Industrial Freeform Generation of Microtools by Laser Micro Sintering

Precision tools with structural resolution reaching the 20 micrometer range can be generated on an industrial scale by “laser micro sintering”. Components featuring aspect ratios above 12 and a roughness Ra down to 1.5 micrometers have already been produced from sub micrometer grained metal powders. The components can be generated either firmly attached to a substrate or fixed in an easily separable mode. If supporting structures are employed, undercuts up to 90° are feasible, without, a process parameter dependent maximum angles of undercut below 90° are obtained. The process has been introduced into the market, labeled microSINTERING by 3D-Micromac AG.Mechanical Engineerin

Principles of Laser Micro Sintering

Laser Micro Sintering was introduced to the international community of freeform fabrication engineers in 2003 and has since been employed for a variety of applications. It owes its unique features to certain effects of q-switched pulses that formerly had been considered detrimental in selective laser sintering. Besides sub-micrometer sized powders also materials with grain sizes of 1-10 micrometers can be sintered. Surface and morphology of the product are influenced by grain size and process environment. First results have been achieved with processing ceramic materials. A comprehensive overview of the process and the features is given supported by experimental evidence. Routes of further development are indicated.Mechanical Engineerin

Multi-level optical signal generation using a segmented-electrode InP IQ-MZM with integrated CMOS binary drivers

We present a segmented-electrode InP IQ-MZM, capable of multi-level optical signal generation (5-bit per I/Q arm) by employing direct digital drive from integrated, low-power (1W) CMOS binary drivers. Programmable, multi-level operation is demonstrated experimentally on one MZM of the device

Ambient Pressure XPS Study of Mixed Conducting Perovskite-type SOFC Cathode and Anode Materials under Well-Defined Electrochemical Polarization

The oxygen exchange activity of mixed conducting oxide surfaces has been widely investigated, but a detailed understanding of the corresponding reaction mechanisms and the rate-limiting steps is largely still missing. Combined in situ investigation of electrochemically polarized model electrode surfaces under realistic temperature and pressure conditions by near-ambient pressure (NAP) XPS and impedance spectroscopy enables very surface-sensitive chemical analysis and may detect species that are involved in the rate-limiting step. In the present study, acceptor-doped perovskite-type La0.6Sr0.4CoO3-δ (LSC), La0.6Sr0.4FeO3-δ (LSF), and SrTi0.7Fe0.3O3-δ (STF) thin film model electrodes were investigated under well-defined electrochemical polarization as cathodes in oxidizing (O2) and as anodes in reducing (H2/H2O) atmospheres. In oxidizing atmosphere all materials exhibit additional surface species of strontium and oxygen. The polaron-type electronic conduction mechanism of LSF and STF and the metal-like mechanism of LSC are reflected by distinct differences in the valence band spectra. Switching between oxidizing and reducing atmosphere as well as electrochemical polarization cause reversible shifts in the measured binding energy. This can be correlated to a Fermi level shift due to variations in the chemical potential of oxygen. Changes of oxidation states were detected on Fe, which appears as FeIII in oxidizing atmosphere and as mixed FeII/III in H2/H2O. Cathodic polarization in reducing atmosphere leads to the reversible formation of a catalytically active Fe0 phase

Growth and decomposition of aligned and ordered PdO nanoparticles

The formation, thermal decomposition, and reduction of small PdO particles were studied by high-resolution transmission electron microscopy and selected area electron diffraction. Well-defined Pd particles (mean size of 5–7 nm) were grown epitaxially on NaCl (001) surfaces and subsequently covered by a layer of amorphous SiO2 (25 nm), prepared by reactive deposition of SiO in 10–2 Pa O2. The resulting films were exposed to molecular O2 in the temperature range of 373–673 K, and the growth of PdO was studied. The formation of a PdO phase starts at 623 K and is almost completed at 673 K. The high-resolution experiments suggest a topotactic growth of PdO crystallites on top of the original Pd particles. Subsequent reaction of the PdO in 10 mbar CO for 15 min and thermal decomposition in 1 bar He for 1 h were also investigated in the temperature range from 373 to 573 K. Reductive treatments in CO up to 493 K do not cause a significant change in the PdO structure. The reduction of PdO starts at 503 K and is completed at 523 K. In contrast, PdO decomposes in 1 bar He at around 573 K. The mechanism of PdO growth and decay is discussed and compared to results of previous studies on other metals, e.g., on rhodium

Combined UHV/high-pressure catalysis setup for depth-resolved near-surface spectroscopic characterization and catalytic testing of model catalysts

An ultra-high vacuum (UHV) setup for “real” and “inverse” model catalyst preparation, depth-resolved near-surface spectroscopic characterization, and quantification of catalytic activity and selectivity under technologically relevant conditions is described. Due to the all-quartz reactor attached directly to the UHV-chamber, transfer of the catalyst for in situ testing without intermediate contact to the ambient is possible. The design of the UHV-compatible re-circulating batch reactor setup allows the study of reaction kinetics under close to technically relevant catalytic conditions up to 1273 K without contact to metallic surfaces except those of the catalyst itself. With the attached differentially pumped exchangeable evaporators and the quartz-microbalance thickness monitoring equipment, a reproducible, versatile, and standardised sample preparation is possible. For three-dimensional near-surface sample characterization, the system is equipped with a hemispherical analyser for X-ray photoelectron spectroscopy (XPS), electron-beam or X-ray-excited Auger-electron spectroscopy, and low-energy ion scattering measurements. Due the dedicated geometry of the X-ray gun (54.7°, “magic angle”) and the rotatable sample holder, depth analysis by angle-resolved XPS measurements can be performed. Thus, by the combination of characterisation methods with different information depths, a detailed three-dimensional picture of the electronic and geometric structure of the model catalyst can be obtained. To demonstrate the capability of the described system, comparative results for depth-resolved sample characterization and catalytic testing in methanol steam reforming on PdGa and PdZn near-surface intermetallic phases are shown