Offset-calibration with Time-Domain Comparators Using Inversion-mode Varactors

This paper presents a differential time-domain comparator formed by two voltage controlled delay lines, one per input terminal, and a binary phase detector for comparison solving. The propagation delay through the respective lines can be adjusted with a set of digitally-controlled inversion-mode varactors. These varactors provide tuning capabilities to the comparator; feature which can be exploited for offset calibration. This is demonstrated with the implementation of a differential 10-bit SAR-ADC. The design, fabricated in a 0.18μm CMOS process, includes an automatic mechanism for adjusting the capacitance of the varactors in order to calibrate the offset of the whole converter. Correct functionality was measured in all samples.Ministerio de Economía y Competitividad TEC2016-80923-POffice of Naval Research (USA) N0001414135

Time-based, Low-power, Low-offset 5-bit 1 GS/s Flash ADC Design in 65nm CMOS Technology

Low-power, medium resolution, high-speed analog-to-digital converters (ADCs) have always been important block which have abundant applications such as digital signal processors (DSP), imaging sensors, environmental and biomedical monitoring devices. This study presents a low power Flash ADC designed in nanometer complementary metal-oxide semiconductors (CMOS) technology. Time analysis on the output delay of the comparators helps to generate one more bit. The proposed technique reduced the power consumption and chip area substantially in comparison to the previous state-of-the-art work. The proposed ADC was developed in TSMC 65nm CMOS technology. The offset cancellation technique was embedded in the proposed comparator to decrement the static offset of the comparator. Moreover, one more bit was generated without using extra comparators. The proposed ADC achieved 4.1 bits ENOB at input Nyquist frequency. The simulated differential and integral non-linearity static tests were equal to +0.26/-0.17 and +0.22/-0.15, respectively. The ADC consumed 7.7 mW at 1 GHz sampling frequency, achieving 415 fJ/Convstep Figure of Merit (FoM)

Development of a 6-bit 15.625 MHz CMOS two-step flash analog-to-digital converter for a low dead time sub-nanosecond time measurement system

The development of a 6-bit 15.625 MHz CMOS two-step analog-to-digital converter (ADC) is presented. The ADC was developed for use in a low dead time, high-performance, sub-nanosecond time-to-digital converter (TDC). The TDC is part of a new custom CMOS application specific integrated circuit (ASIC) that will be incorporated in the next generation of front-end electronics for high-performance positron emission tomography imaging. The ADC is based upon a two-step flash architecture that reduces the comparator count by a factor-of-two when compared to a traditional flash ADC architecture and thus a significant reduction in area, power dissipation, and input capacitance of the converter is achieved. The converter contains time-interleaved auto-zeroed CMOS comparators. These comparators utilize offset correction in both the preamplifier and the subsequent regenerative latch stage to guarantee good integral and differential non-linearity performance of the converter over extreme process conditions. Also, digital error correction was employed to overcome most of the major metastability problems inherent in flash converters and to guarantee a completely monotonic transfer function. Corrected comparator offset measurements reveal that the CMOS comparator design maintains a worse case input-referred offset of less than 1 mV at conversion rates up to 8 MHz and less than a 2 mV offset at conversion rates as high as 16 MHz while dissipating less than 2.6 mW. Extensive laboratory measurements indicate that the ADC achieves differential and integral non-linearity performance of less than ±1/2 LSB with a 20 mV/LSB resolution. The ADC dissipates 90 mW from a single 5 V supply and occupies a die area of 1.97 mm x 1.13 mm in 0.8 μm CMOS technology

Low power high speed and high accuracy design methodologies for pipeline Analog-to-Digital converters

Different aspects of power optimization of a high-speed, high-accuracy pipeline Analog-to-Digital Converters (ADCs) are considered to satisfy the current and future needs of portable communication devices. First power optimized design strategies for the amplifiers are introduced. Closed form expressions of power w.r.t settling requirements are presented to facilitate a fair comparison and selection of the amplifier structure. Next a new low offset dynamic comparator has been designed. Simulation based sensitivity analysis is performed to demonstrate the robustness of the new comparator with respect to stray capacitances, common mode voltage errors and timing errors. With simplified amplifier power model along with the use of dynamic comparators, a method to optimize the power consumption of a pipeline ADC with kT/C noise constraint is also developed. The total power dependence on capacitor scaling and stage resolution is investigated for a near-optimal solution.;After considering the power requirements of a pipeline ADC, design and statistical modeling of over-range protection requirements is investigated. Closed form statistical expressions for the over-range requirements are developed to assist in the allocation of the error budgets to different pipeline blocks. A new over-range protection algorithm is also developed that relaxes the amplifier design and power requirements.;Finally, two new CMOS Schmitt trigger designs are proposed which can be used as clock inputs for the pipeline ADC. In the new designs, sizing of the feedback inverters is used for independent trip point control. The new designs have also a modest reduction in sensitivity to process variations along with immunity to the kick-back noise without the addition of path delay

A Highly Sensitive CMOS Digital Hall Sensor for Low Magnetic Field Applications

Integrated CMOS Hall sensors have been widely used to measure magnetic fields. However, they are difficult to work with in a low magnetic field environment due to their low sensitivity and large offset. This paper describes a highly sensitive digital Hall sensor fabricated in 0.18 μm high voltage CMOS technology for low field applications. The sensor consists of a switched cross-shaped Hall plate and a novel signal conditioner. It effectively eliminates offset and low frequency 1/f noise by applying a dynamic quadrature offset cancellation technique. The measured results show the optimal Hall plate achieves a high current related sensitivity of about 310 V/AT. The whole sensor has a remarkable ability to measure a minimum ±2 mT magnetic field and output a digital Hall signal in a wide temperature range from −40 °C to 120 °C

Development of a front end ASIC for Dark Matter directional detection with MIMAC

A front end ASIC (BiCMOS-SiGe 0.35 \mum) has been developed within the framework of the MIMAC detector project, which aims at directional detection of non-baryonic Dark Matter. This search strategy requires 3D reconstruction of low energy (a few keV) tracks with a gaseous \muTPC. The development of this front end ASIC is a key point of the project, allowing the 3D track reconstruction. Each ASIC monitors 16 strips of pixels with charge preamplifiers and their time over threshold is provided in real time by current discriminators via two serializing LVDS links working at 320 MHz. The charge is summed over the 16 strips and provided via a shaper. These specifications have been chosen in order to build an auto triggered electronics. An acquisition board and the related software were developed in order to validate this methodology on a prototype chamber. The prototype detector presents an anode where 2 x 96 strips of pixels are monitored.Comment: 12 pages, 10 figure

Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Design of Energy-Efficient A/D Converters with Partial Embedded Equalization for High-Speed Wireline Receiver Applications

As the data rates of wireline communication links increases, channel impairments such as skin effect, dielectric loss, fiber dispersion, reflections and cross-talk become more pronounced. This warrants more interest in analog-to-digital converter (ADC)-based serial link receivers, as they allow for more complex and flexible back-end digital signal processing (DSP) relative to binary or mixed-signal receivers. Utilizing this back-end DSP allows for complex digital equalization and more bandwidth-efficient modulation schemes, while also displaying reduced process/voltage/temperature (PVT) sensitivity. Furthermore, these architectures offer straightforward design translation and can directly leverage the area and power scaling offered by new CMOS technology nodes. However, the power consumption of the ADC front-end and subsequent digital signal processing is a major issue. Embedding partial equalization inside the front-end ADC can potentially result in lowering the complexity of back-end DSP and/or decreasing the ADC resolution requirement, which results in a more energy-effcient receiver. This dissertation presents efficient implementations for multi-GS/s time-interleaved ADCs with partial embedded equalization. First prototype details a 6b 1.6GS/s ADC with a novel embedded redundant-cycle 1-tap DFE structure in 90nm CMOS. The other two prototypes explain more complex 6b 10GS/s ADCs with efficiently embedded feed-forward equalization (FFE) and decision feedback equalization (DFE) in 65nm CMOS. Leveraging a time-interleaved successive approximation ADC architecture, new structures for embedded DFE and FFE are proposed with low power/area overhead. Measurement results over FR4 channels verify the effectiveness of proposed embedded equalization schemes. The comparison of fabricated prototypes against state-of-the-art general-purpose ADCs at similar speed/resolution range shows comparable performances, while the proposed architectures include embedded equalization as well

An offset auto-calibration technique with cost-effective implementation for comparator and operational amplifier

Comparators are one of the most fundamental building blocks in all electronic systems involving analog and digital information. A comparator’s performance, or the accuracy of its output, is determined by the comparator’s offset voltage, which includes random offset and systematic offset. To guarantee the overall performance of an entire electronic system, offset-trimming techniques are often necessary to reduce inaccuracy. This study analyzes the offset errors in a representative comparator structure and describes an auto-calibration technique to systematically and significantly reducing the offset. The auto-calibration technique involves trimming of the comparator input transistor pair. Various trimming-switch structures are considered and compared, such as constant-sized drain switch (CDS), constant-sized gate switch (CGS), constant-sized source switch (CSS), binary-weighted source switch (BSS), and constant size split-source switch (SSS). The comparator and the offset auto-calibration circuits are designed using the GlobalFoundry 0.13μm process. Then an offset trimming algorithm, which is written on MATLAB, is applied to these circuits. Afterwards, the results are collected and analyzed. A comparison of linearity and trimming range (TR) achieved with different trimming switch structures is performed to demonstrate advantages and disadvantages of each switch scheme. The results are also plotted in a histogram to show the normal distribution of each scheme. Finally, offset cancellation technique is implemented in an operational amplifier (Op Amp) circuit with further analysis and comparison to prove the methodology