58 research outputs found

    Exploiting Bounds Optimization for the Semi-formal Verification of Analog Circuits

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    This paper proposes a semi-formal methodology for modeling and verification of analog circuits behavioral properties using multivariate optimization techniques. Analog circuit differential models are automatically extracted and their qualitative behavior is computed for interval-valued parameters, inputs and initial conditions. The method has the advantage of guaranteeing the rough enclosure of any possible dynamical behavior of analog circuits. The circuit behavioral properties are then verified on the generated transient response bounds. Experimental results show that the resulting state variable envelopes can be effectively employed for a sound verification of analog circuit properties, in an acceptable run-time

    New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs

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    Tesis por compendio[EN] Relevance of electronics towards safety of common devices has only been growing, as an ever growing stake of the functionality is assigned to them. But of course, this comes along the constant need for higher performances to fulfill such functionality requirements, while keeping power and budget low. In this scenario, industry is struggling to provide a technology which meets all the performance, power and price specifications, at the cost of an increased vulnerability to several types of known faults or the appearance of new ones. To provide a solution for the new and growing faults in the systems, designers have been using traditional techniques from safety-critical applications, which offer in general suboptimal results. In fact, modern embedded architectures offer the possibility of optimizing the dependability properties by enabling the interaction of hardware, firmware and software levels in the process. However, that point is not yet successfully achieved. Advances in every level towards that direction are much needed if flexible, robust, resilient and cost effective fault tolerance is desired. The work presented here focuses on the hardware level, with the background consideration of a potential integration into a holistic approach. The efforts in this thesis have focused several issues: (i) to introduce additional fault models as required for adequate representativity of physical effects blooming in modern manufacturing technologies, (ii) to provide tools and methods to efficiently inject both the proposed models and classical ones, (iii) to analyze the optimum method for assessing the robustness of the systems by using extensive fault injection and later correlation with higher level layers in an effort to cut development time and cost, (iv) to provide new detection methodologies to cope with challenges modeled by proposed fault models, (v) to propose mitigation strategies focused towards tackling such new threat scenarios and (vi) to devise an automated methodology for the deployment of many fault tolerance mechanisms in a systematic robust way. The outcomes of the thesis constitute a suite of tools and methods to help the designer of critical systems in his task to develop robust, validated, and on-time designs tailored to his application.[ES] La relevancia que la electrónica adquiere en la seguridad de los productos ha crecido inexorablemente, puesto que cada vez ésta copa una mayor influencia en la funcionalidad de los mismos. Pero, por supuesto, este hecho viene acompañado de una necesidad constante de mayores prestaciones para cumplir con los requerimientos funcionales, al tiempo que se mantienen los costes y el consumo en unos niveles reducidos. En este escenario, la industria está realizando esfuerzos para proveer una tecnología que cumpla con todas las especificaciones de potencia, consumo y precio, a costa de un incremento en la vulnerabilidad a múltiples tipos de fallos conocidos o la introducción de nuevos. Para ofrecer una solución a los fallos nuevos y crecientes en los sistemas, los diseñadores han recurrido a técnicas tradicionalmente asociadas a sistemas críticos para la seguridad, que ofrecen en general resultados sub-óptimos. De hecho, las arquitecturas empotradas modernas ofrecen la posibilidad de optimizar las propiedades de confiabilidad al habilitar la interacción de los niveles de hardware, firmware y software en el proceso. No obstante, ese punto no está resulto todavía. Se necesitan avances en todos los niveles en la mencionada dirección para poder alcanzar los objetivos de una tolerancia a fallos flexible, robusta, resiliente y a bajo coste. El trabajo presentado aquí se centra en el nivel de hardware, con la consideración de fondo de una potencial integración en una estrategia holística. Los esfuerzos de esta tesis se han centrado en los siguientes aspectos: (i) la introducción de modelos de fallo adicionales requeridos para la representación adecuada de efectos físicos surgentes en las tecnologías de manufactura actuales, (ii) la provisión de herramientas y métodos para la inyección eficiente de los modelos propuestos y de los clásicos, (iii) el análisis del método óptimo para estudiar la robustez de sistemas mediante el uso de inyección de fallos extensiva, y la posterior correlación con capas de más alto nivel en un esfuerzo por recortar el tiempo y coste de desarrollo, (iv) la provisión de nuevos métodos de detección para cubrir los retos planteados por los modelos de fallo propuestos, (v) la propuesta de estrategias de mitigación enfocadas hacia el tratamiento de dichos escenarios de amenaza y (vi) la introducción de una metodología automatizada de despliegue de diversos mecanismos de tolerancia a fallos de forma robusta y sistemática. Los resultados de la presente tesis constituyen un conjunto de herramientas y métodos para ayudar al diseñador de sistemas críticos en su tarea de desarrollo de diseños robustos, validados y en tiempo adaptados a su aplicación.[CA] La rellevància que l'electrònica adquireix en la seguretat dels productes ha crescut inexorablement, puix cada volta més aquesta abasta una major influència en la funcionalitat dels mateixos. Però, per descomptat, aquest fet ve acompanyat d'un constant necessitat de majors prestacions per acomplir els requeriments funcionals, mentre es mantenen els costos i consums en uns nivells reduïts. Donat aquest escenari, la indústria està fent esforços per proveir una tecnologia que complisca amb totes les especificacions de potència, consum i preu, tot a costa d'un increment en la vulnerabilitat a diversos tipus de fallades conegudes, i a la introducció de nous tipus. Per oferir una solució a les noves i creixents fallades als sistemes, els dissenyadors han recorregut a tècniques tradicionalment associades a sistemes crítics per a la seguretat, que en general oferixen resultats sub-òptims. De fet, les arquitectures empotrades modernes oferixen la possibilitat d'optimitzar les propietats de confiabilitat en habilitar la interacció dels nivells de hardware, firmware i software en el procés. Tot i això eixe punt no està resolt encara. Es necessiten avanços a tots els nivells en l'esmentada direcció per poder assolir els objectius d'una tolerància a fallades flexible, robusta, resilient i a baix cost. El treball ací presentat se centra en el nivell de hardware, amb la consideració de fons d'una potencial integració en una estratègia holística. Els esforços d'esta tesi s'han centrat en els següents aspectes: (i) la introducció de models de fallada addicionals requerits per a la representació adequada d'efectes físics que apareixen en les tecnologies de fabricació actuals, (ii) la provisió de ferramentes i mètodes per a la injecció eficient del models proposats i dels clàssics, (iii) l'anàlisi del mètode òptim per estudiar la robustesa de sistemes mitjançant l'ús d'injecció de fallades extensiva, i la posterior correlació amb capes de més alt nivell en un esforç per retallar el temps i cost de desenvolupament, (iv) la provisió de nous mètodes de detecció per cobrir els reptes plantejats pels models de fallades proposats, (v) la proposta d'estratègies de mitigació enfocades cap al tractament dels esmentats escenaris d'amenaça i (vi) la introducció d'una metodologia automatitzada de desplegament de diversos mecanismes de tolerància a fallades de forma robusta i sistemàtica. Els resultats de la present tesi constitueixen un conjunt de ferramentes i mètodes per ajudar el dissenyador de sistemes crítics en la seua tasca de desenvolupament de dissenys robustos, validats i a temps adaptats a la seua aplicació.Espinosa García, J. (2016). New Fault Detection, Mitigation and Injection Strategies for Current and Forthcoming Challenges of HW Embedded Designs [Tesis doctoral no publicada]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/73146TESISCompendi

    Surrogate based Optimization and Verification of Analog and Mixed Signal Circuits

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    Nonlinear Analog and Mixed Signal (AMS) circuits are very complex and expensive to design and verify. Deeper technology scaling has made these designs susceptible to noise and process variations which presents a growing concern due to the degradation in the circuit performances and risks of design failures. In fact, due to process parameters, AMS circuits like phase locked loops may present chaotic behavior that can be confused with noisy behavior. To design and verify circuits, current industrial designs rely heavily on simulation based verification and knowledge based optimization techniques. However, such techniques lack mathematical rigor necessary to catch up with the growing design constraints besides being computationally intractable. Given all aforementioned barriers, new techniques are needed to ensure that circuits are robust and optimized despite process variations and possible chaotic behavior. In this thesis, we develop a methodology for optimization and verification of AMS circuits advancing three frontiers in the variability-aware design flow. The first frontier is a robust circuit sizing methodology wherein a multi-level circuit optimization approach is proposed. The optimization is conducted in two phases. First, a global sizing phase powered by a regional sensitivity analysis to quickly scout the feasible design space that reduces the optimization search. Second, nominal sizing step based on space mapping of two AMS circuits models at different levels of abstraction is developed for the sake of breaking the re-design loop without performance penalties. The second frontier concerns a dynamics verification scheme of the circuit behavior (i.e., study the chaotic vs. stochastic circuit behavior). It is based on a surrogate generation approach and a statistical proof by contradiction technique using Gaussian Kernel measure in the state space domain. The last frontier focus on quantitative verification approaches to predict parametric yield for both a single and multiple circuit performance constraints. The single performance approach is based on a combination of geometrical intertwined reachability analysis and a non-parametric statistical verification scheme. On the other hand, the multiple performances approach involves process parameter reduction, state space based pattern matching, and multiple hypothesis testing procedures. The performance of the proposed methodology is demonstrated on several benchmark analog and mixed signal circuits. The optimization approach greatly improves computational efficiency while locating a comparable/better design point than other approaches. Moreover, great improvements were achieved using our verification methods with many orders of speedup compared to existing techniques

    Algorithms for Verification of Analog and Mixed-Signal Integrated Circuits

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    Over the past few decades, the tremendous growth in the complexity of analog and mixed-signal (AMS) systems has posed great challenges to AMS verification, resulting in a rapidly growing verification gap. Existing formal methods provide appealing completeness and reliability, yet they suffer from their limited efficiency and scalability. Data oriented machine learning based methods offer efficient and scalable solutions but do not guarantee completeness or full coverage. Additionally, the trend towards shorter time to market for AMS chips urges the development of efficient verification algorithms to accelerate with the joint design and testing phases. This dissertation envisions a hierarchical and hybrid AMS verification framework by consolidating assorted algorithms to embrace efficiency, scalability and completeness in a statistical sense. Leveraging diverse advantages from various verification techniques, this dissertation develops algorithms in different categories. In the context of formal methods, this dissertation proposes a generic and comprehensive model abstraction paradigm to model AMS content with a unifying analog representation. Moreover, an algorithm is proposed to parallelize reachability analysis by decomposing AMS systems into subsystems with lower complexity, and dividing the circuit's reachable state space exploration, which is formulated as a satisfiability problem, into subproblems with a reduced number of constraints. The proposed modeling method and the hierarchical parallelization enhance the efficiency and scalability of reachability analysis for AMS verification. On the subject of learning based method, the dissertation proposes to convert the verification problem into a binary classification problem solved using support vector machine (SVM) based learning algorithms. To reduce the need of simulations for training sample collection, an active learning strategy based on probabilistic version space reduction is proposed to perform adaptive sampling. An expansion of the active learning strategy for the purpose of conservative prediction is leveraged to minimize the occurrence of false negatives. Moreover, another learning based method is proposed to characterize AMS systems with a sparse Bayesian learning regression model. An implicit feature weighting mechanism based on the kernel method is embedded in the Bayesian learning model for concurrent quantification of influence of circuit parameters on the targeted specification, which can be efficiently solved in an iterative method similar to the expectation maximization (EM) algorithm. Besides, the achieved sparse parameter weighting offers favorable assistance to design analysis and test optimization

    Adaptive Integrated Circuit Design for Variation Resilience and Security

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    The past few decades witness the burgeoning development of integrated circuit in terms of process technology scaling. Along with the tremendous benefits coming from the scaling, challenges are also presented in various stages. During the design time, the complexity of developing a circuit with millions to billions of smaller size transistors is extended after the variations are taken into account. The difficulty of analyzing these nondeterministic properties makes the allocation scheme of redundant resource hardly work in a cost-efficient way. Besides fabrication variations, analog circuits are suffered from severe performance degradations owing to their physical attributes which are vulnerable to aging effects. As such, the post-silicon calibration approach gains increasing attentions to compensate the performance mismatch. For the user-end applications, additional system failures result from the pirated and counterfeited devices provided by the untrusted semiconductor supply chain. Again analog circuits show their weakness to this threat due to the shortage of piracy avoidance techniques. In this dissertation, we propose three adaptive integrated circuit designs to overcome these challenges respectively. The first one investigates the variability-aware gate implementation with the consideration of the overhead control of adaptivity assignment. This design improves the variation resilience typically for digital circuits while optimizing the power consumption and timing yield. The second design is implemented as a self-validation system for the calibration of diverse analog circuits. The system is completely integrated on chip to enhance the convenience without external assistance. In the last design, a classic analog component is further studied to establish the configurable locking mechanism for analog circuits. The use of Satisfiability Modulo Theories addresses the difficulty of searching the unique unlocking pattern of non-Boolean variables

    Design and Field Test of a WSN Platform Prototype for Long-Term Environmental Monitoring

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    Long-term wildfire monitoring using distributed in situ temperature sensors is an accurate, yet demanding environmental monitoring application, which requires long-life, low-maintenance, low-cost sensors and a simple, fast, error-proof deployment procedure. We present in this paper the most important design considerations and optimizations of all elements of a low-cost WSN platform prototype for long-term, low-maintenance pervasive wildfire monitoring, its preparation for a nearly three-month field test, the analysis of the causes of failure during the test and the lessons learned for platform improvement. The main components of the total cost of the platform (nodes, deployment and maintenance) are carefully analyzed and optimized for this application. The gateways are designed to operate with resources that are generally used for sensor nodes, while the requirements and cost of the sensor nodes are significantly lower. We define and test in simulation and in the field experiment a simple, but effective communication protocol for this application. It helps to lower the cost of the nodes and field deployment procedure, while extending the theoretical lifetime of the sensor nodes to over 16 years on a single 1 Ah lithium battery

    Proceedings of the 21st Conference on Formal Methods in Computer-Aided Design – FMCAD 2021

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    The Conference on Formal Methods in Computer-Aided Design (FMCAD) is an annual conference on the theory and applications of formal methods in hardware and system verification. FMCAD provides a leading forum to researchers in academia and industry for presenting and discussing groundbreaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system design including verification, specification, synthesis, and testing

    On Information-centric Resiliency and System-level Security in Constrained, Wireless Communication

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    The Internet of Things (IoT) interconnects many heterogeneous embedded devices either locally between each other, or globally with the Internet. These things are resource-constrained, e.g., powered by battery, and typically communicate via low-power and lossy wireless links. Communication needs to be secured and relies on crypto-operations that are often resource-intensive and in conflict with the device constraints. These challenging operational conditions on the cheapest hardware possible, the unreliable wireless transmission, and the need for protection against common threats of the inter-network, impose severe challenges to IoT networks. In this thesis, we advance the current state of the art in two dimensions. Part I assesses Information-centric networking (ICN) for the IoT, a network paradigm that promises enhanced reliability for data retrieval in constrained edge networks. ICN lacks a lower layer definition, which, however, is the key to enable device sleep cycles and exclusive wireless media access. This part of the thesis designs and evaluates an effective media access strategy for ICN to reduce the energy consumption and wireless interference on constrained IoT nodes. Part II examines the performance of hardware and software crypto-operations, executed on off-the-shelf IoT platforms. A novel system design enables the accessibility and auto-configuration of crypto-hardware through an operating system. One main focus is the generation of random numbers in the IoT. This part of the thesis further designs and evaluates Physical Unclonable Functions (PUFs) to provide novel randomness sources that generate highly unpredictable secrets, on low-cost devices that lack hardware-based security features. This thesis takes a practical view on the constrained IoT and is accompanied by real-world implementations and measurements. We contribute open source software, automation tools, a simulator, and reproducible measurement results from real IoT deployments using off-the-shelf hardware. The large-scale experiments in an open access testbed provide a direct starting point for future research
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