Measurements, Models, Systems and Design

531 s.

A Discrete Event System approach to On-line Testing of digital circuits with measurement limitation

AbstractIn the present era of complex systems like avionics, industrial processes, electronic circuits, etc., on-the-fly or on-line fault detection is becoming necessary to provide uninterrupted services. Measurement limitation based fault detection schemes are applied to a wide range of systems because sensors cannot be deployed in all the locations from which measurements are required. This paper focuses towards On-Line Testing (OLT) of faults in digital electronic circuits under measurement limitation using the theory of discrete event systems. Most of the techniques presented in the literature on OLT of digital circuits have emphasized on keeping the scheme non-intrusive, low area overhead, high fault coverage, low detection latency etc. However, minimizing tap points (i.e., measurement limitation) of the circuit under test (CUT) by the on-line tester was not considered. Minimizing tap points reduces load on the CUT and this reduces the area overhead of the tester. However, reduction in tap points compromises fault coverage and detection latency. This work studies the effect of minimizing tap points on fault coverage, detection latency and area overhead. Results on ISCAS89 benchmark circuits illustrate that measurement limitation have minimal impact on fault coverage and detection latency but reduces the area overhead of the tester. Further, it was also found that for a given detection latency and fault coverage, area overhead of the proposed scheme is lower compared to other similar schemes reported in the literature

Proceedings of the 5th International Workshop on Reconfigurable Communication-centric Systems on Chip 2010 - ReCoSoC\u2710 - May 17-19, 2010 Karlsruhe, Germany. (KIT Scientific Reports ; 7551)

ReCoSoC is intended to be a periodic annual meeting to expose and discuss gathered expertise as well as state of the art research around SoC related topics through plenary invited papers and posters. The workshop aims to provide a prospective view of tomorrow\u27s challenges in the multibillion transistor era, taking into account the emerging techniques and architectures exploring the synergy between flexible on-chip communication and system reconfigurability

Intrinsically Evolvable Artificial Neural Networks

Dedicated hardware implementations of neural networks promise to provide faster, lower power operation when compared to software implementations executing on processors. Unfortunately, most custom hardware implementations do not support intrinsic training of these networks on-chip. The training is typically done using offline software simulations and the obtained network is synthesized and targeted to the hardware offline. The FPGA design presented here facilitates on-chip intrinsic training of artificial neural networks. Block-based neural networks (BbNN), the type of artificial neural networks implemented here, are grid-based networks neuron blocks. These networks are trained using genetic algorithms to simultaneously optimize the network structure and the internal synaptic parameters. The design supports online structure and parameter updates, and is an intrinsically evolvable BbNN platform supporting functional-level hardware evolution. Functional-level evolvable hardware (EHW) uses evolutionary algorithms to evolve interconnections and internal parameters of functional modules in reconfigurable computing systems such as FPGAs. Functional modules can be any hardware modules such as multipliers, adders, and trigonometric functions. In the implementation presented, the functional module is a neuron block. The designed platform is suitable for applications in dynamic environments, and can be adapted and retrained online. The online training capability has been demonstrated using a case study. A performance characterization model for RC implementations of BbNNs has also been presented

Dependability-driven Strategies to Improve the Design and Verification of Safety-Critical HDL-based Embedded Systems

[ES] La utilización de sistemas empotrados en cada vez más ámbitos de aplicación está llevando a que su diseño deba enfrentarse a mayores requisitos de rendimiento, consumo de energía y área (PPA). Asimismo, su utilización en aplicaciones críticas provoca que deban cumplir con estrictos requisitos de confiabilidad para garantizar su correcto funcionamiento durante períodos prolongados de tiempo. En particular, el uso de dispositivos lógicos programables de tipo FPGA es un gran desafío desde la perspectiva de la confiabilidad, ya que estos dispositivos son muy sensibles a la radiación. Por todo ello, la confiabilidad debe considerarse como uno de los criterios principales para la toma de decisiones a lo largo del todo flujo de diseño, que debe complementarse con diversos procesos que permitan alcanzar estrictos requisitos de confiabilidad. Primero, la evaluación de la robustez del diseño permite identificar sus puntos débiles, guiando así la definición de mecanismos de tolerancia a fallos. Segundo, la eficacia de los mecanismos definidos debe validarse experimentalmente. Tercero, la evaluación comparativa de la confiabilidad permite a los diseñadores seleccionar los componentes prediseñados (IP), las tecnologías de implementación y las herramientas de diseño (EDA) más adecuadas desde la perspectiva de la confiabilidad. Por último, la exploración del espacio de diseño (DSE) permite configurar de manera óptima los componentes y las herramientas seleccionados, mejorando así la confiabilidad y las métricas PPA de la implementación resultante. Todos los procesos anteriormente mencionados se basan en técnicas de inyección de fallos para evaluar la robustez del sistema diseñado. A pesar de que existe una amplia variedad de técnicas de inyección de fallos, varias problemas aún deben abordarse para cubrir las necesidades planteadas en el flujo de diseño. Aquellas soluciones basadas en simulación (SBFI) deben adaptarse a los modelos de nivel de implementación, teniendo en cuenta la arquitectura de los diversos componentes de la tecnología utilizada. Las técnicas de inyección de fallos basadas en FPGAs (FFI) deben abordar problemas relacionados con la granularidad del análisis para poder localizar los puntos débiles del diseño. Otro desafío es la reducción del coste temporal de los experimentos de inyección de fallos. Debido a la alta complejidad de los diseños actuales, el tiempo experimental dedicado a la evaluación de la confiabilidad puede ser excesivo incluso en aquellos escenarios más simples, mientras que puede ser inviable en aquellos procesos relacionados con la evaluación de múltiples configuraciones alternativas del diseño. Por último, estos procesos orientados a la confiabilidad carecen de un soporte instrumental que permita cubrir el flujo de diseño con toda su variedad de lenguajes de descripción de hardware, tecnologías de implementación y herramientas de diseño. Esta tesis aborda los retos anteriormente mencionados con el fin de integrar, de manera eficaz, estos procesos orientados a la confiabilidad en el flujo de diseño. Primeramente, se proponen nuevos métodos de inyección de fallos que permiten una evaluación de la confiabilidad, precisa y detallada, en diferentes niveles del flujo de diseño. Segundo, se definen nuevas técnicas para la aceleración de los experimentos de inyección que mejoran su coste temporal. Tercero, se define dos estrategias DSE que permiten configurar de manera óptima (desde la perspectiva de la confiabilidad) los componentes IP y las herramientas EDA, con un coste experimental mínimo. Cuarto, se propone un kit de herramientas que automatiza e incorpora con eficacia los procesos orientados a la confiabilidad en el flujo de diseño semicustom. Finalmente, se demuestra la utilidad y eficacia de las propuestas mediante un caso de estudio en el que se implementan tres procesadores empotrados en un FPGA de Xilinx serie 7.[CA] La utilització de sistemes encastats en cada vegada més àmbits d'aplicació està portant al fet que el seu disseny haja d'enfrontar-se a majors requisits de rendiment, consum d'energia i àrea (PPA). Així mateix, la seua utilització en aplicacions crítiques provoca que hagen de complir amb estrictes requisits de confiabilitat per a garantir el seu correcte funcionament durant períodes prolongats de temps. En particular, l'ús de dispositius lògics programables de tipus FPGA és un gran desafiament des de la perspectiva de la confiabilitat, ja que aquests dispositius són molt sensibles a la radiació. Per tot això, la confiabilitat ha de considerar-se com un dels criteris principals per a la presa de decisions al llarg del tot flux de disseny, que ha de complementar-se amb diversos processos que permeten aconseguir estrictes requisits de confiabilitat. Primer, l'avaluació de la robustesa del disseny permet identificar els seus punts febles, guiant així la definició de mecanismes de tolerància a fallades. Segon, l'eficàcia dels mecanismes definits ha de validar-se experimentalment. Tercer, l'avaluació comparativa de la confiabilitat permet als dissenyadors seleccionar els components predissenyats (IP), les tecnologies d'implementació i les eines de disseny (EDA) més adequades des de la perspectiva de la confiabilitat. Finalment, l'exploració de l'espai de disseny (DSE) permet configurar de manera òptima els components i les eines seleccionats, millorant així la confiabilitat i les mètriques PPA de la implementació resultant. Tots els processos anteriorment esmentats es basen en tècniques d'injecció de fallades per a poder avaluar la robustesa del sistema dissenyat. A pesar que existeix una àmplia varietat de tècniques d'injecció de fallades, diverses problemes encara han d'abordar-se per a cobrir les necessitats plantejades en el flux de disseny. Aquelles solucions basades en simulació (SBFI) han d'adaptar-se als models de nivell d'implementació, tenint en compte l'arquitectura dels diversos components de la tecnologia utilitzada. Les tècniques d'injecció de fallades basades en FPGAs (FFI) han d'abordar problemes relacionats amb la granularitat de l'anàlisi per a poder localitzar els punts febles del disseny. Un altre desafiament és la reducció del cost temporal dels experiments d'injecció de fallades. A causa de l'alta complexitat dels dissenys actuals, el temps experimental dedicat a l'avaluació de la confiabilitat pot ser excessiu fins i tot en aquells escenaris més simples, mentre que pot ser inviable en aquells processos relacionats amb l'avaluació de múltiples configuracions alternatives del disseny. Finalment, aquests processos orientats a la confiabilitat manquen d'un suport instrumental que permeta cobrir el flux de disseny amb tota la seua varietat de llenguatges de descripció de maquinari, tecnologies d'implementació i eines de disseny. Aquesta tesi aborda els reptes anteriorment esmentats amb la finalitat d'integrar, de manera eficaç, aquests processos orientats a la confiabilitat en el flux de disseny. Primerament, es proposen nous mètodes d'injecció de fallades que permeten una avaluació de la confiabilitat, precisa i detallada, en diferents nivells del flux de disseny. Segon, es defineixen noves tècniques per a l'acceleració dels experiments d'injecció que milloren el seu cost temporal. Tercer, es defineix dues estratègies DSE que permeten configurar de manera òptima (des de la perspectiva de la confiabilitat) els components IP i les eines EDA, amb un cost experimental mínim. Quart, es proposa un kit d'eines (DAVOS) que automatitza i incorpora amb eficàcia els processos orientats a la confiabilitat en el flux de disseny semicustom. Finalment, es demostra la utilitat i eficàcia de les propostes mitjançant un cas d'estudi en el qual s'implementen tres processadors encastats en un FPGA de Xilinx serie 7.[EN] Embedded systems are steadily extending their application areas, dealing with increasing requirements in performance, power consumption, and area (PPA). Whenever embedded systems are used in safety-critical applications, they must also meet rigorous dependability requirements to guarantee their correct operation during an extended period of time. Meeting these requirements is especially challenging for those systems that are based on Field Programmable Gate Arrays (FPGAs), since they are very susceptible to Single Event Upsets. This leads to increased dependability threats, especially in harsh environments. In such a way, dependability should be considered as one of the primary criteria for decision making throughout the whole design flow, which should be complemented by several dependability-driven processes. First, dependability assessment quantifies the robustness of hardware designs against faults and identifies their weak points. Second, dependability-driven verification ensures the correctness and efficiency of fault mitigation mechanisms. Third, dependability benchmarking allows designers to select (from a dependability perspective) the most suitable IP cores, implementation technologies, and electronic design automation (EDA) tools. Finally, dependability-aware design space exploration (DSE) allows to optimally configure the selected IP cores and EDA tools to improve as much as possible the dependability and PPA features of resulting implementations. The aforementioned processes rely on fault injection testing to quantify the robustness of the designed systems. Despite nowadays there exists a wide variety of fault injection solutions, several important problems still should be addressed to better cover the needs of a dependability-driven design flow. In particular, simulation-based fault injection (SBFI) should be adapted to implementation-level HDL models to take into account the architecture of diverse logic primitives, while keeping the injection procedures generic and low-intrusive. Likewise, the granularity of FPGA-based fault injection (FFI) should be refined to the enable accurate identification of weak points in FPGA-based designs. Another important challenge, that dependability-driven processes face in practice, is the reduction of SBFI and FFI experimental effort. The high complexity of modern designs raises the experimental effort beyond the available time budgets, even in simple dependability assessment scenarios, and it becomes prohibitive in presence of alternative design configurations. Finally, dependability-driven processes lack an instrumental support covering the semicustom design flow in all its variety of description languages, implementation technologies, and EDA tools. Existing fault injection tools only partially cover the individual stages of the design flow, being usually specific to a particular design representation level and implementation technology. This work addresses the aforementioned challenges by efficiently integrating dependability-driven processes into the design flow. First, it proposes new SBFI and FFI approaches that enable an accurate and detailed dependability assessment at different levels of the design flow. Second, it improves the performance of dependability-driven processes by defining new techniques for accelerating SBFI and FFI experiments. Third, it defines two DSE strategies that enable the optimal dependability-aware tuning of IP cores and EDA tools, while reducing as much as possible the robustness evaluation effort. Fourth, it proposes a new toolkit (DAVOS) that automates and seamlessly integrates the aforementioned dependability-driven processes into the semicustom design flow. Finally, it illustrates the usefulness and efficiency of these proposals through a case study consisting of three soft-core embedded processors implemented on a Xilinx 7-series SoC FPGA.Tuzov, I. (2020). Dependability-driven Strategies to Improve the Design and Verification of Safety-Critical HDL-based Embedded Systems [Tesis doctoral]. Universitat Politècnica de València. https://doi.org/10.4995/Thesis/10251/159883TESI

Null convention logic circuits for asynchronous computer architecture

For most of its history, computer architecture has been able to benefit from a rapid scaling in semiconductor technology, resulting in continuous improvements to CPU design. During that period, synchronous logic has dominated because of its inherent ease of design and abundant tools. However, with the scaling of semiconductor processes into deep sub-micron and then to nano-scale dimensions, computer architecture is hitting a number of roadblocks such as high power and increased process variability. Asynchronous techniques can potentially offer many advantages compared to conventional synchronous design, including average case vs. worse case performance, robustness in the face of process and operating point variability and the ready availability of high performance, fine grained pipeline architectures. Of the many alternative approaches to asynchronous design, Null Convention Logic (NCL) has the advantage that its quasi delay-insensitive behavior makes it relatively easy to set up complex circuits without the need for exhaustive timing analysis. This thesis examines the characteristics of an NCL based asynchronous RISC-V CPU and analyses the problems with applying NCL to CPU design. While a number of university and industry groups have previously developed small 8-bit microprocessor architectures using NCL techniques, it is still unclear whether these offer any real advantages over conventional synchronous design. A key objective of this work has been to analyse the impact of larger word widths and more complex architectures on NCL CPU implementations. The research commenced by re-evaluating existing techniques for implementing NCL on programmable devices such as FPGAs. The little work that has been undertaken previously on FPGA implementations of asynchronous logic has been inconclusive and seems to indicate that asynchronous systems cannot be easily implemented in these devices. However, most of this work related to an alternative technique called bundled data, which is not well suited to FPGA implementation because of the difficulty in controlling and matching delays in a 'bundle' of signals. On the other hand, this thesis clearly shows that such applications are not only possible with NCL, but there are some distinct advantages in being able to prototype complex asynchronous systems in a field-programmable technology such as the FPGA. A large part of the value of NCL derives from its architectural level behavior, inherent pipelining, and optimization opportunities such as the merging of register and combina- tional logic functions. In this work, a number of NCL multiplier architectures have been analyzed to reveal the performance trade-offs between various non-pipelined, 1D and 2D organizations. Two-dimensional pipelining can easily be applied to regular architectures such as array multipliers in a way that is both high performance and area-efficient. It was found that the performance of 2D pipelining for small networks such as multipliers is around 260% faster than the equivalent non-pipelined design. However, the design uses 265% more transistors so the methodology is mainly of benefit where performance is strongly favored over area. A pipelined 32bit x 32bit signed Baugh-Wooley multiplier with Wallace-Tree Carry Save Adders (CSA), which is representative of a real design used for CPUs and DSPs, was used to further explore this concept as it is faster and has fewer pipeline stages compared to the normal array multiplier using Ripple-Carry adders (RCA). It was found that 1D pipelining with ripple-carry chains is an efficient implementation option but becomes less so for larger multipliers, due to the completion logic for which the delay time depends largely on the number of bits involved in the completion network. The average-case performance of ripple-carry adders was explored using random input vectors and it was observed that it offers little advantage on the smaller multiplier blocks, but this particular timing characteristic of asynchronous design styles be- comes increasingly more important as word size grows. Finally, this research has resulted in the development of the first 32-Bit asynchronous RISC-V CPU core. Called the Redback RISC, the architecture is a structure of pipeline rings composed of computational oscillations linked with flow completeness relationships. It has been written using NELL, a commercial description/synthesis tool that outputs standard Verilog. The Redback has been analysed and compared to two approximately equivalent industry standard 32-Bit synchronous RISC-V cores (PicoRV32 and Rocket) that are already fabricated and used in industry. While the NCL implementation is larger than both commercial cores it has similar performance and lower power compared to the PicoRV32. The implementation results were also compared against an existing NCL design tool flow (UNCLE), which showed how much the results of these implementation strategies differ. The Redback RISC has achieved similar level of throughput and 43% better power and 34% better energy compared to one of the synchronous cores with the same benchmark test and test condition such as input sup- ply voltage. However, it was shown that area is the biggest drawback for NCL CPU design. The core is roughly 2.5× larger than synchronous designs. On the other hand its area is still 2.9× smaller than previous designs using UNCLE tools. The area penalty is largely due to the unavoidable translation into a dual-rail topology when using the standard NCL cell library

SAFE-FLOW : a systematic approach for safety analysis of clinical workflows

The increasing use of technology in delivering clinical services brings substantial benefits to the healthcare industry. At the same time, it introduces potential new complications to clinical workflows that generate new risks and hazards with the potential to affect patients’ safety. These workflows are safety critical and can have a damaging impact on all the involved parties if they fail.Due to the large number of processes included in the delivery of a clinical service, it can be difficult to determine the individuals or the processes that are responsible for adverse events. Using methodological approaches and automated tools to carry out an analysis of the workflow can help in determining the origins of potential adverse events and consequently help in avoiding preventable errors. There is a scarcity of studies addressing this problem; this was a partial motivation for this thesis.The main aim of the research is to demonstrate the potential value of computer science based dependability approaches to healthcare and in particular, the appropriateness and benefits of these dependability approaches to overall clinical workflows. A particular focus is to show that model-based safety analysis techniques can be usefully applied to such areas and then to evaluate this application.This thesis develops the SAFE-FLOW approach for safety analysis of clinical workflows in order to establish the relevance of such application. SAFE-FLOW detailed steps and guidelines for its application are explained. Then, SAFE-FLOW is applied to a case study and is systematically evaluated. The proposed evaluation design provides a generic evaluation strategy that can be used to evaluate the adoption of safety analysis methods in healthcare.It is concluded that safety of clinical workflows can be significantly improved by performing safety analysis on workflow models. The evaluation results show that SAFE-FLOW is feasible and it has the potential to provide various benefits; it provides a mechanism for a systematic identification of both adverse events and safeguards, which is helpful in terms of identifying the causes of possible adverse events before they happen and can assist in the design of workflows to avoid such occurrences. The clear definition of the workflow including its processes and tasks provides a valuable opportunity for formulation of safety improvement strategies