A Low Noise Sub-Sampling PLL in Which Divider Noise Is Eliminated and PD-CP Noise Is not multiplied by N^2

This paper presents a 2.2-GHz low jitter sub-sampling based PLL. It uses a phase-detector/charge-pump (PD/CP)that sub-samples the VCO output with the reference clock. In contrast to what happens in a classical PLL, the PD/CP noise is not multiplied by N2 in this sub-sampling PLL, resulting in a low noise contribution from the PD/CP. Moreover, no frequency divider is needed in the locked state and hence divider noise and power can be eliminated. An added frequency locked loop guarantees correct frequency locking without degenerating jitter performance when in lock. The PLL is implemented in a standard 0.18- m CMOS process. It consumes 4.2 mA from a 1.8 V supply and occupies an active area of 0.4 X 0.45 m

Phase Locked Loop Test Methodology

Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

Low-Jitter Clock Multiplication: a Comparioson between PLLs and DLLs

This paper shows that, for a given power budget, a practical phase-locked loop (PLL)-based clock multiplier generates less jitter than a delay-locked loop (DLL) equivalent. This is due to the fact that the delay cells in a PLL ring-oscillator can consume more power per cell than their counterparts in the DLL. We can show that this effect is stronger than the notorious jitter accumulation effect that occurs in the voltage-controlled oscillator (VCO) of a PLL. First, an analysis of the stochastic-output jitter of the architectures, due to the most important noise sources, is presented. Then, another important source of jitter in a DLL-based clock multiplier is treated, namely the stochastic mismatch in the delay cells which compose the DLL voltage-controlled delay line (VCDL). An analysis is presented that relates the stochastic spread of the delay of the cells to the output jitter of the clock multiplier. A circuit design technique, called impedance level scaling, is then presented which allows the designer to optimize the noise and mismatch behavior of a circuit, independently from other specifications such as speed and linearity. Applying this technique on a delay cell design yields a direct tradeoff between noise induced jitter and power usage, and between stochastic mismatch induced jitter and power usage

Low jitter phase-locked loop clock synthesis with wide locking range

The fast growing demand of wireless and high speed data communications has driven efforts to increase the levels of integration in many communications applications. Phase noise and timing jitter are important design considerations for these communications applications. The desire for highly complex levels of integration using low cost CMOS technologies works against the minimization of timing jitter and phase noise for communications systems which employ a phase-locked loop for frequency and clock synthesis with on-chip VCO. This dictates an integrated CMOS implementation of the VCO with very low phase noise performance. The ring oscillator VCOs based on differential delay cell chains have been used successfully in communications applications, but thermal noise induced phase noise have to be minimized in order not to limit their applicability to some applications which impose stringent timing jitter and phase noise requirements on the PLL clock synthesizer. Obtaining lower timing jitter and phase noise at the PLL output also requires the minimization of noise in critical circuit design blocks as well as the optimization of the loop bandwidth of the PLL. In this dissertation the fundamental performance limits of CMOS PLL clock synthesizers based on ring oscillator VCOs are investigated. The effect of flicker and thermal noise in MOS transistors on timing jitter and phase noise are explored, with particular emphasis on source coupled NMOS differential delay cells with symmetric load elements. Several new circuit architectures are employed for the charge pump circuit and phase-frequency detector (PFD) to minimize the timing jitter due to the finite dead zone in the PFD and the current mismatch in the charge pump circuit. The selection of the optimum PLL loop bandwidth is critical in determining the phase noise performance at the PLL output. The optimum loop bandwidth and the phase noise performance of the PLL is determined using behavioral simulations. These results are compared with transistor level simulated results and experimental results for the PLL clock synthesizer fabricated in a 0.35 µm CMOS technology with good agreement. To demonstrate the proposed concept, a fully integrated CMOS PLL clock synthesizer utilizing integer-N frequency multiplier technique to synthesize several clock signals in the range of 20-400 MHz with low phase noise was designed. Implemented in a standard 0.35-µm N-well CMOS process technology, the PLL achieves a period jitter of 6.5-ps (rms) and 38-ps (peak-to-peak) at 216 MHz with a phase noise of -120 dBc/Hz at frequency offsets above 10 KHz. The specific research contributions of this work include (1) proposing, designing, and implementing a new charge pump circuit architecture that matches current levels and therefore minimizes one source of phase noise due to fluctuations in the control voltage of the VCO, (2) an improved phase-frequency detector architecture which has improved characteristics in lock condition, (3) an improved ring oscillator VCO with excellent thermal noise induced phase noise characteristics, (4) the application of selfbiased techniques together with fixed bias to CMOS low phase noise PLL clock synthesizer for digital video communications ,and (5) an analytical model that describes the phase noise performance of the proposed VCO and PLL clock synthesizer

Novel Systematic Phase Noise Reduction Techniques for Phase Interpolator Clock and Data Recovery

This work focused on high-speed source-synchronous clock and multi-channel data receivers for inter-chip communications. Designs of inter-chip communication are becoming increasingly difficult with the rise in clock rates and the reduction in voltage supplies. Data transmissions at rates of gigabits per second require a fast and accurate clock and data recovery system on the front end of receivers. Many designs allow for source-synchronous clocking architectures, but this work focused on a dual-loop with a phase-locked loop for frequency tracking and phase integrators for tracking each individual data lane. Limitations with the phase interpolator architecture cause systematic jitter, reducing the data eye. Various techniques exist that aim to reduce or eliminate this systematic jitter from phase interpolator architectures. A technique based on digital lock detection was developed for this work that eliminates the phase interpolator systematic jitter

Switched Capacitor Loop Filter 와 Source Switched Charge Pump 를 이용한 Phase-Locked Loop 의 설계

학위논문(석사) -- 서울대학교대학원 : 공과대학 전기·정보공학부, 2022.2. 정덕균.This thesis proposes a low integrated RMS jitter and low reference spur phase locked loop (PLL) using a switched capacitor loop filter and source switched charge pump. The PLL employs a single tunable charge pump which reduces current mis match across wide control voltage range and charge sharing effect to get high perfor mance of reference spur level. The switched capacitor loop filter is adopted to achieve insensitivity to temperature, supply voltage, and process variation of a resistor. The proposed PLL covers a wide frequency range and has a low integrated RMS jitter and low reference spur level to target various interface standards. The mechanism of switched capacitor loop filter and source switched charge pump is analyzed. Fabricated in 40 nm CMOS technology, the proposed analog PLL provides four phase for a quarter-rate transmitter, consumes 6.35 mW at 12 GHz using 750 MHz reference clock, and occupies an 0.008 mm2 with an integrated RMS jitter (10 kHz to 100 MHz) of 244.8 fs. As a result, the PLL achieves a figure of merit (FoM) of -244.2 dB with high power efficiency of 0.53 mW/GHz, and reference spur level is -60.3 dBc.본 논문에서는 낮은 RMS jitter 와 낮은 레퍼런스 스퍼를 가지며 스위치축전기 루프 필터와 소스 스위치 전하 펌프를 이용한 PLL 을 제안한다. 제안된 PLL 은 레퍼런스 스퍼의 성능을 위해 넓은 컨트롤 전압의 범위 동안 전류의 오차를 줄여주고 전하 공유 효과를 줄여주는 하나의 조절 가능한 전하 펌프를 사용하였다. 저항의 온도, 공급 전압, 공정 변화에 따른 민감도를 낮추기 위해 스위치 축전기 루프 필터가 사용되었다. 다양한 인터페이스 표준을 지원하기 위해 제안하는 PLL 은 넓은 주파수 범위를 지원하고 낮은 RMS jitter 와 낮은 레퍼런스 스퍼를 갖는다. 스위치 축전기 루프 필터와 소스 스위치 전하 펌프의 동작 원리에 대해 분석하였다. 40 nm CMOS 공정으로 제작되었으며, 제안된 회로는 quarter-rate 송신기를 위해 4 개의 phase 를 만들어내며 750 MHz 의 레퍼런스 클락을 이용하여 12 GHz 에서 6.35 mW 의 power 를 소모하고 0.008mm2 의 유효 면적을 차지하고 10 kHz 부터 100 MHz 까지 적분했을 때의 RMS jitter 값은 244.8fs 이다. 제안하는 PLL 은 -244.2 dB 의 FoM, 0.53 mW/GHz 의 power 효율을 달성했으며 레퍼런스 스퍼는 -60.3 dBc 이다CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 3 CHAPTER 2 BACKGROUNDS 4 2.1 CLOCK GENERATION IN SERIAL LINK 4 2.2 PLL BUILDING BLOCKS 6 2.2.1 OVERVIEW 6 2.2.2 PHASE FREQUENCY DETECTOR 7 2.2.3 CHARGE PUMP AND LOOP FILTER 9 2.2.4 VOLTAGE CONTROLLED OSCILLATOR 10 2.2.5 FREQUENCY DIVIDER 13 2.3 PLL LOOP ANALYSIS 15 CHAPTER 3 PLL WITH SWITCHED CAPACITOR LOOP FILTER AND SOURCE SWITCHED CHARGE PUMP 19 3.1 DESIGN CONSIDERATION 19 3.2 PROPOSED ARCHITECTURE 21 3.3 CIRCUIT IMPLEMENTATION 23 3.3.1 PHASE FREQUENCY DETECTOR 23 3.3.2 SOURCE SWITCHED CHARGE PUMP 26 3.3.3 SWITCHED CAPACITOR LOOP FILTER 30 3.3.4 VOLTAGE CONTROLLED OSCILLATOR 35 3.3.5 POST VCO AMPLIFIER 39 3.3.6 FREQUENCY DIVIDER 40 CHAPTER 4 MEASUREMENT RESULTS 43 4.1 CHIP PHOTOMICROGRAPH 43 4.2 MEASUREMENT SETUP 45 4.3 MEASURED PHASE NOISE AND REFERENCE SPUR 47 4.4 PERFORMANCE SUMMARY 50 CHAPTER 5 CONCLUSION 52 BIBLIOGRAPHY 53 초 록 58석

A study of phase noise and jitter in submicron CMOS phase-locked loop circuits

Phase-locked loops (PLLs) are widely used in communication systems. With the continuously expanding of market for high speed, portable communication devices, low noise CMOS submicron integrated circuit designs of PLL for different applications are in large demand. In this dissertation, phase noise and jitter properties of PLL and its building blocks are investigated both at the physical and system levels. At the physical level, hot carrier effect in submicron MOSFETs has been considered. As one of the most dominant noise sources of PLL, the voltage-controlled oscillator (VCO) is considered when investigating the noise degradation induced by the hot carrier effect. Experimental results of jitter degradation due to hot carrier effects are presented for different ring oscillator types VCOs designed in 0.5 micron n-well CMOS technology. An increase in RMS jitter by 25% and 10% decrease in oscillation frequency of VCO can be observed after 4 hours hot carrier stress. The hot carrier induced noise degradation on PLL is also presented based on the performance degradation in VCO. Simulation results show 40% decrease in VCO gain after 4 hours stress and a 23% decrease in damping factor and loop bandwidth. Moreover, degradation on PLL noise performance includes a left shift peak in phase noise and a 17% increase in RMS jitter. At the system level, noise sources in a PLL system are investigated including the input reference noise, VCO noise and the frequency divider noise. Phase noise prediction method for PLL is developed. Experimental phase noise measurement results on 0.5 micron CMOS PLL systems based on different types of VCOs are in close agreement with the predicted phase noise. Therefore, the phase noise prediction method is verified. On the other hand, a 3 GHz adaptive bandwidth PLL based on LC-VCO is designed in 0.25 micron n-well CMOS technology to investigate the phase noise and jitter performance by varying the loop parameters. By considering the noise simulation results based on the adaptive bandwidth feature and the quality factor of the on-chip inductor, PLL loop parameters can be carefully chosen at the design phase to achieve an optimal noise performance

A Bang-Bang All-Digital PLL for Frequency Synthesis

abstract: Phase locked loops are an integral part of any electronic system that requires a clock signal and find use in a broad range of applications such as clock and data recovery circuits for high speed serial I/O and frequency synthesizers for RF transceivers and ADCs. Traditionally, PLLs have been primarily analog in nature and since the development of the charge pump PLL, they have almost exclusively been analog. Recently, however, much research has been focused on ADPLLs because of their scalability, flexibility and higher noise immunity. This research investigates some of the latest all-digital PLL architectures and discusses the qualities and tradeoffs of each. A highly flexible and scalable all-digital PLL based frequency synthesizer is implemented in 180 nm CMOS process. This implementation makes use of a binary phase detector, also commonly called a bang-bang phase detector, which has potential of use in high-speed, sub-micron processes due to the simplicity of the phase detector which can be implemented with a simple D flip flop. Due to the nonlinearity introduced by the phase detector, there are certain performance limitations. This architecture incorporates a separate frequency control loop which can alleviate some of these limitations, such as lock range and acquisition time.Dissertation/ThesisM.S. Electrical Engineering 201