190 research outputs found

    ヘモグロビンM症の病態生化学的研究

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    Two new 3-fold interpenetrated 3D microporous metal-organic coordination polymers (MOCPs) of Cu(II), [Cu<SUB>3</SUB>(bipy)<SUB>1.5</SUB>(2,6-ndc)<SUB>3</SUB>]<SUB>n</SUB> (1) and {[Cu(bpe)<SUB>0.5</SUB>(2,6-ndc)]·0.5H<SUB>2</SUB>O}<SUB>n</SUB> (2) (bipy = 4,4′-bipyridine; bpe = 1,2-bis(4-pyridyl)ethane; and 2,6-ndc = 2,6-naphthalenedicarboxylate), have been synthesized using a mixed-ligand system and structurally characterized by single-crystal X-ray diffraction study. Room-temperature reaction of Cu(II) with bipy and 2,6-ndc affords 1, whereas reaction with bpe and 2,6-ndc yields 2. Structure determination reveals that in both cases, a 2D square grid made by Cu(II) and 2,6-ndc with the aid of Cu<SUB>2</SUB>(CO<SUB>2</SUB>)<SUB>4</SUB> paddlewheel building block is connected by bipy (1) or bpe (2) organic pillar results 3D &#x00391;-polonium type frameworks. Framework 1 is rigid and robust without any guest molecules, whereas 2 is flexible, realized by the guest induced structural transformations. Both the frameworks show high thermal stability. Framework 1 and dehydrated form of 2, i.e 2′ contains 16.6% and 21.4% void space, respectively and Langmuir surface area calculated from nitrogen adsorption study for 1 and 2′ is 113.0 and 337.5 m<SUP>2</SUP>/g, respectively. Both the frameworks can store approximately 1 wt % of molecular hydrogen at 77 K and 15 bar, in particular, the density of adsorbed hydrogen in 1 is one of the highest reported so far in porous MOCPs. Compounds 1 and 2′ can also store 11.0 and 13.2 wt % carbon dioxide at 195 K

    Crystallographic studies of gas sorption in metal-organic frameworks.

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    Metal-organic frameworks (MOFs) are a class of porous crystalline materials of modular design. One of the primary applications of these materials is in the adsorption and separation of gases, with potential benefits to the energy, transport and medical sectors. In situ crystallography of MOFs under gas atmospheres has enabled the behaviour of the frameworks under gas loading to be investigated and has established the precise location of adsorbed gas molecules in a significant number of MOFs. This article reviews progress in such crystallographic studies, which has taken place over the past decade, but has its origins in earlier studies of zeolites, clathrates etc. The review considers studies by single-crystal or powder diffraction using either X-rays or neutrons. Features of MOFs that strongly affect gas sorption behaviour are discussed in the context of in situ crystallographic studies, specifically framework flexibility, and the presence of (organic) functional groups and unsaturated (open) metal sites within pores that can form specific interactions with gas molecules

    Physical Deviation of School Children : Examples in Tottori

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    Theoritical Characterization of Different Samples Using Rotating Polarizer and Analyzer Ellipsometer with A Fixed Compensator

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    Ellipsometry is an extremely powerful tool for the study the optical properties of materials with high optical data precision in measurement. Being accurate, fast and non-destructive in data acquisition and characterization of the samples, ellipsometry has been widely applied especially in the scientific research labs and microelectronic industry with continuous efforts and progress made by developing different theoretical models and experimental techniques. In this work, an ellipsometer using a fixed phase retarder and a rotating polarizer and analyzer at any speed ratio is presented. Muller formalism is employed to extract Stokes parameters from which the intensity received by the detector is obtained. A comparison between different configurations is held regarding the effect of the noise on the results extracted from each one and the uncertainties in the ellipsometric parameters as functions of the uncertainties of the Fourier coefficients. Moreover, a set of ellipsometric configurations using a rotating polarizer, compensator, and analyzer at any speed ratio is studied. All configurations are applied to bulk c-Si and GaAs to calculate the real and imaginary parts of the refractive index of the samples. The comparison among different configurations reveals that rotating compensator-analyzer configuration corresponds to the minimum error in the calculated optical parameters

    田代信二先生を偲ぶ

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    田代信二先生を偲ぶ

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