A Wide Band Adaptive All Digital Phase Locked Loop With Self Jitter Measurement And Calibration

The expanding growth of mobile products and services has led to various wireless communication standards that employ different spectrum bands and protocols to provide data, voice or video communication services. Software deffned radio and cognitive radio are emerging techniques that can dynamically integrate various standards to provide seamless global coverage, including global roaming across geographical regions, and interfacing with different wireless networks. In software deffned radio and cognitive radio, one of the most critical RF blocks that need to exhibit frequency agility is the phase lock loop (PLL) frequency synthesizer. In order to access various standards, the frequency synthesizer needs to have wide frequency tuning range, fast tuning speed, and low phase noise and frequency spur. The traditional analog charge pump frequency synthesizer circuit design is becoming diffcult due to the continuous down-scalings of transistor feature size and power supply voltage. The goal of this project was to develop an all digital phase locked loop (ADPLL) as the alternative solution technique in RF transceivers by taking advantage of digital circuitry\u27s characteristic features of good scalability, robustness against process variation and high noise margin. The targeted frequency bands for our ADPLL design included 880MHz-960MHz, 1.92GHz-2.17GHz, 2.3GHz-2.7GHz, 3.3GHz-3.8GHz and 5.15GHz-5.85GHz that are used by wireless communication standards such as GSM, UMTS, bluetooth, WiMAX and Wi-Fi etc. This project started with the system level model development for characterizing ADPLL phase noise, fractional spur and locking speed. Then an on-chip jitter detector and parameter adapter was designed for ADPLL to perform self-tuning and self-calibration to accomplish high frequency purity and fast frequency locking in each frequency band. A novel wide band DCO is presented for multi-band wireless application. The proposed wide band adaptive ADPLL was implemented in the IBM 0.13µm CMOS technology. The phase noise performance, the frequency locking speed as well as the tuning range of the digitally controlled oscillator was assessed and agrees well with the theoretical analysis

A Bang-Bang All-Digital PLL for Frequency Synthesis

abstract: Phase locked loops are an integral part of any electronic system that requires a clock signal and find use in a broad range of applications such as clock and data recovery circuits for high speed serial I/O and frequency synthesizers for RF transceivers and ADCs. Traditionally, PLLs have been primarily analog in nature and since the development of the charge pump PLL, they have almost exclusively been analog. Recently, however, much research has been focused on ADPLLs because of their scalability, flexibility and higher noise immunity. This research investigates some of the latest all-digital PLL architectures and discusses the qualities and tradeoffs of each. A highly flexible and scalable all-digital PLL based frequency synthesizer is implemented in 180 nm CMOS process. This implementation makes use of a binary phase detector, also commonly called a bang-bang phase detector, which has potential of use in high-speed, sub-micron processes due to the simplicity of the phase detector which can be implemented with a simple D flip flop. Due to the nonlinearity introduced by the phase detector, there are certain performance limitations. This architecture incorporates a separate frequency control loop which can alleviate some of these limitations, such as lock range and acquisition time.Dissertation/ThesisM.S. Electrical Engineering 201

A high speed serializer/deserializer design

A Serializer/Deserializer (SerDes) is a circuit that converts parallel data into a serial stream and vice versa. It helps solve clock/data skew problems, simplifies data transmission, lowers the power consumption and reduces the chip cost. The goal of this project was to solve the challenges in high speed SerDes design, which included the low jitter design, wide bandwidth design and low power design. A quarter-rate multiplexer/demultiplexer (MUX/DEMUX) was implemented. This quarter-rate structure decreases the required clock frequency from one half to one quarter of the data rate. It is shown that this significantly relaxes the design of the VCO at high speed and achieves lower power consumption. A novel multi-phase LC-ring oscillator was developed to supply a low noise clock to the SerDes. This proposed VCO combined an LC-tank with a ring structure to achieve both wide tuning range (11%) and low phase noise (-110dBc/Hz at 1MHz offset). With this structure, a data rate of 36 Gb/s was realized with a measured peak-to-peak jitter of 10ps using 0.18microm SiGe BiCMOS technology. The power consumption is 3.6W with 3.4V power supply voltage. At a 60 Gb/s data rate the simulated peak-to-peak jitter was 4.8ps using 65nm CMOS technology. The power consumption is 92mW with 2V power supply voltage. A time-to-digital (TDC) calibration circuit was designed to compensate for the phase mismatches among the multiple phases of the PLL clock using a three dimensional fully depleted silicon on insulator (3D FDSOI) CMOS process. The 3D process separated the analog PLL portion from the digital calibration portion into different tiers. This eliminated the noise coupling through the common substrate in the 2D process. Mismatches caused by the vertical tier-to-tier interconnections and the temperature influence in the 3D process were attenuated by the proposed calibration circuit. The design strategy and circuits developed from this dissertation provide significant benefit to both wired and wireless applications

Development of high speed integrated circuit for very high resolution timing measurements

A multi-channel high-precision low-power time-to-digital converter application specific integrated circuit for high energy physics applications has been designed and implemented in a 130 nm CMOS process. To reach a target resolution of 24.4 ps, a novel delay element has been conceived. This nominal resolution has been experimentally verified with a prototype, with a minimum resolution of 19 ps. To further improve the resolution, a new interpolation scheme has been described. The ASIC has been designed to use a reference clock with the LHC bunch crossing frequency of 40MHz and generate all required timing signals internally, to ease to use within the framework of an LHC upgrade. Special care has been taken to minimise the power consumption

Precise Timing of Digital Signals: Circuits and Applications

With the rapid advances in process technologies, the performance of state-of-the-art integrated circuits is improving steadily. The drive for higher performance is accompanied with increased emphasis on meeting timing constraints not only at the design phase but during device operation as well. Fortunately, technology advancements allow for even more precise control of the timing of digital signals, an advantage which can be used to provide solutions that can address some of the emerging timing issues. In this thesis, circuit and architectural techniques for the precise timing of digital signals are explored. These techniques are demonstrated in applications addressing timing issues in modern digital systems. A methodology for slow-speed timing characterization of high-speed pipelined datapaths is proposed. The technique uses a clock-timing circuit to create shifted versions of a slow-speed clock. These clocks control the data flow in the pipeline in the test mode. Test results show that the design provides an average timing resolution of 52.9ps in 0.18μm CMOS technology. Results also demonstrate the ability of the technique to track the performance of high-speed pipelines at a reduced clock frequency and to test the clock-timing circuit itself. In order to achieve higher resolutions than that of an inverter/buffer stage, a differential (vernier) delay line is commonly used. To allow for the design of differential delay lines with programmable delays, a digitally-controlled delay-element is proposed. The delay element is monotonic and achieves a high degree of transfer characteristics' (digital code vs. delay) linearity. Using the proposed delay element, a sub-1ps resolution is demonstrated experimentally in 0.18μm CMOS. The proposed delay element with a fixed delay step of 2ps is used to design a high-precision all-digital phase aligner. High-precision phase alignment has many applications in modern digital systems such as high-speed memory controllers, clock-deskew buffers, and delay and phase-locked loops. The design is based on a differential delay line and a variation tolerant phase detector using redundancy. Experimental results show that the phase aligner's range is from -264ps to +247ps which corresponds to an average delay step of approximately 2.43ps. For various input phase difference values, test results show that the difference is reduced to less than 2ps at the output of the phase aligner. On-chip time measurement is another application that requires precise timing. It has applications in modern automatic test equipment and on-chip characterization of jitter and skew. In order to achieve small conversion time, a flash time-to-digital converter is proposed. Mismatch between the various delay comparators limits the time measurement precision. This is demonstrated through an experiment in which a 6-bit, 2.5ps resolution flash time-to-digital converter provides an effective resolution of only 4-bits. The converter achieves a maximum conversion rate of 1.25GSa/s

A time-based approach for multi-GHz embedded mixed-signal characterization and measurement /

The increasingly more sophisticated systems that are nowadays implemented on a single chip are placing stringent requirements on the test industry. New test strategies, equipment, and methodologies need to be developed to sustain the constant increase in demand for consumer and communication electronics. Techniques for built-in-self-test (BIST) and design-for-test (DFT) strategies have been proven to offer more feasible and economical testing solutions.Previous works have been conducted to perform on-chip testing, characterization, and measurement of signals and components. The current thesis advances those techniques on many levels. In terms of performance, an increase of more than an order of magnitude in speed is achieved. 70-GHz (effective sampling) on-chip oscilloscope is reported, compared to 4-GHz and 10-GHz ones in previous state-of-the-art implementations. Power dissipation is another area where the proposed work offer a superior solution compared to previous alternatives. All the proposed circuits do not exceed a few milliWatts of power dissipation, while performing multi-GHz high-speed signal capture at a medium resolution. Finally, and possibly most importantly, all the proposed circuits for test rely on a different form of signal processing; the time-based approach. It is believed that this approach paves the path to a lot of new techniques and circuit design skills that can be investigated more deeply. As an integral part of the time-based processing approach for GHz signal capture, this thesis verifies the advantages of using time amplification. The use of such amplification in the time domain is materialized with experimental results from three specific integrated circuits achieving different tasks in GHz high-speed in-situ signal measurement and characterization. Advantages of using such time-based approach techniques, when combined with the use of a front-end time amplifier, include noise immunity, the use of synthesizable digital cells, and circuit building blocks that track the technology scaling in terms of area and speed

Time-based noise-shaping techniques for time-to-digital and analog-to-digital converters

In this dissertation, time-based signal processing techniques and their applications in oversampling and noise-shaping data converters are examined. These techniques demonstrate the ability to shift the burden of high performance analog circuits from the compressed voltage-domain to the augmented time-domain. First, the potential of high order noise-shaping and phase-domain feedback in time-to-digital converters (TDCs) is explored. A prototype phase reference, second-order continuous-time delta-sigma TDC for sensor applications was fabricated in 90nm CMOS and achieves 64 dB dynamic range in 1MHz signal bandwidth. Second, an ultra-high performance oscillator-based delta-sigma modulator architecture is investigated. The proposed circuit is a third-order continuous-time PLL-Based Delta-Sigma Modulator with simulated 77 dB SNDR in 40MHz signal bandwidth with OSR of 16, and is fabricated in 65nm CMOS