Testing high resolution SD ADC’s by using the noise transfer function

A new solution to improve the testability of high resolution SD Analogue to Digital Converters (SD ADC’s) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, 4th order, audio ADC are presented. The analysis demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques

On the use of testability measures for dependability assessment

Program “testability” is informally, the probability that a program will fail under test if it contains at least one fault. When a dependability assessment has to be derived from the observation of a series of failure free test executions (a common need for software subject to “ultra high reliability” requirements), measures of testability can-in theory-be used to draw inferences on program correctness. We rigorously investigate the concept of testability and its use in dependability assessment, criticizing, and improving on, previously published results. We give a general descriptive model of program execution and testing, on which the different measures of interest can be defined. We propose a more precise definition of program testability than that given by other authors, and discuss how to increase testing effectiveness without impairing program reliability in operation. We then study the mathematics of using testability to estimate, from test results: the probability of program correctness and the probability of failures. To derive the probability of program correctness, we use a Bayesian inference procedure and argue that this is more useful than deriving a classical “confidence level”. We also show that a high testability is not an unconditionally desirable property for a program. In particular, for programs complex enough that they are unlikely to be completely fault free, increasing testability may produce a program which will be less trustworthy, even after successful testin

Design and Test Space Exploration of Transport-Triggered Architectures

This paper describes a new approach in the high level design and test of transport-triggered architectures (TTA), a special type of application specific instruction processors (ASIP). The proposed method introduces the test as an additional constraint, besides throughput and circuit area. The method, that calculates the testability of the system, helps the designer to assess the obtained architectures with respect to test, area and throughput in the early phase of the design and selects the most suitable one. In order to create the templated TTA, the ¿MOVE¿ framework has been addressed. The approach is validated with respect to the ¿Crypt¿ Unix applicatio

Bio-inspired 0.35μm CMOS Time-to-Digital Converter with 29.3ps LSB

Time-to-digital converter (TDC) integrated circuit is introduced in this paper. It is based on chain of delay elements composing a regular scalable structure. The scheme is analogous to the sound direction sensitivity nerve system found in barn owl. The circuit occupies small silicon area, and its direct mapping from time to position-code makes conversion rates up to 500Msps possible. Specialty of the circuit is the structural and functional symmetry. Therefore the role of start and stop signals are interchangeable. In other words negative delay is acceptable: the circuit has no dead time problems. These are benefits of the biology model of the auditory scene representation in the bird's brain. The prototype chip is implemented in 0.35μm CMOS having less than 30ps single-shot resolution in the measurements.Hungarian National Research Foundation TS4085

On-line Testing Field Programmable Analog Array Circuits

This work presents an efficient methodology to on-line test field programmable analog array (FPAA) circuits. It proposes to partition the FPAA circuit under test into sub circuits. Each sub circuit is tested by replicating the sub circuit with programmable resources on FPAAs, and comparing the outputs of the original partitioned sub circuit and its replication. The advantages of this approach includes: low implementation cost, enhanced testability, and flexible testing schedules. This work also presents circuit techniques to address stability problems which are often encountered in the proposed on-line testing approach. In addition, the impact of performing circuit partition on testability is investigated in this work. It shows that testability is generally improved in partitioned circuits. Finally, experimental results are presented to demonstrate the feasibility and effectiveness of the proposed techniques

An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group

VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving

Separations of Matroid Freeness Properties

Properties of Boolean functions on the hypercube invariant with respect to linear transformations of the domain are among the most well-studied properties in the context of property testing. In this paper, we study the fundamental class of linear-invariant properties called matroid freeness properties. These properties have been conjectured to essentially coincide with all testable linear-invariant properties, and a recent sequence of works has established testability for increasingly larger subclasses. One question left open, however, is whether the infinitely many syntactically different properties recently shown testable in fact correspond to new, semantically distinct ones. This is a crucial issue since it has also been shown that there exist subclasses of these properties for which an infinite set of syntactically different representations collapse into one of a small, finite set of properties, all previously known to be testable. An important question is therefore to understand the semantics of matroid freeness properties, and in particular when two syntactically different properties are truly distinct. We shed light on this problem by developing a method for determining the relation between two matroid freeness properties P and Q. Furthermore, we show that there is a natural subclass of matroid freeness properties such that for any two properties P and Q from this subclass, a strong dichotomy must hold: either P is contained in Q or the two properties are "well separated." As an application of this method, we exhibit new, infinite hierarchies of testable matroid freeness properties such that at each level of the hierarchy, there are functions that are far from all functions lying in lower levels of the hierarchy. Our key technical tool is an apparently new notion of maps between linear matroids, called matroid homomorphisms, that might be of independent interest

Анализ тестопригодности цифровых схем на уровне регистровых передач

Запропоновано метод аналізу тестопридатності цифрових схем для детермінованого тестування більш адекватний порівняно з відомими класичними методами. Він орієнтований на комбінаційні та послідовностні схеми і базується на топологічному аналізі їх представлення на вентильному рівні та RTL. Отримані показники дозволяють легко модифікувати схему для мінімізації числа несправностей.It is proposed more suitable method of the testability analysis of the digital systems in comparison with known classical algorithmic and probabilistic methods. It is oriented on the complex combinational and sequential asynchronous logic circuits. Estimation of the testability is based on the topological analysis of the circuit. The new method and above mentioned methods were approved on the circuits of different complexity, including circuits from ISCAS’85, ‘89 Libraries. Proposed method can be used on gate-level and RT-level circuit description