The walking robot project

A walking robot was designed, analyzed, and tested as an intelligent, mobile, and a terrain adaptive system. The robot's design was an application of existing technologies. The design of the six legs modified and combines well understood mechanisms and was optimized for performance, flexibility, and simplicity. The body design incorporated two tripods for walking stability and ease of turning. The electrical hardware design used modularity and distributed processing to drive the motors. The software design used feedback to coordinate the system and simple keystrokes to give commands. The walking machine can be easily adapted to hostile environments such as high radiation zones and alien terrain. The primary goal of the leg design was to create a leg capable of supporting a robot's body and electrical hardware while walking or performing desired tasks, namely those required for planetary exploration. The leg designers intent was to study the maximum amount of flexibility and maneuverability achievable by the simplest and lightest leg design. The main constraints for the leg design were leg kinematics, ease of assembly, degrees of freedom, number of motors, overall size, and weight

Infrastructures and Algorithms for Testable and Dependable Systems-on-a-Chip

Every new node of semiconductor technologies provides further miniaturization and higher performances, increasing the number of advanced functions that electronic products can offer. Silicon area is now so cheap that industries can integrate in a single chip usually referred to as System-on-Chip (SoC), all the components and functions that historically were placed on a hardware board. Although adding such advanced functionality can benefit users, the manufacturing process is becoming finer and denser, making chips more susceptible to defects. Today’s very deep-submicron semiconductor technologies (0.13 micron and below) have reached susceptibility levels that put conventional semiconductor manufacturing at an impasse. Being able to rapidly develop, manufacture, test, diagnose and verify such complex new chips and products is crucial for the continued success of our economy at-large. This trend is expected to continue at least for the next ten years making possible the design and production of 100 million transistor chips. To speed up the research, the National Technology Roadmap for Semiconductors identified in 1997 a number of major hurdles to be overcome. Some of these hurdles are related to test and dependability. Test is one of the most critical tasks in the semiconductor production process where Integrated Circuits (ICs) are tested several times starting from the wafer probing to the end of production test. Test is not only necessary to assure fault free devices but it also plays a key role in analyzing defects in the manufacturing process. This last point has high relevance since increasing time-to-market pressure on semiconductor fabrication often forces foundries to start volume production on a given semiconductor technology node before reaching the defect densities, and hence yield levels, traditionally obtained at that stage. The feedback derived from test is the only way to analyze and isolate many of the defects in today’s processes and to increase process’s yield. With the increasing need of high quality electronic products, at each new physical assembly level, such as board and system assembly, test is used for debugging, diagnosing and repairing the sub-assemblies in their new environment. Similarly, the increasing reliability, availability and serviceability requirements, lead the users of high-end products performing periodic tests in the field throughout the full life cycle. To allow advancements in each one of the above scaling trends, fundamental changes are expected to emerge in different Integrated Circuits (ICs) realization disciplines such as IC design, packaging and silicon process. These changes have a direct impact on test methods, tools and equipment. Conventional test equipment and methodologies will be inadequate to assure high quality levels. On chip specialized block dedicated to test, usually referred to as Infrastructure IP (Intellectual Property), need to be developed and included in the new complex designs to assure that new chips will be adequately tested, diagnosed, measured, debugged and even sometimes repaired. In this thesis, some of the scaling trends in designing new complex SoCs will be analyzed one at a time, observing their implications on test and identifying the key hurdles/challenges to be addressed. The goal of the remaining of the thesis is the presentation of possible solutions. It is not sufficient to address just one of the challenges; all must be met at the same time to fulfill the market requirements

Machine Learning Algorithms for Robotic Navigation and Perception and Embedded Implementation Techniques

L'abstract è presente nell'allegato / the abstract is in the attachmen

Low-overhead fault-tolerant logic for field-programmable gate arrays

While allowing for the fabrication of increasingly complex and efficient circuitry, transistor shrinkage and count-per-device expansion have major downsides: chiefly increased variation, degradation and fault susceptibility. For this reason, design-time consideration of faults will have to be given to increasing numbers of electronic systems in the future to ensure yields, reliabilities and lifetimes remain acceptably high. Many mathematical operators commonly accelerated in hardware are suited to modification resulting in datapath error detection and correction capabilities with far lower area, performance and/or power consumption overheads than those incurred through the utilisation of more established, general-purpose fault tolerance methods such as modular redundancy. Field-programmable gate arrays are uniquely placed to allow further area savings to be made thanks to their dynamic reconfigurability. The majority of the technical work presented within this thesis is based upon a benchmark hardware accelerator---a matrix multiplier---that underwent several evolutions in order to detect and correct faults manifesting along its datapath at runtime. In the first instance, fault detectability in excess of 99% was achieved in return for 7.87% additional area and 45.5% extra latency. In the second, the ability to correct errors caused by those faults was added at the cost of 4.20% more area, while 50.7% of this---and 46.2% of the previously incurred latency overhead---was removed through the introduction of partial reconfiguration in the third. The fourth demonstrates further reductions in both area and performance overheads---of 16.7% and 8.27%, respectively---through systematic data width reduction by allowing errors of less than ±0.5% of the maximum output value to propagate.Open Acces

Cost modelling and concurrent engineering for testable design

This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University.As integrated circuits and printed circuit boards increase in complexity, testing becomes a major cost factor of the design and production of the complex devices. Testability has to be considered during the design of complex electronic systems, and automatic test systems have to be used in order to facilitate the test. This fact is now widely accepted in industry. Both design for testability and the usage of automatic test systems aim at reducing the cost of production testing or, sometimes, making it possible at all. Many design for testability methods and test systems are available which can be configured into a production test strategy, in order to achieve high quality of the final product. The designer has to select from the various options for creating a test strategy, by maximising the quality and minimising the total cost for the electronic system. This thesis presents a methodology for test strategy generation which is based on consideration of the economics during the life cycle of the electronic system. This methodology is a concurrent engineering approach which takes into account all effects of a test strategy on the electronic system during its life cycle by evaluating its related cost. This objective methodology is used in an original test strategy planning advisory system, which allows for test strategy planning for VLSI circuits as well as for digital electronic systems. The cost models which are used for evaluating the economics of test strategies are described in detail and the test strategy planning system is presented. A methodology for making decisions which are based on estimated costing data is presented. Results of using the cost models and the test strategy planning system for evaluating the economics of test strategies for selected industrial designs are presented

Nimbus 6 Random Access Measurement System applications experiments

The advantages of a technique in which data collection platforms randomly transmit signal to a polar orbiting satellite, thus eliminating satellite interrogation are demonstrated in investigations of the atmosphere; oceanographic parameters; Arctic regions and ice conditions; navigation and position location; and data buoy development

Enhancing Real-time Embedded Image Processing Robustness on Reconfigurable Devices for Critical Applications

Nowadays, image processing is increasingly used in several application fields, such as biomedical, aerospace, or automotive. Within these fields, image processing is used to serve both non-critical and critical tasks. As example, in automotive, cameras are becoming key sensors in increasing car safety, driving assistance and driving comfort. They have been employed for infotainment (non-critical), as well as for some driver assistance tasks (critical), such as Forward Collision Avoidance, Intelligent Speed Control, or Pedestrian Detection. The complexity of these algorithms brings a challenge in real-time image processing systems, requiring high computing capacity, usually not available in processors for embedded systems. Hardware acceleration is therefore crucial, and devices such as Field Programmable Gate Arrays (FPGAs) best fit the growing demand of computational capabilities. These devices can assist embedded processors by significantly speeding-up computationally intensive software algorithms. Moreover, critical applications introduce strict requirements not only from the real-time constraints, but also from the device reliability and algorithm robustness points of view. Technology scaling is highlighting reliability problems related to aging phenomena, and to the increasing sensitivity of digital devices to external radiation events that can cause transient or even permanent faults. These faults can lead to wrong information processed or, in the worst case, to a dangerous system failure. In this context, the reconfigurable nature of FPGA devices can be exploited to increase the system reliability and robustness by leveraging Dynamic Partial Reconfiguration features. The research work presented in this thesis focuses on the development of techniques for implementing efficient and robust real-time embedded image processing hardware accelerators and systems for mission-critical applications. Three main challenges have been faced and will be discussed, along with proposed solutions, throughout the thesis: (i) achieving real-time performances, (ii) enhancing algorithm robustness, and (iii) increasing overall system's dependability. In order to ensure real-time performances, efficient FPGA-based hardware accelerators implementing selected image processing algorithms have been developed. Functionalities offered by the target technology, and algorithm's characteristics have been constantly taken into account while designing such accelerators, in order to efficiently tailor algorithm's operations to available hardware resources. On the other hand, the key idea for increasing image processing algorithms' robustness is to introduce self-adaptivity features at algorithm level, in order to maintain constant, or improve, the quality of results for a wide range of input conditions, that are not always fully predictable at design-time (e.g., noise level variations). This has been accomplished by measuring at run-time some characteristics of the input images, and then tuning the algorithm parameters based on such estimations. Dynamic reconfiguration features of modern reconfigurable FPGA have been extensively exploited in order to integrate run-time adaptivity into the designed hardware accelerators. Tools and methodologies have been also developed in order to increase the overall system dependability during reconfiguration processes, thus providing safe run-time adaptation mechanisms. In addition, taking into account the target technology and the environments in which the developed hardware accelerators and systems may be employed, dependability issues have been analyzed, leading to the development of a platform for quickly assessing the reliability and characterizing the behavior of hardware accelerators implemented on reconfigurable FPGAs when they are affected by such faults

Development of electronics for the VELO upgrade detector

Esta tesis cubre el diseño electrónico del detector de vértices (VELO) del experimento LHCb del CERN. El VELO está situado rodeando el punto de colisión de los dos haces de protones del LHC del CERN. Su diseño está lleno de restricciones que requieren diseños novedosos: minimizar la materia cerca del punto de colisión, diseño de componentes que soporten radiación, transmisión de datos a alta tasa y el procesado de los mismos, sincronización del sistema, etc. El trabajo presentado en esta tesis se centra en: por un lado, la validación del hardware y sus diferentes prototipos, por otro lado, el diseño del firmware de las FPGAs encargadas del control, sincronización y adquisición de datos del VELO

Performance and area evaluations of processor-based benchmarks on FPGA devices

The computing system on SoCs is being long-term research since the FPGA technology has emerged due to its personality of re-programmable fabric, reconfigurable computing, and fast development time to market. During the last decade, uni-processor in a SoC is no longer to deal with the high growing market for complex applications such as Mobile Phones audio and video encoding, image and network processing. Due to the number of transistors on a silicon wafer is increasing, the recent FPGAs or embedded systems are advancing toward multi-processor-based design to meet tremendous performance and benefit this kind of systems are possible. Therefore, is an upcoming age of the MPSoC. In addition, most of the embedded processors are soft-cores, because they are flexible and reconfigurable for specific software functions and easy to build homogenous multi-processor systems for parallel programming. Moreover, behavioural synthesis tools are becoming a lot more powerful and enable to create datapath of logic units from high-level algorithms such as C to HDL and available for partitioning a HW/SW concurrent methodology. A range of embedded processors is able to implement on a FPGA-based prototyping to integrate the CPUs on a programmable device. This research is, firstly represent different types of computer architectures in modern embedded processors that are followed in different type of software applications (eg. Multi-threading Operations or Complex Functions) on FPGA-based SoCs; and secondly investigate their capability by executing a wide-range of multimedia software codes (Integer-algometric only) in different models of the processor-systems (uni-processor or multi-processor or Co-design), and finally compare those results in terms of the benchmarks and resource utilizations within FPGAs. All the examined programs were written in standard C and executed in a variety numbers of soft-core processors or hardware units to obtain the execution times. However, the number of processors and their customizable configuration or hardware datapath being generated are limited by a target FPGA resource, and designers need to understand the FPGA-based tradeoffs that have been considered - Speed versus Area. For this experimental purpose, I defined benchmarks into DLP / HLS catalogues, which are "data" and "function" intensive respectively. The programs of DLP will be executed in LEON3 MP and LE1 CMP multi-processor systems and the programs of HLS in the LegUp Co-design system on target FPGAs. In preliminary, the performance of the soft-core processors will be examined by executing all the benchmarks. The whole story of this thesis work centres on the issue of the execute times or the speed-up and area breakdown on FPGA devices in terms of different programs