Low power high speed and high accuracy design methodologies for pipeline Analog-to-Digital converters

Different aspects of power optimization of a high-speed, high-accuracy pipeline Analog-to-Digital Converters (ADCs) are considered to satisfy the current and future needs of portable communication devices. First power optimized design strategies for the amplifiers are introduced. Closed form expressions of power w.r.t settling requirements are presented to facilitate a fair comparison and selection of the amplifier structure. Next a new low offset dynamic comparator has been designed. Simulation based sensitivity analysis is performed to demonstrate the robustness of the new comparator with respect to stray capacitances, common mode voltage errors and timing errors. With simplified amplifier power model along with the use of dynamic comparators, a method to optimize the power consumption of a pipeline ADC with kT/C noise constraint is also developed. The total power dependence on capacitor scaling and stage resolution is investigated for a near-optimal solution.;After considering the power requirements of a pipeline ADC, design and statistical modeling of over-range protection requirements is investigated. Closed form statistical expressions for the over-range requirements are developed to assist in the allocation of the error budgets to different pipeline blocks. A new over-range protection algorithm is also developed that relaxes the amplifier design and power requirements.;Finally, two new CMOS Schmitt trigger designs are proposed which can be used as clock inputs for the pipeline ADC. In the new designs, sizing of the feedback inverters is used for independent trip point control. The new designs have also a modest reduction in sensitivity to process variations along with immunity to the kick-back noise without the addition of path delay

Digital Background Self-Calibration Technique for Compensating Transition Offsets in Reference-less Flash ADCs

This Dissertation focusses on proving that background calibration using adaptive algorithms are low-cost, stable and effective methods for obtaining high accuracy in flash A/D converters. An integrated reference-less 3-bit flash ADC circuit has been successfully designed and taped out in UMC 180 nm CMOS technology in order to prove the efficiency of our proposed background calibration. References for ADC transitions have been virtually implemented built-in in the comparators dynamic-latch topology by a controlled mismatch added to each comparator input front-end. An external very simple DAC block (calibration bank) allows control the quantity of mismatch added in each comparator front-end and, therefore, compensate the offset of its effective transition with respect to the nominal value. In order to assist to the estimation of the offset of the prototype comparators, an auxiliary A/D converter with higher resolution and lower conversion speed than the flash ADC is used: a 6-bit capacitive-DAC SAR type. Special care in synchronization of analogue sampling instant in both ADCs has been taken into account. In this thesis, a criterion to identify the optimum parameters of the flash ADC design with adaptive background calibration has been set. With this criterion, the best choice for dynamic latch architecture, calibration bank resolution and flash ADC resolution are selected. The performance of the calibration algorithm have been tested, providing great programmability to the digital processor that implements the algorithm, allowing to choose the algorithm limits, accuracy and quantization errors in the arithmetic. Further, systematic controlled offset can be forced in the comparators of the flash ADC in order to have a more exhaustive test of calibration

Design of a Cost-Efficient Reconfigurable Pipeline ADC

Power budget is very critical in the design of battery-powered implantable biomedical instruments. High speed, high resolution and low power usually cannot be achieved at the same time. Therefore, a tradeoff must be made to compromise every aspect of those features. As the main component of the bioinstrument, high conversion rate, high resolution ADC consumes most of the power. Fortunately, based on the operation modes of the bioinstrument, a reconfigurable ADC can be used to solve this problem. The reconfigurable ADC will operate at 10-bit 40 MSPS for the diagnosis mode and at 8-bit 2.5 MSPS for the monitor mode. The ADC will be completely turned off if no active signal comes from sensors or if an off command is received from the antenna. By turning off the sample hold stage and the first two stages of the pipeline ADC, a significant power saving is achieved. However, the reconfigurable ADC suffers from two drawbacks. First, the leakage signals through the extra off-state switches in the third stage degrade the performance of the data converter. This situation tends to be even worse for high speed and high-resolution applications. An interference elimination technique has been proposed in this work to solve this problem. Simulation results show a significant attenuation of the spurious tones. Moreover, the transistors in the OTA tend to operate in weak inversion region due to the scaling of the bias current. The transistor in subthreshold is very slow due to the small transit frequency. In order to get a better tradeoff between the transconductance efficiency and the transit frequency, reconfigurable OTAs and scalable bias technique are devised to adjust the operating point from weak inversion to moderate inversion. The figure of merit of the reconfigurable ADC is comparable to the previously published conventional pipeline ADCs. For the 10-bit, 40 MSPS mode, the ADC attains a 56.9 dB SNDR for 35.4 mW power consumption. For the 8-bit 2.5 MSPS mode, the ADC attains a 49.2 dB SNDR for 7.9 mW power consumption. The area for the core layout is 1.9 mm2 for a 0.35 micrometer process

Accuracy enhancement techniques in low-voltage high-speed pipelined ADC design

Pipelined analog to digital converters (ADCs) are very important building blocks in many electronic systems such as high quality video systems, high performance digital communication systems and high speed data acquisition systems. The rapid development of these applications is driving the design of pipeline ADCs towards higher speed, higher dynamic range, lower power consumption and lower power supply voltage with the CMOS technology scaling. This trend poses great challenges to conventional pipelined ADC designs which rely on high-gain operational amplifiers (opamps) and well matched capacitors to achieve high accuracy. In this thesis, two novel accuracy improvement techniques to overcome the accuracy limit set by analog building blocks (opamps and capacitors) in the context of low-voltage and high-speed pipelined ADC design are presented. One is the time-shifted correlated double sampling (CDS) technique which addresses the finite opamp gain effect and the other is the radix-based background digital calibration technique which can take care of both finite opamp gain and capacitor mismatch. These methods are simple, easy to implement and power efficient. The effectiveness of the proposed techniques is demonstrated in simulation as well as in experiment. Two prototype ADCs have been designed and fabricated in 0.18μm CMOS technology as the experimental verification of the proposed techniques. The first ADC is a 1.8V 10-bit pipeline ADC which incorporated the time-shifted CDS technique to boost the effective gain of the amplifiers. Much better gain-bandwidth tradeoff in amplifier design is achieved with this gain boosting. Measurement results show total power consumption of 67mW at 1.8V when operating at 100MSPS. The SNR, SNDR and SFDR are 55dB, 54dB and 65dB respectively given a 1MHz input signal. The second one is a 0.9V 12-bit two-stage cyclic ADC which employed a novel correlation-based background calibration to enhance the linearity. The linearity limit set by the capacitor mismatches, finite opamp gain effects is exceeded. After calibration, the SFDR is improved by about 33dB and exceeds 80dB. The power consumption is 12mW from 0.9V supply when operating at 2MSPS

Designs and calibration of delay-line based ADCs

Delay line ADCs become more and more attractive with technology scaling to smaller dimensions with lower voltages. Time domain resolution can be increased by high speed delay cells. A GHz sampling rate can be easily achieved with low power. However, linearity, which has always been an issue, becomes a problem with longer delay lines. Resolutions of reported delay-line ADCs are hardly more than 4 bits with sampling rates of hundreds of MHz. Thus, this dissertation addresses the linearity issue of delay line ADCs. First, a novel 11-bit hybrid ADC using flash and delay line architectures, where a 4-bit flash ADC is followed by a 7-bit delay-line ADC, is proposed. In this structure, the noise/error of the second stage delay-line ADC is attenuated at the hybrid ADC output, such that the overall performance would not be limited by the poor linearity of the delay-line ADC. The achieved figure of merit (FOM) of 33.8 fJ/conversion-step is competitive with state-of-the-art ADCs. Furthermore, the proposed ADC inherits accuracy and high speed from the flash ADC and the delay-line ADC, respectively. The inherited advantages strongly support the scalability of the proposed ADC to provide a better performance with low power in further scaled fabrication processes. Second, in order to remove the harmonic distortion of delay-line ADC, we present a technique which extends harmonic distortion correction (HDC) to digitally calibrate a delay-line ADC. In our simulation results, digital calibration improves SNDR from 25.6 dB to 42.5 dB by averaging $2^{27}$ sample points, which corresponds to a 0.86 second calibration time. Last, a multiple-pass delay line ADC is proposed to improve overall ADC performance in terms of speed and resolution. In this structure, a multiple-pass delay cell can be early triggered by the previous cell to increase speed. Also, phase interpolation is used to improve the effective number of bits. The design is designed and simulated in a commercial 40nm process technology. With 500MHz sampling rate, the multiple-pass delay line ADC achieves an SNDR of 37 dB and consumes 4.2 mW, which is competitive with other reported ADCs.Electrical and Computer Engineerin

Design of a low power switched-capacitor pipeline analog-to-digital converter

An Analog to Digital Converter (ADC) is a circuit which converts an analog signal into digital signal. Real world is analog, and the data processed by the computer or by other signal processing systems is digital. Therefore, the need for ADCs is obvious. In this thesis, several novel designs used to improve ADCs operation speed and reduce ADC power consumption are proposed. First, a high speed switched source follower (SSF) sample and hold amplifier without feedthrough penalty is implemented and simulated. The SSF sample and hold amplifier can achieve 6 Bit resolution with sampling rate at 10Gs/s. Second, a novel rail-to-rail time domain comparator used in successive approximation register ADC (SAR ADC) is implemented and simulated. The simulation results show that the proposed SAR ADC can only consume 1.3 muW with a 0.7 V power supply. Finally, a prototype pipeline ADC is implemented and fabricated in an IBM 90nm CMOS process. The proposed design is validated using measurement on a fabricated silicon IC, and the proposed 10-bit ADC achieves a peak signal-to-noise- and-distortion-ratio (SNDR) of 47 dB. This SNDR translates to a figure of merit (FOM) of 2.6N/conversion-step with a 1.2 V power supply

Low power VCO-based analog-to-digital conversion

textThis dissertation presents novel two stage ADC architecture with a VCO based second stage. With the scaling of the supply voltages in modern CMOS process it is difficult to design high gain operational amplifiers needed for traditional voltage domain two-stage analog to digital converters. However time resolution continues to improve with the advancement in CMOS technology making VCO-based ADC more attractive. The nonlinearity in voltage-to-frequency transfer function is the biggest challenge in design of VCO based ADC. The hybrid approach used in this work uses a voltage domain first stage to determine the most significant bits and uses a VCO based second stage to quantize the small residue obtained from first stage. The architecture relaxes the gain requirement on the the first stage opamp and also relaxes the linearity requirements on the second stage VCO. The prototype ADC built in 65nm CMOS process achieves 63.7dB SNDR in 10MHz bandwidth while only consuming 1.1mW of power. The performance of the prototype chip is comparable to the state-of-art in terms of figure-of-merit but this new architecture uses significantly less circuit area.Electrical and Computer Engineerin

A 12-bit, 40 msamples/s, low-power, low-area pipeline analog-to-digital converter in CMOS 0.18 mum technology.

With advancements in digital signal processing in recent years, the need for high-speed, high-resolution analog-to-digital converters (ADCs) which can be used in the analog front-end has been increasing. Some examples of these applications are image and video signal processing, wireless communications and asymmetrical digital subscriber line (ADSL). In CMOS integrated circuit design, it is desirable to integrate the digital circuit and the ADC in one microchip to reduce the cost of fabrication. Consequently the power dissipation and area of the ADCs are important design factors. The original contributions in this thesis are as follows. Since the performance of pipeline ADCs significantly depends on the op-amps and comparators circuits, the performance of various comparators is analyzed and the effect of op-amp topology on the performance of pipeline ADCs is investigated. This thesis also presents a novel architecture for design of low-power and low-area pipelined ADCs which will be more useful for very low voltage applications in the future. At the schematic level, a low-power CMOS implementation of the current-mode MDAC is presented and an improved voltage comparator is designed. With the proposed design and the optimization methodology it is possible to reduce power dissipation and area compared with conventional fully differential schemes.Dept. of Electrical and Computer Engineering. Paper copy at Leddy Library: Theses & Major Papers - Basement, West Bldg. / Call Number: Thesis2004 .M64. Source: Masters Abstracts International, Volume: 43-01, page: 0281. Adviser: C. Chen. Thesis (M.A.Sc.)--University of Windsor (Canada), 2004

Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

Nyquist-Rate Switched-Capacitor Analog-to-Digital Converters

The miniaturization and digitization of modern microelectronic systems have made Analog-to-Digital converters (ADC) key building components in many applications. Internet and entertainment technologies demand higher and higher performance from the hardware components in many communication and multimedia systems, but at the same time increased mobility demands less and less power consumption. Many applications, such as instrumentation, video, radar and communications, require very high accuracy and speed and with resolutions up to 16 bits and sampling rates in the 100s of MHz, pipelined ADCs are very suitable for such purposes. Resolutions above 10 bits often require very high power consumption and silicon area if no error correction technique is employed. Calibration relaxes the accuracy requirement of the individual building blocks of the ADC and enables power and area savings. Digital calibration is preferred over analog calibration due to higher robustness and accuracy. Furthermore, the microprocessors that process the digital information from the ADCs have constantly reduced cost and power consumption and improved performance due to technology scaling and innovative microprocessor architectures. The work in this dissertation presents a novel digital background calibration technique for high-speed, high-resolution pipelined ADCs. The technique is implemented in a 14 bit, 100 MS/s pipelined ADC fabricated in Taiwan Semiconductor Manufacturing Company (TSMC) 0.13µm Complementary Metal Oxide Semiconductor (CMOS) digital technology. The prototype ADC achieves better than 11.5 bits linearity at 100 MS/s and achieves a best-in-class figure of merit of 360 fJ/conversion-step. The core ADC has a power consumption of 105 mW and occupies an active area of 1.25 mm^2. The work in this dissertation also presents a low-power, 8-bit algorithmic ADC. This ADC reduces power consumption at system level by minimizing voltage reference generation and ADC input capacitance. This ADC is implemented in International Business Machines Corporation (IBM) 90nm digital CMOS technology and achieves around 7.5 bits linearity at 0.25 MS/s with a power consumption of 300 µW and an active area of 0.27 mm^2