The detector based on microchannel plates was designed to detect low-intensity X-ray radiation in the wavelength range 0.1 nm-0.7 nm in diffractometers and X-ray spectrometers. The secondary characteristic radiation of the samples is recorded in the X-ray spectrometer. A microchannel plates (MCP).Работа выполнена при финансовой поддержке Российского фонда фундаментальных исследований (проект № 20-02-00541 А)
