Radiation Hardness Assurance: Evolving for NewSpace

During the past decade, numerous small satellites have been launched into space, with dramatically expanded dependence on advanced commercial-off-the-shelf (COTS) technologies and systems required for mission success. While the radiation effects vulnerabilities of small satellites are the same as those of their larger, traditional relatives, revised approaches are needed for risk management because of differences in technical requirements and programmatic resources. While moving to COTS components and systems may reduce direct costs and procurement lead times, it undermines many cost-reduction strategies used for conventional radiation hardness assurance (RHA). Limited resources are accompanied by a lack of radiation testing and analysis, which can pose significant risksor worse, be neglected altogether. Small satellites have benefited from short mission durations in low Earth orbits with respect to their radiation response, but as mission objectives grow and become reliant on advanced technologies operating for longer and in harsher environments, requirements need to reflect the changing scope without hindering developers that provide new capabilities

Radiation Hardness Assurance (RHA) Guideline

Radiation Hardness Assurance (RHA) consists of all activities undertaken to ensure that the electronics and materials of a space system perform to their design specifications after exposure to the mission space environment. The subset of interests for NEPP and the REAG, are EEE parts. It is important to register that all of these undertakings are in a feedback loop and require constant iteration and updating throughout the mission life. More detail can be found in the reference materials on applicable test data for usage on parts

A TID and SEE Characterization of Multi-Terabit COTS 3D NAND Flash

Single-event effects and total ionizing dose testing is described for a 32-layer NAND flash memory, in both SLC and MLC configurations, with special considerations for unique three-dimensional test results

Modern Hardness Assurance: A Brand New Game Except When it Isn't

Mission success criteria at the device level and required device operation/availability can determine the risk posed by the radiation effects for a given device in a given environment, but rarely are the same from one mission to another. A large portion of New Space / SmallSat missions to date have benefitted from relatively short mission durations and chosen orbits that have less severe particle populations than their larger counterparts. As mission objectives grow and become reliant on their chosen devices operating for longer lives and in more harsh environments, requirements need to reflect the changing scope but not hinder design adoptions from previously successful missions that provide new capabilities. This presentation describes notable differences in radiation environments, the requirement changes that come with choice of orbit, and prioritizations for mission success criteria to be determined by the designers of the system and subsystems. Test methodologies based on radiation effect categories are explained briefly; when they are needed. Similarity data (and its limitations) are discussed so that caveats and short-comings are understood. Reliability and assurance quantification may not always be possible, but determining where risks are taken and how to classify them is the essential topic for the intended practice: to establish radiation requirements with the goal of getting to mission success

Radiation Hardness Assurance (RHA) for Small Missions

Varied mission life and complexity is growing for small spacecraft. Small missions benefit from detailed hazard definition and evaluation as done in the past. Requirements need to flow from the system down to the parts level and aid system level radiation tolerance. RHA is highlighted with increasing COTS usage

Small Mission Radiation Hardness Assurance (RHA)

This presentation will cover Radiation Hardness Assurance (RHA), and unique challenges for implementing RHA in small missions

NASA Electronic Parts and Packaging (NEPP) Program - Innovative EEE Parts Resource for the Future

This presentation includes NASA Electronic Parts and Packaging (NEPP) Program Future Approaches, Radiation Hardness Assurance (RHA) Examples

ISSI IS46DR16640B-25DBA25 DDR2 SDRAM Total Ionizing Dose Characterization Test Report

The purpose of this testing is to characterize the ISSI IS46DR16640B-25DBA25 parameter degradation for total dose response. This tests purpose is to evaluate and compare lot date codes for sensitivity. In the test, the device is exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits or addresses, and overall chip and die health are investigated to determine which lot is more robust. These parameters directly affect the functionality of the memory within a system and may determine thresholds necessary to mitigate failure

Single-Event Effect Testing of the Linear Technology LTC6103HMS8#PBF Current Sense Amplifier

The LTC6103HMS8#PBF (henceforth abbreviated as LTC6103) current sense amplifier from Linear Technology was tested for both destructive and non-destructive single-event effects (SEE) using the heavy-ion cyclotron accelerator beam at Lawrence Berkeley National Laboratory (LBNL) Berkeley Accelerator Effects (BASE) facility. During testing, the input voltages and output currents were monitored to detect single event latch-up (SEL) and single-event transients (SETs)

On-Orbit ELDRS Instrument: BJTs on NASA Space Environment Testbed

Flight data on bipolar junction transistors (BJTs) are recorded to characterize the effect of low dose rate (LDR) space irradiation; results are comparable to ground-based LDR and elevated temperature tests. Additionally, Gummel plots of mission data are compared for different device under test (DUT) experiment variables