Analogue to Digital and Digital to Analogue Converters (ADCs and DACs): A Review Update

This is a review paper updated from that presented for CAS 2004. Essentially, since then, commercial components have continued to extend their performance boundaries but the basic building blocks and the techniques for choosing the best device and implementing it in a design have not changed. Analogue to digital and digital to analogue converters are crucial components in the continued drive to replace analogue circuitry with more controllable and less costly digital processing. This paper discusses the technologies available to perform in the likely measurement and control applications that arise within accelerators. It covers much of the terminology and 'specmanship' together with an application-oriented analysis of the realisable performance of the various types. Finally, some hints and warnings on system integration problems are given.Comment: 15 pages, contribution to the 2014 CAS - CERN Accelerator School: Power Converters, Baden, Switzerland, 7-14 May 201

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process

Discussion of the technology and research in fuel injectors common rail system

Common rail is one of the most important components in a diesel and gasoline direct injection system. It features a high-pressure (100 bar) fuel rail feeding solenoid valves, as opposed to a low-pressure fuel pump feeding unit injectors. Third-generation common rail diesels now feature piezoelectric injectors for increased precision, with fuel pressures up to 2,500 bar. The purpose of this review paper is to investigate the technology and research in fuel injectors common rail system. This review paper focuses on component of common rail injection system, pioneer of common rail injection, characteristics of common rail injection system, method to reduce smoke and NOx emission simultaneously and impact of common rail injection system. Based on our research, it can be concluded that common rail injection gives many benefit such as good for the engine performance, safe to use, and for to reduce the emission of the vehicle. Fuel injection common rail system is the modern technology that must be developed. Nowadays, our earth is polluting by vehicle output such as smoke. If the common rail system is developed, it can reduce the pollution and keep our atmosphere clean and safe

Circuit design techniques for Power Efficient Microscale Energy Harvesting Systems

Power Management is considered one of the hot topics nowadays, as it is already known that all integrated circuits need a stable supply with low noise, a constant voltage level across time, and the ability to supply large range of loads. Normal batteries do not provide those specifications. A new concept of energy management called energy harvesting is introduced here. Energy harvesting means collecting power from ambient resources like solar power, Radio Frequency (RF) power, energy from motion...etc. The Energy is collected by means of a transducer that directly converts this energy into electrical energy that can be managed by design to supply different loads. Harvested energy management is critical because normal batteries have to be replaced with energy harvesting modules with power management, in order to make integrated circuits fully autonomous; this leads to a decrease in maintenance costs and increases the life time. This work covers the design of an energy harvesting system focusing on micro-scale solar energy harvesting with power management. The target application of this study is a Wireless Sensor Node/Network (WSN) because its applications are very wide and power management in it is a big issue, as it is very hard to replace the battery of a WSN after deployment. The contribution of this work is mainly shown on two different scopes. The first scope is to propose a new tracking technique and to verify on the system level. The second scope is to propose a new optimized architecture for switched capacitor based power converters. At last, some future recommendations are proposed for this work to be more robust and reliable so that it can be transfered to the production phase. The proposed system design is based on the sub-threshold operation. This design approach decreases the amount of power consumed in the control circuit. It can efficiently harvest the maximum power possible from the photo-voltaic cell and transfer this power to the super-capacitor side with high efficiency. It shows a better performance compared to the literature work. The proposed architecture of the charge pump is more efficient in terms of power capability and knee frequency over the basic linear charge pump topology. Comparison with recent topologies are discussed and shows the robustness of the proposed technique

A Current-Mode Multi-Channel Integrating Analog-to-Digital Converter

Multi-channel analog to digital converters (ADCs) are required where signals from multiple sensors can be digitized. A lower power per channel for such systems is important in order that when the number of channels is increased the power does not increase drastically. Many applications require signals from current output sensors, such as photosensors and photodiodes to be digitized. Applications for these sensors include spectroscopy and imaging. The ability to digitize current signals without converting currents to voltages saves power, area, and the design time required to implement I-to-V converters. This work describes a novel and unique current-mode multi-channel integrating ADC which processes current signals from sensors and converts it to digital format. The ADC facilitates the processing of current analog signals without the use of transconductors. An attempt has been made also to incorporate voltage-mode techniques into the current-mode design so that the advantages of both techniques can be utilized to augment the performance of the system. Additionally since input signals are in the form of currents, the dynamic range of the ADC is less dependant on the supply voltage. A prototype 4-channel ADC design was fabricated in a 0.5-micron bulk CMOS process. The measurement results for a 10Ksps sampling rate include a DNL, which is less than 0.5 LSB, and a power consumption of less than 2mW per channel

Digital Controlled Multi-phase Buck Converter with Accurate Voltage and Current Control

abstract: A 4-phase, quasi-current-mode hysteretic buck converter with digital frequency synchronization, online comparator offset-calibration and digital current sharing control is presented. The switching frequency of the hysteretic converter is digitally synchronized to the input clock reference with less than ±1.5% error in the switching frequency range of 3-9.5MHz. The online offset calibration cancels the input-referred offset of the hysteretic comparator and enables ±1.1% voltage regulation accuracy. Maximum current-sharing error of ±3.6% is achieved by a duty-cycle-calibrated delay line based PWM generator, without affecting the phase synchronization timing sequence. In light load conditions, individual converter phases can be disabled, and the final stage power converter output stage is segmented for high efficiency. The DC-DC converter achieves 93% peak efficiency for Vi = 2V and Vo = 1.6V.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201

Communications techniques and equipment: A compilation

This Compilation is devoted to equipment and techniques in the field of communications. It contains three sections. One section is on telemetry, including articles on radar and antennas. The second section describes techniques and equipment for coding and handling data. The third and final section includes descriptions of amplifiers, receivers, and other communications subsystems

Pipelined analog-to-digital conversion using current-mode reference shifting

Dissertação para obtenção do grau de Mestre em Engenharia Electrotécnica e de ComputadoresPipeline Analog-to-digital converters (ADCs) are the most popular architecture for high-speed medium-to-high resolution applications. A fundamental, but often unreferenced building block of pipeline ADCs are the reference voltage circuits. They are required to maintain a stable reference with low output impedance to drive large internal switched capacitor loads quickly. Achieving this usually leads to a scheme that consumes a large portion of the overall power and area. A review of the literature shows that the required stable reference can be achieved with either on-chip buffering or with large off-chip decoupling capacitors. On-chip buffering is ideal for system integration but requires a high speed buffer with high power dissipation. The use of a reference with off-chip decoupling results in significant power savings but increases the pads of chip, the count of external components and the overall system cost. Moreover the amount of ringing on the internal reference voltage caused by the series inductance of the package makes this solution not viable for high speed ADCs. To address this challenge, a pipeline ADC employing a multiplying digital-to-analog converter (MDAC) with current-mode reference shifting is presented. Consequently, no reference voltages and, therefore, no voltage buffers are necessary. The bias currents are generated on-chip by a reference current generator that dissipates low power. The proposed ADC is designed in a 65 nm CMOS technology and operates at sampling rates ranging from 10 to 80 MS/s. At 40 MS/s the ADC dissipates 10.8 mW from a 1.2 V power supply and achieves an SNDR of 57.2 dB and a THD of -68 dB, corresponding to an ENOB of 9.2 bit. The corresponding figure of merit is 460 fJ/step