A FPGA-Based Reconfigurable Software Architecture for Highly Dependable Systems

Nowadays, systems-on-chip are commonly equipped with reconfigurable hardware. The use of hybrid architectures based on a mixture of general purpose processors and reconfigurable components has gained importance across the scientific community allowing a significant improvement of computational performance. Along with the demand for performance, the great sensitivity of reconfigurable hardware devices to physical defects lead to the request of highly dependable and fault tolerant systems. This paper proposes an FPGA-based reconfigurable software architecture able to abstract the underlying hardware platform giving an homogeneous view of it. The abstraction mechanism is used to implement fault tolerance mechanisms with a minimum impact on the system performanc

High Performance Spacecraft Computing (HPSC) Middleware Update

High Performance Spacecraft Computing (HPSC) is a joint project between the National Aeronautics and Space Administration (NASA) and Air Force Research Lab (AFRL) to develop a high-performance multi-core radiation hardened flight processor. HPSC offers a new flight computing architecture to meet the needs of NASA missions through 2030 and beyond. Providing on the order of 100X the computational capacity of current flight processors for the same amount of power, the multicore architecture of the HPSC processor, or "Chiplet" provides unprecedented flexibility in a flight computing system by enabling the operating point to be set dynamically, trading among needs for computational performance, energy management and fault tolerance. The HPSC Chiplet is being developed by Boeing under contract to NASA, and is expected to provide prototypes, an evaluation board, system emulators, comprehensive system software, and a software development kit. In addition to the vendor deliverables, the AFRL is funding the development of a flexible Middleware to be developed by NASA Jet Propulsion Laboratory and NASA Goddard Space Flight Center. The HPSC Middleware provides a suite of thirteen high level services to manage the compute, memory and I/O resources of this complex device.This presentation will provide an HPSC project update, an overview of the latest HPSC System Software release, an overview of HPSC Middleware Release 2, and a preview of the third HPSC Middleware release. The presentation will begin with a project update that will provide a look at the high-level changes since the project was introduced at the Flight Software Workshop last year. Next, the presentation will provide an overview of the current suite of HPSC System Software which includes the vendor provided bootloaders, operating systems, emulator, and development tools. Next, the HPSC Middleware progress will be presented, which includes an overview of the features and capabilities of HPSC Middleware Release 2, followed by a look at the reference flight software applications which utilize the Middleware. Finally, the presentation will give a preview of the HPSC Middleware Release 3

Design and Test Space Exploration of Transport-Triggered Architectures

This paper describes a new approach in the high level design and test of transport-triggered architectures (TTA), a special type of application specific instruction processors (ASIP). The proposed method introduces the test as an additional constraint, besides throughput and circuit area. The method, that calculates the testability of the system, helps the designer to assess the obtained architectures with respect to test, area and throughput in the early phase of the design and selects the most suitable one. In order to create the templated TTA, the ¿MOVE¿ framework has been addressed. The approach is validated with respect to the ¿Crypt¿ Unix applicatio

Hardware Design and Implementation of Role-Based Cryptography

Traditional public key cryptographic methods provide access control to sensitive data by allowing the message sender to grant a single recipient permission to read the encrypted message. The Need2Know® system (N2K) improves upon these methods by providing role-based access control. N2K defines data access permissions similar to those of a multi-user file system, but N2K strictly enforces access through cryptographic standards. Since custom hardware can efficiently implement many cryptographic algorithms and can provide additional security, N2K stands to benefit greatly from a hardware implementation. To this end, the main N2K algorithm, the Key Protection Module (KPM), is being specified in VHDL. The design is being built and tested incrementally: this first phase implements the core control logic of the KPM without integrating its cryptographic sub-modules. Both RTL simulation and formal verification are used to test the design. This is the first N2K implementation in hardware, and it promises to provide an accelerated and secured alternative to the software-based system. A hardware implementation is a necessary step toward highly secure and flexible deployments of the N2K system

A Review paper on the Memory Built-In Self-Repair with Redundancy Logic

The Present review paper expresses the word oriented memory test methodology for Built-In Self-Repair (BISR). To replace the defect words few logics are introduced. These logics are memory BIST logic and Wrapper logic. Whenever a test is carries on, the defected words are pointed out by its address only and these addresses are called failing address. The failing addresses are stored in the fuse box. Using fuse box it avoids the classic redundancy concept, where the RAMS has spare rows and columns. After the detection of faulty address, they are stored in redundancy logic. During test and redundancy configuration, the fuse box is connected to a scan registernbsp by this processnbsp inputnbsp and output data can be evaluated

Built-in self test of high speed analog-to-digital converters

Signals found in nature need to be converted to the digital domain through analog-to-digital converters (ADCs) to be processed by digital means [1]. For applications in communication and measurement [2], [3], high conversion rates are required. With advances of the complementary metal oxide semiconductor (CMOS) technology, the conversion rates of CMOS ADCs are now well beyond the gigasamples per second (GS/s) range, but only moderate resolutions are required [4]. These ADCs need to be tested after fabrication and, if possible, during field operation. The test costs are a very significant fraction of their production cost [5]. This is mainly due to lengthy use of very expensive automated test equipment (ATE) to apply specific test stimuli to the devices under test (DUT) and to collect and analyze their responses.publishe

Programmable logic devices: a test approach for the Input / Output blocks and Pad-to-Pin interconnections

Dynamically reconfigurable systems based on partial and dynamically reconfigurable FPGAs may have their functionality partially modified at run-time without stopping the operation of the whole system. The efficient management of the logic space available is one of the biggest problems faced by these systems. When the sequence of reconfigurations to be performed is not predictable, resource allocation decisions have to be made on-line. A rearrangement may be necessary to get enough contiguous space to implement incoming functions, avoiding the spreading of their components and the resulting degradation of system performance.A new software tool that helps to handle the problems posed by the consecutive reconfiguration of the same logic space is presented in this paper. This tool uses a novel on-line rearrangement procedure to solve fragmentation problems and to rearrange the logic space in a way completely transparent to the applications currently running

Memory built-in self-repair and correction for improving yield: a review

Nanometer memories are highly prone to defects due to dense structure, necessitating memory built-in self-repair as a must-have feature to improve yield. Today’s system-on-chips contain memories occupying an area as high as 90% of the chip area. Shrinking technology uses stricter design rules for memories, making them more prone to manufacturing defects. Further, using 3D-stacked memories makes the system vulnerable to newer defects such as those coming from through-silicon-vias (TSV) and micro bumps. The increased memory size is also resulting in an increase in soft errors during system operation. Multiple memory repair techniques based on redundancy and correction codes have been presented to recover from such defects and prevent system failures. This paper reviews recently published memory repair methodologies, including various built-in self-repair (BISR) architectures, repair analysis algorithms, in-system repair, and soft repair handling using error correcting codes (ECC). It provides a classification of these techniques based on method and usage. Finally, it reviews evaluation methods used to determine the effectiveness of the repair algorithms. The paper aims to present a survey of these methodologies and prepare a platform for developing repair methods for upcoming-generation memories

Design-for-delay-testability techniques for high-speed digital circuits

The importance of delay faults is enhanced by the ever increasing clock rates and decreasing geometry sizes of nowadays' circuits. This thesis focuses on the development of Design-for-Delay-Testability (DfDT) techniques for high-speed circuits and embedded cores. The rising costs of IC testing and in particular the costs of Automatic Test Equipment are major concerns for the semiconductor industry. To reverse the trend of rising testing costs, DfDT is\ud getting more and more important