Rapid thermal annealing: An efficient method to improve the electrical properties of tellurium compensated Interfacial Misfit GaSb/GaAs heterostructures

The effect of thermal annealing on Te compensated Interfacial Misfit GaSb/GaAs heterostructures is investigated by using two different thermal annealing procedures, namely rapid thermal annealing and furnace annealing. The electrical properties of the devices are studied by using Current–Voltage, Capacitance–Voltage and Deep Level Transient Spectroscopy techniques. It is observed that rapid thermal annealing treatment is superior in terms of improvement of the electrical characteristics compared to furnace annealing treatment. The lowest leakage current and defect concentration are obtained when rapid thermal annealing is employed

Investigation of optical and electrical properties of erbium-doped TiO2 thin films for photodetector applications

We have investigated the electrical and optical properties of erbium (Er3+) doped TiO2 thin films (Er:TiO2 TFs) grown by sol–gel technique on glass and silicon substrates. The samples were characterized by field emission gun–scanning electron microscopes (FEG–SEM), energy dispersive X-ray spectroscopy (EDX), atomic force microscopy (AFM), X-ray diffraction (XRD), photoluminescence (PL) and current–voltage measurement techniques. FEG–SEM and AFM images showed the morphological change in the structure of Er:TiO2 TFs and EDX analysis confirmed the Er3+ doped into TiO2 lattice. Broad PL emissions in visible and infrared regions were observed in undoped TiO2 samples and associated to different mechanisms due to the anatase and rutile phases. PL spectra revealed sharp peaks at 525 nm, 565 nm, 667 nm and 1.54 µm which are related to Er3+ emissions in Er:TiO2 samples. The undoped TiO2 and Er:TiO2 TFs based UV-photodetectors were fabricated, and various device parameters were investigated. The doped devices exhibit high photoresponse upon illuminating 350 nm UV light at 2 V bias with faster response time compared to undoped device

Effect of thermal annealing on the optical and structural properties of (311)B and (001) GaAsBi/GaAs single quantum wells grown by MBE

The effect of Furnace Annealing (FA) and Rapid Thermal annealing (RTA) on the structural and optical properties of GaAs1 − xBix/GaAs single quantum wells grown on (001) and (311)B substrates by molecular beam epitaxy was investigated. The structural properties were investigated by high-resolution x-ray diffraction (HR-XRD) and Transmission Electron Microscopy. The Bi concentration profiles were determined by simulating the HR-XRD 2θ−ω scans using dynamical scattering theory to estimate the Bi content, lattice coherence, and quality of the interfaces. The Bi composition was found to be similar for both samples grown on (001) and (311)B GaAs substrates. However, the simulations indicate that the Bi composition is not only limited in the GaAsBi quantum well (QW) layer but also extends out of the GaAsBi QW toward the GaAs barrier. Photoluminescence (PL) measurements were performed as a function of temperature and laser power for samples with a nominal Bi composition of 3%. PL spectra showed that (001) and (311)B samples have different peak energies at 1.23 eV and 1.26 eV, respectively, at 10 K. After RTA at 300 °C for 2 min, the PL intensity of (311)B and (001) samples was enhanced by factors of ∼2.5 and 1.75, respectively. However, for the (001) and (311)B FA samples, an enhancement of the PL intensity by a factor of only 1.5 times could be achieved. The enhancement of PL intensity in annealed samples was interpreted in terms of PL activation energies, with a reduction in the alloy disorder and an increase in the Bi cluster

Investigation of the structural, optical and electrical properties of indium-doped TiO2 thin films grown by Pulsed Laser Deposition technique on low and high index GaAs planes

© 2020 Elsevier B.V. The properties of In-doped TiO2 grown by Pulsed Laser Deposition on (1 0 0) and (3 1 1)B GaAs substrates have been investigated. X-ray diffraction and photoluminescence results have shown that samples grown on (3 1 1)B GaAs planes have better crystallographic properties than those grown on (1 0 0). Both anatase and rutile phases were detected in samples with lower In-doping (In = 5 nm) while only rutile phase was observed for higher In-doped samples (In = 15 nm). Furthermore, In-doping adversely affected the electrical properties of samples grown on (1 0 0) substrates while it enhanced those of (3 1 1)B samples. Two shallow defects were detected in all samples except for (3 1 1)B sample (In = 15 nm) where three shallow defects were observed. The presence of more shallow defects in this sample is evidenced by a red-shift in the absorption spectrum. It was concluded that sample (3 1 1)B (In = 15 nm) is best among all other samples and makes it more suitable for solar cell applications

Investigation of electrically active defects in InGaAs quantum wire intermediate-band solar cells using deep-level transient spectroscopy (DLTS) technique

InGaAs quantum wire (QWr) intermediate-band solar cell based nanostructures grown by molecular beam epitaxy are studied. The electrical and interface properties of these solar cell devices, as determined by current–voltage (I–V) and capacitance–voltage (C-V) techniques, were found to change with temperature over a wide range of 20–340 K. The electron and hole traps present in these devices have been investigated using deep-level transient spectroscopy (DLTS). The DLTS results showed that the traps detected in the QWr-doped devices are directly or indirectly related to the insertion of the Si δ-layer used to dope the wires. In addition, in the QWr-doped devices, the decrease of the solar conversion efficiencies at low temperatures and the associated decrease of the integrated external quantum efficiency through InGaAs could be attributed to detected traps E1QWR_D, E2QWR_D, and E3QWR_D with activation energies of 0.0037, 0.0053, and 0.041 eV, respectively

Down- and up-conversion photoluminescence of carbon-dots from brewing industry waste : application in live cell-imaging experiments

Simple synthetic procedures have been applied to obtain luminescent carbon quantum dots, also referred as C-dots, from an abundant carbon source, that is, from the brewing industry waste. The synthetic procedures have been conducted aiming to investigate the effects of the oxidation stage on the properties of the nanomaterial. C-dots down- and up-conversion properties, as well as their potential for cellular imaging experiments in live (and adhered) cells, are disclosed herein

Static and dynamic magnetization investigation in permalloy electrodeposited onto high resistive N-type silicon substrates

The present study reports on the development of permalloy thin films obtained by electrodeposition onto low-doped n-type silicon substrates. While changing from non-percolated clusters into percolated thin films upon increasing the electrodeposition time, the static and dynamic magnetic properties of the as-obtained structures were investigated. We found the experimental magnetic results to be in very good agreement with the simulations performed by solving the Landau-Lifshitz for the dynamics of the magnetic moment. For short electrodeposition times we found the static and dynamic magnetization behavior of the as-formed nanoclusters evidencing vortex magnetization with random chirality and polarization, which is explained in terms of dipolar interaction minimization. Indeed, it is herein emphasized that recent applications of ferromagnetic materials in silicon-based spintronic devices, such as logic and bipolar magnetic transistors and magnetic memories, have revived the possible utilization of low cost and simple electrodeposition techniques for the development of these upcoming hetero-nanostructured devices

Static and dynamic magnetization investigation in permalloy electrodeposited onto high resistive N-type silicon substrates

The present study reports on the development of permalloy thin films obtained by electrodeposition onto low-doped n-type silicon substrates. While changing from non-percolated clusters into percolated thin films upon increasing the electrodeposition time, the static and dynamic magnetic properties of the as-obtained structures were investigated. We found the experimental magnetic results to be in very good agreement with the simulations performed by solving the Landau-Lifshitz for the dynamics of the magnetic moment. For short electrodeposition times we found the static and dynamic magnetization behavior of the as-formed nanoclusters evidencing vortex magnetization with random chirality and polarization, which is explained in terms of dipolar interaction minimization. Indeed, it is herein emphasized that recent applications of ferromagnetic materials in silicon-based spintronic devices, such as logic and bipolar magnetic transistors and magnetic memories, have revived the possible utilization of low cost and simple electrodeposition techniques for the development of these upcoming hetero-nanostructured devices

Effect of gamma radiation on the electrical properties of polyaniline/silicon carbide heterojunctions

Polyaniline thin films have been deposited by a very simple technique on p-type Silicon Carbide (SiC) substrates to fabricate heterojunctions devices with good electrical properties. In this work two heterojunctions devices of Polyaniline (PANI) on p-type 4H–SiC and 6H–SiC substrates were electrically characterized using current- voltage (I-V) in the temperature range 20–430 K Capacitance–frequency (C-f) measurements. Furthermore, impedance and capacitance measurements are carried out to study the effect of gamma irradiation on these devices. Additionally, we demonstrate not only the ease of fabrication of PANI/p-SiC heterostructures, but also we show strong indication that these heterostructures have potential applications as sensors of gamma irradiation