Solid State Circuits Technologies

The evolution of solid-state circuit technology has a long history within a relatively short period of time. This technology has lead to the modern information society that connects us and tools, a large market, and many types of products and applications. The solid-state circuit technology continuously evolves via breakthroughs and improvements every year. This book is devoted to review and present novel approaches for some of the main issues involved in this exciting and vigorous technology. The book is composed of 22 chapters, written by authors coming from 30 different institutions located in 12 different countries throughout the Americas, Asia and Europe. Thus, reflecting the wide international contribution to the book. The broad range of subjects presented in the book offers a general overview of the main issues in modern solid-state circuit technology. Furthermore, the book offers an in depth analysis on specific subjects for specialists. We believe the book is of great scientific and educational value for many readers. I am profoundly indebted to the support provided by all of those involved in the work. First and foremost I would like to acknowledge and thank the authors who worked hard and generously agreed to share their results and knowledge. Second I would like to express my gratitude to the Intech team that invited me to edit the book and give me their full support and a fruitful experience while working together to combine this book

Negative Bias Temperature Instability (NBTI) Monitoring and Mitigation Technique for MOSFET

修士論

Online Nbti Wear-out Estimation

CMOS feature size scaling has been a source of dramatic performance gains, but it has come at a cost of on-chip wear-out. Negative Bias Temperature Instability (NBTI) is one of the main on-chip wear-out problems which questions the reliability of a chip. To check the accuracy of Reaction-Diffusion (RD) model, this work first proposes to compare the NBTI wear-out data from the RD wear-out model and the reliability simulator - Ultrasim RelXpert, by monitoring the activity of the register file on a Leon3 processor. The simulator wear-out data obtained is considered to be the baseline data and is used to tune the RD model using a novel technique time slicing. It turns out that the tuned RD model NBTI degradation is on an average 80% accurate with respect to RelXpert simulator and its calculation is approximately 8 times faster than the simulator. We come up with a waveform compression technique, for the activity waveforms from the Leon3 register file, which consumes 131KB compared to 256MB required without compression, and also provides 91% accuracy in NBTI degradation, compared to the same obtained without compression. We also propose a NBTI ΔVth estimation/prediction technique to reduce the time consumption of the tuned RD model threshold voltage calculation by an order of with one day degradation being 93% within the same of the tuned RD model. This work further proposes to a novel NBTI Degradation Predictor (NDP), to predict the future NBTI degradation, in a DE2 FPGA for WCET benchmarks. Also we measure the ΔVth variation across the 4 corners of the DE2 FPGA running a single Leon3, which varies from 0.08% to 0.11% of the base Vth

Energy Saving and Scavenging in Stand-alone and Large Scale Distributed Systems.

This thesis focuses on energy management techniques for distributed systems such as hand-held mobile devices, sensor nodes, and data center servers. One of the major design problems in multiple application domains is the mismatch between workloads and resources. Sub-optimal assignment of workloads to resources can cause underloaded or overloaded resources, resulting in performance degradation or energy waste. This work specifically focuses on the heterogeneity in system hardware components and workloads. It includes energy management solutions for unregulated or batteryless embedded systems; and data center servers with heterogeneous workloads, machines, and processor wear states. This thesis describes four major contributions: (1) This thesis describes a battery test and energy delivery system design process to maintain battery life in embedded systems without voltage regulators. (2) In battery-less sensor nodes, this thesis demonstrates a routing protocol to maintain reliable transmission through the sensor network. (3) This thesis has characterized typical workloads and developed two models to capture the heterogeneity of data center tasks and machines: a task performance model and a machine resource utilization model. These models allow users to predict task finish time on individual machines. It then integrates these two models into a task scheduler based on the Hadoop framework for MapReduce tasks, and uses this scheduler for server energy minimization using task concentration. (4) In addition to saving server energy consumption, this thesis describes a method of reducing data center cooling energy by maintaining optimal server processor temperature setpoints through a task assignment algorithm. This algorithm considers the reliability impact of processor wear states. It records processor wear states through automatic timing slack tests on a cluster of machines with varying core temperatures, voltages, and frequencies. These optimal temperature setpoints are used in a task scheduling algorithm that saves both server and cooling energy.PhDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/116746/1/xjhe_1.pd