155 research outputs found

    Equalization-Based Digital Background Calibration Technique for Pipelined ADCs

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    In this paper, we present a digital background calibration technique for pipelined analog-to-digital converters (ADCs). In this scheme, the capacitor mismatch, residue gain error, and amplifier nonlinearity are measured and then corrected in digital domain. It is based on the error estimation with nonprecision calibration signals in foreground mode, and an adaptive linear prediction structure is used to convert the foreground scheme to the background one. The proposed foreground technique utilizes the LMS algorithm to estimate the error coefficients without needing high-accuracy calibration signals. Several simulation results in the context of a 12-b 100-MS/s pipelined ADC are provided to verify the usefulness of the proposed calibration technique. Circuit-level simulation results show that the ADC achieves 28-dB signal-to-noise and distortion ratio and 41-dB spurious-free dynamic range improvement, respectively, compared with the noncalibrated ADC

    A novel digital background calibration technique for 16 bit SHA-less multibit pipelined ADC

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    In this paper, a high resolution of 16 bit and high speed of 125MS/s, multibit Pipelined ADC with digital background calibration is presented. In order to achieve low power, SHA-less front end is used with multibit stages. The first and second stages are used here as a 3.5 bit and the stages from third to seventh are of 2.5 bit and last stage is of 3-bit flash ADC. After bit alignment and truncation of total 19 bits, 16 bits are used as final digital output. To precise the remove linear gain error of the residue amplifier and capacitor mismatching error, a digital background calibration technique is used, which is a combination of signal dependent dithering (SDD) and butterfly shuffler. To improve settling time of residue amplifier, a special circuit of voltage separation is used. With the proposed digital background calibration technique, the spurious-free dynamic range (SFDR) has been improved to 97.74 dB @30 MHz and 88.9 dB @150 MHz, and the signal-to-noise and distortion ratio (SNDR) has been improved to 79.77 dB @ 30 MHz, and 73.5 dB @ 150 MHz. The implementation of the Pipelined ADC has been completed with technology parameters of 0.18μm CMOS process with 1.8 V supply. Total power consumption is 300 mW by the proposed ADC

    A 12b 250 MS/s Pipelined ADC With Virtual Ground Reference Buffers

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    The virtual ground reference buffer (VGRB) technique is introduced as a means to improve the performance of switched-capacitor circuits. The technique enhances the performance by improving the feedback factor of the op-amp without affecting the signal gain. The bootstrapping action of the level-shifting buffers relaxes key op-amp performance requirements including unity-gain bandwidth, noise, open-loop gain and offset compared with conventional circuits. This reduces the design complexity and the power consumption of op-amp based circuits. Based on this technique, a 12 b pipelined ADC is implemented in 65 nm CMOS that achieves 67.0 dB SNDR at 250 MS/s and consumes 49.7 mW of power from a 1.2 V power supply

    Pipelined analog-to-digital conversion using current-mode reference shifting

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    Dissertação para obtenção do grau de Mestre em Engenharia Electrotécnica e de ComputadoresPipeline Analog-to-digital converters (ADCs) are the most popular architecture for high-speed medium-to-high resolution applications. A fundamental, but often unreferenced building block of pipeline ADCs are the reference voltage circuits. They are required to maintain a stable reference with low output impedance to drive large internal switched capacitor loads quickly. Achieving this usually leads to a scheme that consumes a large portion of the overall power and area. A review of the literature shows that the required stable reference can be achieved with either on-chip buffering or with large off-chip decoupling capacitors. On-chip buffering is ideal for system integration but requires a high speed buffer with high power dissipation. The use of a reference with off-chip decoupling results in significant power savings but increases the pads of chip, the count of external components and the overall system cost. Moreover the amount of ringing on the internal reference voltage caused by the series inductance of the package makes this solution not viable for high speed ADCs. To address this challenge, a pipeline ADC employing a multiplying digital-to-analog converter (MDAC) with current-mode reference shifting is presented. Consequently, no reference voltages and, therefore, no voltage buffers are necessary. The bias currents are generated on-chip by a reference current generator that dissipates low power. The proposed ADC is designed in a 65 nm CMOS technology and operates at sampling rates ranging from 10 to 80 MS/s. At 40 MS/s the ADC dissipates 10.8 mW from a 1.2 V power supply and achieves an SNDR of 57.2 dB and a THD of -68 dB, corresponding to an ENOB of 9.2 bit. The corresponding figure of merit is 460 fJ/step

    Basic Block of Pipelined ADC Design Requirements

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    The paper describes design requirements of a basic stage (called MDAC - Multiplying Digital-to- Analog Converter) of a pipelined ADC. There exist error sources such as finite DC gain of opamp, capacitor mismatch, thermal noise, etc., arising when the switched capacitor (SC) technique and CMOS technology are used. These non-idealities are explained and their influences on overall parameters of a pipelined ADC are studied. The pipelined ADC including non-idealities was modeled in MATLAB - Simulink simulation environment

    A 12-bit, 40 msamples/s, low-power, low-area pipeline analog-to-digital converter in CMOS 0.18 mum technology.

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    With advancements in digital signal processing in recent years, the need for high-speed, high-resolution analog-to-digital converters (ADCs) which can be used in the analog front-end has been increasing. Some examples of these applications are image and video signal processing, wireless communications and asymmetrical digital subscriber line (ADSL). In CMOS integrated circuit design, it is desirable to integrate the digital circuit and the ADC in one microchip to reduce the cost of fabrication. Consequently the power dissipation and area of the ADCs are important design factors. The original contributions in this thesis are as follows. Since the performance of pipeline ADCs significantly depends on the op-amps and comparators circuits, the performance of various comparators is analyzed and the effect of op-amp topology on the performance of pipeline ADCs is investigated. This thesis also presents a novel architecture for design of low-power and low-area pipelined ADCs which will be more useful for very low voltage applications in the future. At the schematic level, a low-power CMOS implementation of the current-mode MDAC is presented and an improved voltage comparator is designed. With the proposed design and the optimization methodology it is possible to reduce power dissipation and area compared with conventional fully differential schemes.Dept. of Electrical and Computer Engineering. Paper copy at Leddy Library: Theses & Major Papers - Basement, West Bldg. / Call Number: Thesis2004 .M64. Source: Masters Abstracts International, Volume: 43-01, page: 0281. Adviser: C. Chen. Thesis (M.A.Sc.)--University of Windsor (Canada), 2004
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