Design of Energy-Efficient A/D Converters with Partial Embedded Equalization for High-Speed Wireline Receiver Applications

As the data rates of wireline communication links increases, channel impairments such as skin effect, dielectric loss, fiber dispersion, reflections and cross-talk become more pronounced. This warrants more interest in analog-to-digital converter (ADC)-based serial link receivers, as they allow for more complex and flexible back-end digital signal processing (DSP) relative to binary or mixed-signal receivers. Utilizing this back-end DSP allows for complex digital equalization and more bandwidth-efficient modulation schemes, while also displaying reduced process/voltage/temperature (PVT) sensitivity. Furthermore, these architectures offer straightforward design translation and can directly leverage the area and power scaling offered by new CMOS technology nodes. However, the power consumption of the ADC front-end and subsequent digital signal processing is a major issue. Embedding partial equalization inside the front-end ADC can potentially result in lowering the complexity of back-end DSP and/or decreasing the ADC resolution requirement, which results in a more energy-effcient receiver. This dissertation presents efficient implementations for multi-GS/s time-interleaved ADCs with partial embedded equalization. First prototype details a 6b 1.6GS/s ADC with a novel embedded redundant-cycle 1-tap DFE structure in 90nm CMOS. The other two prototypes explain more complex 6b 10GS/s ADCs with efficiently embedded feed-forward equalization (FFE) and decision feedback equalization (DFE) in 65nm CMOS. Leveraging a time-interleaved successive approximation ADC architecture, new structures for embedded DFE and FFE are proposed with low power/area overhead. Measurement results over FR4 channels verify the effectiveness of proposed embedded equalization schemes. The comparison of fabricated prototypes against state-of-the-art general-purpose ADCs at similar speed/resolution range shows comparable performances, while the proposed architectures include embedded equalization as well

A 1.67 pJ/Conversion-step 8-bit SAR-Flash ADC Architecture in 90-nm CMOS Technology

A novice advanced architecture of 8-bit analog todigital converter is introduced and analyzed in this work. Thestructure of proposed ADC is based on the sub-ranging ADCarchitecture in which a 4-bit resolution flash-ADC is utilized. Theproposed ADC architecture is designed by employing a comparatorwhich is equipped with common mode current feedback andgain boosting technique (CMFD-GB) and a residue amplifier. Theproposed 8 bits ADC structure can achieve the speed of 140 megasamplesper second. The proposed ADC architecture is designedat a resolution of 8 bits at 10 MHz sampling frequency. DNL andINL values of the proposed design are -0.94/1.22 and -1.19/1.19respectively. The ADC design dissipates a power of 1.24 mWwith the conversion speed of 0.98 ns. The magnitude of SFDRand SNR from the simulations at Nyquist input is 39.77 and 35.62decibel respectively. Simulations are performed on a SPICE basedtool in 90 nm CMOS technology. The comparison shows betterperformance for the proposed ADC design in comparison toother ADC architectures regarding speed, resolution and powerconsumption

A 1.67 pJ/Conversion-step 8-bit SAR-Flash ADC Architecture in 90-nm CMOS Technology

A novice advanced architecture of 8-bit analog todigital converter is introduced and analyzed in this work. Thestructure of proposed ADC is based on the sub-ranging ADCarchitecture in which a 4-bit resolution flash-ADC is utilized. Theproposed ADC architecture is designed by employing a comparatorwhich is equipped with common mode current feedback andgain boosting technique (CMFD-GB) and a residue amplifier. Theproposed 8 bits ADC structure can achieve the speed of 140 megasamplesper second. The proposed ADC architecture is designedat a resolution of 8 bits at 10 MHz sampling frequency. DNL andINL values of the proposed design are -0.94/1.22 and -1.19/1.19respectively. The ADC design dissipates a power of 1.24 mWwith the conversion speed of 0.98 ns. The magnitude of SFDRand SNR from the simulations at Nyquist input is 39.77 and 35.62decibel respectively. Simulations are performed on a SPICE basedtool in 90 nm CMOS technology. The comparison shows betterperformance for the proposed ADC design in comparison toother ADC architectures regarding speed, resolution and powerconsumption

Designs and calibration of delay-line based ADCs

Delay line ADCs become more and more attractive with technology scaling to smaller dimensions with lower voltages. Time domain resolution can be increased by high speed delay cells. A GHz sampling rate can be easily achieved with low power. However, linearity, which has always been an issue, becomes a problem with longer delay lines. Resolutions of reported delay-line ADCs are hardly more than 4 bits with sampling rates of hundreds of MHz. Thus, this dissertation addresses the linearity issue of delay line ADCs. First, a novel 11-bit hybrid ADC using flash and delay line architectures, where a 4-bit flash ADC is followed by a 7-bit delay-line ADC, is proposed. In this structure, the noise/error of the second stage delay-line ADC is attenuated at the hybrid ADC output, such that the overall performance would not be limited by the poor linearity of the delay-line ADC. The achieved figure of merit (FOM) of 33.8 fJ/conversion-step is competitive with state-of-the-art ADCs. Furthermore, the proposed ADC inherits accuracy and high speed from the flash ADC and the delay-line ADC, respectively. The inherited advantages strongly support the scalability of the proposed ADC to provide a better performance with low power in further scaled fabrication processes. Second, in order to remove the harmonic distortion of delay-line ADC, we present a technique which extends harmonic distortion correction (HDC) to digitally calibrate a delay-line ADC. In our simulation results, digital calibration improves SNDR from 25.6 dB to 42.5 dB by averaging $2^{27}$ sample points, which corresponds to a 0.86 second calibration time. Last, a multiple-pass delay line ADC is proposed to improve overall ADC performance in terms of speed and resolution. In this structure, a multiple-pass delay cell can be early triggered by the previous cell to increase speed. Also, phase interpolation is used to improve the effective number of bits. The design is designed and simulated in a commercial 40nm process technology. With 500MHz sampling rate, the multiple-pass delay line ADC achieves an SNDR of 37 dB and consumes 4.2 mW, which is competitive with other reported ADCs.Electrical and Computer Engineerin

Low-power high-speed ADC design techniques in scaled CMOS process

The power consumption of a single-channel successive approximation register (SAR) analog-to-digital (ADC) tends to linearly increase with its sampling rate (f[subscript s]), when f[subscript s] is small. However, when f[subscript s] passes a certain point for a given technology node, the ADC power P increases at much higher rate and the normalized power efficiency (P/f[subscript s]) starts to degrade rapidly. To enhance the conversion speed of SAR ADC, while maintaining a good power efficiency, this thesis presents speed-enhancing techniques for SAR ADC in nano-scale CMOS technologies. First chapter presents a 2b/cycle hybrid SAR architecture with only 1 differential capacitor-DAC (CDAC). Unlike prior multi-bit/cycle SAR works that make use of only the DAC differential mode (DM) voltage, the proposed architecture exploits both the DM and the common mode (CM). By using two degrees of freedom, 2b/cycle conversion technique can boost the f[subscript s] of the ADC without any additional DAC arrays. High-speed ADCs can boost the conversion speed not only by increasing the f[subscript s] of a single-channel ADC, but also by time-interleaving multiple ADC sub-channels running at a lower rate. For an N-channel time-interleaved (TI) SAR ADC operating at f[subscript s], each sub-SAR channel only needs to operate at f[subscript s]=N. Therefore, each sub-SAR can operate in the linear power versus speed region, leading to a significant power saving compared to a single-channel ADC running at the same sampling rate. Despite of its power efficiency, TI-ADC suffers from mismatches among sub-ADC channels, including gain, offset, and timing mismatches. Among them, timing skew is one of the most difficult errors to calibrate as it is nontrivial to extract and its induced error depends on both the frequency and the amplitude of the input signal. Second chapter of this thesis presents a TI-SAR with a fast variance-based timing-skew calibration technique. It uses a single-comparator based window detector (WD) to calibrate the timing skew. The WD suppresses variance estimation errors and allow precise variance estimation from a significantly small number of samples. It has low-hardware cost and orders of magnitude faster convergence speed compared to prior variance-based timing-skew calibration technique. The last chapter presents another TI-SAR with mean absolute deviation (MAD) based timing-skew calibration technique. In addition to all the advantages presented with the fast variance-based timing-skew calibration technique, the proposed technique further reduces the digital computation power by 50% by eliminating the squaring operations, which are essential in variance-based calibration techniqueElectrical and Computer Engineerin

Wideband CMOS Data Converters for Linear and Efficient mmWave Transmitters

With continuously increasing demands for wireless connectivity, higher\ua0carrier frequencies and wider bandwidths are explored. To overcome a limited transmit power at these higher carrier frequencies, multiple\ua0input multiple output (MIMO) systems, with a large number of transmitters\ua0and antennas, are used to direct the transmitted power towards\ua0the user. With a large transmitter count, each individual transmitter\ua0needs to be small and allow for tight integration with digital circuits. In\ua0addition, modern communication standards require linear transmitters,\ua0making linearity an important factor in the transmitter design.In this thesis, radio frequency digital-to-analog converter (RF-DAC)-based transmitters are explored. They shift the transition from digital\ua0to analog closer to the antennas, performing both digital-to-analog\ua0conversion and up-conversion in a single block. To reduce the need for\ua0computationally costly digital predistortion (DPD), a linear and wellbehaved\ua0RF-DAC transfer characteristic is desirable. The combination\ua0of non-overlapping local oscillator (LO) signals and an expanding segmented\ua0non-linear RF-DAC scaling is evaluated as a way to linearize\ua0the transmitter. This linearization concept has been studied both for\ua0the linearization of the RF-DAC itself and for the joint linearization of\ua0the cascaded RF-DAC-based modulator and power amplifier (PA) combination.\ua0To adapt the linearization, observation receivers are needed.\ua0In these, high-speed analog-to-digital converters (ADCs) have a central\ua0role. A high-speed ADC has been designed and evaluated to understand\ua0how concepts used to increase the sample rate affect the dynamic performance

Voltage-to-Time Converter for High-Speed Time-Based Analog-to-Digital Converters

In modern complementary metal oxide semiconductor (CMOS) technologies, the supply voltage scales faster than the threshold voltage (Vth) of the transistors in successive smaller nodes. Moreover, the intrinsic gain of the transistors diminishes as well. Consequently, these issues increase the difficulty of designing higher speed and larger resolution analog-to-digital converters (ADCs) employing voltage-domain ADC architectures. Nevertheless, smaller transistor dimensions in state-of-the-art CMOS technologies leads to reduced capacitance, resulting in lower gate delays. Therefore, it becomes beneficial to first convert an input voltage to a 'time signal' using a voltage-to-time converter (VTC), instead of directly converting it into a digital output. This 'time-signal' could then be converted to a digital output through a time-to-digital converter (TDC) for complete analog-to-digital conversion. However, the overall performance of such an ADC will still be limited to the performance level of the voltage-to-time conversion process. Hence, this thesis presents the design of a linear VTC for a high-speed time-based ADC in 28 nm CMOS process. The proposed VTC consists of a sample-and-hold (S/H) circuit, a ramp generator and a comparator to perform the conversion of the input signal from the voltage to the time domain. Larger linearity is attained by integrating a constant current (with high output impedance) over a capacitor, generating a linear ramp. The VTC operates at 256 MSPS consuming 1.3 mW from 1 V supply with a full-scale 1 V pk-pk differential input signal, while achieving a time-domain output signal with a spurious-free-dynamic-range (SFDR) of 77 dB and a signal-to-noise-and-distortion ratio (SNDR) of 56 dB at close to Nyquist frequency (f = 126.5 MHz). The proposed VTC attains an output range of 2.7 ns, which is the highest linear output range for a VTC at this speed, published to date

Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

Ring-oscillator with multiple transconductors for linear analog-to-digital conversion

This paper proposes a new circuit-based approach to mitigate nonlinearity in open-loop ring-oscillator-based analog-to-digital converters (ADCs). The approach consists of driving a current-controlled oscillator (CCO) with several transconductors connected in parallel with different bias conditions. The current injected into the oscillator can then be properly sized to linearize the oscillator, performing the inverse current-to-frequency function. To evaluate the approach, a circuit example has been designed in a 65-nm CMOS process, leading to a more than 3-ENOB enhancement in simulation for a high-swing differential input voltage signal of 800-mVpp, with considerable less complex design and lower power and expected area in comparison to state-of-the-art circuit based solutions. The architecture has also been checked against PVT and mismatch variations, proving to be highly robust, requiring only very simple calibration techniques. The solution is especially suitable for high-bandwidth (tens of MHz) medium-resolution applications (10–12 ENOBs), such as 5G or Internet-of-Things (IoT) devices.This research was funded by Project TEC2017-82653-R, Spain