Evaluating Constraints on Heavy-Ion SEE Susceptibility Imposed by Proton SEE Testing and Other Mixed Environments

We develop metrics for assessing the effectiveness of proton SEE data for bounding heavy-ion SEE susceptibility. The metrics range from simple geometric criteria requiring no knowledge of the test articles to bounds of SEE rates

Statistical Model Selection for TID Hardness Assurance

Radiation Hardness Assurance (RHA) methodologies against Total Ionizing Dose (TID) degradation impose rigorous statistical treatments for data from a part's Radiation Lot Acceptance Test (RLAT) and/or its historical performance. However, no similar methods exist for using "similarity" data - that is, data for similar parts fabricated in the same process as the part under qualification. This is despite the greater difficulty and potential risk in interpreting of similarity data. In this work, we develop methods to disentangle part-to-part, lot-to-lot and part-type-to-part-type variation. The methods we develop apply not just for qualification decisions, but also for quality control and detection of process changes and other "out-of-family" behavior. We begin by discussing the data used in the study and the challenges of developing a statistic providing a meaningful measure of degradation across multiple part types, each with its own performance specifications. We then develop analysis techniques and apply them to the different data sets

Effects of Bias, Electrical and Thermal Stress on DDR2 Total Ionizing Dose Response

We investigate whether bias conditions arid electrical and thermal stresses can affect the Total Ionizing Dose response ofDDR2 SDRAM

Bayesian Methods for Bounding Single-Event Related Risk in Low-Cost Satellite Missions

We develop single-event risk Prior probability distributions based on historical and heritage data. The Priors can be used to bound single-event effects risk for testing, part selection and design

Guidelines for Verification Strategies to Minimize RISK Based on Mission Environment, -Application and -Lifetime (MEAL)

There is a trend of compromising verification testing to address the cost and schedule constraints, which poses a high-risk posture for programs/projects. Current and emerging aerospace scientific and/or human exploration programs continue to pose new technological challenges. These technological challenges combined with finite budgets and truncated schedules are forcing designers, scientists, engineers, and managers to push technologies to their physical limits. In addition, budget and schedule pressures challenge how those technologies/missions are verified. A clear understanding of the different verification processes is needed to ensure the proper verification of the technology within the mission (i.e., capabilities, advantages, and limitations). The goal of verification is to prove through test, analysis, inspection, and/or demonstration that a product provides its required function while meeting the performance requirements. It is important that verification yield understanding of representative performance under worst-case conditions so that margins to failure can be evaluated for proposed applications. The capabilities, advantages, and limitations of the testing and inspection performed at each level are different, and the risk incurred by omitting a verification step depends on the level of integration as well as Mission, Environment, Application and Lifetime (MEAL). This paper focuses on verification processes. The goal of the verification process is to ensure the given avionics technology could be safely implemented on the given MEAL consistent with the program/project risk posture

Radiation Performance of 1 Gbit DDR SDRAMs Fabricated in the 90 nm CMOS Technology Node

We present Single Event Effect (SEE) and Total Ionizing Dose (TID) data for 1 Gbit DDR SDRAMs (90 nm CMOS technology) as well as comparing this data with earlier technology nodes from the same manufacturer

Comparison of Measured Dark Current Distributions with Calculated Damage Energy Distributions in HgCdTe

This paper presents a combined Monte Carlo and analytic approach to the calculation of the pixel-to-pixel distribution of proton-induced damage in a HgCdTe sensor array and compares the results to measured dark current distributions after damage by 63 MeV protons. The moments of the Coulombic, nuclear elastic and nuclear inelastic damage distributions were extracted from Monte Carlo simulations and combined to form a damage distribution using the analytic techniques first described in [1]. The calculations show that the high energy recoils from the nuclear inelastic reactions (calculated using the Monte Carlo code MCNPX [2]) produce a pronounced skewing of the damage energy distribution. While the nuclear elastic component (also calculated using the MCNPX) contributes only a small fraction of the total nonionizing damage energy, its inclusion in the shape of the damage across the array is significant. The Coulombic contribution was calculated using MRED [3-5], a Geant4 [4,6] application. The comparison with the dark current distribution strongly suggests that mechanisms which are not linearly correlated with nonionizing damage produced according to collision kinematics are responsible for the observed dark current increases. This has important implications for the process of predicting the on-orbit dark current response of the HgCdTe sensor array

Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs

We investigate the use of commercial FPGA based evaluation boards for radiation testing DDR2 and DDR3 SDRAMs. We evaluate the resulting data quality and the tradeoffs involved in the use of these boards

Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is presented. Devices tested include digital, linear, and hybrid devices