Electrical properties of Bi-implanted amorphous chalcogenide films

The impact of Bi implantation on the conductivity and the thermopower of amorphous chalcogenide films is investigated. Incorporation of Bi in Ge-Sb-Te and GeTe results in enhanced conductivity. The negative Seebeck coefficient confirms onset of the electron conductivity in GeTe implanted with Bi at a dose of 2x1016 cm-2. The enhanced conductivity is accompanied by defect accumulation in the films upon implantation as is inferred by using analysis of the space-charge limited current. The results indicate that native coordination defects in lone-pair semiconductors can be deactivated by means of ion implantation, and higher conductivity of the films stems from additional electrically active defects created by implantation of bismuth.Comment: This is an extended version of the results presented in Proc. SPIE 8982, 898213 (2014

Sampling and Analysis of Impact Crater Residues Found on the Wide Field Planetary Camera-2 Radiator

After nearly 16 years in low Earth orbit (LEO), the Wide Field Planetary Camera-2 (WFPC2) was recovered from the Hubble Space Telescope (HST) in May 2009, during the 12 day shuttle mission designated STS-125. The WFPC-2 radiator had been struck by approximately 700 impactors producing crater features 300 microns and larger in size. Following optical inspection in 2009, agreement was reached for joint NASA-ESA study of crater residues, in 2011. Over 480 impact features were extracted at NASA Johnson Space Center's (JSC) Space Exposed Hardware clean-room and curation facility during 2012, and were shared between NASA and ESA. We describe analyses conducted using scanning electron microscopy (SEM) - energy dispersive X-ray spectrometry (EDX): by NASA at JSC's Astromaterials Research and Exploration Science (ARES) Division; and for ESA at the Natural History Museum (NHM), with Ion beam analysis (IBA) using a scanned proton microbeam at the University of Surrey Ion Beam Centre (IBC)

Impacts on the Hubble Space Telescope Wide Field and Planetary Camera 2: Microanalysis and Recognition of Micrometeoroid Compositions

Postflight surveys of the Wide Field and Planetary Camera 2 (WFPC2) on the Hubble Space Telescope have located hundreds of features on the 2.2 by 0.8 m curved plate, evidence of hypervelocity impact by small particles during 16 years of exposure to space in low Earth orbit (LEO). The radiator has a 100 - 200 micron surface layer of white paint, overlying 4 mm thick Al alloy, which was not fully penetrated by any impact. Over 460 WFPC2 samples were extracted by coring at JSC. About half were sent to NHM in a collaborative program with NASA, ESA and IBC. The structural and compositional heterogeneity at micrometer scale required microanalysis by electron and ion beam microscopes to determine the nature of the impactors (artificial orbital debris, or natural micrometeoroids, MM). Examples of MM impacts are described elsewhere. Here we describe the development of novel electron beam analysis protocols, required to recognize the subtle traces of MM residues

Micrometeoroid Impacts on the Hubble Sace Telescope Wide Field and Planetary Camera 2: Ion Beam Analysis of Subtle Impactor Traces

Recognition of origin for particles responsible for impact damage on spacecraft such as the Hubble Space Telescope (HST) relies upon postflight analysis of returned materials. A unique opportunity arose in 2009 with collection of the Wide Field and Planetary Camera 2 (WFPC2) from HST by shuttle mission STS-125. A preliminary optical survey confirmed that there were hundreds of impact features on the radiator surface. Following extensive discussion between NASA, ESA, NHM and IBC, a collaborative research program was initiated, employing scanning electron microscopy (SEM) and ion beam analysis (IBA) to determine the nature of the impacting grains. Even though some WFPC2 impact features are large, and easily seen without the use of a microscope, impactor remnants may be hard to find

Hypervelocity impact in low earth orbit: finding subtle impactor signatures on the Hubble Space Telescope

Return of materials from the Hubble Space Telescope (HST) during shuttle orbiter service missions has allowed inspection of large numbers of hypervelocity impact features from long exposure at about 615 km altitude in low Earth orbit (LEO) [1,2]. Here we describe the application of advanced X-ray microanalysis techniques on scanning electron microscopes (SEM), microprobes and a 2 MV Tandetron, to nearly 400 impacts on the painted metal surface of the Wide Field and Planetary Camera 2 (WFPC2) radiator shield [3,4]. We identified artificial Orbital Debris (OD) and natural Micrometeoroid (MM) origins for small [5] and even for larger particles [6], which usually may leave little or no detectable trace on HST solar arrays, as they penetrate through the full cell thickness [2,7]

Micrometeoroid Impacts on the Hubble Space Telescope Wide Field and Planetary Camera 2: Smaller Particle Impacts

The radiator shield on the Wide Field and Planetary Camera 2 (WFPC2) was subject to optical inspection following return from the Hubble Space Telescope (HST) in 2009. The survey revealed over 600 impact features of > 300 micrometers diameter, from exposure in space for 16 years. Subsequently, an international collaborative programme of analysis was organized to determine the origin of hypervelocity particles responsible for the damage. Here we describe examples of the numerous smaller micrometeoroid (MM) impact features (< 700 micrometers diameter) which excavated zinc orthotitanate (ZOT) paint from the radiator surface, but did not incorporate material from underlying Al alloy; larger impacts are described by [3]. We discuss recognition and interpretation of impactor remains, and MM compositions found on WFPC2

Simultaneous depth profiling of the C-12 and C-13 elements in different samples using (d,p) reactions

Nuclear reactions (d,p) are often used to perform depth profiling of light elements in solids. In particular, protons coming from C-12(d,p(0)) C-13 and C-13(d,p(0)) C-14 reactions are emitted at very different energies. Consequently these two reactions can be used to depth profile C-12 and C-13 simultaneously. Nevertheless the cross-section of C-13(d,p(0)) C-14 reaction is 10 times smaller than the C-12(d,p(0)) C-13 one. So, the geometry of detection must be judiciously chosen in order to depth profile these two elements with a high sensitivity and good resolution. In the framework of this study we have performed 400 keV C-13 ions implantation into polished copper substrates at different temperatures and implanted doses with a 2 MV Tandem accelerator. Using the reactions described above, we have studied the evolution of C-13 depth profile as a function of implanted doses and temperature. We have also determined the origin of surface contamination that appears during the implantation process