Built-in-self-test of RF front-end circuitry

Fuelled by the ever increasing demand for wireless products and the advent of deep submicron CMOS, RF ICs have become fairly commonplace in the semiconductor market. This has given rise to a new breed of Systems-On-Chip (SOCs) with RF front-ends tightly integrated along with digital, analog and mixed signal circuitry. However, the reliability of the integrated RF front-end continues to be a matter of significant concern and considerable research. A major challenge to the reliability of RF ICs is the fact that their performance is also severely degraded by wide tolerances in on-chip passives and package parasitics, in addition to process related faults. Due to the absence of contact based testing solutions in embedded RF SOCs (because the very act of probing may affect the performance of the RF circuit), coupled with the presence of very few test access nodes, a Built In Self Test approach (BiST) may prove to be the most efficient test scheme. However due to the associated challenges, a comprehensive and low-overhead BiST methodology for on-chip testing of RF ICs has not yet been reported in literature. In the current work, an approach to RF self-test that has hitherto been unexplored both in literature and in the commercial arena is proposed. A sensitive current monitor has been used to extract variations in the supply current drawn by the circuit-under-test (CUT). These variations are then processed in time and frequency domain to develop signatures. The acquired signatures can then be mapped to specific behavioral anomalies and the locations of these anomalies. The CUT is first excited by simple test inputs that can be generated on-chip. The current monitor extracts the corresponding variations in the supply current of the CUT, thereby creating signatures that map to various performance metrics of the circuit. These signatures can then be post-processed by low overhead on-chip circuitry and converted into an accessible form. To be successful in the RF domain any BIST architecture must be minimally invasive, reliable, offer good fault coverage and present low real estate and power overheads. The current-based self-test approach successfully addresses all these concerns. The technique has been applied to RF Low Noise Amplifiers, Mixers and Voltage Controlled Oscillators. The circuitry and post-processing techniques have also been demonstrated in silicon (using the IBM 0.25 micron RF CMOS process). The entire self-test of the RF front-end can be accomplished with a total test time of approximately 30µs, which is several orders of magnitude better than existing commercial test schemes

Dynamic input match correction in R.F. low noise amplifiers

An R.F. circuit that recognizes its faults, and then corrects its performance in real-time has been the holy-grail of RFIC design. This work presents, for the first time, a complete architecture and successful implementation of such a circuit. It is the first step towards the grand vision of fault-free, package independent, integrated R.F. Front End circuitry. The performance of R.F. front-end circuitry can degrade significantly due to process faults and parasitic package inductances at its input. These inductances have wide tolerances and are difficult to co-design for. A novel methodology, which overcomes current obstacles plaguing such an objective, is proposed wherein the affected performance metric of the circuit is quantified, and the appropriate design parameter is modified in real-time, thus enabling self-correction. This proof of concept is demonstrated by designing a cascode LNA and the complete self-correction circuit in IBM 0.25 µm CMOS RF process. The self-correction circuitry ascertains the input match frequency of the circuit by measuring its performance and determines the frequency interval by which it needs to be shifted to restore it to the desired value. It then feeds back a digital word to the LNA which adaptively corrects its input-match. It offers the additional flexibility of using different packages for the front-end since it renders the circuitry independent of package parasitics, by re-calibrating the input match on-the-fly. The circuitry presented in this work offers the advantages of low power, robustness, absence of DSP cores or processors, reduction in design cycle times, guaranteed optimal performance under varying conditions and fast correction times (less than 30 µs)

Fault-tolerant design of RF front-end circuits

The continuing trends of scaling in the CMOS industry have, inevitably, been accompanied by an ever-increasing array of process faults and fabrication complexities. The relentless march towards miniaturization and massive integration, in addition to increasing operating frequencies has resulted in increasing concerns about the reliability of integrated RF front-ends. Coupled with rising cost per chip, the fault-tolerant paradigm has become pertinent in the RFIC domain. Two main reasons have contributed to the fact that fault-tolerant solutions for circuits that operate in the GHz domain have not been realized so far. First, GHz signals are extremely sensitive to higher-order effects such as stray pick-ups, interference, package & on-chip parasitics, etc. Secondly, the use of passives, especially inductors, in the feedback path poses huge area overheads, in addition to a slew of instability problems due to wide variations and soft faults. Hence traditional fault-tolerance methods used in digital and low frequency analog circuits cannot be applied in the RF domain. This work presents a unique methodology to achieve fault-tolerance in RF circuits through dynamic sensing and on-chip self-correction, along with the development of robust algorithms. This technique is minimally intrusive and is transparent during \u27normal\u27 use of the circuit. It is characterized by low area and power overheads, does not need any off-chip computing or DSP cores, and is characterized by self-correction times in the range of a few hundreds of microseconds. It compares very well with existing commercial RF test solutions that use DSP cores and require hundreds of milliseconds. The methodology is demonstrated on a LNA, since it is critical for the performance of the entire front-end. It is validated with simulation and fabrication results of the system designed in IBM 0.25 µm CMOS 6RF process

A self-calibrated, reconfigurable RF LNA

Modern wireless System-on-Chips (SoCs), such as mobile handsets, sensor networks, and mm-wave systems, integrate an entire RF system on a single CMOS chip. Such highly complex systems require significant on-chip digital signal processing to help improve the performance of highly sensitive analog/RF components. The IC market being competitive, the ability to achieve first pass silicon success is crucial, due to very high processing and testing time cost. Unfortunately, the ability to achieve first-pass silicon success is becoming increasingly more difficult, due to higher system complexity, higher frequency of operation, increased performance requirements, and higher process skews. This thesis presents a 2.4 GHz, reconfigurable RF Low Noise Amplifier (LNA) using on-chip peak detection and calibration, to mitigate the deleterious effects of process, voltage and temperature (PVT) variations. The LNA can reconfigure its input impedance matching, as well as its gain. On-chip detection of optimal input/output impedance matching is performed using an amplitude peak detector. A low power, robust maximum peak point calibration scheme is proposed that calibrates the LNA to the resonant frequency of interest. Measurement results show that the calibration of the LNA improves the input matching (S₁₁) by a maximum of 5 dB , and power gain (S₂₁) by 3dB, while not significantly degrading the Noise Figure (NF)

Design of a CMOS power amplifier and built-in sensors for variability monitoring and compensation

This research thesis aims to develop a system composed by a a CMOS power amplifier and built-in sensors for variability monitoring and compensation. The integration of monitoring systems with high frequency analog circuits is commonly used for performance optimization and control. In addition, built-in sensors are used in quality testing, improving the yield by detecting circuit faults during the fabrication of these. Typically, most of the built-in sensors are electrically connected to a node of the circuit under test, affecting its performance. In tuned power amplifers, for instance, a small load variation can cause a degradation of its output power and effciency. Hence, the integration between the circuit under test and the monitoring block should be carefully designed. These loading effects can be avoided using non-invasive solutions such as temperature sensors. An integrated circuit composed by a CMOS power amplifer, two amplitude detectors and a temperature sensor is implemented in this work. The degradation of the power amplifier performance due to variability effects is accelerated by increasing its supply voltage. A feedback loop is added to control and adjust the system operation, stress the amplifier and accelerate its degradation, monitor the amplifier performance using the sensors and compensate the observed degradation. The design of each one of the main parts of the system is presented through this work, explaining their theoretical basis and validating their operation with simulations results. Finally, all the parts are integrated together, and a feedback loop with a control algorithm is proposed to monitor and compensate the DUT variability effects

Test estructural i predictiu per a circuits RF CMOS

En aquesta tesi s’ha desenvolupat una tècnica de test que permet testar un LNA i un mesclador, situats en el capçal RF d’un receptor CMOS, en una configuració de test semblant al mode normal de funcionament. La circuiteria necessària per a implementar aquesta tècnica consta d’un generador IF, per a generar el senyal IF de test, i d’un mesclador auxiliar, per a obtenir el senyal RF de test. Les observables de test escollides han estat l’amplitud de la tensió de sortida del mesclador i el component DC del corrent de consum. S’ha estudiat l’eficàcia de la tècnica de test proposada utilitzant les estratègies de test estructural i predictiu, mitjançant simulacions i mesures experimentals. La seva eficàcia és comparable a altres tècniques de test existents, però l’àrea addicional dedicada a la circuiteria test és inferior.En esta tesis se ha desarrollado una técnica de test que permite verificar un LNA y un mezclador, situados en el cabezal RF de un receptor CMOS, en una configuración de test similar al modo normal de funcionamiento. Los circuitos necesarios para implementar esta técnica son: un generador IF, que permite generar la señal IF de test, y un mezclador auxiliar, para obtener la señal RF de test. Las observables de test seleccionadas han sido la amplitud de la tensión de salida y la componente DC de la corriente de consumo. Se ha estudiado la eficacia de la técnica propuesta usando las estrategias de test estructural y predictiva, mediante simulaciones y medidas experimentales. Su eficacia es comparable a otras técnicas existentes, pero el área dedicada a la circuiteria de test es inferior.This PhD thesis develops a test technique intended for the RF front end of CMOS integrated receivers. This test technique allows testing individually the building blocks of the receiver in a sequential way. The test mode configuration of each block is similar to the normal mode operation. The auxiliary circuitry required to generate the test stimuli consists of an IF generator, which generates the IF test signal, and an auxiliary mixer that produces the RF test signal by mixing the IF test signal with the local oscillator signal. The test observables selected for the test are the voltage amplitude after the IF amplifier, and the DC component of the supply current in each block. The capability of the proposed test technique to perform structural and predictive test strategies has been validated by simulation and experimentally. Its efficiency is comparable to other existing techniques, but the silicon area overhead is lower

ATHENA Research Book, Volume 2

ATHENA European University is an association of nine higher education institutions with the mission of promoting excellence in research and innovation by enabling international cooperation. The acronym ATHENA stands for Association of Advanced Technologies in Higher Education. Partner institutions are from France, Germany, Greece, Italy, Lithuania, Portugal and Slovenia: University of Orléans, University of Siegen, Hellenic Mediterranean University, Niccolò Cusano University, Vilnius Gediminas Technical University, Polytechnic Institute of Porto and University of Maribor. In 2022, two institutions joined the alliance: the Maria Curie-Skłodowska University from Poland and the University of Vigo from Spain. Also in 2022, an institution from Austria joined the alliance as an associate member: Carinthia University of Applied Sciences. This research book presents a selection of the research activities of ATHENA University's partners. It contains an overview of the research activities of individual members, a selection of the most important bibliographic works of members, peer-reviewed student theses, a descriptive list of ATHENA lectures and reports from individual working sections of the ATHENA project. The ATHENA Research Book provides a platform that encourages collaborative and interdisciplinary research projects by advanced and early career researchers

A NEW TREATMENT OF LOW PROBABILITY EVENTS WITH PARTICULAR APPLICATION TO NUCLEAR POWER PLANT INCIDENTS

PhDTechnological innovation is inescapable if civilisation is to continue in the face of population growth, rising expectations and resource exhaustion. Unfortunately, major innovations, confidently thought to be safe, occasionally fail catastrophically. The fears so engendered are impeding technical progress generally and that of nuclear power in particular. Attempts to allay disquiet about these disastrous Low Probability Events (LPEs) by exhaustive studies of nuclear power plant designs have, so far, been less than successful. The New Treatment adopts instead an approach that, after examination of the LPE in its historical and societal settings, combines theoretical design analysis with construction site and operational realities in pragmatic engineering, the quality of which can be assured by accountable inspection. The LPE is envisaged as a singularity in a stream of largely mundane, but untoward incidents, described as 'Event-noise'. Predictions of the likelihood of plant LPEs by frequency-theory probability are illusory because the LPE is unique and not part of a stable distribution. Again, noise analysis seems to lead to intractable mathematical expressions. While theoretical LPE prognostications depend on the identification of fault sequences in design that can either be designed-out or reduced to plausibly negligible probabilities, the reality of LPE prevention lies with the plant in operation. As absolute safety is unattainable, the approach aims at ensuring that the perceived residual nuclear risk is societally tolerable. An adaption of elementary Catastrophe theory to model the prospective Event-noise field to be experienced by the plant is proposed whereby potential, credible LPEs could be more readily discerned and avoided. In this milieu of increasing sophistication in technology when management in the traditional administrative mold is proving inadequate, the engineer emerges as the proper central decision-maker. The special intellectual capability needed is acquired during his training and experience, a claim that can draw support from new studies in neuropsychology. The Nuclear Installation Inspectorate is cited as an exemplar of a body practising the kind of engineering inspection needed to apprehend those human fallibilities to which most catastrophic failures of technology are due. Nevertheless, such regulatory systems lack accountability and, as Goedel's theorem suggests, cannot assess their own efficiency. Independent appraisal by Signal Detection Theory is suggested as a remedy