24 research outputs found

    Towards Successful Application of Phase Change Memories: Addressing Challenges from Write Operations

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    The emerging Phase Change Memory (PCM) technology is drawing increasing attention due to its advantages in non-volatility, byte-addressability and scalability. It is regarded as a promising candidate for future main memory. However, PCM's write operation has some limitations that pose challenges to its application in memory. The disadvantages include long write latency, high write power and limited write endurance. In this thesis, I present my effort towards successful application of PCM memory. My research consists of several optimizing techniques at both the circuit and architecture level. First, at the circuit level, I propose Differential Write to remove unnecessary bit changes in PCM writes. This is not only beneficial to endurance but also to the energy and latency of writes. Second, I propose two memory scheduling enhancements (AWP and RAWP) for a non-blocking bank design. My memory scheduling enhancements can exploit intra-bank parallelism provided by non-blocking bank design, and achieve significant throughput improvement. Third, I propose Bit Level Power Budgeting (BPB), a fine-grained power budgeting technique that leverages the information from Differential Write to achieve even higher memory throughput under the same power budget. Fourth, I propose techniques to improve the QoS tuning ability of high-priority applications when running on PCM memory. In summary, the techniques I propose effectively address the challenges of PCM's write operations. In addition, I present the experimental infrastructure in this work and my visions of potential future research topics, which could be helpful to other researchers in the area

    A DATA AWARE APPROACH TO SALVAGE THE ENDURANCE OF PHASE-CHANGE MEMORY

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    Phase Change Memory (PCM) is an emerging non-volatile memory technology that could either replace or augment DRAM and NAND flash that are hindered by scalability challenges. PCM suffers from a limited endurance problem that needs to be alleviated before it can be endorsed into the memory stack. This thesis is based on the observation that the endurance problem and its ramification depend on the write data. Accordingly, a data-aware approach is applied to salvage the endurance of PCM at three different stages: pre-write fault avoidance, post-write fault tolerance and post-failure recovery. The pre-write fault avoidance stage aims at reducing the endurance cost of servicing write requests. To this end, Cost Aware Flip Optimization (CAFO) is presented as an efficient technique to lessen the endurance degradation. Essentially, CAFO relies on a cost model that captures the endurance cost of programming memory cells based on their already stored values. Subsequently,the write data is encoded into a form that incurs a lower endurance cost than the original write data. Overall, CAFO is capable of reducing the endurance cost by up to 65% more than the existing schemes. Worn out PCM cells exhibit a stuck-at fault model which makes the manifestation of errors dependent on the values that cells are stuck at. When a write fails, the data is rewritten inverted. This dissertation shows that applying data inversion at the post-write fault tolerance stage exploits the data dependent nature of errors which enables ECCs to tolerate faults up to double their nominal capability. Furthermore, extensions to RDIS which is an ECC designed specifically for the stuck-at fault model are presented. At the post-failure recovery stage, Data Dependent Sparing is presented to manage bad blocks in PCM. Departing from the observation that defective blocks in the context of the stuck-at fault model still exhibit a low write failure probability due to the data dependent nature of errors, this thesis takes the approach of reusing blocks that are defective yet better-than-bad through a dynamic management of the reserve spare space. Data Dependent Sparing is capable of increasing the lifetime of PCM by up to 18%

    Enhanced 3-Tier Storage Management Scheme For Flash Memory-Based Solid State Disk

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    Nowadays, significant attention has been paid to the flash memory-based Solid State Disk (SSD). Different from traditional disks, SSD uses semiconductor chips for storing the data. This structure enjoys original technical characteristics including low power consumption, shock resistance and high performance in random access. Owing to these features, many devices are using flash memory as a basic storage component, such as mp3, smartphones, and tablet devices. However, the flash memory, basic unit of SSD, has many distinctive characteristics, which lead to multifarious challenges for example, writing data (storing data) is only allowed on empty storage unit (block), which makes it more time-consuming

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    ํ•™์œ„๋…ผ๋ฌธ(๋ฐ•์‚ฌ) -- ์„œ์šธ๋Œ€ํ•™๊ต๋Œ€ํ•™์› : ๊ณต๊ณผ๋Œ€ํ•™ ํ™”ํ•™์ƒ๋ฌผ๊ณตํ•™๋ถ€, 2021.8. ์กฐ์žฌ์˜.The goal of this dissertation is to investigate effect of nanostructures for local electric field enhancement in electronic devices and to provide experimental and theoretical bases for their practical use. Resistive random access memory (RRAM) is a data storage device that can be modulated its resistance states by external electrical stimuli. The electric field generated by the applied potential difference between the two electrodes acts as the driving force to switch the resistance states, so controlling the electric field within the device can lead to improved operational performance and reliability of the device. Even though considerable progress has been made through significant efforts to control the electric field within the device, selectively enhancing the electric field in the intended position for stable and uniform resistive switching behavior is still challenging. Engineered metal structures in the RRAM can efficiently manipulate the electric field. As the radius of the metal structures decreases, the charge density increases, generating electric field enhancements in confined region. To minimize the radius of the metal structure and thus to greatly increase the electric field in a local area, we introduced a nanoscale metal structure into the RRAM. First, pyramid-structured metal electrode with a sharp tip was used to achieve a tip-enhanced electric field, and the effect of the enhanced electric field on the resistive switching behaviors of the device was investigated. Based on numerical simulation and experimental results, we confirmed that pyramidal electrode with a tip radius of tens of nanometers can selectively enhance the electric field at the tip. The tip-enhanced electric field can facilitate the thermochemical reaction in transition metal oxide-based RRAMs and efficiency of charge injection and transport in organic-based RRAMs, as well as provide position selectivity during formation of conductive filament. The resulting RRAM exhibited reliable resistive switching behavior and highly improved device performance compared with conventional RRAM with planar electrode. As another approach to enhance the electric field within the resistive switching layer, we prepared spherical nanostructures via self-assembled block copolymer (BCP)/metal compound micelles. BCP and metal precursors were dissolved in aqueous media for use as BCP/metal compound micelles. These micelles were used as complementary resistive switch (CRS) layers of the memory device and the mechanism of CRS behavior was investigated. The spherical metal nanostructures can improve the electric fields, promoting a resistive switching mechanism based on electrochemical metallization. The resulting CRS memory exhibited reliable resistive switching behavior with four distinct threshold voltages in both cycle-to-cycle and cell-to-cell tests. Also, the conduction and resistive switching mechanism are experimentally demonstrated through the the analysis of the currentโ€“voltage data plot and detemination of the temperature coefficient of resistance. Overall, we pursued efficient engineering of metal nanostructures capable of manipulating electric fields for improving the operational performance and reliability of memory devices. There is no doubt that the commercialized RRAM will become popular in the near future after overcoming all the challenges of RRAM through continuous interest and research. We believe that these results will not only contribute to the significant advancement of all electronic devices, including RRAM, but will also help promote research activities in the electronic device field.๋ณธ ๋…ผ๋ฌธ์˜ ๋ชฉ์ ์€ ๋‚˜๋…ธ ๊ตฌ์กฐ์ฒด๋ฅผ ํ†ตํ•œ ์ „์ž ์žฅ์น˜ ๋‚ด ๊ตญ๋ถ€์  ์ „๊ณ„ ํ–ฅ์ƒ ํšจ๊ณผ๋ฅผ ์กฐ์‚ฌํ•˜๊ณ , ์ด์˜ ์‹ค์ œ ์‚ฌ์šฉ์„ ์œ„ํ•œ ์‹คํ—˜ ๋ฐ ์ด๋ก ์  ๊ธฐ๋ฐ˜์„ ์ œ๊ณตํ•˜๋Š” ๊ฒƒ์ด๋‹ค. ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ (resistive random access memory) ๋Š” ์™ธ๋ถ€ ์ „๊ธฐ ์ž๊ทน์— ์˜ํ•ด ์ €ํ•ญ ์ƒํƒœ๋ฅผ ๋ณ€ํ™” ์‹œํ‚ฌ ์ˆ˜ ์žˆ๋Š” ๋ฐ์ดํ„ฐ ์ €์žฅ ์žฅ์น˜์ด๋‹ค. ๋‘ ์ „๊ทน ์‚ฌ์ด์— ์ธ๊ฐ€๋œ ์ „์œ„์ฐจ์— ์˜ํ•ด ์ƒ์„ฑ๋œ ์ „๊ธฐ์žฅ์€ ์ €ํ•ญ ์ƒํƒœ๋ฅผ ์ „ํ™˜์‹œํ‚ค๋Š” ๊ตฌ๋™๋ ฅ์œผ๋กœ์จ ์ž‘์šฉํ•˜๋ฏ€๋กœ, ์ „์ž ์žฅ์น˜ ๋‚ด์—์„œ ์ „๊ธฐ์žฅ์„ ์ œ์–ดํ•˜๋ฉด ์žฅ์น˜์˜ ์„ฑ๋Šฅ๊ณผ ์‹ ๋ขฐ์„ฑ์„ ํ–ฅ์ƒ์‹œํ‚ฌ ์ˆ˜ ์žˆ๋‹ค. ์žฅ์น˜ ๋‚ด์—์„œ ์ „๊ธฐ์žฅ์„ ์ œ์–ดํ•˜๋ ค๋Š” ๋งŽ์€ ๋…ธ๋ ฅ์„ ํ†ตํ•ด ์ƒ๋‹นํ•œ ์ง„์ „์ด ์žˆ์—ˆ์ง€๋งŒ, ์•ˆ์ •์ ์ด๊ณ  ๊ท ์ผํ•œ ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™์„ ์œ„ํ•ด ์˜๋„๋œ ์œ„์น˜์—์„œ ์ „๊ธฐ์žฅ์„ ์„ ํƒ์ ์œผ๋กœ ํ–ฅ์ƒ์‹œํ‚ค๋Š” ์ผ์€ ์•„์ง ๋„์ „์  ๊ณผ์ œ์ด๋‹ค. ๊ตฌ์กฐํ™”๋œ ๊ธˆ์†์„ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์— ์ ‘๋ชฉ์‹œํ‚ด์œผ๋กœ์จ ์ „๊ธฐ์žฅ์„ ํšจ์œจ์ ์œผ๋กœ ์กฐ์ž‘ํ•  ์ˆ˜ ์žˆ๋‹ค. ๊ธˆ์† ๊ตฌ์กฐ์ฒด์˜ ๋ฐ˜๊ฒฝ์ด ๊ฐ์†Œํ•จ์— ๋”ฐ๋ผ ์ „ํ•˜ ๋ฐ€๋„๊ฐ€ ์ฆ๊ฐ€ํ•˜์—ฌ ๊ตญ๋ถ€์  ์˜์—ญ์—์„œ ์ „๊ธฐ์žฅ์ด ํ–ฅ์ƒ๋œ๋‹ค. ์ด ๋…ผ๋ฌธ์—์„œ๋Š” ๊ธˆ์† ๊ตฌ์กฐ์ฒด์˜ ๋ฐ˜๊ฒฝ์„ ์ตœ์†Œํ™”ํ•˜์—ฌ ๊ตญ๋ถ€์ ์œผ๋กœ ์ „๊ธฐ์žฅ์„ ํฌ๊ฒŒ ํ–ฅ์ƒ์‹œํ‚ค๊ธฐ ์œ„ํ•ด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์— ๋‚˜๋…ธ์Šค์ผ€์ผ์˜ ๊ธˆ์† ๊ตฌ์กฐ์ฒด๋ฅผ ๋„์ž…ํ•˜์˜€๋‹ค. ์ฒซ ๋ฒˆ์งธ๋กœ, ํŒ ๊ฐ•ํ™” (tip-enhanced) ์ „๊ธฐ์žฅ ํšจ๊ณผ๋ฅผ ๋‹ฌ์„ฑํ•˜๊ธฐ ์œ„ํ•ด ๋‚ ์นด๋กœ์šด ํŒ์„ ๊ฐ€์ง€๋Š” ํ”ผ๋ผ๋ฏธ๋“œ ๊ธˆ์† ๊ตฌ์กฐ์ฒด๋ฅผ ์ „๊ทน์œผ๋กœ ์‚ฌ์šฉํ•˜์˜€์œผ๋ฉฐ, ๊ฐ•ํ™”๋œ ์ „๊ธฐ์žฅ์ด ์†Œ์ž์˜ ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™์— ๋ฏธ์น˜๋Š” ์˜ํ–ฅ์„ ์กฐ์‚ฌํ•˜์˜€๋‹ค. ์œ ํ•œ์š”์†Œ๋ชจ๋ธ๋ง๊ณผ ์‹คํ—˜๊ฒฐ๊ณผ๋ฅผ ๋ฐ”ํƒ•์œผ๋กœ, ์ˆ˜์‹ญ ๋‚˜๋…ธ ๋ฏธํ„ฐ์˜ ํŒ ๋ฐ˜๊ฒฝ์„ ๊ฐ€์ง€๋Š” ํ”ผ๋ผ๋ฏธ๋“œ ๊ตฌ์กฐ์ฒด ์ „๊ทน์ด ํŒ ๋ถ€๊ทผ์—์„œ ์ „๊ธฐ์žฅ์„ ๊ตญ์†Œ์ ์œผ๋กœ ํ–ฅ์ƒ์‹œํ‚ฌ ์ˆ˜ ์žˆ์Œ์„ ํ™•์ธํ•˜์˜€๋‹ค. ํŒ ๊ฐ•ํ™” ์ „๊ธฐ์žฅ์€ ์ „์ด ๊ธˆ์† ์‚ฐํ™”๋ฌผ-๊ธฐ๋ฐ˜ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์—์„œ ์—ดํ™”ํ•™ (thermochemical) ๋ฐ˜์‘์„ ์ด‰์ง„์‹œํ‚ค๊ณ  ์œ ๊ธฐ-๊ธฐ๋ฐ˜ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์—์„œ ์ „ํ•˜ ์ฃผ์ž… (charge injection) ๋ฐ ์ˆ˜์†ก (transport) ํšจ์œจ์„ฑ์„ ํ–ฅ์ƒ์‹œํ‚ฌ ๋ฟ ์•„๋‹ˆ๋ผ, ์„ ํƒ์ ์ธ ์œ„์น˜์—์„œ๋งŒ ์ „๋„์„ฑ ํ•„๋ผ๋ฉ˜ํŠธ (conductive filament)๋ฅผ ํ˜•์„ฑ์‹œํ‚ฌ ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๊ทธ ๊ฒฐ๊ณผ ํ”ผ๋ผ๋ฏธ๋“œ ๊ตฌ์กฐ์ฒด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ๋Š” ์ข…๋ž˜์˜ ํ‰ํŒ ๊ตฌ์กฐ์ฒด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์— ๋น„ํ•ด ์•ˆ์ •์ ์ธ ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™๊ณผ ํ–ฅ์ƒ๋œ ์žฅ์น˜ ์„ฑ๋Šฅ์„ ๋ณด์—ฌ์ฃผ์—ˆ๋‹ค. ์ €ํ•ญ ๋ณ€ํ™” ์ธต ๋‚ด์˜ ์ „๊ธฐ์žฅ์„ ํ–ฅ์ƒ์‹œํ‚ค๊ธฐ ์œ„ํ•œ ๋˜ ๋‹ค๋ฅธ ์ ‘๊ทผ๋ฒ•์œผ๋กœ, ์ž๊ธฐ์กฐ๋ฆฝ (self-assembled)๋œ ๋ธ”๋ก๊ณต์ค‘ํ•ฉ์ฒด (block copolymer)/๊ธˆ์† ๋ณตํ•ฉ์ฒด ๋ฏธ์…€ (micelle)์„ ์ด์šฉํ•˜์—ฌ ๊ตฌํ˜•์˜ ๋‚˜๋…ธ๊ตฌ์กฐ์ฒด๋ฅผ ์†Œ์ž์˜ ์ค‘๊ฐ„์ธต์œผ๋กœ ๋„์ž…ํ•˜์˜€๋‹ค. ๋ธ”๋ก๊ณต์ค‘ํ•ฉ์ฒด ๋ฐ ๊ธˆ์†์ „๊ตฌ์ฒด๋ฅผ ๋ณตํ•ฉ์ฒด ๋ฏธ์…€๋กœ ์‚ฌ์šฉํ•˜๊ธฐ ์œ„ํ•ด ์„ ํƒ์  ์šฉ๋งค์— ์šฉํ•ด์‹œ์ผฐ๋‹ค. ํ•ด๋‹น ๋ฏธ์…€์„ ๋ฉ”๋ชจ๋ฆฌ ์†Œ์ž์˜ ์ƒ๋ณด์  ์ €ํ•ญ ๋ณ€ํ™” (complementary resistive switch) ์ธต์œผ๋กœ ์‚ฌ์šฉํ•˜์˜€์œผ๋ฉฐ, ์ƒ๋ณด์  ์ €ํ•ญ ๋ณ€ํ™” ๊ฑฐ๋™์˜ ๋ฉ”์ปค๋‹ˆ์ฆ˜์„ ์กฐ์‚ฌํ•˜์˜€๋‹ค. ๊ตฌํ˜•์˜ ๊ธˆ์† ๋‚˜๋…ธ๊ตฌ์กฐ์ฒด๋Š” ์ „๊ธฐ์žฅ์„ ํ–ฅ์ƒ์‹œ์ผœ ์ „๊ธฐํ™”ํ•™์  ๊ธˆ์†ํ™” (electrochemical metallization)์— ๊ธฐ๋ฐ˜ํ•œ ์ €ํ•ญ ๋ณ€ํ™” ๋ฉ”์ปค๋‹ˆ์ฆ˜์„ ์ด‰์ง„์‹œํ‚ฌ ์ˆ˜ ์žˆ์—ˆ๋‹ค. ๊ทธ ๊ฒฐ๊ณผ ์ƒ๋ณด์  ์ €ํ•ญ ๋ณ€ํ™” ๋ฉ”๋ชจ๋ฆฌ๋Š” ์‚ฌ์ดํด ๋ฐ ์…€๊ฐ„ ๋ฐ˜๋ณต ์‹œํ—˜ ๋ชจ๋‘์—์„œ 4๊ฐœ์˜ ์ž„๊ณ„ ์ „์••์œผ๋กœ ์•ˆ์ •์ ์ธ ์ €ํ•ญ ๋ณ€ํ™” ๋™์ž‘์„ ๋‚˜ํƒ€๋‚ด์—ˆ๋‹ค. ๋˜ํ•œ ์ „๋ฅ˜-์ „์•• ์ž๋ฃŒ ํ”Œ๋กฏ (plot) ๋ถ„์„๊ณผ ์ €ํ•ญ์˜ ์˜จ๋„ ๊ณ„์ˆ˜ ๊ฒฐ์ •์„ ํ†ตํ•ด ์žฅ์น˜์˜ ์ „๋„ ๋ฐ ์ €ํ•ญ ๋ณ€ํ™” ๋ฉ”์ปค๋‹ˆ์ฆ˜์„ ์‹คํ—˜์ ์œผ๋กœ ์ž…์ฆํ•˜์˜€๋‹ค. ์ „๋ฐ˜์ ์œผ๋กœ ๋ณธ ๋…ผ๋ฌธ์—์„œ๋Š” ์žฅ์น˜ ๋‚ด ์ „๊ธฐ์žฅ์„ ์ฆํญ์‹œํ‚ฌ ์ˆ˜ ์žˆ๋Š” ๊ธˆ์† ๋‚˜๋…ธ๊ตฌ์กฐ์ฒด์˜ ํšจ์œจ์ ์ธ ์—”์ง€๋‹ˆ์–ด๋ง์„ ํ†ตํ•ด ๋ฉ”๋ชจ๋ฆฌ ์žฅ์น˜์˜ ์„ฑ๋Šฅ๊ณผ ์‹ ๋ขฐ์„ฑ ํ–ฅ์ƒ์„ ์ถ”๊ตฌํ•˜์˜€๋‹ค. ์ง€์†์ ์ธ ๊ด€์‹ฌ๊ณผ ์—ฐ๊ตฌ๋ฅผ ํ†ตํ•ด ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ์˜ ๋ชจ๋“  ๊ณผ์ œ๋ฅผ ๊ทน๋ณตํ•œ ํ›„, ์ƒ์šฉํ™”๋œ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ๊ฐ€ ๊ฐ€๊นŒ์šด ๋ฏธ๋ž˜์— ๋Œ€์ค‘ํ™”๋  ๊ฒƒ์ž„์„ ๋ฏฟ์–ด ์˜์‹ฌ์น˜ ์•Š๋Š”๋‹ค. ์šฐ๋ฆฌ๋Š” ์ด ๊ฒฐ๊ณผ๊ฐ€ ์ €ํ•ญ๋ณ€ํ™”๋ฉ”๋ชจ๋ฆฌ๋ฅผ ํฌํ•จํ•œ ๋ชจ๋“  ์ „์ž ์žฅ์น˜์˜ ํš๊ธฐ์ ์ธ ๋ฐœ์ „์— ๊ธฐ์—ฌํ•  ๋ฟ๋งŒ ์•„๋‹ˆ๋ผ ์ „์ž ์žฅ์น˜ ๋ถ„์•ผ์˜ ์—ฐ๊ตฌ ํ™œ๋™์„ ์ด‰์ง„ํ•˜๋Š” ๋ฐ์—๋„ ๋„์›€์ด ๋  ๊ฒƒ์ด๋ผ๊ณ  ๋ฏฟ๋Š”๋‹ค.Chapter 1. Introduction 1 1.1. Background 1 1.1.1. Necessity of new memory devices 1 1.1.2. Resistive random access memory 2 1.2. Motivation 4 1.3. Dissertation Overview 6 1.4. References 9 Chapter 2. Tip-Enhanced Electric Field-Driven Efficient Charge Injection and Transport in Organic Material-Based Resistive Memories 19 2.1. Introduction 21 2.2. Experimental 24 2.3. Results and Discussion 27 2.4. Conclusions 37 2.5. References 38 Chapter 3. Facilitation of the Thermochemical Mechanism in NiO-Based Resistive Switching Memories via Tip-Enhanced Electric Fields 52 3.1. Introduction 54 3.2. Experimental 57 3.3. Results and Discussion 60 3.4. Conclusions 66 3.5. References 67 Chapter 4. Facile Achievement of Complementary Resistive Switching Behaviors via Self-Assembled Block Copolymer Micelles 82 4.1. Introduction 83 4.2. Experimental 86 4.3. Results and Discussion 89 4.4. Conclusions 96 4.5. References 97 Chapter 5. Conclusion 109 Abstract in Korean 112๋ฐ•

    Nanoparticle Engineering for Chemical-Mechanical Planarization

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    Increasing reliance on electronic devices demands products with high performance and efficiency. Such devices can be realized through the advent of nanoparticle technology. This book explains the physicochemical properties of nanoparticles according to each step in the chemical mechanical planarization (CMP) process, including dielectric CMP, shallow trend isolation CMP, metal CMP, poly isolation CMP, and noble metal CMP. The authors provide a detailed guide to nanoparticle engineering of novel CMP slurry for next-generation nanoscale devices below the 60nm design rule. This comprehensive text also presents design techniques using polymeric additives to improve CMP performance

    Design and Code Optimization for Systems with Next-generation Racetrack Memories

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    With the rise of computationally expensive application domains such as machine learning, genomics, and fluids simulation, the quest for performance and energy-efficient computing has gained unprecedented momentum. The significant increase in computing and memory devices in modern systems has resulted in an unsustainable surge in energy consumption, a substantial portion of which is attributed to the memory system. The scaling of conventional memory technologies and their suitability for the next-generation system is also questionable. This has led to the emergence and rise of nonvolatile memory ( NVM ) technologies. Today, in different development stages, several NVM technologies are competing for their rapid access to the market. Racetrack memory ( RTM ) is one such nonvolatile memory technology that promises SRAM -comparable latency, reduced energy consumption, and unprecedented density compared to other technologies. However, racetrack memory ( RTM ) is sequential in nature, i.e., data in an RTM cell needs to be shifted to an access port before it can be accessed. These shift operations incur performance and energy penalties. An ideal RTM , requiring at most one shift per access, can easily outperform SRAM . However, in the worst-cast shifting scenario, RTM can be an order of magnitude slower than SRAM . This thesis presents an overview of the RTM device physics, its evolution, strengths and challenges, and its application in the memory subsystem. We develop tools that allow the programmability and modeling of RTM -based systems. For shifts minimization, we propose a set of techniques including optimal, near-optimal, and evolutionary algorithms for efficient scalar and instruction placement in RTMs . For array accesses, we explore schedule and layout transformations that eliminate the longer overhead shifts in RTMs . We present an automatic compilation framework that analyzes static control flow programs and transforms the loop traversal order and memory layout to maximize accesses to consecutive RTM locations and minimize shifts. We develop a simulation framework called RTSim that models various RTM parameters and enables accurate architectural level simulation. Finally, to demonstrate the RTM potential in non-Von-Neumann in-memory computing paradigms, we exploit its device attributes to implement logic and arithmetic operations. As a concrete use-case, we implement an entire hyperdimensional computing framework in RTM to accelerate the language recognition problem. Our evaluation shows considerable performance and energy improvements compared to conventional Von-Neumann models and state-of-the-art accelerators

    Quantum and spin-based tunneling devices for memory systems

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    Rapid developments in information technology, such as internet, portable computing, and wireless communication, create a huge demand for fast and reliable ways to store and process information. Thus far, this need has been paralleled with the revolution in solid-state memory technologies. Memory devices, such as SRAM, DRAM, and flash, have been widely used in most electronic products. The primary strategy to keep up the trend is miniaturization. CMOS devices have been scaled down beyond sub-45 nm, the size of only a few atomic layers. Scaling, however, will soon reach the physical limitation of the material and cease to yield the desired enhancement in device performance. In this thesis, an alternative method to scaling is proposed and successfully realized. The proposed scheme integrates quantum devices, Si/SiGe resonant interband tunnel diodes (RITD), with classical CMOS devices forming a microsystem of disparate devices to achieve higher performance as well as higher density. The device/circuit designs, layouts and masks involving 12 levels were fabricated utilizing a process that incorporates nearly a hundred processing steps. Utilizing unique characteristics of each component, a low-power tunneling-based static random access memory (TSRAM) has been demonstrated. The TSRAM cells exhibit bistability operation with a power supply voltage as low as 0.37 V. Various TSRAM cells were also constructed and their latching mechanisms have been extensively investigated. In addition, the operation margins of TSRAM cells are evaluated based on different device structures and temperature variation from room temperature up to 200oC. The versatility of TSRAM is extended beyond the binary system. Using multi-peak Si/SiGe RITD, various multi-valued TSRAM (MV-TSRAM) configurations that can store more than two logic levels per cell are demonstrated. By this virtue, memory density can be substantially increased. Using two novel methods via ambipolar operation and utilization of enable/disable transistors, a six-valued MV-TSRAM cell are demonstrated. A revolutionary novel concept of integrating of Si/SiGe RITD with spin tunnel devices, magnetic tunnel junctions (MTJ), has been developed. This hybrid approach adds non-volatility and multi-valued memory potential as demonstrated by theoretical predictions and simulations. The challenges of physically fabricating these devices have been identified. These include process compatibility and device design. A test bed approach of fabricating RITD-MTJ structures has been developed. In conclusion, this body of work has created a sound foundation for new research frontiers in four different major areas: integrated TSRAM system, MV-TSRAM system, MTJ/RITD-based nonvolatile MRAM, and RITD/CMOS logic circuits

    ENERGY-AWARE OPTIMIZATION FOR EMBEDDED SYSTEMS WITH CHIP MULTIPROCESSOR AND PHASE-CHANGE MEMORY

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    Over the last two decades, functions of the embedded systems have evolved from simple real-time control and monitoring to more complicated services. Embedded systems equipped with powerful chips can provide the performance that computationally demanding information processing applications need. However, due to the power issue, the easy way to gain increasing performance by scaling up chip frequencies is no longer feasible. Recently, low-power architecture designs have been the main trend in embedded system designs. In this dissertation, we present our approaches to attack the energy-related issues in embedded system designs, such as thermal issues in the 3D chip multiprocessor (CMP), the endurance issue in the phase-change memory(PCM), the battery issue in the embedded system designs, the impact of inaccurate information in embedded system, and the cloud computing to move the workload to remote cloud computing facilities. We propose a real-time constrained task scheduling method to reduce peak temperature on a 3D CMP, including an online 3D CMP temperature prediction model and a set of algorithm for scheduling tasks to different cores in order to minimize the peak temperature on chip. To address the challenging issues in applying PCM in embedded systems, we propose a PCM main memory optimization mechanism through the utilization of the scratch pad memory (SPM). Furthermore, we propose an MLC/SLC configuration optimization algorithm to enhance the efficiency of the hybrid DRAM + PCM memory. We also propose an energy-aware task scheduling algorithm for parallel computing in mobile systems powered by batteries. When scheduling tasks in embedded systems, we make the scheduling decisions based on information, such as estimated execution time of tasks. Therefore, we design an evaluation method for impacts of inaccurate information on the resource allocation in embedded systems. Finally, in order to move workload from embedded systems to remote cloud computing facility, we present a resource optimization mechanism in heterogeneous federated multi-cloud systems. And we also propose two online dynamic algorithms for resource allocation and task scheduling. We consider the resource contention in the task scheduling

    Facilitating Emerging Non-volatile Memories in Next-Generation Memory System Design: Architecture-Level and Application-Level Perspectives

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    This dissertation focuses on three types of emerging NVMs, spin-transfer torque RAM (STT-RAM), phase change memory (PCM), and metal-oxide resistive RAM (ReRAM). STT-RAM has been identified as the best replacement of SRAM to build large-scale and low-power on-chip caches and also an energy-efficient alternative to DRAM as main memory. PCM and ReRAM have been considered to be promising technologies for building future large-scale and low-power main memory systems. This dissertation investigates two aspects to facilitate them in next-generation memory system design, architecture-level and application-level perspectives. First, multi-level cell (MLC) STT-RAM based cache design is optimized by using data encoding and data compression. Second, MLC STT-RAM is utilized as persistent main memory for fast and energy-efficient local checkpointing. Third, the commonly used database indexing algorithm, B+tree, is redesigned to be NVM-friendly. Forth, a novel processing-in-memory architecture built on ReRAM based main memory is proposed to accelerate neural network applications

    NASA Tech Briefs, October 1990

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    Topics: New Product Ideas; NASA TU Services; Electronic Components and Circuits; Electronic Systems; Physical' Sciences; Materials; Computer Programs; Mechanics; Machinery; Fabrication Technology; Mathematics and Information Sciences; Life Sciences
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