RT-level fast fault simulator

In this paper a new fast fault simulation technique is presented for calculation of fault propagation through HLPs (High Level Primitives). ROTDDs (Reduced Ordered Ternary Decision Diagrams) are used to describe HLP modules. The technique is implemented in the HTDD RT-level fault simulator. The simulator is evaluated with some ITC99 benchmarks. A hypothesis is proved that a test set coverage of physical failures can be anticipated with high accuracy when RTL fault model takes into account optimization strategies that are used in CAE system applied

Analysis of Hardware Descriptions

The design process for integrated circuits requires a lot of analysis of circuit descriptions. An important class of analyses determines how easy it will be to determine if a physical component suffers from any manufacturing errors. As circuit complexities grow rapidly, the problem of testing circuits also becomes increasingly difficult. This thesis explores the potential for analysing a recent high level hardware description language called Ruby. In particular, we are interested in performing testability analyses of Ruby circuit descriptions. Ruby is ammenable to algebraic manipulation, so we have sought transformations that improve testability while preserving behaviour. The analysis of Ruby descriptions is performed by adapting a technique called abstract interpretation. This has been used successfully to analyse functional programs. This technique is most applicable where the analysis to be captured operates over structures isomorphic to the structure of the circuit. Many digital systems analysis tools require the circuit description to be given in some special form. This can lead to inconsistency between representations, and involves additional work converting between representations. We propose using the original description medium, in this case Ruby, for performing analyses. A related technique, called non-standard interpretation, is shown to be very useful for capturing many circuit analyses. An implementation of a system that performs non-standard interpretation forms the central part of the work. This allows Ruby descriptions to be analysed using alternative interpretations such test pattern generation and circuit layout interpretations. This system follows a similar approach to Boute's system semantics work and O'Donnell's work on Hydra. However, we have allowed a larger class of interpretations to be captured and offer a richer description language. The implementation presented here is constructed to allow a large degree of code sharing between different analyses. Several analyses have been implemented including simulation, test pattern generation and circuit layout. Non-standard interpretation provides a good framework for implementing these analyses. A general model for making non-standard interpretations is presented. Combining forms that combine two interpretations to produce a new interpretation are also introduced. This allows complex circuit analyses to be decomposed in a modular manner into smaller circuit analyses which can be built independently

Efficient VLSI fault simulation

AbstractLet C be an acyclic Boolean circuit with n gates and ≤ n inputs. A circuit manufacture error may result in a “Stuck-at” (S-A) fault in a circuit identical to C except a gate v only outputs a fixed Boolean value. The S-A fault simulation problem for C is to determine all possible (S-A) faults which can be detected (i.e., faults circuit and C would give distinct outputs) by a given test pattern input.We consider the case where C is a tree (i.e., has fan-out 1.)We give a practical algorithm for fault simulation which simultaneously determines all detectable S-A faults for every gate in the circuit tree C. Our algorithm required only the evaluation of a circuit FS(C) which has ≤ 7n gates and has depth ≤ 3(d + 1), when d is the depth of C. Thus the sequential time of our algorithm is ≤ 7n, and the parallel time is ≤ 3(d + 1). Furthermore, FS(C) requires only a small constant factor more VLSI area than does the original circuit C.We also extend our results to get efficient methods for fault simulation of oblivious VLSI circuits with feedback lines

An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group

VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving

FPGA Based Design for Accelerated Fault-testing of Integrated Circuits

In the past few decades, integrated circuits have become a major part of everyday life. Every circuit that is created needs to be tested for faults so faulty circuits are not sent to end-users. The creation of these tests is time consuming, costly and difficult to perform on larger circuits. This research presents a novel method for fault detection and test pattern reduction in integrated circuitry under test. By leveraging the FPGA\u27s reconfigurability and parallel processing capabilities, a speed up in fault detection can be achieved over previous computer simulation techniques. This work presents the following contributions to the field of Stuck-At-Fault detection: We present a new method for inserting faults into a circuit net list. Given any circuit netlist, our tool can insert multiplexers into a circuit at correct internal nodes to aid in fault emulation on reconfigurable hardware. We present a parallel method of fault emulation. The benefit of the FPGA is not only its ability to implement any circuit, but its ability to process data in parallel. This research utilizes this to create a more efficient emulation method that implements numerous copies of the same circuit in the FPGA. A new method to organize the most efficient faults. Most methods for determinin the minimum number of inputs to cover the most faults require sophisticated softwareprograms that use heuristics. By utilizing hardware, this research is able to process data faster and use a simpler method for an efficient way of minimizing inputs

CBR and MBR techniques: review for an application in the emergencies domain

The purpose of this document is to provide an in-depth analysis of current reasoning engine practice and the integration strategies of Case Based Reasoning and Model Based Reasoning that will be used in the design and development of the RIMSAT system. RIMSAT (Remote Intelligent Management Support and Training) is a European Commission funded project designed to: a.. Provide an innovative, 'intelligent', knowledge based solution aimed at improving the quality of critical decisions b.. Enhance the competencies and responsiveness of individuals and organisations involved in highly complex, safety critical incidents - irrespective of their location. In other words, RIMSAT aims to design and implement a decision support system that using Case Base Reasoning as well as Model Base Reasoning technology is applied in the management of emergency situations. This document is part of a deliverable for RIMSAT project, and although it has been done in close contact with the requirements of the project, it provides an overview wide enough for providing a state of the art in integration strategies between CBR and MBR technologies.Postprint (published version

Towards temporal verification of swarm robotic systems

A robot swarm is a collection of simple robots designed to work together to carry out some task. Such swarms rely on the simplicity of the individual robots; the fault tolerance inherent in having a large population of identical robots; and the self-organised behaviour of the swarm as a whole. Although robot swarms present an attractive solution to demanding real-world applications, designing individual control algorithms that can guarantee the required global behaviour is a difficult problem. In this paper we assess and apply the use of formal verification techniques for analysing the emergent behaviours of robotic swarms. These techniques, based on the automated analysis of systems using temporal logics, allow us to analyse whether all possible behaviours within the robot swarm conform to some required specification. In particular, we apply model-checking, an automated and exhaustive algorithmic technique, to check whether temporal properties are satisfied on all the possible behaviours of the system. We target a particular swarm control algorithm that has been tested in real robotic swarms, and show how automated temporal analysis can help to refine and analyse such an algorithm. © 2012 Elsevier B.V. All rights reserved

Multi-level simulation of nano-electronic digital circuits on GPUs

Simulation of circuits and faults is an essential part in design and test validation tasks of contemporary nano-electronic digital integrated CMOS circuits. Shrinking technology processes with smaller feature sizes and strict performance and reliability requirements demand not only detailed validation of the functional properties of a design, but also accurate validation of non-functional aspects including the timing behavior. However, due to the rising complexity of the circuit behavior and the steady growth of the designs with respect to the transistor count, timing-accurate simulation of current designs requires a lot of computational effort which can only be handled by proper abstraction and a high degree of parallelization. This work presents a simulation model for scalable and accurate timing simulation of digital circuits on data-parallel graphics processing unit (GPU) accelerators. By providing compact modeling and data-structures as well as through exploiting multiple dimensions of parallelism, the simulation model enables not only fast and timing-accurate simulation at logic level, but also massively-parallel simulation with switch level accuracy. The model facilitates extensions for fast and efficient fault simulation of small delay faults at logic level, as well as first-order parametric and parasitic faults at switch level. With the parallelization on GPUs, detailed and scalable simulation is enabled that is applicable even to multi-million gate designs. This way, comprehensive analyses of realistic timing-related faults in presence of process- and parameter variations are enabled for the first time. Additional simulation efficiency is achieved by merging the presented methods in a unified simulation model, that allows to combine the unique advantages of the different levels of abstraction in a mixed-abstraction multi-level simulation flow to reach even higher speedups. Experimental results show that the implemented parallel approach achieves unprecedented simulation throughput as well as high speedup compared to conventional timing simulators. The underlying model scales for multi-million gate designs and gives detailed insights into the timing behavior of digital CMOS circuits, thereby enabling large-scale applications to aid even highly complex design and test validation tasks