Built-In Test Sequence Generation for Synchronous Sequential Circuits Based on Loading and Expansion of Test Subsequences

We describe an on-chip test generation scheme for synchronous sequential circuits that allows at-speed testing of such circuits. The proposed scheme is based on loading of (short) input sequences into an on-chip memory, and expansion of these sequences on-chip into test sequences. Complete coverage of modeled faults is achieved by basing the selection of the loaded sequences on a deterministic test sequence T 0, and ensuring that every fault detected by T 0 is detected by the expanded version of at least one loaded sequence. Experimental results presented for benchmark circuits show that the length of the sequence that needs to be stored at any time is on the average 10 % of the length of T 0, and that the total length of all the loaded sequences is on the average 46 % of the length of T 0. 1

Behavioral synthesis from VHDL using structured modeling

This dissertation describes work in behavioral synthesis involving the development of a VHDL Synthesis System VSS which accepts a VHDL behavioral input specification and performs technology independent synthesis to generate a circuit netlist of generic components. The VHDL language is used for input and output descriptions. An intermediate representation which incorporates signal typing and component attributes simplifies compilation and facilitates design optimization.A Structured Modeling methodology has been developed to suggest standard VHDL modeling practices for synthesis. Structured modeling provides recommendations for the use of available VHDL description styles so that optimal designs will be synthesized.A design composed of generic components is synthesized from the input description through a process of Graph Compilation, Graph Criticism, and Design Compilation. Experiments were performed to demonstrate the effects of different modeling styles on the quality of the design produced by VSS. Several alternative VHDL models were examined for each benchmark, illustrating the improvements in design quality achieved when Structured Modeling guidelines were followed

Build Testbenches for Verification in Shift Register ICs using SystemVerilog

A testbench is built to verify a functionality of a shift register IC (Integrated Circuit) from stuck-at-faults, stuck-at-1 as well as stuck-at-0. The testbench is supported by components, i.e., generator, interface, driver, monitor, scoreboard, environment, test, and testbench top. The IC consists of sequential logic circuits of D-type flip-flops. The faults may occur at interconnects between the circuits inside the IC. In order to examine the functionality from the faults, both the testbench and the IC are designed using SystemVerilog and simulated using Questasim simulator. Simulation results show the faults may be detected by the testbench. Moreover, the detected faults may be indicated by error statements in transcript results of the simulato

The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

Build Testbenches for Verification in Shift Register ICs using SystemVerilog

A testbench is built to verify a functionality of a shift register IC (Integrated Circuit) from stuck-at-faults, stuck-at-1 as well as stuck-at-0. The testbench is supported by components, i.e., generator, interface, driver, monitor, scoreboard, environment, test, and testbench top. The IC consists of sequential logic circuits of D-type flip-flops. The faults may occur at interconnects between the circuits inside the IC. In order to examine the functionality from the faults, both the testbench and the IC are designed using SystemVerilog and simulated using Questasim simulator. Simulation results show the faults may be detected by the testbench. Moreover, the detected faults may be indicated by error statements in transcript results of the simulato

Experimental Evaluation and Comparison of Time-Multiplexed Multi-FPGA Routing Architectures

Emulating large complex designs require multi-FPGA systems (MFS). However, inter-FPGA communication is confronted by the challenge of lack of interconnect capacity due to limited number of FPGA input/output (I/O) pins. Serializing parallel signals onto a single trace effectively addresses the limited I/O pin obstacle. Besides the multiplexing scheme and multiplexing ratio (number of inter-FPGA signals per trace), the choice of the MFS routing architecture also affect the critical path latency. The routing architecture of an MFS is the interconnection pattern of FPGAs, fixed wires and/or programmable interconnect chips. Performance of existing MFS routing architectures is also limited by off-chip interface selection. In this dissertation we proposed novel 2D and 3D latency-optimized time-multiplexed MFS routing architectures. We used rigorous experimental approach and real sequential benchmark circuits to evaluate and compare the proposed and existing MFS routing architectures. This research provides a new insight into the encouraging effects of using off-chip optical interface and three dimensional MFS routing architectures. The vertical stacking results in shorter off-chip links improving the overall system frequency with the additional advantage of smaller footprint area. The proposed 3D architectures employed serialized interconnect between intra-plane and inter-plane FPGAs to address the pin limitation problem. Additionally, all off-chip links are replaced by optical fibers that exhibited latency improvement and resulted in faster MFS. Results indicated that exploiting third dimension provided latency and area improvements as compared to 2D MFS. We also proposed latency-optimized planar 2D MFS architectures in which electrical interconnections are replaced by optical interface in same spatial distribution. Performance evaluation and comparison showed that the proposed architectures have reduced critical path delay and system frequency improvement as compared to conventional MFS. We also experimentally evaluated and compared the system performance of three inter-FPGA communication schemes i.e. Logic Multiplexing, SERDES and MGT in conjunction with two routing architectures i.e. Completely Connected Graph (CCG) and TORUS. Experimental results showed that SERDES attained maximum frequency than the other two schemes. However, for very high multiplexing ratios, the performance of SERDES & MGT became comparable

Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

Генераторы тестов для встроенного самотестирования дискретных устройств

Запропоновано новий метод синтезу генераторів детермінованих тестів для взбудованного самотестування дискретних пристроїв на основі зсувних регістрів з нелінійним зворотним зв'язком та перетворювачем тестових векторів.A new built-in test pattern generation method of precomputed test set is proposed. The pattern generator consists of two component : nonlinear feedback shift register generator and combinational logic to map the outputs of pattern generator