Deductive Fault Simulation Technique for Asynchronous Circuits

Fault simulator for acpASC needs to deal with hazards, oscillations and races. The simplest algorithm for simulating faults is the serial fault simulation technique which was successfully used for the acpASC. Faster fault simulation techniques, for example deductive fault simulation, was previously used for the combinational and synchronous sequential circuits only. In this paper a deductive fault simulator for the stuck-at faults of acSI acpASC is presented. An algorithm for the propagation of the fault lists is proposed which can deal with the complex gates of the acpASC. The implemented deductive fault simulator was tested using acSI benchmark circuits. The experimental results show significant reduction of the computation time and negligible increase of the memory requirements in comparison with the serial fault simulation technique

A micropower centroiding vision processor

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Doctor of Philosophy

dissertationThe design of integrated circuit (IC) requires an exhaustive verification and a thorough test mechanism to ensure the functionality and robustness of the circuit. This dissertation employs the theory of relative timing that has the advantage of enabling designers to create designs that have significant power and performance over traditional clocked designs. Research has been carried out to enable the relative timing approach to be supported by commercial electronic design automation (EDA) tools. This allows asynchronous and sequential designs to be designed using commercial cad tools. However, two very significant holes in the flow exist: the lack of support for timing verification and manufacturing test. Relative timing (RT) utilizes circuit delay to enforce and measure event sequencing on circuit design. Asynchronous circuits can optimize power-performance product by adjusting the circuit timing. A thorough analysis on the timing characteristic of each and every timing path is required to ensure the robustness and correctness of RT designs. All timing paths have to conform to the circuit timing constraints. This dissertation addresses back-end design robustness by validating full cyclical path timing verification with static timing analysis and implementing design for testability (DFT). Circuit reliability and correctness are necessary aspects for the technology to become commercially ready. In this study, scan-chain, a commercial DFT implementation, is applied to burst-mode RT designs. In addition, a novel testing approach is developed along with scan-chain to over achieve 90% fault coverage on two fault models: stuck-at fault model and delay fault model. This work evaluates the cost of DFT and its coverage trade-off then determines the best implementation. Designs such as a 64-point fast Fourier transform (FFT) design, an I2C design, and a mixed-signal design are built to demonstrate power, area, performance advantages of the relative timing methodology and are used as a platform for developing the backend robustness. Results are verified by performing post-silicon timing validation and test. This work strengthens overall relative timed circuit flow, reliability, and testability

Behavioral synthesis from VHDL using structured modeling

This dissertation describes work in behavioral synthesis involving the development of a VHDL Synthesis System VSS which accepts a VHDL behavioral input specification and performs technology independent synthesis to generate a circuit netlist of generic components. The VHDL language is used for input and output descriptions. An intermediate representation which incorporates signal typing and component attributes simplifies compilation and facilitates design optimization.A Structured Modeling methodology has been developed to suggest standard VHDL modeling practices for synthesis. Structured modeling provides recommendations for the use of available VHDL description styles so that optimal designs will be synthesized.A design composed of generic components is synthesized from the input description through a process of Graph Compilation, Graph Criticism, and Design Compilation. Experiments were performed to demonstrate the effects of different modeling styles on the quality of the design produced by VSS. Several alternative VHDL models were examined for each benchmark, illustrating the improvements in design quality achieved when Structured Modeling guidelines were followed

Technology Mapping for Circuit Optimization Using Content-Addressable Memory

The growing complexity of Field Programmable Gate Arrays (FPGA's) is leading to architectures with high input cardinality look-up tables (LUT's). This thesis describes a methodology for area-minimizing technology mapping for combinational logic, specifically designed for such FPGA architectures. This methodology, called LURU, leverages the parallel search capabilities of Content-Addressable Memories (CAM's) to outperform traditional mapping algorithms in both execution time and quality of results. The LURU algorithm is fundamentally different from other techniques for technology mapping in that LURU uses textual string representations of circuit topology in order to efficiently store and search for circuit patterns in a CAM. A circuit is mapped to the target LUT technology using both exact and inexact string matching techniques. Common subcircuit expressions (CSE's) are also identified and used for architectural optimization---a small set of CSE's is shown to effectively cover an average of 96% of the test circuits. LURU was tested with the ISCAS'85 suite of combinational benchmark circuits and compared with the mapping algorithms FlowMap and CutMap. The area reduction shown by LURU is, on average, 20% better compared to FlowMap and CutMap. The asymptotic runtime complexity of LURU is shown to be better than that of both FlowMap and CutMap

Testing of Asynchronous NULL Conventional Logic (NCL) Circuits

Due to the absence of a global clock and presence of more state holding elements that synchronize the control and data paths, conventional automatic test pattern generation (ATPG) algorithms would fail when applied to asynchronous circuits, leading to poor fault coverage. This paper focuses on design for test (DFT) techniques aimed at making asynchronous NCL designs testable using existing DFT CAD tools with reasonable gate overhead, by enhancing controllability of feedback nets and observability for fault sites that are flagged unobservable. The proposed approach performs scan and test points insertion on NCL designs using custom ATPG library. The approach has been automated, which is essential for large systems; and are fully compatible with industry standard tools

Area/latency optimized early output asynchronous full adders and relative-timed ripple carry adders

This article presents two area/latency optimized gate level asynchronous full adder designs which correspond to early output logic. The proposed full adders are constructed using the delay-insensitive dual-rail code and adhere to the four-phase return-to-zero handshaking. For an asynchronous ripple carry adder (RCA) constructed using the proposed early output full adders, the relative-timing assumption becomes necessary and the inherent advantages of the relative-timed RCA are: (1) computation with valid inputs, i.e., forward latency is data-dependent, and (2) computation with spacer inputs involves a bare minimum constant reverse latency of just one full adder delay, thus resulting in the optimal cycle time. With respect to different 32-bit RCA implementations, and in comparison with the optimized strong-indication, weak-indication, and early output full adder designs, one of the proposed early output full adders achieves respective reductions in latency by 67.8, 12.3 and 6.1 %, while the other proposed early output full adder achieves corresponding reductions in area by 32.6, 24.6 and 6.9 %, with practically no power penalty. Further, the proposed early output full adders based asynchronous RCAs enable minimum reductions in cycle time by 83.4, 15, and 8.8 % when considering carry-propagation over the entire RCA width of 32-bits, and maximum reductions in cycle time by 97.5, 27.4, and 22.4 % for the consideration of a typical carry chain length of 4 full adder stages, when compared to the least of the cycle time estimates of various strong-indication, weak-indication, and early output asynchronous RCAs of similar size. All the asynchronous full adders and RCAs were realized using standard cells in a semi-custom design fashion based on a 32/28 nm CMOS process technology

Automatic test pattern generation for asynchronous circuits

The testability of integrated circuits becomes worse with transistor dimensions reaching nanometer scales. Testing, the process of ensuring that circuits are fabricated without defects, becomes inevitably part of the design process; a technique called design for test (DFT). Asynchronous circuits have a number of desirable properties making them suitable for the challenges posed by modern technologies, but are severely limited by the unavailability of EDA tools for DFT and automatic test-pattern generation (ATPG). This thesis is motivated towards developing test generation methodologies for asynchronous circuits. In total four methods were developed which are aimed at two different fault models: stuck-at faults at the basic logic gate level and transistor-level faults. The methods were evaluated using a set of benchmark circuits and compared favorably to previously published work. First, ABALLAST is a partial-scan DFT method adapting the well-known BALLAST technique for asynchronous circuits where balanced structures are used to guide the selection of the state-holding elements that will be scanned. The test inputs are automatically provided by a novel test pattern generator, which uses time frame unrolling to deal with the remaining, non-scanned sequential C-elements. The second method, called AGLOB, uses algorithms from strongly-connected components in graph graph theory as a method for finding the optimal position of breaking the loops in the asynchronous circuit and adding scan registers. The corresponding ATPG method converts cyclic circuits into acyclic for which standard tools can provide test patterns. These patterns are then automatically converted for use in the original cyclic circuits. The third method, ASCP, employs a new cycle enumeration method to find the loops present in a circuit. Enumerated cycles are then processed using an efficient set covering heuristic to select the scan elements for the circuit to be tested.Applying these methods to the benchmark circuits shows an improvement in fault coverage compared to previous work, which, for some circuits, was substantial. As no single method consistently outperforms the others in all benchmarks, they are all valuable as a designer’s suite of tools for testing. Moreover, since they are all scan-based, they are compatible and thus can be simultaneously used in different parts of a larger circuit. In the final method, ATRANTE, the main motivation of developing ATPG is supplemented by transistor level test generation. It is developed for asynchronous circuits designed using a State Transition Graph (STG) as their specification. The transistor-level circuit faults are efficiently mapped onto faults that modify the original STG. For each potential STG fault, the ATPG tool provides a sequence of test vectors that expose the difference in behavior to the output ports. The fault coverage obtained was 52-72 % higher than the coverage obtained using the gate level tests. Overall, four different design for test (DFT) methods for automatic test pattern generation (ATPG) for asynchronous circuits at both gate and transistor level were introduced in this thesis. A circuit extraction method for representing the asynchronous circuits at a higher level of abstraction was also implemented. Developing new methods for the test generation of asynchronous circuits in this thesis facilitates the test generation for asynchronous designs using the CAD tools available for testing the synchronous designs. Lessons learned and the research questions raised due to this work will impact the future work to probe the possibilities of developing robust CAD tools for testing the future asynchronous designs