Analysis and application of improved feedthrough logic

Continuous technology scaling and increased frequency of operation of VLSI circuits leads to increase in power density which raises thermal management problem. Therefore design of low power VLSI circuit technique is a challenging task without sacrificing its performance. This thesis presents the design of a low power dynamic circuit using a new CMOS domino logic family called feedthrough (FTL) logic. Dynamic logic circuits are more significant because of its faster speed and lesser transistor requirement as compared to static CMOS logic circuits. The need for faster circuits compels designers to use FTL as compared static and domino CMOS logic and the requirement of output inverter for cascading of various logic blocks in domino logic are eliminated in the proposed design. The proposed circuit for low power (LP-FTL) improves dynamic power consumption as compared to the existing FTL and to further improve its speed we propose another circuit (HS-FTL). This logic family improves speed at the cost of dynamic power consumption and area. Proposed modified FTL circuit families provide better PDP as compared to the existing FTL. Simulation results of both the proposed circuit using 0.18 µm, 1.8 V CMOS process technology indicate that the LP-FTL structure reduces the dynamic power approximately by 42% and the HS-FTL structure achieves a speed up- 1.4 for 10-stage of inverters and 8-bit ripple carry adder in comparison to existing FTL logic. Furthermore, we present various circuit design techniques to improve noise tolerance of the proposed FTL logic families. Noise in deep submicron technology limits the reliability and performance of ICs. The ANTE (average noise threshold energy) metric is used for the analysis of noise tolerance of proposed FTL. A 2-input NAND and NOR gate is designed by the proposed technique. Simulation results for a 2-input NAND gate at 0.18-µm, 1.8 V CMOS process technology show that the proposed noise tolerant circuit achieves 1.79X ANTE improvement along with the reduction in leakage power. Continuous scaling of technology towards the nanometer range significantly increases leakage current level and the effect of noise. This research can be further extended for performance optimization in terms of power, speed, area and noise immunity

Static noise margin analysis for CMOS logic cells in near-threshold

The advancement of semiconductor technology enabled the fabrication of devices with faster switching activity and chips with higher integration density. However, these advances are facing new impediments related to energy and power dissipation. Besides, the increasing demand for portable devices leads the circuit design paradigm to prioritize energy efficiency instead of performance. Altogether, this scenario motivates engineers towards reducing the supply voltage to the near and subthreshold regime to increase the lifespan of battery-powered devices. Even though operating in these regime offer interesting energy-frequency trade-offs, it brings challenges concerning noise tolerance. As the supply voltage reduces, the available noise margins decrease, and circuits become more prone to functional failures. In addition, near and subthreshold circuits are more susceptible to manufacturing variability, hence further aggravating noise issues. Other issues, such as wire minimization and gate fan-out, also contribute to the relevance of evaluating the noise margin of circuits early in the design Accordingly, this work investigates how to improve the static noise margin of digital synchronous circuits that will operate at the near/subthreshold regime. This investigation produces a set of three original contributions. The first is an automated tool to estimate the static noise margin of CMOS combinational cells. The second contribution is a realistic static noise margin estimation methodology that considers process-voltage-temperature variations. Results show that the proposed methodology allows to reduce up to 70% of the static noise margin pessimism. Finally, the third contribution is the noise-aware cell design methodology and the inclusion of a noise evaluation of complex circuits during the logic synthesis. The resulting library achieved higher static noise margin (up to 24%) and less spread among different cells (up to 62%).Os avanços na tecnologia de semicondutores possibilitou que se fabricasse dispositivos com atividade de chaveamento mais rápida e com maior capacidade de integração de transistores. Estes avanços, todavia, impuseram novos empecilhos relacionados com a dissipação de potência e energia. Além disso, a crescente demanda por dispositivos portáteis levaram à uma mudança no paradigma de projeto de circuitos para que se priorize energia ao invés de desempenho. Este cenário motivou à reduzir a tensão de alimentação com qual os dispositivos operam para um regime próximo ou abaixo da tensão de limiar, com o objetivo de aumentar sua duração de bateria. Apesar desta abordagem balancear características de performance e energia, ela traz novos desafios com relação a tolerância à ruído. Ao reduzirmos a tensão de alimentação, também reduz-se a margem de ruído disponível e, assim, os circuitos tornam-se mais suscetíveis à falhas funcionais. Somado à este efeito, circuitos com tensões de alimentação nestes regimes são mais sensíveis à variações do processo de fabricação, logo agravando problemas com ruído. Existem também outros aspectos, tais como a miniaturização das interconexões e a relação de fan-out de uma célula digital, que incentivam a avaliação de ruído nas fases iniciais do projeto de circuitos integrados Por estes motivos, este trabalho investiga como aprimorar a margem de ruído estática de circuitos síncronos digitais que irão operar em tensões no regime de tensão próximo ou abaixo do limiar. Esta investigação produz um conjunto de três contribuições originais. A primeira é uma ferramenta capaz de avaliar automaticamente a margem de ruído estática de células CMOS combinacionais. A segunda contribuição é uma metodologia realista para estimar a margem de ruído estática considerando variações de processo, tensão e temperatura. Os resultados obtidos mostram que a metodologia proposta permitiu reduzir até 70% do pessimismo das margens de ruído estática, Por último, a terceira contribuição é um fluxo de projeto de células combinacionais digitais considerando ruído, e uma abordagem para avaliar a margem de ruído estática de circuitos complexos durante a etapa de síntese lógica. A biblioteca de células resultante deste fluxo obteve maior margem de ruído (até 24%) e menor variação entre diferentes células (até 62%)

Analysis of Dynamic Logic Circuits in Deep Submicron CMOS Technologies

Dynamic logic circuits are utilized to minimize the delay in the critical path of high-performance designs such as the datapath circuits in state-of-the-art microprocessors. However, as integrated circuits (ICs) scale to the very deep submicron (VDSM) regime, dynamic logic becomes susceptible to a variety of failure modes due to decreasing noise margins and increasing leakage currents. The objective of this thesis is to characterize the performance of dynamic logic circuits in VDSM technologies and to evaluate various design strategies to mitigate the effects of leakage currents and small noise margins

Design and Implementation of Novel High Performance Domino Logic

This dissertation presents design and implementation of novel high performance domino logic techniques with increased noise robustness and reduced leakages. The speed and overhead area became the primary parameters of choice for fabrication industry that led to invention of clocked logic styles named as Dynamic logic and Domino logic families. Most importantly, power consumption, noise immunity, speed of operation, area and cost are the predominant parameters for designing any kind of digital logic circuit technique with effective trade-off amongst these parameters depending on the situation and application of design. Because of its high speed and low overhead area domino logic became process of choice for designing of high speed application circuits. The concerning issues are large power consumption and high sensitivity towards noise. Hence, there is a need for designing new domino methodology to meet the requirements by overcoming above mentioned drawbacks which led to ample opportunities for diversified research in this field. Therefore, the outcome of research must be able to handle the primary design parameters efficiently. Besides this, the designed circuit must exhibit high degree of robustness towards noise.In this thesis, few domino logic circuit techniques are proposed to deal with noise and sub-threshold leakages. Effect of signal integrity issues on domino logic techniques is studied. Furthermore, having been subjected to process corner analysis and noise analysis, the overall performance of proposed domino techniques is found to be enhanced despite a few limitations that are mentioned in this work. Besides this, lector based domino and dynamic node stabilized techniques are also proposed and are investigated thoroughly. Simulations show that proposed circuits are showing superior performance. In addition to this, domino based Schmitt triggers with various hysteresis phenomena are designed and simulated. Pre-layout and post-layout simulation results are compared for proposed Schmitt trigger. Simulations reveal that proposed Schmitt trigger techniques are more noise tolerant than CMOS counterparts. Moreover, a test chip for domino based Schmitt trigger is done in UMC 180 nm technology for fabrication

ENHANCEMENT OF MARKOV RANDOM FIELD MECHANISM TO ACHIEVE FAULT-TOLERANCE IN NANOSCALE CIRCUIT DESIGN

As the MOSFET dimensions scale down towards nanoscale level, the reliability of circuits based on these devices decreases. Hence, designing reliable systems using these nano-devices is becoming challenging. Therefore, a mechanism has to be devised that can make the nanoscale systems perform reliably using unreliable circuit components. The solution is fault-tolerant circuit design. Markov Random Field (MRF) is an effective approach that achieves fault-tolerance in integrated circuit design. The previous research on this technique suffers from limitations at the design, simulation and implementation levels. As improvements, the MRF fault-tolerance rules have been validated for a practical circuit example. The simulation framework is extended from thermal to a combination of thermal and random telegraph signal (RTS) noise sources to provide a more rigorous noise environment for the simulation of circuits build on nanoscale technologies. Moreover, an architecture-level improvement has been proposed in the design of previous MRF gates. The redesigned MRF is termed as Improved-MRF. The CMOS, MRF and Improved-MRF designs were simulated under application of highly noisy inputs. On the basis of simulations conducted for several test circuits, it is found that Improved-MRF circuits are 400 whereas MRF circuits are only 10 times more noise-tolerant than the CMOS alternatives. The number of transistors, on the other hand increased from a factor of 9 to 15 from MRF to Improved-MRF respectively (as compared to the CMOS). Therefore, in order to provide a trade-off between reliability and the area overhead required for obtaining a fault-tolerant circuit, a novel parameter called as ‘Reliable Area Index’ (RAI) is introduced in this research work. The value of RAI exceeds around 1.3 and 40 times for MRF and Improved-MRF respectively as compared to CMOS design which makes Improved- MRF to be still 30 times more efficient circuit design than MRF in terms of maintaining a suitable trade-off between reliability and area-consumption of the circuit

Energy Efficient Design for Deep Sub-micron CMOS VLSIs

Over the past decade, low power, energy efficient VLSI design has been the focal point of active research and development. The rapid technology scaling, the growing integration capacity, and the mounting active and leakage power dissipation are contributing to the growing complexity of modern VLSI design. Careful power planning on all design levels is required. This dissertation tackles the low-power, low-energy challenges in deep sub-micron technologies on the architecture and circuit levels. Voltage scaling is one of the most efficient ways for reducing power and energy. For ultra-low voltage operation, a new circuit technique which allows bulk CMOS circuits to work in the sub-0. 5V supply territory is presented. The threshold voltage of the slow PMOS transistor is controlled dynamically to get a lower threshold voltage during the active mode. Due to the reduced threshold voltage, switching speed becomes faster while active leakage current is increased. A technique to dynamically manage active leakage current is presented. Energy reduction resulting from using the proposed structure is demonstrated through simulations of different circuits with different levels of complexity. As technology scales, the mounting leakage current and degraded noise immunity impact performance especially that of high performance dynamic circuits. Dual threshold technology shows a good potential for leakage reduction while meeting performance goals. A model for optimally selecting threshold voltages and transistor sizes in wide fan-in dynamic circuits is presented. On the circuit level, a novel circuit level technique which handles the trade-off between noise immunity and energy dissipation for wide fan-in dynamic circuits is presented. Energy efficiency of the proposed wide fan-in dynamic circuit is further enhanced through efficient low voltage operation. Another direct consequence of technology scaling is the growing impact of interconnect parasitics and process variations on performance. Traditionally, worst case process, parasitics, and environmental conditions are considered. Designing for worst case guarantees a fail-safe operation but requires a large delay and voltage margins. This large margin can be recovered if the design can adapt to the actual silicon conditions. Dynamic voltage scaling is considered a key enabler in reducing such margin. An on-chip process identifier to recover the margin required due to process variations is described. The proposed architecture adjusts supply voltage using a hybrid between the one-time voltage setting and the continuous monitoring modes of operation. The interconnect impact on delay is minimized through a novel adaptive voltage scaling architecture. The proposed system recovers the large delay and voltage margins required by conventional systems by closely tracking the actual critical path at anytime. By tracking the actual critical path, the proposed system is robust and more energy efficient compared to both the conventional open-loop and closed-loop systems

Design and Analysis of Improved Domino Logic with Noise Tolerance and High Performance

The demands of upcoming computing, as well as the challenges of nanometer-era of VLSI design necessitate new digital logic techniques and styles that are at the same time high performance, energy efficient and robust to noise and variation. Dynamic CMOS logic gates are broadly used to design high performance circuits due to their high speed. Conversely, the vital demerit of dynamic logic style is its high noise sensitivity. The main reason for this is the sub-threshold leakage current flowing through the pull down network. With continuous technology scaling, this problem is getting more and more severe. In this thesis, a new noise tolerant dynamic CMOS circuit technique is proposed. In the proposed work, we have enhanced the behavior of the domino CMOS logic. This technique also gets benefit in terms of delay and power. This thesis describes the new low power, noise tolerant and high speed domino logic technique and presents a comparison result of this logic with previously reported schemes. Simulation results prove that, in 180 nm CMOS technology when we used this logic style to realize wide fan-in logic gates, it could achieve maximum level of noise robustness as compared to its basic counterpart. In addition, the logic also works efficiently with sequential circuits. The feasibility of this new technique is demonstrated by means of a real hardware, we have built a custom test-chip in the UMC 180 nm process technology with an ALU core, using the proposed domino logic style for each design block. In this thesis, we have also described the design and implementation of this chip. In addition to this, we have also presented initial power and delay performance comparisons between the circuit level simulated ALU and test-chip implemented in the proposed domino logic style. Finally we conclude that, the thesis contributes a very efficient logic style for wide fan-in gates, which is not only noise robust but also energy efficient and high speed

Circuit designs for low-power and SEU-hardened systems

The desire to have smaller and faster portable devices is one of the primary motivations for technology scaling. Though advancements in device physics are moving at a very good pace, they might not be aggressive enough for now-a-day technology scaling trends. As a result, the MOS devices used for present day integrated circuits are pushed to the limit in terms of performance, power consumption and robustness, which are the most critical criteria for almost all applications. Secondly, technology advancements have led to design of complex chips with increasing chip densities and higher operating speeds. The design of such high performance complex chips (microprocessors, digital signal processors, etc) has massively increased the power dissipation and, as a result, the operating temperatures of these integrated circuits. In addition, due to the aggressive technology scaling the heat withstanding capabilities of the circuits is reducing, thereby increasing the cost of packaging and heat sink units. This led to the increase in prominence for smarter and more robust low-power circuit and system designs. Apart from power consumption, another criterion affected by technology scaling is robustness of the design, particularly for critical applications (security, medical, finance, etc). Thus, the need for error free or error immune designs. Until recently, radiation effects were a major concern in space applications only. With technology scaling reaching nanometer level, terrestrial radiation has become a growing concern. As a result Single Event Upsets (SEUs) have become a major challenge to robust designs. Single event upset is a temporary change in the state of a device due to a particle strike (usually from the radiation belts or from cosmic rays) which may manifest as an error at the output. This thesis proposes a novel method for adaptive digital designs to efficiently work with the lowest possible power consumption. This new technique improves options in performance, robustness and power. The thesis also proposes a new dual data rate flipflop, which reduces the necessary clock speed by half, drastically reducing the power consumption. This new dual data rate flip-flop design culminates in a proposed unique radiation hardened dual data rate flip-flop, Firebird\u27. Firebird offers a valuable addition to the future circuit designs, especially with the increasing importance of the Single Event Upsets (SEUs) and power dissipation with technology scaling.\u2