Methodology for testing high-performance data converters using low-accuracy instruments

There has been explosive growth in the consumer electronics market during the last decade. As the IC industry is shifting from PC-centric to consumer electronics-centric, digital technologies are no longer solving all the problems. Electronic devices integrating mixed-signal, RF and other non-purely digital functions are becoming new challenges to the industry. When digital testing has been studied for long time, testing of analog and mixed-signal circuits is still in its development stage. Existing solutions have two major problems. First, high-performance mixed-signal test equipments are expensive and it is difficult to integrate their functions on chip. Second, it is challenging to improve the test capability of existing methods to keep up with the fast-evolving performance of mixed-signal products demanded on the market. The International Technology Roadmap for Semiconductors identified mixed-signal testing as one of the most daunting system-on-a-chip challenges;My works have been focused on developing new strategies for testing the analog-to-digital converter (ADC) and digital-to-analog converter (DAC). Different from conventional methods that require test instruments to have better performance than the device under test, our algorithms allow the use of medium and low-accuracy instruments in testing. Therefore, we can provide practical and accurate test solutions for high-performance data converters. Meanwhile, the test cost is dramatically reduced because of the low price of such test instruments. These algorithms have the potential for built-in self-test and can be generalized to other mixed-signal circuitries. When incorporated with self-calibration, these algorithms can enable new design techniques for mixed-signal integrated circuits. Following contents are covered in the dissertation:;(1) A general stimulus error identification and removal (SEIR) algorithm that can test high-resolution ADCs using two low-linearity signals with a constant offset in between; (2) A center-symmetric interleaving (CSI) strategy for generating test signals to be used with the SEIR algorithm; (3) An architecture-based test algorithm for high-performance pipelined or cyclic ADCs using a single nonlinear stimulus; (4) Using Kalman Filter to improve the efficiency of ADC testing; and (5) A testing algorithm for high-speed high-resolution DACs using low-resolution ADCs with dithering

Accurate and robust spectral testing with relaxed instrumentation requirements

Spectral testing has been widely used to characterize the dynamic performances of the electrical signals and devices, such as Analog-to-Digital Converters (ADCs) for many decades. One of the difficulties faced is to accurately and cost-effectively test the continually higher performance devices. Standard test methods can be difficult to implement accurately and cost effectively, due to stringent requirements. To relax these necessary conditions and to reduce test costs, while achieving accurate spectral test results, several new algorithms are developed to perform accurate spectral and linearity test without requiring precise, expensive instruments. In this dissertation, three classes of methods for overcoming the above difficulties are presented. The first class of methods targeted the accurate, single-tone spectral testing. The first method targets the non-coherent sampling issue on spectral testing, especially when the non-coherently sampled signal has large distortions. The second method resolves simultaneous amplitude and frequency drift with non-coherent sampling. The third method achieves accurate linearity results for DAC-ADC co-testing, and generates high-purity sine wave using the nonlinear DAC in the system via pre-distortion. The fourth method targets ultra-pure sine wave generation with two nonlinear DACs, two simple filters, and a nonlinear ADC. These proposed methods are validated by both simulation and measurement results, and have demonstrated their high accuracy and robustness against various test conditions. The second class of methods deals with the accurate multi-tone spectral testing. The first method in this class resolves the non-coherent sampling issue in multi-tone spectral testing. The second method in this class introduces another proposed method to deal with multi-tone impure sources in spectral testing. The third method generates the multi-tone sine wave with minimum peak-to-average power ratio, which can be implemented in many applications, such as spectral testing and signal analysis. Similarly, simulation and measurement results validate the functionality and robustness of these proposed methods. Finally, the third class introduces two proposed methods to accurately test linearity characteristics of high-performance ADCs using low purity sinusoidal or ramp stimulus in the presence of flicker noise. Extensive simulation results have verified their effectiveness to reduce flicker noise influence and achieve accurate linearity results

Precise linear signal generation with nonideal components and deterministic dynamic element matching

A dynamic element matching (DEM) approach to ADC testing is introduced. Two variants of this method are introduced and compared; a deterministic DEM method and a random DEM method. With both variants, a highly non-ideal DAC is used to generate an excitation for a DUT that has effective linearity that far exceeds that of the DAC. Simulation results show that both methods can be used for testing of ADCs. The deterministic DEM (DDEM) offers potential for a substantial reduction in the number of samples when compared with a random DEM approach with the same measurement accuracy. It is shown that the concept of usinf DEM for signal generation in a test environment finds applications well-beyond ADC testing. The DDEM approach offers potential for use in both production test and BIST environments

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Evaluation of selected strapdown inertial instruments and pulse torque loops, volume 1

Design, operational and performance variations between ternary, binary and forced-binary pulse torque loops are presented. A fill-in binary loop which combines the constant power advantage of binary with the low sampling error of ternary is also discussed. The effects of different output-axis supports on the performance of a single-degree-of-freedom, floated gyroscope under a strapdown environment are illustrated. Three types of output-axis supports are discussed: pivot-dithered jewel, ball bearing and electromagnetic. A test evaluation on a Kearfott 2544 single-degree-of-freedom, strapdown gyroscope operating with a pulse torque loop, under constant rates and angular oscillatory inputs is described and the results presented. Contributions of the gyroscope's torque generator and the torque-to-balance electronics on scale factor variation with rate are illustrated for a SDF 18 IRIG Mod-B strapdown gyroscope operating with various pulse rebalance loops. Also discussed are methods of reducing this scale factor variation with rate by adjusting the tuning network which shunts the torque coil. A simplified analysis illustrating the principles of operation of the Teledyne two-degree-of-freedom, elastically-supported, tuned gyroscope and the results of a static and constant rate test evaluation of that instrument are presented

Signal acquisition challenges in mobile systems

In recent decades, the advent of mobile computing has changed human lives by providing information that was not available in the past. The mobile computing platform opens a new door to the connected world in which various forms of hand-held and wearable systems are ubiquitous. A single mobile device plays multiple roles and shapes human lives towards a better future. In these systems, sensor-based data acquisition plays an essential role in generating and providing useful information. The increased number of sensors is embedded in a single device in order to process various signal modalities. In practice, more than 30 data converters are required in designing a mobile system in which the data-converting blocks become among the most power-hungry components in battery-operated systems. Due to the increased variety of sensors, mobile systems are meant to face several obstacles. For example, the increased number of sensors increase system power consumption during the system operation. The increased power consumption directly affects operation time because mobile systems are powered by a limited energy source. Moreover, an increased amount of information also gives rise to bandwidth problems in communication due to the increased volume of data transmission. Also, this system design requires a larger area in a silicon die so that multiple signal paths can be placed without cross-channel interference. Therefore, the system design has presented a challenge in terms of trying to resolve the design constraints such as power consumption, bandwidth usage, storage space, and design complexity issues. To overcome these obstacles, in this dissertation, efficient data acquisition and processing methods are investigated. Specifically, this thesis considers the problems of energy-efficient sampling and binary event detection. This dissertation begins by presenting a new signal sampling scheme that enables higher precision signal conversion in compressed-sensing-based signal acquisition. The proposed scheme is based on the popular successive approximation register and employs a modified compressive sensing technique to increase the resolution of successive-approximation-register (SAR) analog-to-digital converter (ADC) architecture. Circuit-level architecture is discussed to implement the proposed scheme using the SAR ADC architecture. A non-uniform quantization scheme is proposed and it improves data quality after data acquisition. The proposed scheme is expected to be used for medium- or high- frequency data conversion. Secondly, the possibility of using fewer ADCs than channels is studied by leveraging sparse-signal representation and blind-source-separation (BSS) techniques. In particular, this dissertation examines the problem of using a single ADC or quantizer system for digitizing multi-channel inputs. Mixing and de-mixing strategies are extensively studied for sampling frequency-sparse signals and the proposed multi-channel architecture can be easily implemented using today's analog/mixed-signal circuits. The third part of this dissertation investigates a binary hypothesis testing problem. In mobile devices such as smartphones and tablet PCs, a major portion of energy is consumed in user interfaces (LCD display and touch input processing). For accurate detection and better user interface, energy-efficient sensing and detection schemes are necessary to manage multiple sensor inputs. A highly efficient detection scheme is presented that can detect binary events reliably with a fraction of the energy consumption required in the conventional energy detection.Electrical and Computer Engineerin

Alternative Methods for Non-Linearity Estimation in High-Resolution Analog-to-Digital Converters

The evaluation of the linearity performance of a high resolution Analog-to- Digital Converter (ADC) by the Standard Histogram method is an outstanding challenge due to the requirement of high purity of the input signal and the high number of output data that must be acquired to obtain an acceptable accuracy on the estimation. These requirements become major application drawbacks when the measures have to be performed multiple times within long test flows and for many parts, and under an industrial environment that seeks to reduce costs and lead times as is the case in the New Space sector. This thesis introduces two alternative methods that succeed in relaxing the two previous requirements for the estimation of the Integral Nonlinearity (INL) parameter in ADCs. The methods have been evaluated by estimating the Integral Non-Linearity pattern by simulation using realistic high-resolution ADC models and experimentally by applying them to real high performance ADCs. First, the challenge of applying the Standard Histogram method for the evaluation of static parameters in high resolution ADCs and how the drawbacks are accentuated in the New Space industry is analysed, being a highly expensive method for an industrial environment where cost and lead time reduction is demanded. Several alternative methods to the Standard Histogram for estimating Integral Nonlinearity in high resolution ADCs are reviewed and studied. As the number of existing works in the literature is very large and addressing all of them is a challenge in itself, only those most relevant to the development of this thesis have been included. Methods based on spectral processing to reduce the number of data acquired for the linearity test and methods based on a double histogram to be able to use generators that do not meet the the purity requirement against the ADC to be tested are further analysed. Two novel contributions are presented in this work for the estimation of the Integral Nonlinearity in ADCs, as possible alternatives to the Standard Histogram method. The first method, referred to as SSA (Simple Spectral Approach), seeks to reduce the number of output data that need to be acquired and focuses on INL estimation using an algorithm based on processing the spectrum of the output signal when a sinusoidal input stimulus is used. This type of approach requires a much smaller number of samples than the Standard Histogram method, although the estimation accuracy will depend on how smooth or abrupt the ADC nonlinearity pattern is. In general, this algorithm cannot be used to perform a calibration of the ADC nonlinearity error, but it can be applied to find out between which limits it lies and what its approximate shape is. The second method, named SDH (Simplified Double Histogram)aims to estimate the Non-Linearity of the ADC using a poor linearity generator. The approach uses two histograms constructed from the two set of output data in response to two identical input signals except for a dc offset between them. Using a simple adder model, an extended approach named ESDH (Extended Simplified Double Histogram) addresses and corrects for possible time drifts during the two data acquisitions, so that it can be successfully applied in a non-stationary test environment. According to the experimental results obtained, the proposed algorithm achieves high estimation accuracy. Both contributions have been successfully tested in high-resolution ADCs with both simulated and real laboratory experiments, the latter using a commercial ADC with 14-bit resolution and 65Msps sampling rate (AD6644 from Analog Devices).La medida de la característica de linealidad de un convertidor analógicodigital (ADC) de alta resolución mediante el método estándar del Histograma constituye un gran desafío debido los requisitos de alta pureza de la señal de entrada y del elevado número de datos de salida que deben adquirirse para obtener una precisión aceptable en la estimación. Estos requisitos encuentran importantes inconvenientes para su aplicación cuando las medidas deben realizarse dentro de largos flujos de pruebas, múltiples veces y en un gran número de piezas, y todo bajo un entorno industrial que busca reducir costes y plazos de entrega como es el caso del sector del Nuevo Espacio. Esta tesis introduce dos métodos alternativos que consiguen relajar los dos requisitos anteriores para la estimación de los parámetros de no linealidad en los ADCs. Los métodos se han evaluado estimando el patrón de No Linealidad Integral (INL) mediante simulación utilizando modelos realistas de ADC de alta resolución y experimentalmente aplicándolos en ADCs reales. Inicialmente se analiza el reto que supone la aplicación del método estándar del Histograma para la evaluación de los parámetros estáticos en ADCs de alta resolución y cómo sus inconvenientes se acentúan en la industria del Nuevo Espacio, siendo un método altamente costoso para un entorno industrial donde se exige la reducción de costes y plazos de entrega. Se estudian métodos alternativos al Histograma estándar para la estimación de la No Linealidad Integral en ADCs de alta resolución. Como el número de trabajos es muy amplio y abordarlos todos es ya en sí un desafío, se han incluido aquellos más relevantes para el desarrollo de esta tesis. Se analizan especialmente los métodos basados en el procesamiento espectral para reducir el número de datos que necesitan ser adquiridos y los métodos basados en un doble histograma para poder utilizar generadores que no cumplen el requisito de precisión frente al ADC a medir. En este trabajo se presentan dos novedosas aportaciones para la estimación de la No Linealidad Integral en ADCs, como posibles alternativas al método estándar del Histograma. El primer método, denominado SSA (Simple Spectral Approach), busca reducir el número de datos de salida que es necesario adquirir y se centra en la estimación de la INL mediante un algoritmo basado en el procesamiento del espectro de la señal de salida cuando se utiliza un estímulo de entrada sinusoidal. Este tipo de enfoque requiere un número mucho menor de muestras que el método estándar del Histograma, aunque la precisión de la estimación dependerá de lo suave o abrupto que sea el patrón de no-linealidad del ADC a medir. En general, este algoritmo no puede utilizarse para realizar una calibración del error de no linealidad del ADC, pero puede aplicarse para averiguar entre qué límites se encuentra y cuál es su forma aproximada. El segundo método, denominado SDH (Simplified Double Histogram) tiene como objetivo estimar la no linealidad del ADC utilizando un generador de baja pureza. El algoritmo utiliza dos histogramas, construidos a partir de dos conjuntos de datos de salida en respuesta a dos señales de entrada idénticas, excepto por un desplazamiento constante entre ellas. Utilizando un modelo simple de sumador, un enfoque ampliado denominado ESDH (Extended Simplified Double Histogram) aborda y corrige las posibles derivas temporales durante las dos adquisiciones de datos, de modo que puede aplicarse con éxito en un entorno de prueba no estacionario. De acuerdo con los resultados experimentales obtenidos, el algoritmo propuesto alcanza una alta precisión de estimación. Ambas contribuciones han sido probadas en ADCs de alta resolución con experimentos tanto simulados como reales en laboratorio, estos últimos utilizando un ADC comercial con una resolución de 14 bits y una tasa de muestreo de 65Msps (AD6644 de Analog Devices)

Applied high resolution digital control for universal precision systems

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2008.Includes bibliographical references (p. 223-225).This thesis describes the design and characterization of a high-resolution analog interface for dSPACE digital control systems and a high-resolution, high-speed data acquisition and control system. These designs are intended to enable higher precision digital control than currently available. The dSPACE system was previously designed within the PMC Lab and includes higher resolution A/D and D/A interfaces than natively available. Characterization on the custom A/D channel demonstrates 20.1 effective bits, or a 121 dB dynamic range, and the custom D/A channel demonstrates 15.1 effective bits, or a 91 dB dynamic range. This compares to a 15.7 effective bits on the A/D dSPACE channel and 12.3 effective bits on the D/A dSPACE channel. The increased resolution is attained by higher performance hardware and oversampling and averaging the A/D channel. The sampling rate is limited to 8 kHz. The high-resolution, high-speed data acquisition and control system can sample two A/D channels at 2.5 MHz and display/save an acquired one second burst. The A/D channel is characterized at 109 dB dynamic range with a grounded input and 96 dB dynamic range, or 0.74 nm RMS over a 50 [mu]m range, with a fixtured capacitive probe. Acquisition at 2.5 MHz and closed-loop control at 625 kHz sampling rate is implemented on a National Instruments FPGA. The A/D circuit was designed and built on a custom printed circuit board around the commercially available AD7760 sigma-delta converter from Analog Devices and includes fully differential ±10 V inputs, a dedicated microcontroller to provide an initialization sequence, and digital galvanic isolation. LabVIEW FPGA code demonstrates arbitrary transfer function control implementation.(cont.) The digital platform is applied to a 1-DOF positioner to demonstrate 0.10 nm RMS control over a 10 [mu]m mechanical range when filtered to the 1.5 kHz closed-loop bandwidth, which is limited by the A/D converter architecture propagation delay.by Aaron John Gawlik.S.M