A Rad-hard On-chip CMOS Charge Detector with High Dynamic Range

This article introduces a CMOS charge detector tailored for measuring ionizing radiation in a wide range of fluences. It represents an entirely on-chip solution based on capacitive sensing. It was fabricated using a standard 0.18 μm CMOS process and employs Metal-insulator-Metal (MiM) capacitor arrays to attain high matching, low leakage, and minimal process variations. The sensing area was radhardened with a post-CMOS layer of metal deposited with a Focus Ion Beam (FIB) that removes the use of external metallic plates. Experimental testing under the electron beam of a scanning electron microscope (SEM) demonstrated radiation hardness at energies up to 10 keV, with a very high dynamic range of up to 138 dB (externally adjustable), and with a sensitivity of 1.43 μV/e-. By harnessing the detection of relative charge variations instead of relying on absolute values, this approach proves highly suitable for particle event detection and facilitates future integrations compatible with the Address Event Representation (AER) communication protocol.Ministerio de Ciencia, Innovación y Universidades PGC2018-101538-A-I00, PID2021-128009OBC31, VERSO AT21_00096, P20_0120

Tomographic Heating Holder for In Situ TEM:Study of Pt/C and PtPd/Al2O3 Catalysts as a Function of Temperature

A tomographic heating holder for transmission electron microscopy that can be used to study supported catalysts at temperatures of up to ~1,500°C is described. The specimen is placed in direct thermal contact with a tungsten filament that is oriented perpendicular to the axis of the holder without using a support film, allowing tomographic image acquisition at high specimen tilt angles with minimum optical shadowing. We use the holder to illustrate the evolution of the active phases of Pt nanoparticles on carbon black and PtPd nanoparticles on ¿-alumina with temperature. Particle size distributions and changes in active surface area are quantified from tilt series of images acquired after subjecting the specimens to increasing temperatures. The porosity of the alumina support and the sintering mechanisms of the catalysts are shown to depend on distance from the heating filament.Peer Reviewe

Removing the effects of the “dark matter” in tomography

lectron tomography (ET) using different imaging modes has been progressively consolidating its position as a key tool in materials science. The fidelity of a tomographic reconstruction, or tomogram, is affected by several experimental factors. Most often, an unrealistic cloud of intensity that does not correspond to a real material phase of the specimen (“dark matter”) blurs the tomograms and enhances artefacts arising from the missing wedge (MW). Here we show that by simple preprocessing of the background level of any tomographic tilt series, it is possible to minimise the negative effects of that “dark matter”. Iterative reconstruction algorithms converge better, leading to tomograms with fewer streaking artefacts from the MW, more contrast, and increased accuracy. The conclusions are valid irrespective of the imaging mode used, and the methodology improves the segmentation and visualisation of tomograms of both crystalline and amorphous materials. We show examples of HAADF STEM and BF TEM tomography.Peer reviewe

Cellular-Neural-Network Focal-Plane Processor as Pre-Processor for ConvNet Inference

Cellular Neural Networks (CNN 1 ) can be embodied in the form of a focal-plane image processor. They represent a computing paradigm with evident advantages in terms of energy and resources. Their operation relies in the strong parallelization of the processing chain thanks to a distributed allocation of computing resources. In this way, image sensing and ultra-fast processing can be embedded in a single chip. This makes them good candidates for portable and/or distributed applications in fields like autonomous robots or smart cities. With the irruption of visual features learning through convolutional neural networks (ConvNets), several works attempt to implement this functionality within the CNN framework. In this paper we carry out some experiments on the implementation of ConvNets with CNN hardware in the form of a focal-plane image processor. It is shown that ultra-fast inference can be implemented, using as an example a LeNet-based ConvNet architecturePeer reviewe

Transmission electron microscopy of thiol-capped Au clusters on C: Structure and electron irradiation effects

High-resolution transmission electron microscopy is used to study interactions between thiol-capped Au clusters and amorphous C support films. The morphologies of the clusters are found to depend both on their size and on the local structure of the underlying C. When the C is amorphous, larger Au clusters are crystalline, while smaller clusters are typically disordered. When the C is graphitic, the Au particles adopt either elongated shapes that maximize their contact with the edge of the C film or planar arrays when they contain few Au atoms. We demonstrate the influence of electron beam irradiation on the structure, shape and stability of the Au clusters, as well as on the formation of holes bounded by terraces of graphitic lamellae in the underlying C

Detecting single-electron events in TEM using low-cost electronics and a silicon strip sensor

There is great interest in developing novel position-sensitive direct detectors for transmission electron microscopy (TEM) that do not rely in the conversion of electrons into photons. Direct imaging improves contrast and efficiency and allows the operation of the microscope at lower energies and at lower doses without loss in resolution, which is especially important for studying soft materials and biological samples. We investigate the feasibility of employing a silicon strip detector as an imaging detector for TEM. This device, routinely used in high-energy particle physics, can detect small variations in electric current associated with the impact of a single charged particle. The main advantages of using this type of sensor for direct imaging in TEM are its intrinsic radiation hardness and large detection area. Here, we detail design, simulation, fabrication and tests in a TEM of the front-end electronics developed using low-cost discrete components and discuss the limitations and applications of this technology for TEMPeer reviewe

Vertically Stacked CMOS-compatible Photodiodes for Scanning Electron Microscopy

This paper reports the use of vertically stacked photodiodes as compact solid-state spectrometers for transmission scanning electron microscopy. SEM microscopes operate by illuminating the sample with accelerated electrons. They can have one or more solid-state sensors. In this work we have tested a set of stacked photodiodes fabricated in a standard 180nm HV-CMOS technology without process modifications. We have measured their sensitivity to electron irradiation in the energy range between 10keV and 30keV. We have also assessed their radiation hardness. The experiments are compared with Monte Carlo simulations to investigate their spectral sensitivityPeer reviewe

Impregnation of carbon black for the examination of colloids using TEM

Nanoparticles are frequently synthesised as colloids, dispersed in solvents such as water, hexane or ethanol. For their characterisation by transmission electron microscopy (TEM), a drop of colloid is typically deposited on a carbon support and the solvent allowed to evaporate. However, this method of supporting the nanoparticles reduces the visibility of fine atomic details, particularly for carbonaceous species, due to interference from the 2-dimensional carbon support at most viewing angles. We propose here the impregnation of a 3 dimensional carbon black matrix that has been previously deposited on a carbon film as an alternative means of supporting colloidal nanoparticles, and show examples of the application of this method to advanced TEM techniques in the analysis of monometallic, core@shell and hybrid nanoparticles with carbon-based shellsPeer reviewe