Accelerated hardware video object segmentation: From foreground detection to connected components labelling

This is the preprint version of the Article - Copyright @ 2010 ElsevierThis paper demonstrates the use of a single-chip FPGA for the segmentation of moving objects in a video sequence. The system maintains highly accurate background models, and integrates the detection of foreground pixels with the labelling of objects using a connected components algorithm. The background models are based on 24-bit RGB values and 8-bit gray scale intensity values. A multimodal background differencing algorithm is presented, using a single FPGA chip and four blocks of RAM. The real-time connected component labelling algorithm, also designed for FPGA implementation, run-length encodes the output of the background subtraction, and performs connected component analysis on this representation. The run-length encoding, together with other parts of the algorithm, is performed in parallel; sequential operations are minimized as the number of run-lengths are typically less than the number of pixels. The two algorithms are pipelined together for maximum efficiency

A graph theoretic approach to scene matching

The ability to match two scenes is a fundamental requirement in a variety of computer vision tasks. A graph theoretic approach to inexact scene matching is presented which is useful in dealing with problems due to imperfect image segmentation. A scene is described by a set of graphs, with nodes representing objects and arcs representing relationships between objects. Each node has a set of values representing the relations between pairs of objects, such as angle, adjacency, or distance. With this method of scene representation, the task in scene matching is to match two sets of graphs. Because of segmentation errors, variations in camera angle, illumination, and other conditions, an exact match between the sets of observed and stored graphs is usually not possible. In the developed approach, the problem is represented as an association graph, in which each node represents a possible mapping of an observed region to a stored object, and each arc represents the compatibility of two mappings. Nodes and arcs have weights indicating the merit or a region-object mapping and the degree of compatibility between two mappings. A match between the two graphs corresponds to a clique, or fully connected subgraph, in the association graph. The task is to find the clique that represents the best match. Fuzzy relaxation is used to update the node weights using the contextual information contained in the arcs and neighboring nodes. This simplifies the evaluation of cliques. A method of handling oversegmentation and undersegmentation problems is also presented. The approach is tested with a set of realistic images which exhibit many types of sementation errors

A survey of kernel and spectral methods for clustering

Clustering algorithms are a useful tool to explore data structures and have been employed in many disciplines. The focus of this paper is the partitioning clustering problem with a special interest in two recent approaches: kernel and spectral methods. The aim of this paper is to present a survey of kernel and spectral clustering methods, two approaches able to produce nonlinear separating hypersurfaces between clusters. The presented kernel clustering methods are the kernel version of many classical clustering algorithms, e.g., K-means, SOM and neural gas. Spectral clustering arise from concepts in spectral graph theory and the clustering problem is configured as a graph cut problem where an appropriate objective function has to be optimized. An explicit proof of the fact that these two paradigms have the same objective is reported since it has been proven that these two seemingly different approaches have the same mathematical foundation. Besides, fuzzy kernel clustering methods are presented as extensions of kernel K-means clustering algorithm. (C) 2007 Pattem Recognition Society. Published by Elsevier Ltd. All rights reserved

A graph-based mathematical morphology reader

This survey paper aims at providing a "literary" anthology of mathematical morphology on graphs. It describes in the English language many ideas stemming from a large number of different papers, hence providing a unified view of an active and diverse field of research

Object recognition using shape-from-shading

This paper investigates whether surface topography information extracted from intensity images using a recently reported shape-from-shading (SFS) algorithm can be used for the purposes of 3D object recognition. We consider how curvature and shape-index information delivered by this algorithm can be used to recognize objects based on their surface topography. We explore two contrasting object recognition strategies. The first of these is based on a low-level attribute summary and uses histograms of curvature and orientation measurements. The second approach is based on the structural arrangement of constant shape-index maximal patches and their associated region attributes. We show that region curvedness and a string ordering of the regions according to size provides recognition accuracy of about 96 percent. By polling various recognition schemes. including a graph matching method. we show that a recognition rate of 98-99 percent is achievable

Grouping Method Of Image Fragments Of Adjacent Dislocation Etch Pits Of The Semiconductor Wafer

An increase in production volumes of gallium arsenide semiconductor devices determines the need for better control of dislocations of semiconductor wafer.The grouping method of image fragments of adjacent dislocation etch pits of the semiconductor wafer is proposed in the article. Adjacent fragments will be allocated in the pre-binarized image of wafer surface, which contains adjacent fragments of etch pits of dislocation loops after treatment by the described method. Improved methods for determining the loop line width determines the edge line width of etch pits of suspected dislocations, given the variability of their display in the binarized image. The current loop line width is compared to the reference line width of the dislocation loop.The grouping method of image fragments of adjacent dislocation etch pits of the semiconductor wafer defines recovery of loop lines branching, takes into account various options of line adjacency and determines the direction of further recovery of loop line of dislocation etch pits. A step by step description of the method is given