Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

Time-based noise-shaping techniques for time-to-digital and analog-to-digital converters

In this dissertation, time-based signal processing techniques and their applications in oversampling and noise-shaping data converters are examined. These techniques demonstrate the ability to shift the burden of high performance analog circuits from the compressed voltage-domain to the augmented time-domain. First, the potential of high order noise-shaping and phase-domain feedback in time-to-digital converters (TDCs) is explored. A prototype phase reference, second-order continuous-time delta-sigma TDC for sensor applications was fabricated in 90nm CMOS and achieves 64 dB dynamic range in 1MHz signal bandwidth. Second, an ultra-high performance oscillator-based delta-sigma modulator architecture is investigated. The proposed circuit is a third-order continuous-time PLL-Based Delta-Sigma Modulator with simulated 77 dB SNDR in 40MHz signal bandwidth with OSR of 16, and is fabricated in 65nm CMOS

Efficient Continuous-Time Sigma-Delta Converters for High Frequency Applications

Over the years Continuous-Time (CT) Sigma-Delta (ΣΔ) modulators have received a lot of attention due to their ability to efficiently digitize a variety of signals, and suitability for many different applications. Because of their tolerance to component mismatch, the easy to drive input structure, as well as intrinsic anti-aliasing filtering and noise shaping abilities, CTΣΔ modulators have become one of the most popular data-converter type for high dynamic range and moderate/wide bandwidth. This trend is the result of faster CMOS technologies along with design innovations such as better architectures and faster amplifiers. In other words, CTΣΔ modulators are starting to offer the best of both worlds, with high resolution and high bandwidth. This dissertation focuses on the bandwidth and resolution of CTΣΔ modulators. The goal of this research is to use the noise shaping benefits of CTΣΔ modulators for different wireless applications, while achieving high resolution and/or wide bandwidth. For this purpose, this research focuses on two different application areas that demand speed and resolution. These are a low-noise high-resolution time-to-digital converter (TDC), ideal for digital phase lock loops (PLL), and a very high-speed, wide-bandwidth CTΣΔ modulator for wireless communication. The first part of this dissertation presents a new noise shaping time-to-digital converter, based on a CTΣΔ modulator. This is intended to reduce the in-band phase noise of a high frequency digital phase lock loop (PLL) without reducing its loop bandwidth. To prove the effectiveness of the proposed TDC, 30GHz and a 40GHz fractional-N digital PLL are designed as a signal sources for a 240GHz FMCW radar system. Both prototypes are fabricated in a 65nm CMOS process. The standalone TDC achieves 81dB dynamic range and 13.2 equivalent number of bits (ENOB) with 176fs integrated-rms noise from 1MHz bandwidth. The in-band phase noise of the 30GHz digital fractional-N PLL is measured as -87dBc/Hz at a 100kHz offset which is equivalent to -212.6dBc/Hz2 normalized in-band phase noise. The second part of this dissertation focuses on high-speed (GS/s) CTΣΔ modulators for wireless communication, and introduces a new time-interleaved reference data weighted averaging (TI-RDWA) architecture suitable for GS/s CTΣΔ modulators. This new architecture shapes the digital-to-analog converter (DAC) mismatch effects in a CTΣΔ modulator at GS/s operating speeds. It allows us to use smaller DAC unit sizes to reduce area and power consumption for the same bandwidth. The prototype 5GS/s CTΣΔ modulator with TI-RDWA is fabricated in 40nm CMOS and it achieves 156MHz bandwidth, 70dB dynamic range, 84dB SFDR and a Schreier FoM of 158.3dB.PHDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/138763/1/bdayanik_1.pd

A Bang-Bang All-Digital PLL for Frequency Synthesis

abstract: Phase locked loops are an integral part of any electronic system that requires a clock signal and find use in a broad range of applications such as clock and data recovery circuits for high speed serial I/O and frequency synthesizers for RF transceivers and ADCs. Traditionally, PLLs have been primarily analog in nature and since the development of the charge pump PLL, they have almost exclusively been analog. Recently, however, much research has been focused on ADPLLs because of their scalability, flexibility and higher noise immunity. This research investigates some of the latest all-digital PLL architectures and discusses the qualities and tradeoffs of each. A highly flexible and scalable all-digital PLL based frequency synthesizer is implemented in 180 nm CMOS process. This implementation makes use of a binary phase detector, also commonly called a bang-bang phase detector, which has potential of use in high-speed, sub-micron processes due to the simplicity of the phase detector which can be implemented with a simple D flip flop. Due to the nonlinearity introduced by the phase detector, there are certain performance limitations. This architecture incorporates a separate frequency control loop which can alleviate some of these limitations, such as lock range and acquisition time.Dissertation/ThesisM.S. Electrical Engineering 201

Preliminary characterisation measurements of CERN picoTDC

In questa tesi sono presentate misure preliminari per valutare le prestazioni di un nuovo ASIC TDC sviluppato dal CERN (picoTDC) al fine di valutarne l'idoneità per l'implementazione all'interno del rilevatore TOF di ALICE. La parziale sostituzione dell'attuale HPTDC con il picoTDC comporterebbe, oltre al rinnovo dei componenti delle schede di lettura TDC sviluppate circa 20 anni fa, la semplificazione dell'architettura complessiva, consentendo l'integrazione di 64 canali per chip anziché gli 8 attuali dell'HPTDC. Per raggiungere questo obiettivo, sono stati eseguiti test mirati per valutare la risoluzione, la non linearità differenziale e la capacità di risposta ai segnali forniti dalla NINO FEA, la scheda di front-end del rivelatore TOF, del picoTDC. Dopo una breve introduzione alle varie tipologie di Analog to Digital Converter (ADC) e Time to Digital Converter (TDC), vengono presentate l'architettura del picoTDC e la configurazione sperimentale utilizzata, seguite dall'illustrazione dell'attività di ricerca condotta in laboratorio. I dati ottenuti hanno evidenziato una buona risoluzione del dispositivo (inferiore a 5 ps) e una notevole compatibilità con la scheda di front-end del rivelatore di ALICE. Tuttavia, i test sulla non linearità differenziale hanno mostrato risultati ancora insoddisfacenti. Pertanto, per il futuro, sarà necessario svolgere ulteriori approfondimenti al fine di migliorare la configurazione del chip

차량용 CIS Interface 를 위한 All-Digital Phase-Locked Loop 의 설계 및 분석

학위논문 (석사) -- 서울대학교 대학원 : 공과대학 전기·정보공학부, 2021. 2. 정덕균.This thesis presents design techniques for All-Digital Phase-Locked Loop (ADPLL) assisting the automotive CMOS image sensor (CIS) interface. To target Gear 3 of the automotive physical system, the proposed AD-PLL has a wide operation range, low RMS jitter, and high PVT tolerance characteristics. Detailed analysis of the loop dynamics and the noise analysis of AD-PLL are done by using Matlab and Verilog behavioral modeling simulation before an actual design. Based on that analysis, the optimal DLF gain configurations are yielded, and also, accurate output responses and performance are predictable. The design techniques to reduce the output RMS jitter are discussed thoroughly and utilized for actual implementation. The proposed AD-PLL is fabricated in the 40 nm CMOS process and occupies an effective area of 0.026 mm2. The PLL output clock pulses exhibit an RMS jitter of 827 fs at 2 GHz. The power dissipation is 5.8 mW at 2 GHz, where the overall supply voltage domain is 0.9 V excluding the buffer which is 1.1 V domain.본 논문에서는 자동차 CMOS 이미지 센서 (CIS) 인터페이스를 지원하 는 AD-PLL 을 제안한다. Automotive Physical 시스템의 Gear 3 를 지원하기 위해 제안된 AD-PLL 은 1.5 GHz 에서 3 GHz 의 동작 주파수를 가지며, 낮 은 RMS Jitter 및 PVT 변화에 대한 높은 둔감성을 갖는다. 설계에 앞서서 Matlab 및 Verilog Behavioral Simulation 을 통해 Loop system 의 역학에 대한 자세한 분석 및 AD-PLL 의 Noise 분석을 수행하였고, 이 분석을 기반으로 최적의 DLF gain 과 정확한 출력 응답 및 성능을 예측 할 수 있었다. 또한, 출력의 Phase Noise 와 RMS Jitter 를 줄이기 위한 설계 기법을 자세히 다루고 있으며 이를 실제 구현에 활용했다. 제안된 회로는 40 nm CMOS 공정으로 제작되었으며 Decoupling Cap 을 제외하고 0.026 mm2 의 유효 면적을 차지한다. 측정된 출력 Clock 신호의 RMS Jitter 값은 2 GHz 에서 827 fs 이며, 총 5.8 mW의 Power 를 소비한다. 이 때, 전체적인 공급 전압은 0.9 V 이며, Buffer 의 Power 만이 1.1 V 를 사용하 였다.ABSTRACT I CONTENTS II LIST OF FIGURES IV LIST OF TABLES VII CHAPTER 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 THESIS ORGANIZATION 3 CHAPTER 2 BACKGROUND ON ALL-DIGITAL PLL 4 2.1 OVERVIEW 4 2.2 BUILDING BLOCKS OF AD-PLL 7 2.2.1 TIME-TO-DIGITAL CONVERTER 7 2.2.2 DIGITALLY-CONTROLLED OSCILLATOR 10 2.2.3 DIGITAL LOOP FILTER 13 2.2.4 DELTA-SIGMA MODULATOR 16 2.3 PHASE NOISE ANALYSIS OF AD-PLL 20 2.3.1 BASIC ASSUMPTION OF LINEAR ANALYSIS 20 2.3.2 NOISE SOURCES OF AD-PLL 21 2.3.3 EFFECTS OF LOOP DELAY ON AD-PLL 24 2.3.4 PHASE NOISE ANALYSIS OF PROPOSED AD-PLL 26 CHAPTER 3 DESIGN OF ALL-DIGITAL PLL 28 3.1 DESIGN CONSIDERATION 28 3.2 OVERALL ARCHITECTURE 30 3.3 CIRCUIT IMPLEMENTATION 32 3.3.1 PFD-TDC 32 3.3.2 DCO 37 3.3.3 DIGITAL BLOCK 43 3.3.4 LEVEL SHIFTING BUFFER AND DIVIDER 45 CHAPTER 4 MEASUREMENT AND SIMULATION RESULTS 52 4.1 DIE PHOTOMICROGRAPH 52 4.2 MEASUREMENT SETUP 54 4.3 TRANSIENT ANALYSIS 57 4.4 PHASE NOISE AND SPUR PERFORMANCE 59 4.4.1 FREE-RUNNING DCO 59 4.4.2 PLL PERFORMANCE 61 4.5 PERFORMANCE SUMMARY 65 CHAPTER 5 CONCLUSION 67 BIBLIOGRAPHY 68 초 록 72Maste

Design of Digital FMCW Chirp Synthesizer PLLs Using Continuous-Time Delta-Sigma Time-to-Digital Converters

Radar applications for driver assistance systems and autonomous vehicles have spurred the development of frequency-modulated continuous-wave (FMCW) radar. Continuous signal transmission and high operation frequencies in the K- and W-bands enable radar systems with low power consumption and small form factors. The radar performance depends on high-quality signal sources for chirp generation to ensure accurate and reliable target detection, requiring chirp synthesizers that offer fast frequency settling and low phase noise. Fractional-N phase locked loops (PLLs) are an effective tool for synthesis of FMCW waveform profiles, and advances in CMOS technology have enabled high-performance single-chip CMOS synthesizers for FMCW radar. Design approaches for FMCW chirp synthesizer PLLs need to address the conflicting requirements of fast settling and low close-in phase noise. While integrated PLLs can be implemented as analog or digital PLLs, analog PLLs still dominate for high frequencies. Digital PLLs offer greater programmability and area efficiency than their analog counterparts, but rely on high-resolution time-to-digital converters (TDCs) for low close-in phase noise. Performance limitations of conventional TDCs remain a roadblock for achieving low phase noise with high-frequency digital PLLs. This shortcoming of digital PLLs becomes even more pronounced with wide loop bandwidths as required for FMCW radar. To address this problem, this work presents digital FMCW chirp synthesizer PLLs using continuous-time delta-sigma TDCs. After a discussion of the requirements for PLL-based FMCW chirp synthesizers, this dissertation focuses on digital fractional-N PLL designs based on noise-shaping TDCs that leverage state-of-the-art delta-sigma modulator techniques to achieve low close-in phase noise in wide-bandwidth digital PLLs. First, an analysis of the PLL bandwidth and chirp linearity studies the design requirements for chirp synthesizer PLLs. Based on a model of a complete radar system, the analysis examines the impact of the PLL bandwidth on the radar performance. The modeling approach allows for a straightforward study of the radar accuracy and reliability as functions of the chirp parameters and the PLL configuration. Next, an 18-to-22GHz chirp synthesizer PLL that produces a 25-segment chirp for a 240GHz FMCW radar application is described. This synthesizer design adapts an existing third-order noise-shaping TDC design. A 65nm CMOS prototype achieves a measured close-in phase noise of -88dBc/Hz at 100kHz offset for wide PLL bandwidths and consumes 39.6mW. The prototype drives a radar testbed to demonstrate the effectiveness of the synthesizer design in a complete radar system. Finally, a second-order noise-shaping TDC based on a fourth-order bandpass delta-sigma modulator is introduced. This bandpass delta-sigma TDC leverages the high resolution of a bandpass delta-sigma modulator by sampling a sinusoidal PLL reference and applies digital down-conversion to achieve low TDC noise in the frequency band of interest. Based on the bandpass delta-sigma TDC, a 38GHz digital FMCW chirp synthesizer PLL is designed. The feedback divider applies phase interpolation with a phase rotation scheme to ensure the effectiveness of the low TDC noise. A prototype PLL, fabricated in 40nm CMOS, achieves a measured close-in phase noise of -85dBc/Hz at 100kHz offset for wide loop bandwidths >1MHz and consumes 68mW. It effectively generates fast (500MHz/55us) and precise (824kHz rms frequency error) triangular chirps for FMCW radar. The bandpass delta-sigma TDC achieves a measured integrated rms noise of 325fs in a 1MHz bandwidth.PHDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/147732/1/dweyer_1.pdfDescription of dweyer_1.pdf : Restricted to UM users only

Noise shaping techniques for analog and time to digital converters using voltage controlled oscillators

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.Includes bibliographical references (p. 175-181).Advanced CMOS processes offer very fast switching speed and high transistor density that can be utilized to implement analog signal processing functions in interesting and unconventional ways, for example by leveraging time as a signal domain. In this context, voltage controlled ring oscillators are circuit elements that are not only very attractive due to their highly digital implementation which takes advantage of scaling, but also due to their ability to amplify or integrate conventional voltage signals into the time domain. In this work, we take advantage of voltage controlled oscillators to implement analog- and time-to-digital converters with first-order quantization and mismatch noise-shaping. To implement a time-to-digital converter (TDC) with noise-shaping, we present a oscillator that is enabled during the measurement of an input, and then disabled in between measurements. By holding the state of the oscillator in between samples, the quantization error is saved and transferred to the following sample, which can be seen as first-order noise-shaping in the frequency domain. In order to achieve good noise shaping performance, we also present key details of a multi-path oscillator topology that is able to reduce the effective delay per stage by a factor of 5 and accurately preserve the quantization error from measurement to measurement. An 11-bit, 50Msps prototype time-to-digital converter (TDC) using a multi-path gated ring oscillator with 6ps of delay per stage demonstrates over 20dB of ist-order noise shaping. At frequencies below 1MHz, the TDC error integrates to 80fsrms for a dynamic range of 95dB with no calibration of differential non-linearity required. The 157x258pm TDC is realized in 0.13ipm CMOS and operates from a 1.5V supply.(cont.) The use of VCO-based quantization within continuous-time (CT) [Epsilon] [Delta] ADC structures is also explored, with a custom prototype in 0.13pm CMOS showing measured performance of 86/72dB SNR/SNDR with 10MHz bandwidth while consuming 40mW from a 1.2V supply and occupying an active area of 640pm X 660pm. A key element of the ADC structure is a 5-bit VCO-based quantizer clocked at 950 MHz which we show achieves first-order noise-shaping of its quantization noise. The quantizer structure allows the second order CT Epsilon] [Delta] ADC topology to achieve third order noise shaping, and direct connection of the VCO-based quantizer to the internal DACs of the ADC provides intrinsic dynamic element matching (DEM) of the DAC elements.by Matthew A. Z. Straayer.Ph.D

Time-encoding analog-to-digital converters : bridging the analog gap to advanced digital CMOS : part 1: basic principles

The scaling of CMOS technology deep into the nanometer range has created challenges for the design of highperformance analog ICs. The shrinking supply voltage and presence of mismatch and noise restrain the dynamic range, causing analog circuits to be large in area and have a high power consumption in spite of the process scaling. Analog circuits based on time encoding [1], [2] and hybrid analog/digital signal processing [3] have been developed to overcome these issues. Realizing analog circuit functionality with highly digital circuits results in more scalable design solutions that can achieve excellent performance. This article reviews the basic principles of time encoding applied, in particular, to analog-to-digital converters (ADCs) based on voltage-controlled oscillators (VCOs), one of the most successful time-encoding techniques to date

Analog-to-digital converter circuit and system design to improve with CMOS scaling

textThere is a need to rethink the design of analog/mixed-signal circuits to be viable in state-of-the-art nanometer-scale CMOS processes due to the hostile environment they create for analog circuits. Reduced supply voltages and smaller capacitances are beneficial to circuit speed and digital circuit power efficiency; however, these changes along with smaller dimensions and close coupling of fast-switching digital circuits have made high-accuracy voltage domain analog processing increasingly difficult. In this work, techniques to improve analog-to-digital converters (ADC) for nanometer-scale processes are explored. First, I propose a mostly-digital time-based oversampling delta-sigma (∆Σ) ADC architecture. This system uses time, rather than voltage, as the analog variable for its quantizer, where the noise shaping process is realized by modulating the width of a variable-width digital "pulse." The merits of this architecture render it not only viable to scaling, but also enable improved circuit performance with ever-increasing time resolution of scaled CMOS processes. This is in contrast to traditional voltage-based analog circuit design, whose performance generally decreases with scaling due to increasingly higher voltage uncertainty due to supply voltage reduction and short-channel effects. In conjunction with Dr. Woo Young Jung while he was a Ph.D. student at The University of Texas at Austin, two prototype implementations of the proposed architecture were designed and fabricated in TSMC 180 nm CMOS and IBM 45 nm Silicon-On-Insulator (SOI) processes. The prototype ADCs demonstrate that the architecture can achieve bandwidths of 5-20 MHz and ∼50 dB SNR with very small area. The first generation ADC core occupies an area of only 0.0275 mm² , while the second generation ADC core occupies 0.0192 mm² . The two prototypes can be categorized as some of the smallestarea modulators in the literature. Second, I analyze the measured results of the prototype ADC chips, and determine the source for the harmonic distortion. I then demonstrate a digital calibration algorithm that sufficiently mitigates the distortion. This calibration approach falls in the general philosophy of digitally-assisted analog systems. In this philosophy, digital calibration and post-correction are favored over traditional analog solutions, in which there is a high cost to the analog solution either in complexity, power, or area.Electrical and Computer Engineerin