Localization of charge carriers in materials with high polaron concentration

Abstract The influence of polaron concentration on the type of transition from band to activate conductivity has been investigated. For a single polaron in the crystal lattice or for material with polaron concentration higher than the percolation threshold, such a transition is continuous, in accordance with theory. However, for intermediate cases this process becomes step-like, because the rapid increase of density of states at Fermi level leads to a change of polaron characteristics. These suppositions are illustrated by experimental results (XPS-spectra, crystal structure analysis, DC conductivity) for intercalation compounds based on titanium dichalcogenides.

The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration

An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.05 - 0.6) using the x-rays photoemission spectroscopy, resonant photoemission and x-rays absorption spectroscopy has been performed. Negative energy shifts of the Ti 2p and Se 3d core levels spectra and a corresponding decrease of the photon energy in Ti 2p absorption spectra with increasing concentration of copper have been found. Such sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix.Comment: 12 pages, 6 figure

Non-quasiparticle states in the core level spectra of ferromagnetic semiconductors and half-metallic ferromagnets

The Green's functions that determine x-ray spectra are calculated in the s-d exchange model of a saturated conducting ferromagnet in the presence of the core hole. A possibility to observe non-quasiparticle (NQP) states in the core level (x-ray absorption, emission and photoelectron) spectroscopy is demonstrated. It is shown that NQP contributions to resonant x-ray scattering spectra can be considerably enhanced by core hole effects in comparison with those to the density of states.Comment: 13 pages, 7 figures, final versio

ELECTRONIC STRUCTURE OF FeSi

The full set of high-energy spectroscopy measurements including X-ray photoelectron valence band spectra and soft X-ray emission valence band spectra of both components of FeSi (Fe K_beta_5, Fe L_alpha, Si K_beta_1,3 and Si L_2,3) are performed and compared with the results of ab-initio band structure calculations using the linearized muffin-tin orbital method and linearized augmented plane wave method.Comment: 11 pages + 3 PostScript figures, RevTex3.0, to be published in J.Phys.:Cond.Matte

Electronic structure of Co_xTiSe_2 and Cr_xTiSe_2

The results of investigations of intercalated compounds Cr_xTiSe_2 and Co_xTiSe_2 by X-ray photoelectron spectroscopy (XPS) and X-ray emission spectroscopy (XES) are presented. The data obtained are compared with theoretical results of spin-polarized band structure calculations. A good agreement between theoretical and experimental data for the electronic structure of the investigated materials has been observed. The interplay between the M3d--Ti3d hybridization (M=Cr, Co) and the magnetic moment at the M site is discussed. A 0.9 eV large splitting of the core Cr2p{3/2} level was observed, which reveals a strong exchange magnetic interaction of 3d-2p electrons of Cr. In the case of a strong localization of the Cr3d electrons (for x<0.25), the broadening of the CrL spectra into the region of the states above the nominal Fermi level was observed and attributed to X-ray re-emission. The measured kinetic properties are in good accordance with spectral investigations and band calculation results.Comment: 14 pages, 11 figures, submitted to Phys.Rev.

COMPARISON OF SYSTEMS FOR REGISTRATION OF X-RAY SPECTRA AND IMAGES IN VARIOUS COMBINATIONS OF “DETECTOR-CAMERA” PAIR

An X-ray image registration system consisting of a detector, an optical lens and a digital video camera is described. The measurements were performed using detectors with different gain coefficients and two video cameras with different characteristics and pixel sizes.Работа выполнена в рамках государственных заданий Минобрнауки России (темы: “Спинˮ, г.р. № 122021000036-3; “Электронˮ, г.р. № 122021000039-4)

A LOW-INTENSITY X-RAY DETECTOR BASED ON MICROCHANNEL PLATES

The detector based on microchannel plates was designed to detect low-intensity X-ray radiation in the wavelength range 0.1 nm-0.7 nm in diffractometers and X-ray spectrometers. The secondary characteristic radiation of the samples is recorded in the X-ray spectrometer. A microchannel plates (MCP).Работа выполнена при финансовой поддержке Российского фонда фундаментальных исследований (проект № 20-02-00541 А)