전원 잡음에 둔감한 고리 발진기와 디지털 위상 동기 회로 설계

학위논문(석사) -- 서울대학교대학원 : 공과대학 전기·정보공학부, 2023. 2. 정덕균.One of the critical blocks integrated into the PAM4-binary bridge, bridging the high-speed DRAM and the low-speed DRAM Tester, is an All-Digital Phase-Locked Loop (ADPLL). Since the transmitter and receiver operate based on the clock signal, whose frequency is doubled compared to the clock signal transmitted from the memory tester by the ADPLL, the ADPLL needs to have a low RMS jitter and high Process-Voltage-Temperature (PVT) tolerance characteristics. However, due to the complex bridge circuit sharing the supply power with the ADPLL, power supply noise (PSN) is the main challenge for the Ring Oscillator (RO) based ADPLL. This thesis presents a Supply Noise-Insensitive RO-based ADPLL. A supply noise absorbing shunt regulator composed of 31-bit NMOS transistors Array is embedded parallel to the RO. Output codes from the Digital Loop Filter (DLF) not only control the Digitally-Controlled Resistor (DCR) but also the transconductance of the NMOS transistor Array. The proposed ADPLL is fabricated in the 40-nm CMOS technology. The ADPLL occupies an active area of 0.06 mm2 and consumes power 13.5 mW, while the proposed scheme only takes 6.6% and 2.8% of it, respectively. At 8 GHz operation, the proposed ADPLL achieves an RMS jitter of 3.255 ps with 1-MHz 40-mVpp sinusoidal noise injected into the supply voltage. With the Supply Noise-Insensitive technique, the RMS jitter lowers to 1.268 ps.고속 DRAM과 저속 검사 장비를 연결하는 4단계 펄스 진폭 변조-2진법 브리지 칩의 주요 구성 회로 중에 디지털 위상 동기 회로가 있다. 이 회로가 검사 장비에서 온 참조 클락의 진동수를 2배로 빠르게 하여 출력하고, 그 클락을 기준으로 칩의 송수신 회로들이 동작하기 때문에 낮은 RMS 지터와 공정-전압-온도 변화에 둔감한 성능이 요구된다. 하지만, 칩의 복잡한 회로들 때문에 고리 발진기를 기반으로 한 이 회로에게 전원 전압 잡음이 가장 큰 문제점이 된다. 본 논문은 전원 잡음에 둔감한 고리 발진기를 기반으로 한 디지털 위상 동기 회로를 제안한다. 전원 잡음을 흡수하는 단락 레귤레이터 역할의 31-비트NMOS 트랜지스터 배열이 고리 발진기와 평행하게 구현되었다. 디지털 제어 저항을 조절하는 디지털 루프 필터에서 온 행 조정 비트들이 NMOS 트랜지스터 배열의 트랜스컨덕턴스도 조절하게 디자인하였다. 제안된 디지털 위상 동기 회로는 40-nm CMOS 공정으로 제작되었다. 0.06 mm2 의 면적을 차지하고 13.5 mW의 전력을 소모하며, 고안된 전원 잡음 흡수 회로는 각각 0.0017 mm2와 0.9mW, 즉, 전체의 6.6%와 2.8%만 차지하였다. 8GHz 동작에서, 제안된 회로는 1-MHz 40-mVpp 사인파 전원 잡음 아래에서 3.255 ps의 RMS 지터를 보였지만, 고안된 회로의 동작과 함께 1.268 ps로 줄었다.CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 4 CHAPTER 2 BACKGROUNDS 5 2.1 OVERVIEW 5 2.2 COMPOSITIONS OF THE ADPLL 8 2.2.1 TIME-TO-DIGITAL CONVERTER 8 2.2.2 DIGITAL LOOP FILTER 11 2.2.3 DIGITALLY CONTROLLED OSCILLATOR 14 2.2.4 PRIOR WORKS OF SUPPLY NOISE CANCELLATION 19 2.3 ADPLL LOOP ANALYSIS 21 2.3.1 LOOP TRANSFER FUNCTION 21 2.3.2 NOISE MODELING 23 CHAPTER 3 DESIGN OF SUPPLY NOISE-INSENSITIVE ADPLL 26 3.1 DESIGN CONSIDERATION 26 3.2 OVERALL ARCHITECTURE 28 3.3 PROPOSED CIRCUIT IMPLEMENTATION 30 3.3.1 PFD-TDC AND DIGITAL BLOCK 30 3.3.2 PROPOSED DCO WITH DCR 33 3.3.3 NMOS SHUNT REGULATOR ARRAY 37 3.3.4 SUPPLY SENSING AMPLIFIER 39 3.3.5 SUPPLY NOISE-INSENSITIVE TECHNIQUE 41 CHAPTER 4 MEASUREMENT RESULTS 43 4.1 CHIP PHOTOMICROGRAPH 43 4.2 MEASUREMENT SETUP 45 4.3 MEASUREMENT RESULTS 46 4.3.1 FREE-RUNNING DCO 46 4.3.2 CLOSED-LOOP PERFORMANCE 47 4.4 PERFORMANCE SUMMARY 49 CHAPTER 5 CONCLUSION 51 BIBLIOGRAPHY 52 초 록 55석

34th Midwest Symposium on Circuits and Systems-Final Program

Organized by the Naval Postgraduate School Monterey California. Cosponsored by the IEEE Circuits and Systems Society. Symposium Organizing Committee: General Chairman-Sherif Michael, Technical Program-Roberto Cristi, Publications-Michael Soderstrand, Special Sessions- Charles W. Therrien, Publicity: Jeffrey Burl, Finance: Ralph Hippenstiel, and Local Arrangements: Barbara Cristi

Phenotypic properties and intrinsic currents of neurons involved in the neural generation of mammalian breathing

Breathing is essential for mammalian life. Although there is an emerging consensus that the inspiratory respiratory rhythm is generated in a lower brainstem region known as the preBotzinger Complex (preBotC), the mechanism of rhythmogenesis is still unclear. Additionally, the modulation of intrinsic currents within preBotC neurons has yet to be fully elucidated. This dissertation addresses both of these issues and relies on imaging, electrophysiological, and modeling techniques. The first chapter examines the size and composition of the preBotC. The chapter also decribes the means by which substance P (SP) excites the vast majority of preBotC neurons by illustrating the characteristics of the SP-activated current (/SP) in these neurons. In the subsequent chapter, we characterize a voltage-dependent potassium current that is involved in maintaining stable rhythms during normal fictive breathing. The third chapter presents a mathematical model of heterogeneous and rhythmogenic neurons that initiate network bursts. We show how this behavior relies on feedback synaptic connections within the network that reinforces activity, i.e., recurrent-excitation. We also compare model results to experimental data and make testable predictions. The final chapter elaborates on the discussion of /SP from the first chapter and presents evidence suggesting that a cyclic adenosine monophosphate (cAMP)-modulated non-specific cation channel may account for the depolarizing response in preBotC neurons from several neuromodulators. Altogether, this dissertation advances the field\u27s understanding on several fronts. We have distinguished possible functional roles of neurons from electrophysiological characteristics, estimated the number of neurons necessary for rhythmogenesis, characterized /SP , and clarified the distribution of SP-sensitive receptors among inspiratory neurons. We have identified and characterized a voltage-dependent potassium currrent important for inspiratory activity and analyzed its role. We have also described in detail how rhythmic bursts form from recurrent excitation and how this relates to experimental data. Finally, we have identified and begun characterizing a potentially important and novel mechanism for the modulation of membrane potentials in critical inspiratory neurons

Contribution to the design of continuous -time Sigma - Delta Modulators based on time delay elements

The research carried out in this thesis is focused in the development of a new class of data converters for digital radio. There are two main architectures for communication receivers which perform a digital demodulation. One of them is based on analog demodulation to the base band and digitization of the I/Q components. Another option is to digitize the band pass signal at the output of the IF stage using a bandpass Sigma-Delta modulator. Bandpass Sigma- Delta modulators can be implemented with discrete-time circuits, using switched capacitors or continuous-time circuits. The main innovation introduced in this work is the use of passive transmission lines in the loop filter of a bandpass continuous-time Sigma-Delta modulator instead of the conventional solution with gm-C or LC resonators. As long as transmission lines are used as replacement of a LC resonator in RF technology, it seems compelling that transmission lines could improve bandpass continuous-time Sigma-Delta modulators. The analysis of a Sigma- Delta modulator using distributed resonators has led to a completely new family of Sigma- Delta modulators which possess properties inherited both from continuous-time and discretetime Sigma-Delta modulators. In this thesis we present the basic theory and the practical design trade-offs of this new family of Sigma-Delta modulators. Three demonstration chips have been implemented to validate the theoretical developments. The first two are a proof of concept of the application of transmission lines to build lowpass and bandpass modulators. The third chip summarizes all the contributions of the thesis. It consists of a transmission line Sigma-Delta modulator which combines subsampling techniques, a mismatch insensitive circuitry and a quadrature architecture to implement the IF to digital stage of a receiver

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

A re-configurable pipeline ADC architecture with built-in self-test techniques

High-performance analog and mixed-signal integrated circuits are integral parts of today\u27s and future networking and communication systems. The main challenge facing the semiconductor industry is the ability to economically produce these analog ICs. This translates, in part, into the need to efficiently evaluate the performance of such ICs during manufacturing (production testing) and to come up with dynamic architectures that enable the performance of these ICs to be maximized during manufacturing and later when they\u27re operating in the field. On the performance evaluation side, this dissertation deals with the concept of Built-In-Self-Test (BIST) to allow the efficient and economical evaluation of certain classes of high-performance analog circuits. On the dynamic architecture side, this dissertation deals with pipeline ADCs and the use of BIST to dynamically, during production testing or in the field, re-configure them to produce better performing ICs.;In the BIST system proposed, the analog test signal is generated on-chip by sigma-delta modulation techniques. The performance of the ADC is measured on-chip by a digital narrow-band filter. When this system is used on the wafer level, significant testing time and thus testing cost can be saved.;A re-configurable pipeline ADC architecture to improve the dynamic performance is proposed. Based on dynamic performance measurements, the best performance configuration is chosen from a collection of possible pipeline configurations. This basic algorithm can be applied to many pipeline analog systems. The proposed grouping algorithm cuts down the number of evaluation permutation from thousands to 18 for a 9-bit ADC thus allowing the method to be used in real applications.;To validate the developments of this dissertation, a 40MS/s 9-bit re-configurable pipeline ADC was designed and implemented in TSMC\u27s 0.25mum single-poly CMOS digital process. This includes a fully differential folded-cascode gain-boosting operational amplifier with high gain and high unity-gain bandwidth. The experimental results strongly support the effectiveness of reconfiguration algorithm, which provides an average of 0.5bit ENOB improvement among the set of configurations. For many applications, this is a very significant performance improvement.;The BIST and re-configurability techniques proposed are not limited to pipeline ADCs only. The BIST methodology is applicable to many analog systems and the re-configurability is applicable to any analog pipeline system

The 1991 3rd NASA Symposium on VLSI Design

Papers from the symposium are presented from the following sessions: (1) featured presentations 1; (2) very large scale integration (VLSI) circuit design; (3) VLSI architecture 1; (4) featured presentations 2; (5) neural networks; (6) VLSI architectures 2; (7) featured presentations 3; (8) verification 1; (9) analog design; (10) verification 2; (11) design innovations 1; (12) asynchronous design; and (13) design innovations 2

On-Chip Analog Circuit Design Using Built-In Self-Test and an Integrated Multi-Dimensional Optimization Platform

Nowadays, the rapid development of system-on-chip (SoC) market introduces tremendous complexity into the integrated circuit (IC) design. Meanwhile, the IC fabrication process is scaling down to allow higher density of integration but makes the chips more sensitive to the process-voltage-temperature (PVT) variations. A successful IC product not only imposes great pressure on the IC designers, who have to handle wider variations and enforce more design margins, but also challenges the test procedure, leading to more check points and longer test time. To relax the designers’ burden and reduce the cost of testing, it is valuable to make the IC chips able to test and tune itself to some extent. In this dissertation, a fully integrated in-situ design validation and optimization (VO) hardware for analog circuits is proposed. It implements in-situ built-in self-test (BIST) techniques for analog circuits. Based on the data collected from BIST, the error between the measured and the desired performance of the target circuit is evaluated using a cost function. A digital multi-dimensional optimization engine is implemented to adaptively adjust the analog circuit parameters, seeking the minimum value of the cost function and achieving the desired performance. To verify this concept, study cases of a 2nd/4th active-RC band-pass filter (BPF) and a 2nd order Gm-C BPF, as well as all BIST and optimization blocks, are adopted on-chip. Apart from the VO system, several improved BIST techniques are also proposed in this dissertation. A single-tone sinusoidal waveform generator based on a finite-impulse-response (FIR) architecture, which utilizes an optimization algorithm to enhance its spur free dynamic range (SFDR), is proposed. It achieves an SFDR of 59 to 70 dBc from 150 to 850 MHz after the optimization procedure. A low-distortion current-steering two-tone sinusoidal signal synthesizer based on a mixing-FIR architecture is also proposed. The two-tone synthesizer extends the FIR architecture to two stages and implements an up-conversion mixer to generate the two tones, achieving better than -68 dBc IM3 below 480 MHz LO frequency without calibration. Moreover, an on-chip RF receiver linearity BIST methodology for continuous and discrete-time hybrid baseband chain is proposed. The proposed receiver chain implements a charge-domain FIR filter to notch the two excitation signals but expose the third order intermodulation (IM3) tones. It simplifies the linearity measurement procedure–using a power detector is enough to analyze the receiver’s linearity. Finally, a low cost fully digital built-in analog tester for linear-time-invariant (LTI) analog blocks is proposed. It adopts a time-to-digital converter (TDC) to measure the delays corresponded to a ramp excitation signal and is able to estimate the pole or zero locations of a low-pass LTI system

Signal Encoding and Digital Signal Processing in Continuous Time

This work investigates signal encoding in, and architectures of, digital signal processing systems that function in continuous time (CT). Unlike conventional digital signal processors (DSPs), which rely on a clock to dictate the sampling times of an analog-to-digital converter (ADC) and to provide the tap delay timing, CT DSPs function entirely in continuous time, without a sampling or a synchronizing clock. The samples of a CT DSP system are generated and processed only when some measure of the input signal crosses a predetermined threshold. The effective sampling rate and the dynamic power dissipation of a CT digital system automatically adapt to the activity of the input signal. The properties of signals sampled in continuous time are investigated in this thesis. A technique for reducing the effective sampling rate of a CT system is presented, in which the digital signal encoding is varied by adjusting the resolution according to a property of the input. A variable-resolution system leads to a decrease in the number of samples generated, a reduction in the power dissipation and a reduction in the effective chip area of a CT DSP, all without sacrificing in-band performance. The properties of several asynchronous signal-driven sampling techniques are analyzed and compared. The architecture and signal encoding of CT DSPs for signals in the lower gigahertz frequency range are investigated, with consideration of speed and accuracy limitations in the context of submicron CMOS technologies. A per-edge digital signal encoding technique is developed, which bypasses timing problems of processing high-speed digital signals; the properties of per-edge encoded signals are discussed. The design considerations of a low-resolution per-edge-encoded gigahertz-range CT DSP are discussed and an implementation for a possible application is detailed. A prototype chip has been fabricated in ST 65 nm CMOS technology, which has a compact processor core area of 0.073 mm^2. The implemented CT digital processor achieves SNDR of over 20 dB with 3 bits of resolution and a maximum usable -3 dB bandwidth of 0.8 GHz to 3.2 GHz. The processor can be configured as a one-tap to six-tap CT FIR filter and has an active power dissipation that varies from 0.27 mW to 9.5 mW, depending on the amplitude and frequency of the input signal