1,227 research outputs found
A comparative study of experimental configurations in synchrotron pair distribution function
The identification and quantification of amorphous components and nanocrystalline phases
with very small crystal sizes, smaller than ~3 nm, within samples containing crystalline phases is
very challenging. However, this is important as there are several types of systems that contain these
matrices: building materials, glass-ceramics, some alloys, etc. The total scattering synchrotron pair
distribution function (PDF) can be used to characterize the local atomic order of the nanocrystalline
components and to carry out quantitative analyses in complex mixtures. Although the resolution in
momentum transfer space has been widely discussed, the resolution in the interatomic distance space
has not been discussed to the best of our knowledge. Here, we report synchrotron PDF data collected at
three beamlines in different experimental configurations and X-ray detectors. We not only discuss the
effect of the resolution in Q-space, Qmax ins of the recorded data and Qmax of the processed data, but we
also discuss the resolution in the interatomic distance (real) space. A thorough study of single-phase
crystalline nickel used as standard was carried out. Then, selected cement-related samples including
anhydrous tricalcium and dicalcium silicates, and pastes derived from the hydration of tricalcium
silicate and yeâelimite with bassanite were analyzed.This work is part of the PhD of Mr. Jesus D. Zea-Garcia. This work was supported by Spanish MINECO and FEDER [BIA2017-82391-R research project and I3 [IEDI-2016-0079] program]
Epitaxial checkerboard arrangement of nanorods in ZnMnGaO4 films studied by x-ray diffraction
The intriguing nano-structural properties of a ZnMnGaO4 film epitaxially
grown on MgO (001) substrate have been investigated using synchrotron
radiation-based x-ray diffraction. The ZnMnGaO4 film consisted of a
self-assembled checkerboard (CB) structure with perfectly aligned and regularly
spaced vertical nanorods. The lattice parameters of the orthorhombic and
rotated tetragonal phases of the CB structure were analyzed using H-K, H-L, and
K-L cross sections of the reciprocal space maps measured around various
symmetric and asymmetric reflections of the spinel structure. We demonstrate
that the symmetry of atomic displacements at the phases boundaries provides the
means for coherent coexistence of two domains types within the volume of the
film
In-situ strain tuning of the Dirac surface states in Bi2Se3 films
Elastic strain has the potential for a controlled manipulation of the band
gap and spin-polarized Dirac states of topological materials, which can lead to
pseudo-magnetic-field effects, helical flat bands and topological phase
transitions. However, practical realization of these exotic phenomena is
challenging and yet to be achieved. Here, we show that the Dirac surface states
of the topological insulator Bi2Se3 can be reversibly tuned by an externally
applied elastic strain. Performing in-situ x-ray diffraction and in-situ
angle-resolved photoemission spectroscopy measurements during tensile testing
of epitaxial Bi2Se3 films bonded onto a flexible substrate, we demonstrate
elastic strains of up to 2.1% and quantify the resulting reversible changes in
the topological surface state. Our study establishes the functional
relationship between the lattice and electronic structures of Bi2Se3 and, more
generally, demonstrates a new route toward momentum-resolved mapping of
strain-induced band structure changes
Design, Control and in Situ Visualization of Gas Nitriding Processes
The article presents a complex system of design, in situ visualization and control of the commonly used surface treatment process: the gas nitriding process. In the computer design conception, analytical mathematical models and artificial intelligence methods were used. As a result, possibilities were obtained of the poly-optimization and poly-parametric simulations of the course of the process combined with a visualization of the value changes of the process parameters in the function of time, as well as possibilities to predict the properties of nitrided layers. For in situ visualization of the growth of the nitrided layer, computer procedures were developed which make use of the results of the correlations of direct and differential voltage and time runs of the process result sensor (magnetic sensor), with the proper layer growth stage. Computer procedures make it possible to combine, in the duration of the process, the registered voltage and time runs with the models of the process
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