermore, there are several interesting aspects of time-domain quantizer by processing the signal in time rather than only in voltage domain especially for power efficiency. This research focuses on developing a new architecture for power efficient, high resolution ADCs using both voltage and time domain information. As a first approach, a new ΔƩ ADC based on a noise-shaped two-step integrating quantizer which quantizes the signal in voltage and time domains is presented. Attaining an extra order of noise-shaping from the integrating quantizer, the proposed ΔƩ ADC manifests a second-order noise-shaping with a first-order loop filter. Furthermore, this quantizer provides an 8b uantization in itself, drastically reducing the oversampling requirement. The proposed ADC also incorporates a new feedback DAC topology that alleviates the feedback DAC complexity of a two-step 8b quantizer. The measured results of the prototype ADC implemented in a 0.13μm CMOS demonstrate peak SNDR of 70.7dB (11.5b ENOB) at 8.1mW power, with an 8x OSR at 80MHz sampling frequency. To further improve ADC performance, a Nyquist ADC based on a time-based pipelined TDC is also proposed as a second approach. In this work, a simple V-T conversion scheme with a cheap low gain amplifier in its first stage and a hybrid time-domain quantization stage based on simple charge pump and capacitive DAC in its backend stages, are also proposed to improve ADC linearity and power efficiency. Using voltage and time domain information, the proposed ADC architecture is beneficial for both resolution and power efficiency, with MSBs resolved in voltage domain and LSBs in time domain. The measured results of the prototype ADC implemented in a 0.13μm CMOS demonstrate peak SNDR of 69.3dB (11.2b ENOB) at 6.38mW power and 70MHz sampling frequency. The FOM is 38.2fJ/conversion-step

Architectural Alternatives to Implement High-Performance Delta-Sigma Modulators

RÉSUMÉ Le besoin d’appareils portatifs, de téléphones intelligents et de systèmes microélectroniques implantables médicaux s’accroît remarquablement. Cependant, l’optimisation de l’alimentation de tous ces appareils électroniques portables est l’un des principaux défis en raison du manque de piles à grande capacité utilisées pour les alimenter. C’est un fait bien établi que le convertisseur analogique-numérique (CAN) est l’un des blocs les plus critiques de ces appareils et qu’il doit convertir efficacement les signaux analogiques au monde numérique pour effectuer un post-traitement tel que l’extraction de caractéristiques. Parmi les différents types de CAN, les modulateurs Delta Sigma (��M) ont été utilisés dans ces appareils en raison des fonctionnalités alléchantes qu’ils offrent. En raison du suréchantillonnage et pour éloigner le bruit de la bande d’intérêt, un CAN haute résolution peut être obtenu avec les architectures ��. Il offre également un compromis entre la fréquence d’échantillonnage et la résolution, tout en offrant une architecture programmable pour réaliser un CAN flexible. Ces CAN peuvent être implémentés avec des blocs analogiques de faible précision. De plus, ils peuvent être efficacement optimisés au niveau de l’architecture et circuits correspondants. Cette dernière caractéristique a été une motivation pour proposer différentes architectures au fil des ans. Cette thèse contribue à ce sujet en explorant de nouvelles architectures pour optimiser la structure ��M en termes de résolution, de consommation d’énergie et de surface de silicium. Des soucis particuliers doivent également être pris en compte pour faciliter la mise en œuvre du ��M. D’autre part, les nouveaux procédés CMOS de conception et fabrication apportent des améliorations remarquables en termes de vitesse, de taille et de consommation d’énergie lors de la mise en œuvre de circuits numériques. Une telle mise à l’échelle agressive des procédés, rend la conception de blocs analogiques tel que un amplificateur de transconductance opérationnel (OTA), difficile. Par conséquent, des soins spéciaux sont également pris en compte dans cette thèse pour surmonter les problèmes énumérés. Ayant mentionné ci-dessus que cette thèse est principalement composée de deux parties principales. La première concerne les nouvelles architectures implémentées en mode de tension et la seconde partie contient une nouvelle architecture réalisée en mode hybride tension et temps.----------ABSTRACT The need for hand-held devices, smart-phones and medical implantable microelectronic sys-tems, is remarkably growing up. However, keeping all these electronic devices power optimized is one of the main challenges due to the lack of long life-time batteries utilized to power them up. It is a well-established fact that analog-to-digital converter (ADC) is one of the most critical building blocks of such devices and it needs to efficiently convert analog signals to the digital world to perform post processing such as channelizing, feature extraction, etc. Among various type of ADCs, Delta Sigma Modulators (��Ms) have been widely used in those devices due to the tempting features they offer. In fact, due to oversampling and noise-shaping technique a high-resolution ADC can be achieved with �� architectures. It also offers a compromise between sampling frequency and resolution while providing a highly-programmable approach to realize an ADC. Moreover, such ADCs can be implemented with low-precision analog blocks. Last but not the least, they are capable of being effectively power optimized at both architectural and circuit levels. The latter has been a motivation to proposed different architectures over the years.This thesis contributes to this topic by exploring new architectures to effectively optimize the ��M structure in terms of resolution, power consumption and chip area. Special cares must also be taken into account to ease the implementation of the ��M. On the other hand, advanced node CMOS processes bring remarkable improvements in terms of speed, size and power consumption while implementing digital circuits. Such an aggressive process scaling, however, make the design of analog blocks, e.g. operational transconductance amplifiers (OTAs), cumbersome. Therefore, special cares are also taken into account in this thesis to overcome the mentioned issues. Having had above mentioned discussion, this thesis is mainly split in two main categories. First category addresses new architectures implemented in a pure voltage domain and the second category contains new architecture realized in a hybrid voltage and time domain. In doing so, the thesis first focuses on a switched-capacitor implementation of a ��M while presenting an architectural solution to overcome the limitations of the previous approaches. This limitations include a power hungry adder in a conventional feed-forward topology as well as power hungry OTAs

Aika-digitaalimuunnin laajakaistaisiin aikapohjaisiin analogia-digitaalimuuntimiin

Modern deeply scaled semiconductor processes make the design of voltage-domain circuits increasingly challenging. On the contrary, the area and power consumption of digital circuits are improving with every new process node. Consequently, digital solutions are designed in place of their purely analog counterparts in applications such as analog-to-digital (A/D) conversion. Time-based analog-to-digital converters (ADC) employ digital-intensive architectures by processing analog quantities in time-domain. The quantization step of the time-based A/D-conversion is carried out by a time-to-digital converter (TDC). A free-running ring oscillator -based TDC design is presented for use in wideband time-based ADCs. The proposed architecture aims to maximize time resolution and full-scale range, and to achieve error resilient conversion performance with minimized power and area consumptions. The time resolution is maximized by employing a high-frequency multipath ring oscillator, and the full-scale range is extended using a high-speed gray counter. The error resilience is achieved by custom sense-amplifier -based sampling flip-flops, gray coded counter and a digital error correction algorithm for counter sampling error correction. The implemented design achieves up to 9-bit effective resolution at 250 MS/s with 4.3 milliwatt power consumption.Modernien puolijohdeteknologioiden skaalautumisen seurauksena jännitetason piirien suunnittelu tulee entistä haasteellisemmaksi. Toisaalta digitaalisten piirirakenteiden pinta-ala sekä tehonkulutus pienenevät prosessikehityksen myötä. Tästä syystä digitaalisia ratkaisuja suunnitellaan vastaavien puhtaasti analogisien rakenteiden tilalle. Analogia-digitaalimuunnos (A/D-muunnos) voidaan toteuttaa jännitetason sijaan aikatasossa käyttämällä aikapohjaisia A/D-muuntimia, jotka ovat rakenteeltaan pääosin digitaalisia. Kvantisointivaihe aikapohjaisessa A/D-muuntimessa toteutetaan aika-digitaalimuuntimella. Työ esittelee vapaasti oskilloivaan silmukkaoskillaattoriin perustuvan aika-digitaalimuuntimen, joka on suunniteltu käytettäväksi laajakaistaisessa aikapohjaisessa A/D-muuntimessa. Esitelty rakenne pyrkii maksimoimaan muuntimen aikaresoluution sekä muunnosalueen, sekä saavuttamaan virhesietoisen muunnostoiminnan minimoidulla tehon sekä pinta-alan kulutuksella. Aikaresoluutio on maksimoitu hyödyntämällä suuritaajuista monipolkuista silmukkaoskillaattoria, ja muunnosalue on maksimoitu nopealla Gray-koodi -laskuripiirillä. Muunnosprosessin virhesietoisuus on saavutettu toteuttamalla näytteistys herkillä kiikkuelementeillä, hyödyntämällä Gray-koodattua laskuria, sekä jälkiprosessoimalla laskurin näytteistetyt arvot virheenkorjausalgoritmilla. Esitelty muunnintoteutus saavuttaa 9 bitin efektiivisen resoluution 250 MS/s näytetaajuudella ja 4.3 milliwatin tehonkulutuksella

Time-based noise-shaping techniques for time-to-digital and analog-to-digital converters

In this dissertation, time-based signal processing techniques and their applications in oversampling and noise-shaping data converters are examined. These techniques demonstrate the ability to shift the burden of high performance analog circuits from the compressed voltage-domain to the augmented time-domain. First, the potential of high order noise-shaping and phase-domain feedback in time-to-digital converters (TDCs) is explored. A prototype phase reference, second-order continuous-time delta-sigma TDC for sensor applications was fabricated in 90nm CMOS and achieves 64 dB dynamic range in 1MHz signal bandwidth. Second, an ultra-high performance oscillator-based delta-sigma modulator architecture is investigated. The proposed circuit is a third-order continuous-time PLL-Based Delta-Sigma Modulator with simulated 77 dB SNDR in 40MHz signal bandwidth with OSR of 16, and is fabricated in 65nm CMOS

Low power VCO-based analog-to-digital conversion

textThis dissertation presents novel two stage ADC architecture with a VCO based second stage. With the scaling of the supply voltages in modern CMOS process it is difficult to design high gain operational amplifiers needed for traditional voltage domain two-stage analog to digital converters. However time resolution continues to improve with the advancement in CMOS technology making VCO-based ADC more attractive. The nonlinearity in voltage-to-frequency transfer function is the biggest challenge in design of VCO based ADC. The hybrid approach used in this work uses a voltage domain first stage to determine the most significant bits and uses a VCO based second stage to quantize the small residue obtained from first stage. The architecture relaxes the gain requirement on the the first stage opamp and also relaxes the linearity requirements on the second stage VCO. The prototype ADC built in 65nm CMOS process achieves 63.7dB SNDR in 10MHz bandwidth while only consuming 1.1mW of power. The performance of the prototype chip is comparable to the state-of-art in terms of figure-of-merit but this new architecture uses significantly less circuit area.Electrical and Computer Engineerin