Robust and reliable hardware accelerator design through high-level synthesis

System-on-chip design is becoming increasingly complex as technology scaling enables more and more functionality on a chip. This scaling-driven complexity has resulted in a variety of reliability and validation challenges including logic bugs, hot spots, wear-out, and soft errors. To make matters worse, as we reach the limits of Dennard scaling, efforts to improve system performance and energy efficiency have resulted in the integration of a wide variety of complex hardware accelerators in SoCs. Thus the challenge is to design complex, custom hardware that is efficient, but also correct and reliable. High-level synthesis shows promise to address the problem of complex hardware design by providing a bridge from the high-productivity software domain to the hardware design process. Much research has been done on high-level synthesis efficiency optimizations. This dissertation shows that high-level synthesis also has the power to address validation and reliability challenges through three automated solutions targeting three key stages in the hardware design and use cycle: pre-silicon debugging, post-silicon validation, and post-deployment error detection. Our solution for rapid pre-silicon debugging of accelerator designs is hybrid tracing: comparing a datapath-level trace of hardware execution with a reference software implementation at a fine temporal and spatial granularity to detect logic bugs. An integrated backtrace process delivers source-code meaning to the hardware designer, pinpointing the location of bug activation and providing a strong hint for potential bug fixes. Experimental results show that we are able to detect and aid in localization of logic bugs from both C/C++ specifications as well as the high-level synthesis engine itself. A variation of this solution tailored for rapid post-silicon validation of accelerator designs is hybrid hashing: inserting signature generation logic in a hardware design to create a heavily compressed signature stream that captures the internal behavior of the design at a fine temporal and spatial granularity for comparison with a reference set of signatures generated by high-level simulation to detect bugs. Using hybrid hashing, we demonstrate an improvement in error detection latency (time elapsed from when a bug is activated to when it manifests as an observable failure) of two orders of magnitude and a threefold improvement in bug coverage compared to traditional post-silicon validation techniques. Hybrid hashing also uncovered previously unknown bugs in the CHStone benchmark suite, which is widely used by the HLS community. Hybrid hashing incurs less than 10% area overhead for the accelerator it validates with negligible performance impact, and we also introduce techniques to minimize any possible intrusiveness introduced by hybrid hashing. Finally, our solution for post-deployment error detection is modulo-3 shadow datapaths: performing lightweight shadow computations in modulo-3 space for each main computation. We leverage the binding and scheduling flexibility of high-level synthesis to detect control errors through diverse binding and minimize area cost through intelligent checkpoint scheduling and modulo-3 reducer sharing. We introduce logic and dataflow optimizations to further reduce cost. We evaluated our technique with 12 high-level synthesis benchmarks from the arithmetic-oriented PolyBench benchmark suite using FPGA emulated netlist-level error injection. We observe coverages of 99.1% for stuck-at faults, 99.5% for soft errors, and 99.6% for timing errors with a 25.7% area cost and negligible performance impact. Leveraging a mean error detection latency of 12.75 cycles (4150× faster than end result check) for soft errors, we also explore a rollback recovery method with an additional area cost of 28.0%, observing a 175× increase in reliability against soft errors. While the area cost of our modulo shadow datapaths is much better than traditional modular redundancy approaches, we want to maximize the applicability of our approach. To this end, we take a dive into gate-level architectural design for modulo arithmetic functional units. We introduce new low-cost gate-level architectures for all four key functional units in a shadow datapath: (1) a modulo reduction algorithm that generates architectures consisting entirely of full-adder standard cells; (2) minimum-area modulo adder and subtractor architectures; (3) an array-based modulo multiplier design; and (4) a modulo equality comparator that handles the residue encoding produced by the above. We compare our new functional units to the previous state-of-the-art approach, observing a 12.5% reduction in area and a 47.1% reduction in delay for a 32-bit mod-3 reducer; that our reducer costs, which tend to dominate shadow datapath costs, do not increase with larger modulo bases; and that for modulo-15 and above, all of our modulo functional units have better area and delay then their previous counterparts. We also demonstrate the practicality of our approach by designing a custom shadow datapath for error detection of a multiply accumulate functional unit, which has an area overhead of only 12% for a 32-bit main datapath and 2-bit modulo-3 shadow datapath. Taking our reliability solution further, we look at the bigger picture of modulo shadow datapaths combined with other solutions at different abstraction layers, looking to answer the following question: Given all of the existing reliability improvement techniques for application-specific hardware accelerators, what techniques or combinations of techniques are the most cost-effective? To answer this question, we consider a soft error fault model and empirically evaluate cross-layer combinations of ABFT, EDDI, and modulo shadow datapaths in the context of high-level synthesis; parity in logic synthesis; and flip-flop hardening techniques at the physical design level. We measure the reliability benefit and area, energy, and performance cost of each technique individually and for interesting technique combinations through FPGA emulated fault-injection and physical place-and-route. Our results show that a combination of parity and flip-flop hardening is the most cost-effective in general with an average 1.3% area cost and 5.7% energy cost for a 50× improvement in reliability. The addition of modulo-3 shadow datapaths to this combination provides some additional benefit for some applications, even without considering its combinational logic, stuck-at fault, and timing error protection benefits. We also observe new efficiency challenges for ABFT and EDDI when used for hardware accelerators

Proceedings of the 21st Conference on Formal Methods in Computer-Aided Design – FMCAD 2021

The Conference on Formal Methods in Computer-Aided Design (FMCAD) is an annual conference on the theory and applications of formal methods in hardware and system verification. FMCAD provides a leading forum to researchers in academia and industry for presenting and discussing groundbreaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system design including verification, specification, synthesis, and testing

Dependability-driven Strategies to Improve the Design and Verification of Safety-Critical HDL-based Embedded Systems

[ES] La utilización de sistemas empotrados en cada vez más ámbitos de aplicación está llevando a que su diseño deba enfrentarse a mayores requisitos de rendimiento, consumo de energía y área (PPA). Asimismo, su utilización en aplicaciones críticas provoca que deban cumplir con estrictos requisitos de confiabilidad para garantizar su correcto funcionamiento durante períodos prolongados de tiempo. En particular, el uso de dispositivos lógicos programables de tipo FPGA es un gran desafío desde la perspectiva de la confiabilidad, ya que estos dispositivos son muy sensibles a la radiación. Por todo ello, la confiabilidad debe considerarse como uno de los criterios principales para la toma de decisiones a lo largo del todo flujo de diseño, que debe complementarse con diversos procesos que permitan alcanzar estrictos requisitos de confiabilidad. Primero, la evaluación de la robustez del diseño permite identificar sus puntos débiles, guiando así la definición de mecanismos de tolerancia a fallos. Segundo, la eficacia de los mecanismos definidos debe validarse experimentalmente. Tercero, la evaluación comparativa de la confiabilidad permite a los diseñadores seleccionar los componentes prediseñados (IP), las tecnologías de implementación y las herramientas de diseño (EDA) más adecuadas desde la perspectiva de la confiabilidad. Por último, la exploración del espacio de diseño (DSE) permite configurar de manera óptima los componentes y las herramientas seleccionados, mejorando así la confiabilidad y las métricas PPA de la implementación resultante. Todos los procesos anteriormente mencionados se basan en técnicas de inyección de fallos para evaluar la robustez del sistema diseñado. A pesar de que existe una amplia variedad de técnicas de inyección de fallos, varias problemas aún deben abordarse para cubrir las necesidades planteadas en el flujo de diseño. Aquellas soluciones basadas en simulación (SBFI) deben adaptarse a los modelos de nivel de implementación, teniendo en cuenta la arquitectura de los diversos componentes de la tecnología utilizada. Las técnicas de inyección de fallos basadas en FPGAs (FFI) deben abordar problemas relacionados con la granularidad del análisis para poder localizar los puntos débiles del diseño. Otro desafío es la reducción del coste temporal de los experimentos de inyección de fallos. Debido a la alta complejidad de los diseños actuales, el tiempo experimental dedicado a la evaluación de la confiabilidad puede ser excesivo incluso en aquellos escenarios más simples, mientras que puede ser inviable en aquellos procesos relacionados con la evaluación de múltiples configuraciones alternativas del diseño. Por último, estos procesos orientados a la confiabilidad carecen de un soporte instrumental que permita cubrir el flujo de diseño con toda su variedad de lenguajes de descripción de hardware, tecnologías de implementación y herramientas de diseño. Esta tesis aborda los retos anteriormente mencionados con el fin de integrar, de manera eficaz, estos procesos orientados a la confiabilidad en el flujo de diseño. Primeramente, se proponen nuevos métodos de inyección de fallos que permiten una evaluación de la confiabilidad, precisa y detallada, en diferentes niveles del flujo de diseño. Segundo, se definen nuevas técnicas para la aceleración de los experimentos de inyección que mejoran su coste temporal. Tercero, se define dos estrategias DSE que permiten configurar de manera óptima (desde la perspectiva de la confiabilidad) los componentes IP y las herramientas EDA, con un coste experimental mínimo. Cuarto, se propone un kit de herramientas que automatiza e incorpora con eficacia los procesos orientados a la confiabilidad en el flujo de diseño semicustom. Finalmente, se demuestra la utilidad y eficacia de las propuestas mediante un caso de estudio en el que se implementan tres procesadores empotrados en un FPGA de Xilinx serie 7.[CA] La utilització de sistemes encastats en cada vegada més àmbits d'aplicació està portant al fet que el seu disseny haja d'enfrontar-se a majors requisits de rendiment, consum d'energia i àrea (PPA). Així mateix, la seua utilització en aplicacions crítiques provoca que hagen de complir amb estrictes requisits de confiabilitat per a garantir el seu correcte funcionament durant períodes prolongats de temps. En particular, l'ús de dispositius lògics programables de tipus FPGA és un gran desafiament des de la perspectiva de la confiabilitat, ja que aquests dispositius són molt sensibles a la radiació. Per tot això, la confiabilitat ha de considerar-se com un dels criteris principals per a la presa de decisions al llarg del tot flux de disseny, que ha de complementar-se amb diversos processos que permeten aconseguir estrictes requisits de confiabilitat. Primer, l'avaluació de la robustesa del disseny permet identificar els seus punts febles, guiant així la definició de mecanismes de tolerància a fallades. Segon, l'eficàcia dels mecanismes definits ha de validar-se experimentalment. Tercer, l'avaluació comparativa de la confiabilitat permet als dissenyadors seleccionar els components predissenyats (IP), les tecnologies d'implementació i les eines de disseny (EDA) més adequades des de la perspectiva de la confiabilitat. Finalment, l'exploració de l'espai de disseny (DSE) permet configurar de manera òptima els components i les eines seleccionats, millorant així la confiabilitat i les mètriques PPA de la implementació resultant. Tots els processos anteriorment esmentats es basen en tècniques d'injecció de fallades per a poder avaluar la robustesa del sistema dissenyat. A pesar que existeix una àmplia varietat de tècniques d'injecció de fallades, diverses problemes encara han d'abordar-se per a cobrir les necessitats plantejades en el flux de disseny. Aquelles solucions basades en simulació (SBFI) han d'adaptar-se als models de nivell d'implementació, tenint en compte l'arquitectura dels diversos components de la tecnologia utilitzada. Les tècniques d'injecció de fallades basades en FPGAs (FFI) han d'abordar problemes relacionats amb la granularitat de l'anàlisi per a poder localitzar els punts febles del disseny. Un altre desafiament és la reducció del cost temporal dels experiments d'injecció de fallades. A causa de l'alta complexitat dels dissenys actuals, el temps experimental dedicat a l'avaluació de la confiabilitat pot ser excessiu fins i tot en aquells escenaris més simples, mentre que pot ser inviable en aquells processos relacionats amb l'avaluació de múltiples configuracions alternatives del disseny. Finalment, aquests processos orientats a la confiabilitat manquen d'un suport instrumental que permeta cobrir el flux de disseny amb tota la seua varietat de llenguatges de descripció de maquinari, tecnologies d'implementació i eines de disseny. Aquesta tesi aborda els reptes anteriorment esmentats amb la finalitat d'integrar, de manera eficaç, aquests processos orientats a la confiabilitat en el flux de disseny. Primerament, es proposen nous mètodes d'injecció de fallades que permeten una avaluació de la confiabilitat, precisa i detallada, en diferents nivells del flux de disseny. Segon, es defineixen noves tècniques per a l'acceleració dels experiments d'injecció que milloren el seu cost temporal. Tercer, es defineix dues estratègies DSE que permeten configurar de manera òptima (des de la perspectiva de la confiabilitat) els components IP i les eines EDA, amb un cost experimental mínim. Quart, es proposa un kit d'eines (DAVOS) que automatitza i incorpora amb eficàcia els processos orientats a la confiabilitat en el flux de disseny semicustom. Finalment, es demostra la utilitat i eficàcia de les propostes mitjançant un cas d'estudi en el qual s'implementen tres processadors encastats en un FPGA de Xilinx serie 7.[EN] Embedded systems are steadily extending their application areas, dealing with increasing requirements in performance, power consumption, and area (PPA). Whenever embedded systems are used in safety-critical applications, they must also meet rigorous dependability requirements to guarantee their correct operation during an extended period of time. Meeting these requirements is especially challenging for those systems that are based on Field Programmable Gate Arrays (FPGAs), since they are very susceptible to Single Event Upsets. This leads to increased dependability threats, especially in harsh environments. In such a way, dependability should be considered as one of the primary criteria for decision making throughout the whole design flow, which should be complemented by several dependability-driven processes. First, dependability assessment quantifies the robustness of hardware designs against faults and identifies their weak points. Second, dependability-driven verification ensures the correctness and efficiency of fault mitigation mechanisms. Third, dependability benchmarking allows designers to select (from a dependability perspective) the most suitable IP cores, implementation technologies, and electronic design automation (EDA) tools. Finally, dependability-aware design space exploration (DSE) allows to optimally configure the selected IP cores and EDA tools to improve as much as possible the dependability and PPA features of resulting implementations. The aforementioned processes rely on fault injection testing to quantify the robustness of the designed systems. Despite nowadays there exists a wide variety of fault injection solutions, several important problems still should be addressed to better cover the needs of a dependability-driven design flow. In particular, simulation-based fault injection (SBFI) should be adapted to implementation-level HDL models to take into account the architecture of diverse logic primitives, while keeping the injection procedures generic and low-intrusive. Likewise, the granularity of FPGA-based fault injection (FFI) should be refined to the enable accurate identification of weak points in FPGA-based designs. Another important challenge, that dependability-driven processes face in practice, is the reduction of SBFI and FFI experimental effort. The high complexity of modern designs raises the experimental effort beyond the available time budgets, even in simple dependability assessment scenarios, and it becomes prohibitive in presence of alternative design configurations. Finally, dependability-driven processes lack an instrumental support covering the semicustom design flow in all its variety of description languages, implementation technologies, and EDA tools. Existing fault injection tools only partially cover the individual stages of the design flow, being usually specific to a particular design representation level and implementation technology. This work addresses the aforementioned challenges by efficiently integrating dependability-driven processes into the design flow. First, it proposes new SBFI and FFI approaches that enable an accurate and detailed dependability assessment at different levels of the design flow. Second, it improves the performance of dependability-driven processes by defining new techniques for accelerating SBFI and FFI experiments. Third, it defines two DSE strategies that enable the optimal dependability-aware tuning of IP cores and EDA tools, while reducing as much as possible the robustness evaluation effort. Fourth, it proposes a new toolkit (DAVOS) that automates and seamlessly integrates the aforementioned dependability-driven processes into the semicustom design flow. Finally, it illustrates the usefulness and efficiency of these proposals through a case study consisting of three soft-core embedded processors implemented on a Xilinx 7-series SoC FPGA.Tuzov, I. (2020). Dependability-driven Strategies to Improve the Design and Verification of Safety-Critical HDL-based Embedded Systems [Tesis doctoral]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/159883TESI

Receptive fields optimization in deep learning for enhanced interpretability, diversity, and resource efficiency.

In both supervised and unsupervised learning settings, deep neural networks (DNNs) are known to perform hierarchical and discriminative representation of data. They are capable of automatically extracting excellent hierarchy of features from raw data without the need for manual feature engineering. Over the past few years, the general trend has been that DNNs have grown deeper and larger, amounting to huge number of final parameters and highly nonlinear cascade of features, thus improving the flexibility and accuracy of resulting models. In order to account for the scale, diversity and the difficulty of data DNNs learn from, the architectural complexity and the excessive number of weights are often deliberately built in into their design. This flexibility and performance usually come with high computational and memory demands both during training and inference. In addition, insight into the mappings DNN models perform and human ability to understand them still remain very limited. This dissertation addresses some of these limitations by balancing three conflicting objectives: computational/ memory demands, interpretability, and accuracy. This dissertation first introduces some unsupervised feature learning methods in a broader context of dictionary learning. It also sets the tone for deep autoencoder learning and constraints for data representations in light of removing some of the aforementioned bottlenecks such as the feature interpretability of deep learning models with nonnegativity constraints on receptive fields. In addition, the two main classes of solution to the drawbacks associated with overparameterization/ over-complete representation in deep learning models are also presented. Subsequently, two novel methods, one for each solution class, are presented to address the problems resulting from over-complete representation exhibited by most deep learning models. The first method is developed to achieve inference-cost-efficient models via elimination of redundant features with negligible deterioration of prediction accuracy. This is important especially for deploying deep learning models into resource-limited portable devices. The second method aims at diversifying the features of DNNs in the learning phase to improve their performance without undermining their size and capacity. Lastly, feature diversification is considered to stabilize adversarial learning and extensive experimental outcomes show that these methods have the potential of advancing the current state-of-the-art on different learning tasks and benchmark datasets

Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems

Error Detection and Diagnosis for System-on-Chip in Space Applications

Tesis por compendio de publicacionesLos componentes electrónicos comerciales, comúnmente llamados componentes Commercial-Off-The-Shelf (COTS) están presentes en multitud de dispositivos habituales en nuestro día a día. Particularmente, el uso de microprocesadores y sistemas en chip (SoC) altamente integrados ha favorecido la aparición de dispositivos electrónicos cada vez más inteligentes que sostienen el estilo de vida y el avance de la sociedad moderna. Su uso se ha generalizado incluso en aquellos sistemas que se consideran críticos para la seguridad, como vehículos, aviones, armamento, dispositivos médicos, implantes o centrales eléctricas. En cualquiera de ellos, un fallo podría tener graves consecuencias humanas o económicas. Sin embargo, todos los sistemas electrónicos conviven constantemente con factores internos y externos que pueden provocar fallos en su funcionamiento. La capacidad de un sistema para funcionar correctamente en presencia de fallos se denomina tolerancia a fallos, y es un requisito en el diseño y operación de sistemas críticos. Los vehículos espaciales como satélites o naves espaciales también hacen uso de microprocesadores para operar de forma autónoma o semi autónoma durante su vida útil, con la dificultad añadida de que no pueden ser reparados en órbita, por lo que se consideran sistemas críticos. Además, las duras condiciones existentes en el espacio, y en particular los efectos de la radiación, suponen un gran desafío para el correcto funcionamiento de los dispositivos electrónicos. Concretamente, los fallos transitorios provocados por radiación (conocidos como soft errors) tienen el potencial de ser una de las mayores amenazas para la fiabilidad de un sistema en el espacio. Las misiones espaciales de gran envergadura, típicamente financiadas públicamente como en el caso de la NASA o la Agencia Espacial Europea (ESA), han tenido históricamente como requisito evitar el riesgo a toda costa por encima de cualquier restricción de coste o plazo. Por ello, la selección de componentes resistentes a la radiación (rad-hard) específicamente diseñados para su uso en el espacio ha sido la metodología imperante en el paradigma que hoy podemos denominar industria espacial tradicional, u Old Space. Sin embargo, los componentes rad-hard tienen habitualmente un coste mucho más alto y unas prestaciones mucho menores que otros componentes COTS equivalentes. De hecho, los componentes COTS ya han sido utilizados satisfactoriamente en misiones de la NASA o la ESA cuando las prestaciones requeridas por la misión no podían ser cubiertas por ningún componente rad-hard existente. En los últimos años, el acceso al espacio se está facilitando debido en gran parte a la entrada de empresas privadas en la industria espacial. Estas empresas no siempre buscan evitar el riesgo a toda costa, sino que deben perseguir una rentabilidad económica, por lo que hacen un balance entre riesgo, coste y plazo mediante gestión del riesgo en un paradigma denominado Nuevo Espacio o New Space. Estas empresas a menudo están interesadas en entregar servicios basados en el espacio con las máximas prestaciones y el mayor beneficio posibles, para lo cual los componentes rad-hard son menos atractivos debido a su mayor coste y menores prestaciones que los componentes COTS existentes. Sin embargo, los componentes COTS no han sido específicamente diseñados para su uso en el espacio y típicamente no incluyen técnicas específicas para evitar que los efectos de la radiación afecten su funcionamiento. Los componentes COTS se comercializan tal cual son, y habitualmente no es posible modificarlos para mejorar su resistencia a la radiación. Además, los elevados niveles de integración de los sistemas en chip (SoC) complejos de altas prestaciones dificultan su observación y la aplicación de técnicas de tolerancia a fallos. Este problema es especialmente relevante en el caso de los microprocesadores. Por tanto, existe un gran interés en el desarrollo de técnicas que permitan conocer y mejorar el comportamiento de los microprocesadores COTS bajo radiación sin modificar su arquitectura y sin interferir en su funcionamiento para facilitar su uso en el espacio y con ello maximizar las prestaciones de las misiones espaciales presentes y futuras. En esta Tesis se han desarrollado técnicas novedosas para detectar, diagnosticar y mitigar los errores producidos por radiación en microprocesadores y sistemas en chip (SoC) comerciales, utilizando la interfaz de traza como punto de observación. La interfaz de traza es un recurso habitual en los microprocesadores modernos, principalmente enfocado a soportar las tareas de desarrollo y depuración del software durante la fase de diseño. Sin embargo, una vez el desarrollo ha concluido, la interfaz de traza típicamente no se utiliza durante la fase operativa del sistema, por lo que puede ser reutilizada sin coste. La interfaz de traza constituye un punto de conexión viable para observar el comportamiento de un microprocesador de forma no intrusiva y sin interferir en su funcionamiento. Como resultado de esta Tesis se ha desarrollado un módulo IP capaz de recabar y decodificar la información de traza de un microprocesador COTS moderno de altas prestaciones. El IP es altamente configurable y personalizable para adaptarse a diferentes aplicaciones y tipos de procesadores. Ha sido diseñado y validado utilizando el dispositivo Zynq-7000 de Xilinx como plataforma de desarrollo, que constituye un dispositivo COTS de interés en la industria espacial. Este dispositivo incluye un procesador ARM Cortex-A9 de doble núcleo, que es representativo del conjunto de microprocesadores hard-core modernos de altas prestaciones. El IP resultante es compatible con la tecnología ARM CoreSight, que proporciona acceso a información de traza en los microprocesadores ARM. El IP incorpora técnicas para detectar errores en el flujo de ejecución y en los datos de la aplicación ejecutada utilizando la información de traza, en tiempo real y con muy baja latencia. El IP se ha validado en campañas de inyección de fallos y también en radiación con protones y neutrones en instalaciones especializadas. También se ha combinado con otras técnicas de tolerancia a fallos para construir técnicas híbridas de mitigación de errores. Los resultados experimentales obtenidos demuestran su alta capacidad de detección y potencialidad en el diagnóstico de errores producidos por radiación. El resultado de esta Tesis, desarrollada en el marco de un Doctorado Industrial entre la Universidad Carlos III de Madrid (UC3M) y la empresa Arquimea, se ha transferido satisfactoriamente al entorno empresarial en forma de un proyecto financiado por la Agencia Espacial Europea para continuar su desarrollo y posterior explotación.Commercial electronic components, also known as Commercial-Off-The-Shelf (COTS), are present in a wide variety of devices commonly used in our daily life. Particularly, the use of microprocessors and highly integrated System-on-Chip (SoC) devices has fostered the advent of increasingly intelligent electronic devices which sustain the lifestyles and the progress of modern society. Microprocessors are present even in safety-critical systems, such as vehicles, planes, weapons, medical devices, implants, or power plants. In any of these cases, a fault could involve severe human or economic consequences. However, every electronic system deals continuously with internal and external factors that could provoke faults in its operation. The capacity of a system to operate correctly in presence of faults is known as fault-tolerance, and it becomes a requirement in the design and operation of critical systems. Space vehicles such as satellites or spacecraft also incorporate microprocessors to operate autonomously or semi-autonomously during their service life, with the additional difficulty that they cannot be repaired once in-orbit, so they are considered critical systems. In addition, the harsh conditions in space, and specifically radiation effects, involve a big challenge for the correct operation of electronic devices. In particular, radiation-induced soft errors have the potential to become one of the major risks for the reliability of systems in space. Large space missions, typically publicly funded as in the case of NASA or European Space Agency (ESA), have followed historically the requirement to avoid the risk at any expense, regardless of any cost or schedule restriction. Because of that, the selection of radiation-resistant components (known as rad-hard) specifically designed to be used in space has been the dominant methodology in the paradigm of traditional space industry, also known as “Old Space”. However, rad-hard components have commonly a much higher associated cost and much lower performance that other equivalent COTS devices. In fact, COTS components have already been used successfully by NASA and ESA in missions that requested such high performance that could not be satisfied by any available rad-hard component. In the recent years, the access to space is being facilitated in part due to the irruption of private companies in the space industry. Such companies do not always seek to avoid the risk at any cost, but they must pursue profitability, so they perform a trade-off between risk, cost, and schedule through risk management in a paradigm known as “New Space”. Private companies are often interested in deliver space-based services with the maximum performance and maximum benefit as possible. With such objective, rad-hard components are less attractive than COTS due to their higher cost and lower performance. However, COTS components have not been specifically designed to be used in space and typically they do not include specific techniques to avoid or mitigate the radiation effects in their operation. COTS components are commercialized “as is”, so it is not possible to modify them to improve their susceptibility to radiation effects. Moreover, the high levels of integration of complex, high-performance SoC devices hinder their observability and the application of fault-tolerance techniques. This problem is especially relevant in the case of microprocessors. Thus, there is a growing interest in the development of techniques allowing to understand and improve the behavior of COTS microprocessors under radiation without modifying their architecture and without interfering with their operation. Such techniques may facilitate the use of COTS components in space and maximize the performance of present and future space missions. In this Thesis, novel techniques have been developed to detect, diagnose, and mitigate radiation-induced errors in COTS microprocessors and SoCs using the trace interface as an observation point. The trace interface is a resource commonly found in modern microprocessors, mainly intended to support software development and debugging activities during the design phase. However, it is commonly left unused during the operational phase of the system, so it can be reused with no cost. The trace interface constitutes a feasible connection point to observe microprocessor behavior in a non-intrusive manner and without disturbing processor operation. As a result of this Thesis, an IP module has been developed capable to gather and decode the trace information of a modern, high-end, COTS microprocessor. The IP is highly configurable and customizable to support different applications and processor types. The IP has been designed and validated using the Xilinx Zynq-7000 device as a development platform, which is an interesting COTS device for the space industry. This device features a dual-core ARM Cortex-A9 processor, which is a good representative of modern, high-end, hard-core microprocessors. The resulting IP is compatible with the ARM CoreSight technology, which enables access to trace information in ARM microprocessors. The IP is able to detect errors in the execution flow of the microprocessor and in the application data using trace information, in real time and with very low latency. The IP has been validated in fault injection campaigns and also under proton and neutron irradiation campaigns in specialized facilities. It has also been combined with other fault-tolerance techniques to build hybrid error mitigation approaches. Experimental results demonstrate its high detection capabilities and high potential for the diagnosis of radiation-induced errors. The result of this Thesis, developed in the framework of an Industrial Ph.D. between the University Carlos III of Madrid (UC3M) and the company Arquimea, has been successfully transferred to the company business as a project sponsored by European Space Agency to continue its development and subsequent commercialization.Programa de Doctorado en Ingeniería Eléctrica, Electrónica y Automática por la Universidad Carlos III de MadridPresidenta: María Luisa López Vallejo.- Secretario: Enrique San Millán Heredia.- Vocal: Luigi Di Lill