Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry

Optical scatterometry is the state of art optical inspection technique for quality control in lithographic process. As such, any boost in its performance carries very relevant potential in semiconductor industry. Recently we have shown that coherent Fourier scatterometry (CFS) can lead to a notably improved sensitivity in the reconstruction of the geometry of printed gratings. In this work, we report on implementation of a CFS instrument, which confirms the predicted performances. The system, although currently operating at a relatively low numerical aperture (NA = 0.4) and long wavelength (633 nm) allows already the reconstruction of the grating parameters with nanometer accuracy, which is comparable to that of AFM and SEM measurements on the same sample, used as reference measurements. Additionally, 1 nm accuracy in lateral positioning has been demonstrated, corresponding to 0.08% of the pitch of the grating used in the actual experiment

Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning

Non-interferometric phase retrieval from the intensity measurements in Coherent Fourier Scatterometry (CFS) is presented using a scanningfocused spot. Formulae to determine the state of polarization of the scattered light and to retrieve the phase difference between overlappingscattered orders are given. The scattered far field is rigorously computed and the functionality of the method is proved with experimentalresults

Scanning effects in coherent fourier scatterometry

Incoherent Fourier Scatterometry (IFS) is a successful tool for high accuracy nano-metrology. As this method uses only far field measurements, it is very convenient from the point of view of industrial applications. A recent development is Coherent Fourier Scatterometry (CFS) in which incoherent illumination is replaced by a coherent one. Through sensitivity analyses using rigorous electromagnetic simulations, we show that the use of coherence and multiple scanning makes Coherent Fourier Scatterometry (CFS) more sensitive than Incoherent Fourier Scatterometry (IFS). We also report that in Coherent Fourier Scatterometry it is possible to determine the position of the sample with respect to the optical axis of the system to a precision dependent only on the experimental noise

Relativistic Hermite polynomials and Lorentz beams

The link between relativistic Hermite polynomials and Lorentz beams is shown. That suggests introducing new optical fields. The paraxial propagation properties of such fields are studied in detail. They are finally put in relation to the so-called Weber-Hermite beams, which emerged within a certain class of general solutions of the 1D paraxial wave equation in Cartesian coordinates as a result of a recent re-analysis of such an equation

Dependence of the degree of paraxiality on field correlations

A linearly polarized optical field can be obtained by filtering a stochastic field through an ideal linear polarizer. The produced field possesses a given degree of paraxiality that, as proved in the present Letter, can be affected by the correlations of the original stochastic field. An example with Gaussian beams is discussed in detail.Imaging Science and TechnologyApplied Science

Diffraction grating parameter retrieval using non-paraxial structured beams in coherent Fourier scatterometry

In recent years, a lot of works have been published that use parameter retrieval using orbital angular momentum (OAM) beams. Most make use of the OAM of different Laguerre-Gauss modes. However, those specific optical beams are paraxial beams and this limits the regime in which they can be used. In this paper, we report on the first results on retrieving the geometric parameters of a diffraction grating by analysing the corresponding complex-valued (i.e. amplitude and phase) Helmholtz Natural Modes (HNM) spectra containing both the azimuthal (i.e. n) and radial (i.e. m) indices. HNMs are a set of orthogonal, non-paraxial beams with finite energy carrying OAM. We use the coherent Fourier scatterometry (CFS) setup to calculate the field scattered from the diffraction grating. The amplitude and phase contributions of each HNM are then obtained by numerically calculating the overlap integral of the scattered field with the different modes. We show results on the sensitivity of the HNMs to several grating parameters. ImPhys/Optic