Single-shot temporal characterization of XUV pulses with duration from ~10 fs to ~350 fs at FLASH

Ultra-short extreme ultraviolet pulses from the free-electron laser FLASH are characterized using terahertz-field driven streaking. Measurements at different ultra-short extreme ultraviolet wavelengths and pulse durations as well as numerical simulations were performed to explore the application range and accuracy of the method. For the simulation of streaking, a standard classical approach is used which is compared to quantum mechanical theory, based on strong field approximation. Various factors limiting the temporal resolution of the presented terahertz streaking setup are investigated and discussed. Special attention is paid to the cases of very short (similar to 10 fs) and long (up to similar to 350 fs) pulses.We want to acknowledge the work of the scientific and technical team at FLASH. NMK acknowledges the hospitality and financial support from DESY and from the theory group in cooperation with the SQS research group of the European XFEL (Hamburg). KW and MD acknowledge support by the SFB925-A1. UF and AD acknowledge support by the excellence cluster `The Hamburg Center for Ultrafast Imaging-Structure, Dynamics and Control of Matter at the Atomic Scale' (DFG)-EXC 1074 project ID 194651731. SW acknowledges support by the DFG Forschergruppe FOR 1789. Editoria

THz streak camera performance for single-shot characterization of XUV pulses with complex temporal structures

The THz-field-driven streak camera has proven to be a powerful diagnostic-technique that enables the shot-to-shot characterization of the duration and the arrival time jitter of free electron laser (FEL) pulses. Here we investigate the performance of three computational approaches capable to determine the duration of FEL pulses with complex temporal structures from single-shot measurements of up to three simultaneously recorded spectra. We use numerically simulated FEL pulses in order to validate the accuracy of the pulse length retrieval in average as well as in a single-shot mode. We discuss requirements for the THz field strength in order to achieve reliable results and compare our numerical study with the analysis of experimental data that were obtained at the FEL in Hamburg - FLASH. © 2020 Optical Society of America under the terms of the OSA Open Access Publishing Agreemen

Correlated electronic decay in expanding clusters triggered by intense XUV pulses from a Free-Electron-Laser

Irradiation of nanoscale clusters and large molecules with intense laser pulses transforms them into highly-excited non- equilibrium states. The dynamics of intense laser-cluster interaction is encoded in electron kinetic energy spectra, which contain signatures of direct photoelectron emission as well as emission of thermalized nanoplasma electrons. In this work we report on a so far not observed spectrally narrow bound state signature in the electron kinetic energy spectra from mixed Xe core - Ar shell clusters ionized by intense extreme-ultraviolet (XUV) pulses from a free-electron-laser. This signature is attributed to the correlated electronic decay (CED) process, in which an excited atom relaxes and the excess energy is used to ionize the same or another excited atom or a nanoplasma electron. By applying the terahertz field streaking principle we demonstrate that CED-electrons are emitted at least a few picoseconds after the ionizing XUV pulse has ended. Following the recent finding of CED in clusters ionized by intense near-infrared laser pulses, our observation of CED in the XUV range suggests that this process is of general relevance for the relaxation dynamics in laser produced nanoplasmas

Single-Shot Timing Measurement of Extreme-Ultraviolet Free-Electron Laser Pulses

Arrival time fluctuations of extreme-ultraviolet (EUV) pulses from the free-electron laser in Hamburg (FLASH) are measured single-pulse resolved at the experimental end-station. To this end, they are non-collinearly superimposed in space and time with visible femtosecond laser pulses on a GaAs substrate. The EUV irradiation induces changes of the reflectivity for the visible pulse. The temporal delay between the two light pulses is directly encoded in the spatial position of the reflectivity change which is captured with a CCD camera. For each single shot, the relative EUV/visible arrival-time can be measured with about 40 fs rms accuracy. The method constitutes a novel route for an improvement of future pump–probe experiments at short-wavelength free-electron lasers (FELs) by a pulse-wise correction with simultaneously measured arrival times of individual EUV pulses

Single-shot terahertz field driven X-ray streak-camera

A few femtosecond X ray streak camera has been realized using a pump probe scheme that samples the transient response of matter to ionizing soft X ray radiation in the presence of an intense synchronized terahertz field. Borrowing its concept from attosecond metrology, the femtosecond X ray streak camera fills the gap between conventional streak cameras with typical resolutions of hundreds of femtoseconds and streaking techniques operating in the sub femtosecond regime. Its single shot capability permits the duration and time structure of individual X ray pulses to be determined. For several classes of experiments in time resolved spectroscopy, diffraction or imaging envisaged with novel accelerator and laser based short pulse X ray sources this knowledge is essential, but represents a major challenge to X ray metrology. Here we report on the single shot characterization of soft X ray pulses from the free electron laser facility FLAS