Dynamic Response of a fast near infra-red Mueller matrix ellipsometer

The dynamic response of a near infrared Ferroelectric Liquid Crystal based Mueller matrix ellipsometer (NIR FLC-MME) is presented. A time dependent simulation model, using the measured time response of the individual FLCs, is used to describe the measured temporal response. Furthermore, the impulse response of the detector and the pre-amplifier is characterized and included in the simulation model. The measured time-dependent intensity response of the MME is reproduced in simulations, and it is concluded that the switching time of the FLCs is the limiting factor for the Mueller matrix measurement time of the FLC-based MME. Based on measurements and simulations our FLC based NIR-MME system is estimated to operate at the maximum speed of approximately 16 ms per Mueller matrix measurement. The FLC-MME may be operated several times faster, since the switching time of the crystals depends on the individual crystal being switched, and to what state it is switched. As a demonstration, the measured temporal response of the Mueller matrix and the retardance of a thick liquid crystal variable retarder upon changing state is demonstrated.Comment: to be published in Journal of Modern Optics 20 pages, 6 figure

Diffuse-interface model for nanopatterning induced by self-sustained ion etch masking

We construct a simple phenomenological diffuse-interface model for composition-induced nanopatterning during ion sputtering of alloys. In simulations, this model reproduces without difficulties the high-aspect ratio structures and tilted pillars observed in experiments. We investigate the time evolution of the pillar height, both by simulations and by {\it in situ} ellipsometry. The analysis of the simulation results yields a good understanding of the transitions between different growth regimes and supports the role of segregation in the pattern-formation process.Comment: 10 pages, 3 figures; minor revisions with respect to first version; figures nicened; journal ref. adde

Mueller matrix measurements and modeling pertaining to Spectralon white reflectance standards

The full Mueller matrix for a Spectralon white reflectance standard was measured in the incidence plane, to obtain the polarization state of the scattered light for different angles of illumination. The experimental setup was a Mueller matrix ellipsometer, by which measurements were performed for scattering angles measured relative to the normal of the Spectralon surface from −90° to 90° sampled at every 2.5° for an illumination wavelength of 532 nm. Previously, the polarization of light scattered from Spectralon white reflectance standards was measured only for four of the elements of the Muller matrix. As in previous investigations, the reflection properties of the Spectralon white reflectance standard was found to be close to those of a Lambertian surface for small scattering and illumination angles. At large scattering and illumination angles, all elements of the Mueller matrix were found to deviate from those of a Lambertian surface. A simple empirical model with only two parameters, was developed, and used to simulate the measured results with fairly good accuracy.publishedVersio

Field Emission Dark Current of Technical Metallic Electrodes

In the framework of the Low Emittance Gun (LEG) project, high gradient acceleration of a low emittance electron beam will be necessary. In order to achieve this acceleration a -500 kV, 250 ns FWHM, pulse will be applied in between two electrodes. Those electrodes should sustain the pulsed field without arcing, must not outgass and must not emit electrons. Ion back bombardment, and dark current will be damageable to the electron source as well as for the low emittance beam. Electrodes of commercially available OFE copper, aluminium, stainless steel, titanium and molybdenum were tested following different procedures including plasma glow discharge cleaning.Comment: 22 pages, 6 tables, 10 figures Vs 2 : graphics more readable, enhanced content Vs 3 : typo correcte

Characterisation of nanostructured GaSb : Comparison between large-area optical and local direct microscopic techniques

Low energy ion-beam sputtering of GaSb results in self-organized nanostructures, with the potential of structuring large surface areas. Characterisation of such nanostructures by optical methods is studied and compared to direct (local) microscopic methods. The samples consist of densely packed GaSb cones on bulk GaSb, approximately 30, 50 and 300 nm in height, prepared by sputtering at normal incidence. The optical properties are studied by spectroscopic ellipsometry, in the range 0.6-6.5 eV, and with Mueller matrix ellipsometry in the visible range, 1.46-2.88 eV. The optical measurements are compared to direct topography measurements obtained by Scanning Electron Microscopy (SEM), High Resolution Transmission Electron Microscopy (HR-TEM), and Atomic Force Microscopy (AFM). Good agreement is achieved between the two classes of methods when the experimental optical response of the short cones (<55 nm) is inverted with respect to topological surface information via a graded anisotropic effective medium model. The main topological parameter measured was the average cone height, but estimates of typical cone shape and density (in terms of volume fractions) were also obtained. The graded anisotropic effective medium model treats the cones as a stack of concentric cylinders (discs) of non-increasing radii. Optical methods are shown to represent a valuable characterization tool for nanostructured surfaces, in particular when large coverage area is desirable. Due to the fast and non-destructive properties of optical techniques, they may readily be adapted to in-situ configurations

Fast and optimal broad-band Stokes/Mueller polarimeter design by the use of a genetic algorithm

A fast multichannel Stokes/Mueller polarimeter with no mechanically moving parts has been designed to have close to optimal performance from 430-2000 nm by applying a genetic algorithm. Stokes (Mueller) polarimeters are characterized by their ability to analyze the full Stokes (Mueller) vector (matrix) of the incident light. This ability is characterized by the condition number, $\kappa$, which directly influences the measurement noise in polarimetric measurements. Due to the spectral dependence of the retardance in birefringent materials, it is not trivial to design a polarimeter using dispersive components. We present here both a method to do this optimization using a genetic algorithm, as well as simulation results. Our results include fast, broad-band polarimeter designs for spectrographic use, based on 2 and 3 Ferroelectric Liquid Crystals, whose material properties are taken from measured values. The results promise to reduce the measurement noise significantly over previous designs, up to a factor of 4.5 for a Mueller polarimeter, in addition to extending the spectral range.Comment: 10 pages, 6 figures, submitted to Optics Expres