Design of Gain Booster for Sample and Hold Stage of High Speed-Low Power Pipelined Analog-To-Digital Converter

This paper presents the full custom design of an operational transconductance amplifier (OTA) for the sample and hold (SHA) stage of a 10-bit 50-MS/s pipelined analog-to-digital converter (ADC) implemented in a TSMC 0.35μm CMOS process. The OTA chosen for this design is folded cascode with gain boost topology. It is demonstrated through the design analysis and HSPICE simulation that such a structure realizes the best trade-off between power, speed and gain. The simulation results show the OTA achieves DC gain of 88.05dB, unity gain bandwidth of 430.03MHz and 84.06 degree of phase margin. The OTA achieves 62.13 dB SNR at the sampling rate of 50MHz with the input frequency of 24MHz. Power consumption is 9.68 mW from a single 3V supply. The settling time to 2-11 accuracy is 8.2ns

Multi-beam 4 GHz Microwave Apertures Using Current-Mode DFT Approximation on 65 nm CMOS

A current-mode CMOS design is proposed for realizing receive mode multi-beams in the analog domain using a novel DFT approximation. High-bandwidth CMOS RF transistors are employed in low-voltage current mirrors to achieve bandwidths exceeding 4 GHz with good beam fidelity. Current mirrors realize the coefficients of the considered DFT approximation, which take simple values in $\{0, \pm1, \pm2\}$ only. This allows high bandwidths realizations using simple circuitry without needing phase-shifters or delays. The proposed design is used as a method to efficiently achieve spatial discrete Fourier transform operation across a ULA to obtain multiple simultaneous RF beams. An example using 1.2 V current-mode approximate DFT on 65 nm CMOS, with BSIM4 models from the RF kit, show potential operation up to 4 GHz with eight independent aperture beams.Comment: 7 pages, 4 figures, In: IEEE International Microwave Symposium 201

Design of a Cost-Efficient Reconfigurable Pipeline ADC

Power budget is very critical in the design of battery-powered implantable biomedical instruments. High speed, high resolution and low power usually cannot be achieved at the same time. Therefore, a tradeoff must be made to compromise every aspect of those features. As the main component of the bioinstrument, high conversion rate, high resolution ADC consumes most of the power. Fortunately, based on the operation modes of the bioinstrument, a reconfigurable ADC can be used to solve this problem. The reconfigurable ADC will operate at 10-bit 40 MSPS for the diagnosis mode and at 8-bit 2.5 MSPS for the monitor mode. The ADC will be completely turned off if no active signal comes from sensors or if an off command is received from the antenna. By turning off the sample hold stage and the first two stages of the pipeline ADC, a significant power saving is achieved. However, the reconfigurable ADC suffers from two drawbacks. First, the leakage signals through the extra off-state switches in the third stage degrade the performance of the data converter. This situation tends to be even worse for high speed and high-resolution applications. An interference elimination technique has been proposed in this work to solve this problem. Simulation results show a significant attenuation of the spurious tones. Moreover, the transistors in the OTA tend to operate in weak inversion region due to the scaling of the bias current. The transistor in subthreshold is very slow due to the small transit frequency. In order to get a better tradeoff between the transconductance efficiency and the transit frequency, reconfigurable OTAs and scalable bias technique are devised to adjust the operating point from weak inversion to moderate inversion. The figure of merit of the reconfigurable ADC is comparable to the previously published conventional pipeline ADCs. For the 10-bit, 40 MSPS mode, the ADC attains a 56.9 dB SNDR for 35.4 mW power consumption. For the 8-bit 2.5 MSPS mode, the ADC attains a 49.2 dB SNDR for 7.9 mW power consumption. The area for the core layout is 1.9 mm2 for a 0.35 micrometer process

A re-configurable pipeline ADC architecture with built-in self-test techniques

High-performance analog and mixed-signal integrated circuits are integral parts of today\u27s and future networking and communication systems. The main challenge facing the semiconductor industry is the ability to economically produce these analog ICs. This translates, in part, into the need to efficiently evaluate the performance of such ICs during manufacturing (production testing) and to come up with dynamic architectures that enable the performance of these ICs to be maximized during manufacturing and later when they\u27re operating in the field. On the performance evaluation side, this dissertation deals with the concept of Built-In-Self-Test (BIST) to allow the efficient and economical evaluation of certain classes of high-performance analog circuits. On the dynamic architecture side, this dissertation deals with pipeline ADCs and the use of BIST to dynamically, during production testing or in the field, re-configure them to produce better performing ICs.;In the BIST system proposed, the analog test signal is generated on-chip by sigma-delta modulation techniques. The performance of the ADC is measured on-chip by a digital narrow-band filter. When this system is used on the wafer level, significant testing time and thus testing cost can be saved.;A re-configurable pipeline ADC architecture to improve the dynamic performance is proposed. Based on dynamic performance measurements, the best performance configuration is chosen from a collection of possible pipeline configurations. This basic algorithm can be applied to many pipeline analog systems. The proposed grouping algorithm cuts down the number of evaluation permutation from thousands to 18 for a 9-bit ADC thus allowing the method to be used in real applications.;To validate the developments of this dissertation, a 40MS/s 9-bit re-configurable pipeline ADC was designed and implemented in TSMC\u27s 0.25mum single-poly CMOS digital process. This includes a fully differential folded-cascode gain-boosting operational amplifier with high gain and high unity-gain bandwidth. The experimental results strongly support the effectiveness of reconfiguration algorithm, which provides an average of 0.5bit ENOB improvement among the set of configurations. For many applications, this is a very significant performance improvement.;The BIST and re-configurability techniques proposed are not limited to pipeline ADCs only. The BIST methodology is applicable to many analog systems and the re-configurability is applicable to any analog pipeline system

Pipelined analog-to-digital conversion using current-mode reference shifting

Dissertação para obtenção do grau de Mestre em Engenharia Electrotécnica e de ComputadoresPipeline Analog-to-digital converters (ADCs) are the most popular architecture for high-speed medium-to-high resolution applications. A fundamental, but often unreferenced building block of pipeline ADCs are the reference voltage circuits. They are required to maintain a stable reference with low output impedance to drive large internal switched capacitor loads quickly. Achieving this usually leads to a scheme that consumes a large portion of the overall power and area. A review of the literature shows that the required stable reference can be achieved with either on-chip buffering or with large off-chip decoupling capacitors. On-chip buffering is ideal for system integration but requires a high speed buffer with high power dissipation. The use of a reference with off-chip decoupling results in significant power savings but increases the pads of chip, the count of external components and the overall system cost. Moreover the amount of ringing on the internal reference voltage caused by the series inductance of the package makes this solution not viable for high speed ADCs. To address this challenge, a pipeline ADC employing a multiplying digital-to-analog converter (MDAC) with current-mode reference shifting is presented. Consequently, no reference voltages and, therefore, no voltage buffers are necessary. The bias currents are generated on-chip by a reference current generator that dissipates low power. The proposed ADC is designed in a 65 nm CMOS technology and operates at sampling rates ranging from 10 to 80 MS/s. At 40 MS/s the ADC dissipates 10.8 mW from a 1.2 V power supply and achieves an SNDR of 57.2 dB and a THD of -68 dB, corresponding to an ENOB of 9.2 bit. The corresponding figure of merit is 460 fJ/step

Low-Voltage Analog Circuit Design Using the Adaptively Biased Body-Driven Circuit Technique

The scaling of MOSFET dimensions and power supply voltage, in conjunction with an increase in system- and circuit-level performance requirements, are the most important factors driving the development of new technologies and design techniques for analog and mixed-signal integrated circuits. Though scaling has been a fact of life for analog circuit designers for many years, the approaching 1-V and sub-1-V power supplies, combined with applications that have increasingly divergent technology requirements, means that the analog and mixed-signal IC designs of the future will probably look quite different from those of the past. Foremost among the challenges that analog designers will face in highly scaled technologies are low power supply voltages, which limit dynamic range and even circuit functionality, and ultra-thin gate oxides, which give rise to significant levels of gate leakage current. The goal of this research is to develop novel analog design techniques which are commensurate with the challenges that designers will face in highly scaled CMOS technologies. To that end, a new and unique body-driven design technique called adaptive gate biasing has been developed. Adaptive gate biasing is a method for guaranteeing that MOSFETs in a body-driven simple current mirror, cascode current mirror, or regulated cascode current source are biased in saturation—independent of operating region, temperature, or supply voltage—and is an enabling technology for high-performance, low-voltage analog circuits. To prove the usefulness of the new design technique, a body-driven operational amplifier that heavily leverages adaptive gate biasing has been developed. Fabricated on a 3.3-V/0.35-μm partially depleted silicon-onv-insulator (PD-SOI) CMOS process, which has nMOS and pMOS threshold voltages of 0.65 V and 0.85 V, respectively, the body-driven amplifier displayed an open-loop gain of 88 dB, bandwidth of 9 MHz, and PSRR greater than 50 dB at 1-V power supply

Design Techniques for High Speed Low Voltage and Low Power Non-Calibrated Pipeline Analog to Digital Converters

The profound digitization of modern microelectronic modules made Analog-to- Digital converters (ADC) key components in many systems. With resolutions up to 14bits and sampling rates in the 100s of MHz, the pipeline ADC is a prime candidate for a wide range of applications such as instrumentation, communications and consumer electronics. However, while past work focused on enhancing the performance of the pipeline ADC from an architectural standpoint, little has been done to individually address its fundamental building blocks. This work aims to achieve the latter by proposing design techniques to improve the performance of these blocks with minimal power consumption in low voltage environments, such that collectively high performance is achieved in the pipeline ADC. Towards this goal, a Recycling Folded Cascode (RFC) amplifier is proposed as an enhancement to the general performance of the conventional folded cascode. Tested in Taiwan Semiconductor Manufacturing Company (TSMC) 0.18?m Complementary Metal Oxide Semiconductor (CMOS) technology, the RFC provides twice the bandwidth, 8-10dB additional gain, more than twice the slew rate and improved noise performance over the conventional folded cascode-all at no additional power or silicon area. The direct auto-zeroing offset cancellation scheme is optimized for low voltage environments using a dual level common mode feedback (CMFB) circuit, and amplifier differential offsets up to 50mV are effectively cancelled. Together with the RFC, the dual level CMFB was used to implement a sample and hold amplifier driving a singleended load of 1.4pF and using only 2.6mA; at 200MS/s better than 9bit linearity is achieved. Finally a power conscious technique is proposed to reduce the kickback noise of dynamic comparators without resorting to the use of pre-amplifiers. When all techniques are collectively used to implement a 1Vpp 10bit 160MS/s pipeline ADC in Semiconductor Manufacturing International Corporation (SMIC) 0.18[mu]m CMOS, 9.2 effective number of bits (ENOB) is achieved with a near Nyquist-rate full scale signal. The ADC uses an area of 1.1mm2 and consumes 42mW in its analog core. Compared to recent state-of-the-art implementations in the 100-200MS/s range, the presented pipeline ADC uses the least power per conversion rated at 0.45pJ/conversion-step

A low power and low signal 4 bit 50MS/s double sampling pipelined ADC for Monolithic Active Pixel Sensors

International audienceA 4 bit very low power and low incoming signal analog to digital converter (ADC) using a double sampling switched capacitor technique, designed for use in CMOS monolithic active pixels sensor readout, has been implemented in 0.35μm CMOS technology. A non-resetting sample and hold stage is integrated to amplify the incoming signal by 4. This first stage compensates both the amplifier offset effect and the input common mode voltage fluctuations. The converter is composed of a 2.5 bit pipeline stage followed by a 2 bit flash stage. This prototype consists of 4 ADC double-channels; each one is sampling at 50MS/s and dissipates only 2.6mW at 3.3V supply voltage. A bias pulsing stage is integrated in the circuit. Therefore, the analog part is switched OFF or ON in less than 1μs. The size for the layout is 80μm*0.9mm. This corresponds to the pitch of 4 pixel columns, each one is 20μm wide

A Low-Power Capacitive Transimpedance D/A Converter

This thesis proposes a new low-power and low-area DAC for single-slope ADCs used in CMOS image sensors. With increase in resolution requirements for ADCs, conventional DAC architectures suffered the limitation of either large area or high power consumption with higher resolution scaling. Thus, the proposed capacitive transimpedance amplifier DAC (CTIA DAC) could solve this by offering the resolution requirement required without taking a hit on the area or power budget. The thesis has been structured in the following manner: The first chapter introduces image sensors in general and talks about progression through different image sensors and pixel architectures that have been used through the years. It also explains the operation of a CMOS image sensor from a paper published from Sony on high-speed image sensors. The second chapter presents the importance and role of DACs in CMOS image sensors and briefly explains a few commonly used DAC architectures in image sensors. It explains the advantages and disadvantages of present architectures and leads the discussion towards the development of the proposed DAC. The third chapter gives an overview of the CTIA DAC and explains the working of the different circuit blocks that are used to implement the proposed DAC. Chapter Four explains the design approach for the blocks explained in Chapter Three. It presents the critical design choices that were made for overall performance of the DAC. Results of individual blocks and the DAC as a whole are presented and compared against other recently published DAC papers. The final chapter summarizes some key results of the design and talks about the scope for future work and improvement

Design of a 14-bit fully differential discrete time delta-sigma modulator

Analog to digital converters play an essential role in modern mixed signal circuit design. Conventional Nyquist-rate converters require analog components that are precise and highly immune to noise and interference. In contrast, oversampling converters can be implemented using simple and high-tolerance analog components. Moreover, sampling at high frequency eliminates the need for abrupt cutoffs in the analog anti-aliasing filters. A noise shaping technique is also used in DS converters in addition to oversampling to achieve a high resolution conversion. A significant advantage of the method is that analog signals are converted using simple and high-tolerance analog circuits, usually a 1-bit comparator, and analog signal processing circuits having a precision that is usually much less than the resolution of the overall converter. In this thesis, a technique to design the discrete time DS converters for 25 kHz baseband signal bandwidth will be described. The noise shaping is achieved using a switched capacitor low-pass integrator around the 1-bit quantizer loop. A latched-type comparator is used as the quantizer of the DS converter. A second order DS modulator is implemented in a TSMC 0.35 µm CMOS technology using a 3.3 V power supply. The peak signal-to-noise ratio (SNR) simulated is 87 dB; the SNDR simulated is 82 dB which corresponds to a resolution of 14 bits. The total static power dissipation is 6.6 mW