Passivation behaviour of Alloy 31 (UNS N08031) in polluted phosphoric acid at different temperatures

The influence of temperature (20–80 °C) and chloride concentration (0.06–0.42 wt.% KCl) on the electrochemical behaviour of the UNS N08031 was studied in 40 wt.% polluted phosphoric acid solution. Passivation behaviour was investigated by using potentiostatic tests at different potentials. From the linear regions of the log i vs. log t transients, the parameter n was obtained. The results showed that the applied potential hardly affects on the passivation rate n. However, n values decreased when temperature increased. The values of n demonstrated that the passive film formed on Alloy 31 was compact and highly protective.The authors express their gratitude to the MAEC of Spain (PCI Mediterraneo C/8196/07, C/018046/08, D/023608/09 and D/030177/10), to Programa de Apoyo a la Investigacion y Desarrollo de la UPV (PAID-06-09) and to the Generalitat Valenciana (GV/2011/093) for the financial support and to Dr. Asuncion Jaime for her translation assistance.Escrivá Cerdán, C.; Blasco Tamarit, ME.; García García, DM.; García Antón, J.; Guenbour, A. (2012). Passivation behaviour of Alloy 31 (UNS N08031) in polluted phosphoric acid at different temperatures. Corrosion Science. 56:114-122. https://doi.org/10.1016/j.corsci.2011.11.014S1141225

Effect of temperature on passive film formation of UNS N08031 Cr-Ni alloy in phosphoric acid contaminated with different aggressive anions

tThe influence of temperature and the effect of aggressive anions on the electrochemical behaviour of UNSN08031 stainless steel in a contaminated phosphoric acid solution were evaluated. Stabilisation of thepassive film was studied by potentiodynamic polarisation curves, potentiostatic tests, electrochemicalimpedance spectroscopy (EIS) measurements, Mott Schottky analysis and X-ray photoelectron spec-troscopy (XPS). The stability of the passive film was found to decrease as temperature increases. The filmformed on the stainless steel surface was a n-type semiconductor and the XPS spectrum revealed thepresence of fluoride ions.Authors express their gratitude to the Ministry of Education of Spain (MHE2011-00202) for its financial support during the stay at University of Manchester, to MAEC of Spain (PCI Mediterraneo C/8196/07, C/018046/08, D/023608/09 and D/030177/10) and to the Generalitat Valenciana (GV/2011/093) for the financial support. The authors would also like to acknowledge the support of the School of Materials at the University of Manchester for providing analytical and technical support for the study.Escrivá Cerdán, C.; Blasco Tamarit, ME.; García García, DM.; García Antón, J.; Akid, R.; Walton, J. (2013). Effect of temperature on passive film formation of UNS N08031 Cr-Ni alloy in phosphoric acid contaminated with different aggressive anions. Electrochimica Acta. 111:552-561. https://doi.org/10.1016/j.electacta.2013.08.040S55256111